JP7181832B2 - Ａｌｖａｒｅｚ－Ｍａｃｏｖｓｋｉ減衰モデルを使用した断層像再構成におけるＸ線ビームハードニング補正 - Google Patents

Ａｌｖａｒｅｚ－Ｍａｃｏｖｓｋｉ減衰モデルを使用した断層像再構成におけるＸ線ビームハードニング補正 Download PDF

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JP7181832B2
JP7181832B2 JP2019077112A JP2019077112A JP7181832B2 JP 7181832 B2 JP7181832 B2 JP 7181832B2 JP 2019077112 A JP2019077112 A JP 2019077112A JP 2019077112 A JP2019077112 A JP 2019077112A JP 7181832 B2 JP7181832 B2 JP 7181832B2
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チーヘン ヤン
グレン アール． マイヤーズ
シェーン ジェイ． レイサム
エイドリアン ピー． シェパード
アンドリュー キングストン
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T12/00—Tomographic reconstruction from projections
    • G06T12/20—Inverse problem, i.e. transformations from projection space into object space
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T12/00—Tomographic reconstruction from projections
    • G06T12/10—Image preprocessing, e.g. calibration, positioning of sources or scatter correction
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/03—Investigating materials by wave or particle radiation by transmission
    • G—PHYSICS
    • G01—MEASURING; TESTING
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    • G01N2223/00—Investigating materials by wave or particle radiation
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    • G01N2223/1016—X-ray
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/303—Accessories, mechanical or electrical features calibrating, standardising
    • G01N2223/3035—Accessories, mechanical or electrical features calibrating, standardising phantom
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/401—Imaging image processing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/419—Imaging computed tomograph
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/423—Imaging multispectral imaging-multiple energy imaging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/616—Specific applications or type of materials earth materials
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2211/00—Image generation
    • G06T2211/40—Computed tomography
    • G06T2211/408—Dual energy
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2211/00—Image generation
    • G06T2211/40—Computed tomography
    • G06T2211/424—Iterative

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  • General Physics & Mathematics (AREA)
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  • Analysing Materials By The Use Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
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JP2019077112A 2018-04-19 2019-04-15 Ａｌｖａｒｅｚ－Ｍａｃｏｖｓｋｉ減衰モデルを使用した断層像再構成におけるＸ線ビームハードニング補正 Active JP7181832B2 (ja)

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US201862659887P 2018-04-19 2018-04-19
US62/659,887 2018-04-19

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JP2019188135A JP2019188135A (ja) 2019-10-31
JP2019188135A5 JP2019188135A5 (https=) 2022-02-01
JP7181832B2 true JP7181832B2 (ja) 2022-12-01

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US (1) US10902650B2 (https=)
JP (1) JP7181832B2 (https=)
CN (1) CN110389138B (https=)
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RU (1) RU2770544C2 (https=)

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US10846860B2 (en) * 2013-03-05 2020-11-24 Nview Medical Inc. Systems and methods for x-ray tomosynthesis image reconstruction
CN111373448B (zh) 2017-09-22 2023-12-08 尼维医疗公司 使用机器学习正则化器的图像重建
US11610297B2 (en) * 2019-12-02 2023-03-21 Kla Corporation Tomography based semiconductor measurements using simplified models
FR3126779B1 (fr) * 2021-09-09 2024-05-31 Safran Procédé, dispositif et programme d’ordinateur de contrôle d’une pièce par radiographie aux rayons X
CN115078214B (zh) * 2022-06-14 2024-01-26 西南石油大学 基于双能ct的岩心矿物识别及孔隙度分布联合表征方法
US12408888B2 (en) 2023-06-12 2025-09-09 Canon Medical Systems Corporation Detector response calibaration data weight optimization method for a photon counting x-ray imaging system
CN117330592B (zh) * 2023-11-30 2024-03-15 赛诺威盛科技(北京)股份有限公司 能谱及散射校正方法、装置和设备
CN118505831B (zh) * 2024-04-23 2025-10-21 中北大学 基于积分不变性的单电压下ct图像硬化伪影校正方法

Citations (1)

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US20030156684A1 (en) 2002-02-20 2003-08-21 Fessler Jeffrey A. Method for statistically reconstructing images from a plurality of transmission measurements having energy diversity and image reconstructor apparatus utilizing the method

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US4029963A (en) * 1976-07-30 1977-06-14 The Board Of Trustees Of Leland Stanford Junior University X-ray spectral decomposition imaging system
US7356113B2 (en) * 2003-02-12 2008-04-08 Brandeis University Tomosynthesis imaging system and method
US6973158B2 (en) * 2003-06-25 2005-12-06 Besson Guy M Multi-target X-ray tube for dynamic multi-spectral limited-angle CT imaging
WO2008072175A1 (en) * 2006-12-15 2008-06-19 Koninklijke Philips Electronics N.V. Spectrally resolving x-ray imaging device
DE102008030552A1 (de) * 2008-06-27 2009-12-31 Siemens Aktiengesellschaft Verfahren zur Erzeugung von Bilddaten zu einer virtuell vorgebbaren Röntgenröhrenspannung aus ersten und zweiten CT-Bilddaten
DE102011075917B4 (de) * 2011-05-16 2021-10-28 Siemens Healthcare Gmbh Verfahren zum Bereitstellen eines 3D-Bilddatensatzes mit unterdrückten Messfeldüberschreitungsartefakten und Computertomograph
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JP2019188135A (ja) 2019-10-31
US20190325618A1 (en) 2019-10-24
RU2019111292A3 (https=) 2021-11-01
US10902650B2 (en) 2021-01-26
CN110389138B (zh) 2024-06-11
CN110389138A (zh) 2019-10-29
RU2770544C2 (ru) 2022-04-18
AU2019202047B2 (en) 2023-10-05
RU2019111292A (ru) 2020-10-16
AU2019202047A1 (en) 2019-11-07

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