JP7059517B2 - Awareness-based optometry device - Google Patents

Description

The present disclosure relates to a subjective optometry device for measuring the optical properties of an eye to be inspected.

An optical member such as a spherical lens or a pillar lens is placed in front of the subject's eye, and an inspection target is presented to the subject's eye via this optical member to measure the optical characteristics (refractive power, etc.) of the subject's eye. A subjective optometry device is known (see Patent Document 1).

Japanese Unexamined Patent Publication No. 5-176893

In the subjective examination, the alignment between the eye to be inspected and the subjective eye examination device is performed, and an inspection target corresponding to the refractive power of the eye to be inspected is presented to the eye to be inspected. However, when the luminous flux is incident on the optical member from outside the axis, the inspection target guided to the optometry may be distorted. In this state, the inspection target deformed by the strain is guided to the eye to be inspected, so that it is difficult to accurately measure the optical characteristics of the eye to be inspected.

In view of the above-mentioned prior art, it is a technical subject of the present disclosure to provide a subjective optometry apparatus and a subjective optometry program capable of easily and accurately performing a subjective examination.

In order to solve the above problems, the present disclosure is characterized by having the following configurations.

(1) The subjective eye examination device according to the first aspect of the present disclosure is arranged in a projection optical system that projects an target light beam toward the eye to be inspected and in the optical path of the projection optical system, and the target light beam. A correction optical system that changes the optical characteristics of the optical member and an optical member that guides the target light beam corrected by the correction optical system to the eye to be inspected. It is a subjective eye examination device for subjectively measuring the optical characteristics of the eye to be inspected by using the optotype beam that is guided to the eye to be inspected through an out-of-light path and is guided to the eye to be inspected. A correction means for correcting the distortion of the target light beam caused by the target light beam passing through an optical path deviating from the optical axis of the optical member based on the correction power of the correction optical system. It is a feature.
(2) The subjective eye examination device according to the second aspect of the present disclosure is arranged in a projection optical system that projects an target light beam toward the eye to be inspected and in the optical path of the projection optical system, and the target light beam. A correction optical system that changes the optical characteristics of the optical member and an optical member that guides the target light beam corrected by the correction optical system to the eye to be inspected. It is a subjective eye examination device for subjectively measuring the optical characteristics of the eye to be inspected by using the optotype beam that is guided to the eye to be inspected through an out-of-light path and is guided to the eye to be inspected. Based on the measurement unit accommodating the projection optical system, the deviation detecting means for detecting the positional deviation of the target light beam with respect to the eye to be inspected, and the detection result detected by the deviation detecting means, the target light beam. Is provided with a correction means for correcting the distortion of the target light beam caused by passing through an optical path off the optical axis of the optical member.
(3) The subjective optometry program according to the third aspect of the present disclosure is characterized in that a computer functions as the correction means in the subjective optometry devices of (1) and (2).

It is an external view of the subjective optometry apparatus which concerns on this Example. It is a figure explaining the structure of the measuring means. It is a schematic block diagram which looked at the inside of the subjective optometry apparatus from the front direction. It is a schematic block diagram which looked at the inside of the subjective optometry apparatus from the side direction. It is a schematic block diagram which looked at the inside of the subjective optometry apparatus from the top surface direction. It is a figure which shows the control system of the subjective optometry apparatus. It is a figure which shows the anterior eye part image of the eye to be inspected. It is a figure explaining alignment control. It is a figure explaining the inclination of the image plane of the image of a visual flux. It is a figure which shows the image plane of the image of the target luminous flux by the inclination of a display. It is a figure explaining the distortion of the visual flux. It is a figure explaining the correction of the distortion in the luminous flux.

<Overview>
Hereinafter, one of the typical embodiments will be described with reference to the drawings. 1 to 12 are diagrams illustrating a subjective optometry device according to the present embodiment. It should be noted that the present disclosure is not limited to the apparatus described in this embodiment. For example, terminal control software (program) that performs the functions of the following embodiments is supplied to the system or device via a network or various storage media, and the control device (for example, CPU or the like) of the system or device reads the program. It is also possible to do it. The items classified by <> below can be used independently or in relation to each other.

In the following description, the depth direction (front-back direction of the subject) of the subjective eye examination device is the Z direction, the horizontal direction on the plane perpendicular to the depth direction (the left-right direction of the subject) is the X direction, and the depth direction. The vertical direction (vertical direction of the subject) on a vertical plane will be described as the Y direction. It should be noted that L and R attached to the reference numerals indicate those for the left eye and those for the right eye, respectively.

