JP7179523B2 - 眼底撮像装置、眼底撮像方法およびプログラム - Google Patents

眼底撮像装置、眼底撮像方法およびプログラム Download PDF

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JP7179523B2
JP7179523B2 JP2018147783A JP2018147783A JP7179523B2 JP 7179523 B2 JP7179523 B2 JP 7179523B2 JP 2018147783 A JP2018147783 A JP 2018147783A JP 2018147783 A JP2018147783 A JP 2018147783A JP 7179523 B2 JP7179523 B2 JP 7179523B2
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measurement light
optical path
slo
oct
light
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JP2020022569A5 (enrdf_load_stackoverflow
JP2020022569A (ja
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悠二 片芝
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Canon Inc
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Canon Inc
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JP2018147783A 2018-08-06 2018-08-06 眼底撮像装置、眼底撮像方法およびプログラム Active JP7179523B2 (ja)

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JP2020022569A JP2020022569A (ja) 2020-02-13
JP2020022569A5 JP2020022569A5 (enrdf_load_stackoverflow) 2021-08-19
JP7179523B2 true JP7179523B2 (ja) 2022-11-29

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US12390369B2 (en) 2021-11-19 2025-08-19 Alcon Inc. Ophthalmic procedure contact lens with enhanced vitreous visualization
JP2024540025A (ja) 2021-11-19 2024-10-31 アルコン インコーポレイティド 眼の内部の2次元画像及び3次元画像を生成及び評価すること
CA3234753A1 (en) 2021-11-19 2023-05-25 Zsolt Bor Evaluating and treating eye floaters
CN115721256A (zh) * 2022-11-14 2023-03-03 执鼎医疗科技(杭州)有限公司 Oct设备辅助调试装置及oct设备调试系统

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007521866A (ja) 2004-01-22 2007-08-09 セントレ ナショナル デ ラ レチャーチェ シャーティフィック 網膜の高解像側方及び軸位断層画像化
JP2013188316A (ja) 2012-03-13 2013-09-26 Nidek Co Ltd 眼底撮影装置
JP2013212313A (ja) 2012-04-03 2013-10-17 Canon Inc 光干渉断層撮影装置、制御方法、及びプログラム
JP2015221091A (ja) 2014-05-22 2015-12-10 株式会社トプコン 眼科装置
JP2017064378A (ja) 2015-09-30 2017-04-06 キヤノン株式会社 光干渉断層撮影装置、その制御方法および光干渉断層撮影システム
JP2017184788A (ja) 2016-03-31 2017-10-12 株式会社ニデック 走査型レーザー検眼鏡

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007521866A (ja) 2004-01-22 2007-08-09 セントレ ナショナル デ ラ レチャーチェ シャーティフィック 網膜の高解像側方及び軸位断層画像化
JP2013188316A (ja) 2012-03-13 2013-09-26 Nidek Co Ltd 眼底撮影装置
JP2013212313A (ja) 2012-04-03 2013-10-17 Canon Inc 光干渉断層撮影装置、制御方法、及びプログラム
JP2015221091A (ja) 2014-05-22 2015-12-10 株式会社トプコン 眼科装置
JP2017064378A (ja) 2015-09-30 2017-04-06 キヤノン株式会社 光干渉断層撮影装置、その制御方法および光干渉断層撮影システム
JP2017184788A (ja) 2016-03-31 2017-10-12 株式会社ニデック 走査型レーザー検眼鏡

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