JP7059517B2 - 自覚式検眼装置 - Google Patents

自覚式検眼装置 Download PDF

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Publication number
JP7059517B2
JP7059517B2 JP2017070652A JP2017070652A JP7059517B2 JP 7059517 B2 JP7059517 B2 JP 7059517B2 JP 2017070652 A JP2017070652 A JP 2017070652A JP 2017070652 A JP2017070652 A JP 2017070652A JP 7059517 B2 JP7059517 B2 JP 7059517B2
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eye
optical system
correction
inspected
luminous flux
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JP2017070652A
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Japanese (ja)
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JP2018171228A5 (enExample
JP2018171228A (ja
Inventor
通浩 滝井
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Nidek Co Ltd
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Nidek Co Ltd
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Priority to JP2017070652A priority Critical patent/JP7059517B2/ja
Priority to EP18164514.4A priority patent/EP3381350B1/en
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Publication of JP2018171228A5 publication Critical patent/JP2018171228A5/ja
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JP2017070652A 2017-03-31 2017-03-31 自覚式検眼装置 Active JP7059517B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2017070652A JP7059517B2 (ja) 2017-03-31 2017-03-31 自覚式検眼装置
EP18164514.4A EP3381350B1 (en) 2017-03-31 2018-03-28 Subjective optometry apparatus and subjective optometry program

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Application Number Priority Date Filing Date Title
JP2017070652A JP7059517B2 (ja) 2017-03-31 2017-03-31 自覚式検眼装置

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JP2018171228A JP2018171228A (ja) 2018-11-08
JP2018171228A5 JP2018171228A5 (enExample) 2020-04-30
JP7059517B2 true JP7059517B2 (ja) 2022-04-26

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JP2017070652A Active JP7059517B2 (ja) 2017-03-31 2017-03-31 自覚式検眼装置

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Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7279349B2 (ja) * 2018-12-03 2023-05-23 株式会社ニデック 眼科装置
EP3711654A1 (en) * 2019-03-20 2020-09-23 Essilor International Optometry device for testing an individual's eye and associated method
JP7375332B2 (ja) * 2019-05-09 2023-11-08 株式会社ニデック 検眼装置及び検眼プログラム
CN112515931B (zh) * 2020-12-01 2022-08-23 广东英华投资控股有限公司 一种视力康复矫正训练机构

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014028070A (ja) 2012-07-31 2014-02-13 Nidek Co Ltd 検眼装置
JP2014128315A (ja) 2012-12-28 2014-07-10 Nidek Co Ltd 視標呈示装置

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4015899A (en) * 1975-10-22 1977-04-05 Humphrey Instruments, Inc. Eye test apparatus with physician routed patient input adjustment to variable optical elements

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014028070A (ja) 2012-07-31 2014-02-13 Nidek Co Ltd 検眼装置
JP2014128315A (ja) 2012-12-28 2014-07-10 Nidek Co Ltd 視標呈示装置

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