For example, the subjective optometry device (for example, the subjective optometry device 1) in the present embodiment subjectively measures the optical characteristics of the eye to be inspected. For example, the subjective optometry apparatus may include a floodlight optical system (for example, a floodlight optical system 30). For example, the projection optical system projects a target beam toward the eye to be inspected and projects the target to the eye to be inspected. Further, for example, the subjective optometry apparatus may include a corrective optical system (for example, a corrective optical system 60, a subjective measurement optical system 25). For example, the correction optical system is arranged in the optical path of the projection optical system and changes the optical characteristics of the target luminous flux. Further, for example, the subjective optometry device may include an optical member (for example, a concave mirror 85) that guides the optotype light flux corrected by the correction optical system to the eye to be inspected.

For example, the luminous flux of the optotype passes through an optical path off the optical axis of the optical member and is guided to the eye to be inspected. For example, the subjective optometry device in the present embodiment subjectively measures the optical characteristics of the optometry subject by using an image of an optotype luminous flux guided to the optometry subject. Further, for example, the subjective optometry apparatus according to the present embodiment subjectively measures the optical characteristics of the optometry subject by using the target luminous flux guided to the optometry subject.

For example, the optical characteristics of the eye to be measured that are subjectively measured include optical power (for example, at least one of spherical power, columnar power, astigmatic axis angle, etc.), contrast sensitivity, and binocular vision function (for example, oblique position). It may be at least one of quantity, at least one of stereoscopic functions, etc.).

<Light projection optical system>
For example, the projection optical system has a light source (for example, a display 31) that irradiates a target luminous flux. Further, for example, the projection optical system may have at least one or more optical members that guide the target luminous flux projected from the light source that irradiates the target luminous flux toward the eye to be inspected. For example, a display may be used as the light source for projecting the luminous flux. For example, as a display, an LCD (Liquid Crystal Display), an organic EL (Electro Luminescence), or the like is used. For example, an inspection target such as a Randold ring optotype is displayed on the display. Further, for example, a light source and a DMD (Digital Micromirror Device) may be used as the light source for projecting the luminous flux. In general, DMD has high reflectance and is bright. Therefore, the amount of light of the target luminous flux can be maintained as compared with the case of using a liquid crystal display using polarization.

For example, the light source for projecting the luminous flux may be configured to include a visible light source for presenting an optotype and an optotype plate. In this case, for example, the optotype is a rotatable disc plate and has a plurality of optotypes. For example, the plurality of optotypes include a visual acuity test optotype used at the time of subjective measurement. For example, as a visual acuity test target, visual acuity values (visual acuity values 0.1, 0.3, ..., 1.5) for each visual acuity value are prepared. For example, the optotype plate is rotated by a motor or the like, and the optotypes are switched and arranged on an optical path in which the optotype light flux is guided to the eye to be inspected. Of course, as the light source for projecting the luminous flux, a light source other than the above configuration may be used.

For example, the projection optical system may include a pair of left and right eye projection optical systems and a right eye projection optical system. For example, in the projection optical system for the left eye and the projection optical system for the right eye, the member constituting the projection optical system for the left eye and the member constituting the projection optical system for the right eye are the same members. It may be configured. Further, for example, the left-eye projection optical system and the right-eye projection optical system are at least one in a member constituting the left-eye projection optical system and a member constituting the right-eye projection optical system. The members of the portions may be composed of different members. Further, for example, the left-eye projection optical system and the right-eye projection optical system are at least one in a member constituting the left-eye projection optical system and a member constituting the right-eye projection optical system. It may be configured so that the members of the parts are also used. Further, for example, in the left-eye projection optical system and the right-eye projection optical system, a member constituting the left-eye projection optical system and a member constituting the right-eye projection optical system are separately provided. It may be provided.

<Correcting optical system>
For example, the correction optical system may be configured to change the optical characteristics of the visual target light flux (for example, at least one of spherical power, cylindrical power, cylindrical axis, polarization characteristics, aberration amount, and the like). For example, the configuration for changing the optical characteristics of the luminous flux may be a configuration for controlling an optical element. For example, the optical element may be configured to use at least one of a spherical lens, a cylindrical lens, a cross cylinder lens, a rotary prism, a wavefront modulation element, and the like. Of course, for example, as the optical element, an optical element different from the above-mentioned optical element may be used.

For example, the correction optical system may be configured to correct the spherical power of the eye to be inspected by optically changing the presentation position (presentation distance) of the optotype with respect to the eye to be inspected. In this case, for example, the configuration for optically changing the presentation position (presentation distance) of the optotype may be a configuration in which the light source (for example, the display) is moved in the optical axis direction. Further, for example, as a configuration for optically changing the presentation position (presentation distance) of the optotype, an optical element (for example, a spherical lens) arranged in the optical path may be moved in the optical axis direction. .. Of course, the correction optical system may have a configuration in which a configuration for controlling the optical element and a configuration for moving the optical element arranged in the optical path in the optical axis direction are combined.

For example, as a correction optical system, an optical element is arranged between an optical member for guiding a target light beam from the projection optical system toward the eye to be inspected and a light source of the projection optical system, and optical light is provided. The optical characteristics of the target light beam may be changed by controlling the element. That is, as the correction means, a phantom lens refractometer (phantom correction optical system) may be configured. In this case, for example, the target luminous flux corrected by the correction optical system is guided to the eye to be inspected via the optical member.

For example, the corrective optical system may have a pair of left and right corrective optical systems for the left eye and a corrective optical system for the right eye. For example, the correction optical system for the left eye and the correction optical system for the right eye are composed of the same member as the member constituting the correction optical system for the left eye and the member constituting the correction optical system for the right eye. It is also good. Further, for example, in the correction optical system for the left eye and the correction optical system for the right eye, at least a part of the members constituting the correction optical system for the left eye and the member constituting the correction optical system for the right eye is used. It may be composed of different members. Further, for example, in the correction optical system for the left eye and the correction optical system for the right eye, at least a part of the members constituting the correction optical system for the left eye and the member constituting the correction optical system for the right eye is used. It may be a configuration that is also used. Further, for example, the correction optical system for the left eye and the correction optical system for the right eye have a configuration in which a member constituting the correction optical system for the left eye and a member constituting the correction optical system for the right eye are separately provided. There may be.

<Optical member>
For example, an optical member that guides the optotype light beam corrected by the correction optical system to the eye to be inspected, guides the optotype light beam or the image of the optotype light beam to the eye to be inspected optically at a predetermined inspection distance. It may be an optical member. For example, the optical member may use a concave mirror. For example, by using a concave mirror, it becomes possible to optically present the optotype at a predetermined inspection distance in the subjective inspection means, and the actual distance is obtained when the optotype is presented at the predetermined inspection distance. There is no need to arrange members or the like. This eliminates the need for extra members and space, and makes it possible to reduce the size of the device. Of course, for example, the optical member is not limited to the concave mirror. For example, the optical member may be configured to guide the target luminous flux or the image of the target luminous flux to the eye to be inspected so as to optically reach a predetermined inspection distance. In this case, for example, a lens or the like may be used as the optical member.

<Correction of the image plane of the image in the luminous flux>
For example, the subjective optometry device in the present embodiment may include a correction means (for example, a control unit 70). For example, the correction means may be configured to correct the inclination of the image plane of the image of the target luminous flux generated by the passage of the target luminous flux through an optical path off the optical axis of the optical member. In other words, the correction means may be configured to correct the inclination of the image plane of the image of the target luminous flux projected on the fundus of the eye to be inspected.

This makes it possible to subjectively measure the optical characteristics of the eye to be inspected in a state where the inclination of the image plane of the image of the luminous flux is reduced. Therefore, the examiner can accurately perform the subjective measurement for the eye to be inspected.

For example, the correction means may correct at least a part of the image plane of the image in the luminous flux. That is, the correction means may correct at least a part of the light-collecting position of the target luminous flux. Further, for example, the correction means may correct the entire image plane of the image in the luminous flux. That is, the correction means may correct the entire condensing position of the target luminous flux.

For example, the correction means may be configured to correct the inclination of the image plane of the image of the target luminous flux by changing the angle of the surface of the display with respect to the optical axis. In this case, for example, the projection optical system may have a display, and the optotype may be emitted by displaying the optotype on the display. For example, by changing the angle of the surface of the display, the examiner can easily correct the inclination of the image surface of the image of the luminous flux.

For example, the display may be configured to be rotatable about a rotation axis extending in the vertical direction (Y direction) of the display. For example, when the display is rotated about a rotation axis extending in the vertical direction (vertical direction), the display is tilted in the horizontal direction (X direction) with respect to the optical axis direction of the projection optical system. That is, for example, the display may have a configuration in which the rotation angle in the horizontal direction (left-right direction) can be changed with respect to the optical axis of the projection optical system.

For example, the display may be configured to be rotatable about a rotation axis extending in the horizontal direction (X direction) of the display. For example, when the display is rotated about a rotation axis extending in the horizontal direction (horizontal direction), the display is tilted in the vertical direction (Y direction) with respect to the optical axis direction of the projection optical system. That is, for example, the display may have a configuration in which the rotation angle in the vertical direction (vertical direction) can be changed with respect to the optical axis of the projection optical system.

For example, the display may be configured to be two-dimensionally rotatable. In this case, for example, the display may be configured to be rotatable around a rotation axis extending in the left-right direction and a rotation axis extending in the up-down direction by driving the driving means. That is, for example, the display may have a configuration in which the rotation angle in the XY directions with respect to the optical axis of the floodlight optical system can be changed.

Further, for example, the correction means may be configured to correct the inclination of the image plane of the image of the luminous flux by controlling the driving means to move the optical member. In this case, for example, the projection optical system may be configured to include a mobile optical member that can move in the optical path of the projection optical system and a driving means that moves the mobile optical member in the optical path of the projection optical system. good. For example, as the moving optical member, a lens, a prism, a mirror, or the like may be used. Further, for example, as the moving optical member, any optical member of the floodlight optical system may be used. Further, for example, as the moving optical member, a different member provided separately from the optical member of the floodlight optical system may be used. For example, by controlling the driving means to move the optical member, the examiner arranges the optical member at an appropriate position with respect to the eye to be inspected and accurately corrects the inclination of the image plane of the image of the target luminous flux. be able to.

<Correction of image plane based on correction power>
For example, the subjective optometry device in the present embodiment may include an acquisition means (for example, a control unit 70) for acquiring the correction power of the correction optical system. In this case, for example, the subjective optometry device may be configured to correct the inclination of the image plane of the image of the target luminous flux based on the correction power of the correction optical system. As a result, it is possible to suppress the inclination of the image plane of the image of the target luminous flux generated by changing the correction power of the correction optical system according to the refractive power of the eye to be inspected. Therefore, the examiner can accurately perform the subjective measurement for the eye to be inspected.

For example, the subjective optometry device provides a correction amount setting means (for example, a control unit 70) for setting a correction amount for correcting the inclination of the image plane of the image of the target luminous flux based on the correction degree of the correction optical system. You may be prepared. Further, for example, the subjective optometry device includes a correction means (for example, a control unit 70) that corrects the inclination of the image plane of the image of the target luminous flux based on the correction amount set by the correction amount setting means. May be good. For example, the correction amount setting means may have a configuration in which a correction amount based on the correction power of the correction optical system is set in advance. In this case, for example, a correction table based on the correction power of the correction optical system may be stored in the storage means (for example, the memory 75), and the correction amount may be set by calling the correction amount from the storage means. .. Further, for example, the correction amount setting means may be configured to calculate the correction amount by performing arithmetic processing based on the correction power of the correction optical system.

For example, the acquisition means acquires the correction power of the correction optical system by measuring the optical refractive power of the eye to be inspected by an objective measurement optical system (for example, the objective measurement optical system 10) included in the subjective optometry device. It may be configured. Further, for example, the acquisition means acquires the correction power of the correction optical system by measuring the optical refractive power of the eye to be inspected by the awareness measurement optical system (for example, the objective measurement optical system 25) provided in the subjective eye examination device. It may be configured to be. In this case, for example, the optical power of refraction may be the power of refraction of the eye acquired at the timing during the subjective measurement. Further, for example, the optical power of refraction may be an optical power of refraction acquired at a timing different from that during subjective measurement.
For example, the acquisition means acquires the correction power of the correction optical system by receiving the optical refractive power of the eye to be inspected measured by the objective measurement optical system or the subjective measurement optical system of a device different from the subjective eye examination device. It may be configured. Further, for example, the acquisition means may be configured to acquire the correction power of the correction optical system by receiving the optical refractive power of the eye to be inspected input by the examiner by operating the operation means.

<Correction of the image plane based on the positional deviation of the luminous flux with respect to the eye to be inspected>
For example, the subjective optometry device in the present embodiment may include a measuring unit (for example, measuring means 7) for accommodating a projection optical system. Further, for example, the subjective optometry device may include a deviation detecting means (for example, a control unit 70) for detecting a displacement of the target luminous flux with respect to the eye to be inspected. Further, for example, the subjective optometry device may be configured to correct the inclination of the image plane of the image of the luminous flux based on the detected positional deviation. As a result, it is possible to suppress the inclination of the image plane of the image of the luminous flux caused by the positional deviation of the luminous flux with respect to the eye to be inspected. Therefore, the examiner can accurately perform the subjective measurement for the eye to be inspected.

For example, the correction based on the misalignment may be a correction using the misalignment directly, or a correction using the position information of the measurement unit moved based on the misalignment (correction using the misalignment indirectly). ) May be.

For example, the deviation detecting means projects an alignment light onto the eye to be inspected to form an alignment index around the corneum (for example, a first index projection optical system 45 and a second index projection optical system). 46) may be used. In this case, for example, the deviation detecting means projects the eye to be inspected and the target light beam by detecting the alignment state based on the alignment index taken by the front eye observation optical system (for example, the observation optical system 50). The configuration may be such that the relative position with respect to the position (optical axis of the floodlight optical system) is detected. Further, for example, the deviation detecting means detects the pupil position from the front image of the front eye portion imaged by the front eye observation optical system, and the detected pupil position and the projection position of the target light beam (light of the projection optical system). It may be configured to detect the position relative to the axis).

For example, even if the subjective optometry device includes a correction amount setting means (for example, a control unit 70) that sets a correction amount for correcting the inclination of the image plane of the image of the target luminous flux based on the positional deviation. good. Further, for example, the subjective optometry device includes a correction means (for example, a control unit 70) that corrects the inclination of the image plane of the image of the target luminous flux based on the correction amount set by the correction amount setting means. May be good. For example, the correction amount setting means may have a configuration in which a correction amount based on the misalignment amount is set in advance. In this case, for example, a correction table based on the amount of misalignment may be stored in the storage means, and the correction amount may be set by calling the correction amount from the storage means. Further, for example, the correction amount setting means may be configured to perform arithmetic processing based on the misalignment amount and calculate the correction amount.

For example, when performing correction using the position information of the measuring unit moved based on the misalignment, the subjective optometry device is a moving means for moving the measuring means unit based on the detection result detected by the misalignment detecting means. May be provided. Further, for example, the subjective optometry apparatus may include a position information acquisition unit (for example, a control unit 70) for acquiring the position information of the measurement unit. Further, for example, the subjective optometry device may be configured to correct the inclination of the image plane of the image of the luminous flux based on the position information. As a result, it is possible to suppress the inclination of the image plane of the image of the luminous flux that occurs when the eye to be inspected and the measuring means are aligned. Therefore, the examiner can accurately perform the subjective measurement for the eye to be inspected.

For example, the position information acquisition means may have a configuration that can acquire the position information of the measurement unit. For example, the configuration for acquiring the position information of the measurement unit may be a configuration for detecting the movement of the measurement unit (for example, the position information of the measurement unit). The configuration for detecting the position information of the measurement unit may be a configuration for detecting the position of the measurement unit or a configuration for detecting the movement amount of the measurement unit. The position information of the measurement unit may be the position information of the entire measurement unit or the position information of at least one member of the projection optical system housed in the measurement unit. Further, the position information of the measurement unit may be the position information of the optical member (for example, the deflection mirror 81) that is moved together with the measurement unit in the subjective optometry device 1. In this case, the optical member moved together with the measuring unit may be configured to be moved integrally with the measuring unit.

Further, for example, the configuration for acquiring the position information of the measurement unit may be a configuration for acquiring the relative position information between the eye to be inspected (for example, the corneal apex position or the pupil position of the eye to be inspected) and the measurement unit. For example, when the position information acquisition means acquires the relative position information between the eye to be inspected and the measurement unit, the position information acquisition means acquires the relative position information by detecting the position of the eye to be inspected and the position of the measurement unit, respectively. May be good. Further, for example, the position information acquisition means may be configured to acquire the relative position information by detecting the position of the measurement unit when acquiring the relative position information between the eye to be inspected and the measurement unit. In this case, for example, the position of the measuring unit may be stored in the storage means in advance. Further, for example, the position information acquisition means may be configured to acquire relative position information by detecting the movement amount of the measurement unit. In this case, for example, the amount of movement of the measuring unit may be detected from a preset initial position. The position information of the measurement unit may be the position information of the entire measurement unit or the position information of at least one member of the projection optical system housed in the measurement unit.

Further, for example, the configuration for acquiring the position information of the measurement unit may be a configuration for acquiring the position information of the measurement unit by acquiring the relative position information between the optical member and the measurement unit. For example, when the position information acquisition means acquires the relative position information between the optical member and the measurement unit, the position information acquisition means acquires the relative position information by detecting the position of the optical member and the position of the measurement unit, respectively. You may. Further, for example, the position information acquisition means may be configured to acquire the relative position information by detecting the position of the measurement unit when acquiring the relative position information between the optical member and the measurement unit. In this case, for example, the position of the optical member may be stored in the storage means in advance. Further, for example, the position information acquisition means may be configured to acquire relative position information by detecting the movement amount of the measurement unit. In this case, for example, the amount of movement of the measuring unit may be detected from a preset initial position. The position information of the measurement unit may be the position information of the entire measurement unit or the position information of at least one member of the projection optical system housed in the measurement unit.

<Strain correction in luminous flux>
For example, the correction means may be configured to correct the distortion of the target luminous flux caused by the passage of the target luminous flux through an optical path off the optical axis of the optical member. In other words, the correction means may be configured to correct the distortion of the target luminous flux projected on the fundus of the eye to be inspected. This makes it possible to subjectively measure the optical characteristics of the eye to be inspected in a state where the distortion of the luminous flux is reduced. Therefore, the examiner can accurately perform the subjective measurement for the eye to be inspected.

For example, the correction means may correct at least a part of the distortion of the luminous flux, or may correct the entire distortion of the luminous flux. For example, the correction means may be configured to correct the distortion of the luminous flux of the optotype by deforming the optotype displayed on the display (for example, the display 31). In this case, for example, the projection optical system may have a display, and the optotype may be emitted by displaying the optotype on the display.

When making corrections using a display, for example, the correction means may change the vertical size of the optotype displayed on the display. Further, for example, the correction means may change the lateral size of the optotype displayed on the display. Further, for example, the correction means may move the optotype in the optotype displayed on the display. That is, the correction means may be configured to perform at least one of processing of changing the vertical size of the optotype displayed on the display, changing the size in the horizontal direction, and moving the optotype. For example, a configuration that deforms the optotype displayed on the display allows the examiner to easily correct the distortion of the optotype light flux.

Further, for example, the correction means may be configured to correct the distortion of the luminous flux by controlling the driving means to move the optical member. In this case, for example, the projectile optical system may be configured to include a mobile optical member that can move in the optical path of the projectile optical system and a driving means that moves the mobile optical member in the optical path of the projectile optical system. .. For example, as the moving optical member, a lens, a prism, a mirror, or the like may be used. Further, for example, as the moving optical member, any optical member of the floodlight optical system may be used, or a different member provided separately from the optical member of the floodlight optical system may be used. For example, the examiner can accurately correct the distortion of the luminous flux by controlling the driving means to move the optical member.

<Correction of distortion based on correction power>
For example, the subjective optometry device in the present embodiment may include an acquisition means (for example, a control unit 70) for acquiring the correction power of the correction optical system. In this case, for example, the subjective optometry device may be configured to correct the distortion of the visual target light flux based on the correction power of the correction optical system. As a result, it is possible to suppress distortion of the image of the target luminous flux caused by the correction power of the correction optical system changing according to the refractive power of the eye to be inspected. Therefore, the examiner can accurately perform the subjective measurement for the eye to be inspected.

For example, the subjective optometry device may include a correction amount setting means (for example, a control unit 70) that sets a correction amount for correcting the distortion of the visual target luminous flux based on the correction power of the correction optical system. .. Further, for example, the subjective optometry apparatus may include a correction means (for example, a control unit 70) for correcting the distortion of the image of the luminous flux based on the correction amount set by the correction amount setting means. For example, the correction amount setting means may have a configuration in which a correction amount based on the correction power of the correction optical system is set in advance. In this case, for example, a correction table based on the correction power of the correction optical system may be stored in the storage means (for example, the memory 75), and the correction amount may be set by calling the correction amount from the storage means. .. Further, for example, the correction amount setting means may be configured to calculate the correction amount by performing arithmetic processing based on the correction power of the correction optical system.

For example, the acquisition means acquires the correction power of the correction optical system by measuring the optical refractive power of the eye to be inspected by an objective measurement optical system (for example, the objective measurement optical system 10) included in the subjective optometry device. It may be configured. Further, for example, the acquisition means acquires the correction power of the correction optical system by measuring the optical refractive power of the eye to be inspected by the awareness measurement optical system (for example, the objective measurement optical system 25) provided in the subjective eye examination device. It may be configured to be. In this case, for example, the optical power of refraction may be the power of refraction of the eye acquired at the timing during the subjective measurement. Further, for example, the optical power of refraction may be an optical power of refraction acquired at a timing different from that during subjective measurement.

For example, the acquisition means acquires the correction power of the correction optical system by receiving the optical refractive power of the eye to be inspected measured by the objective measurement optical system or the subjective measurement optical system of a device different from the subjective eye examination device. It may be configured. Further, for example, the acquisition means may be configured to acquire the correction power of the correction optical system by receiving the optical refractive power of the eye to be inspected input by the examiner by operating the operation means.

<Correction of distortion based on the positional deviation of the luminous flux with respect to the eye to be inspected>
For example, the subjective optometry device in the present embodiment may include a measuring unit (for example, measuring means 7) for accommodating a projection optical system. Further, for example, the subjective optometry device may include a deviation detecting means (for example, a control unit 70) for detecting a displacement of the target luminous flux with respect to the eye to be inspected. Further, for example, the subjective optometry device may be configured to correct the distortion of the image of the luminous flux based on the detected positional deviation. This makes it possible to suppress the distortion of the image of the luminous flux caused by the positional deviation of the luminous flux with respect to the eye to be inspected. Therefore, the examiner can accurately perform the subjective measurement for the eye to be inspected.

For example, the correction based on the misalignment may be a correction using the misalignment directly, or a correction using the position information of the measurement unit moved based on the misalignment (correction using the misalignment indirectly). ) May be.

For example, the deviation detecting means projects an alignment light onto the eye to be inspected to form an alignment index around the cortex (for example, a first index projection optical system 45 and a second index projection optical system). 46) may be used. In this case, for example, the deviation detecting means projects the eye to be inspected and the target light beam by detecting the alignment state based on the alignment index taken by the front eye observation optical system (for example, the observation optical system 50). The configuration may be such that the relative position with respect to the position (optical axis of the floodlight optical system) is detected. Further, for example, the deviation detecting means detects the pupil position from the front image of the front eye portion imaged by the front eye observation optical system, and the detected pupil position and the projection position of the target light beam (light of the projection optical system). It may be configured to detect the position relative to the axis).

For example, the subjective optometry device may include a correction amount setting means (for example, a control unit 70) that sets a correction amount for correcting the distortion of the image of the luminous flux based on the positional deviation. Further, for example, the subjective optometry apparatus may include a correction means (for example, a control unit 70) for correcting the distortion of the image of the luminous flux based on the correction amount set by the correction amount setting means. For example, the correction amount setting means may have a configuration in which a correction amount based on the misalignment amount is set in advance. In this case, for example, a correction table based on the amount of misalignment may be stored in the storage means, and the correction amount may be set by calling the correction amount from the storage means. Further, for example, the correction amount setting means may be configured to perform arithmetic processing based on the misalignment amount and calculate the correction amount.

For example, when performing correction using the position information of the measuring unit moved based on the misalignment, the subjective optometry device is a moving means for moving the measuring means unit based on the detection result detected by the misalignment detecting means. May be provided. Further, for example, the subjective optometry apparatus may include a position information acquisition unit (for example, a control unit 70) for acquiring the position information of the measurement unit. Further, for example, the subjective optometry device may be configured to correct the distortion of the luminous flux based on the position information. This makes it possible to suppress the distortion of the luminous flux that occurs when the eye to be inspected and the measuring means are aligned. Therefore, the examiner can accurately perform the subjective measurement for the eye to be inspected.

For example, the position information acquisition means may have a configuration that can acquire the position information of the measurement unit. For example, the configuration for acquiring the position information of the measurement unit may be a configuration for detecting the movement of the measurement unit (for example, the position information of the measurement unit). The configuration for detecting the position information of the measurement unit may be a configuration for detecting the position of the measurement unit or a configuration for detecting the movement amount of the measurement unit. The position information of the measurement unit may be the position information of the entire measurement unit or the position information of at least one member of the projection optical system housed in the measurement unit. Further, the position information of the measurement unit may be the position information of the optical member (for example, the deflection mirror 81) that is moved together with the measurement unit in the subjective optometry device 1. In this case, the optical member moved together with the measuring unit may be configured to be moved integrally with the measuring unit.

Further, for example, the configuration for acquiring the position information of the measurement unit may be a configuration for acquiring the relative position information between the eye to be inspected (for example, the corneal apex position or the pupil position of the eye to be inspected) and the measurement unit. For example, when the position information acquisition means acquires the relative position information between the eye to be inspected and the measurement unit, the position information acquisition means acquires the relative position information by detecting the position of the eye to be inspected and the position of the measurement unit, respectively. May be good. Further, for example, the position information acquisition means may be configured to acquire the relative position information by detecting the position of the measurement unit when acquiring the relative position information between the eye to be inspected and the measurement unit. In this case, for example, the position of the measuring unit may be stored in the storage means in advance. Further, for example, the position information acquisition means may be configured to acquire relative position information by detecting the movement amount of the measurement unit. In this case, for example, the amount of movement of the measuring unit may be detected from a preset initial position. The position information of the measurement unit may be the position information of the entire measurement unit or the position information of at least one member of the projection optical system housed in the measurement unit.

Further, for example, the configuration for acquiring the position information of the measurement unit may be a configuration for acquiring the position information of the measurement unit by acquiring the relative position information between the optical member and the measurement unit. For example, when the position information acquisition means acquires the relative position information between the optical member and the measurement unit, the position information acquisition means acquires the relative position information by detecting the position of the optical member and the position of the measurement unit, respectively. You may. Further, for example, the position information acquisition means may be configured to acquire the relative position information by detecting the position of the measurement unit when acquiring the relative position information between the optical member and the measurement unit. In this case, for example, the position of the optical member may be stored in the storage means in advance. Further, for example, the position information acquisition means may be configured to acquire relative position information by detecting the movement amount of the measurement unit. In this case, for example, the amount of movement of the measuring unit may be detected from a preset initial position. The position information of the measurement unit may be the position information of the entire measurement unit or the position information of at least one member of the projection optical system housed in the measurement unit.

<Example>
Hereinafter, the subjective optometry device in this embodiment will be described. For example, the optometry device may include a conscious measuring means. Further, for example, the subjective optometry device may be provided with objective measuring means. In this embodiment, a subjective optometry device including both a subjective measuring means and an objective measuring means will be described as an example.

FIG. 1 shows an external view of the subjective optometry device 1 according to the present embodiment. For example, the subjective optometry device 1 includes a housing 2, a presentation window 3, a monitor 4, a chin rest 5, a base 6, an anterior eye imaging optical system 100, and the like. For example, the housing 2 includes a measuring means 7 inside the housing 2 (details will be described later). For example, the presentation window 3 is used to present a target to the subject. For example, the target luminous flux from the measuring means 7 is projected onto the eye E of the subject through the presentation window 3.

For example, the monitor (display) 4 displays the optical characteristic results of the eye E to be inspected (for example, spherical refraction degree S, cylindrical refraction degree C, astigmatic axis angle A, prism value Δ, etc.). For example, the monitor 4 is a touch panel. That is, in this embodiment, the monitor 4 functions as an operation unit (controller). For example, the signal corresponding to the operation instruction input from the monitor 4 is output to the control unit 70 described later. The monitor 4 does not have to be a touch panel type, and the monitor 4 and the operation unit may be provided separately. For example, in this case, the operation unit may be configured to use at least one of an operation means such as a mouse, a joystick, and a keyboard.

For example, the monitor 4 may be a display mounted on the housing 2 or a display connected to the housing 2. For example, in this case, the display of a personal computer may be used. Moreover, you may use a plurality of displays together.

For example, the chin rest 5 keeps the distance between the optometry E and the subjective optometry device 1 constant. In this embodiment, a configuration in which the chin rest 5 is used to keep the distance between the optometry E and the subjective optometry device 1 constant has been described as an example, but the present invention is not limited to this. For example, in this embodiment, a forehead pad, a face pad, or the like may be used in order to keep the distance between the eye to be inspected E and the subjective optometry device 1 constant. For example, the chin rest 5 and the housing 2 are fixed to the base 6.

For example, the anterior eye image pickup optical system 100 is composed of an image pickup device (not shown) and a lens. For example, the anterior eye imaging optical system 100 is used to image the face of a subject.

<Measuring means>
For example, the measuring means 7 includes a measuring means 7L for the left eye and a measuring means 7R for the right eye. That is, the subjective optometry device 1 in this embodiment has a pair of left and right subjective measuring means and a pair of left and right objective measuring means. In this embodiment, the subjective optometry device 1 is provided with either the left eye measuring means 7L or the right eye measuring means 7R, and by moving this in the left-right direction, the left eye to be inspected EL and the right cover are covered. The optometric luminous flux may be projected onto each of the optometry ERs. For example, the measuring means 7L for the left eye and the measuring means 7R for the right eye in this embodiment include the same member. Of course, the measuring means 7L for the left eye and the measuring means 7R for the right eye may have at least some components different from each other.

FIG. 2 is a diagram illustrating the configuration of the measuring means 7. For example, in this embodiment, the measuring means for the left eye 7L will be described as an example. Since the measuring means 7R for the right eye has the same configuration as the measuring means 7L for the left eye, the description thereof will be omitted. For example, the measuring means 7L for the left eye includes a subjective measurement optical system 25, an objective measurement optical system 10, a first index projection optical system 45, a second index projection optical system 46, an observation optical system 50, and the like.

<Aware optical system>
For example, the subjective measurement optical system 25 is used as a part of the configuration of the subjective measurement means for subjectively measuring the optical characteristics of the eye E to be inspected (details will be described later). For example, the optical characteristics of the eye to be inspected E include optical power, contrast sensitivity, binocular vision function (for example, oblique amount, stereoscopic vision function, etc.) and the like. In this embodiment, a subjective measuring means for measuring the refractive power of the eye to be inspected E will be described as an example. For example, the subjective measurement optical system 25 includes a projection optical system (target projection system) 30, a correction optical system 60, and a correction optical system 90.

For example, the projection optical system 30 projects the target luminous flux toward the eye E to be inspected. For example, the projection optical system 30 includes a display 31, a projection lens 33, a projection lens 34, a reflection mirror 36, a dichroic mirror 35, a dichroic mirror 29, an objective lens 14, and the like. For example, the luminous flux projected from the display 31 passes through the optical member in the order of the projection lens 33, the projection lens 34, the reflection mirror 36, the dichroic mirror 35, the dichroic mirror 29, and the objective lens 14, and the eye to be inspected E. Projected on.

For example, the display 31 is provided with a drive mechanism 37 (for example, a motor or the like) for rotating (tilting) the display 31 in the vertical direction. For example, the display 31 is rotated around an axis extending in the left-right direction from the center of the display 31 by the drive mechanism 37. The display 31 may rotate about an axis extending in the left-right direction from a position different from the center of the display 31. As a result, the display 31 is tilted up and down with respect to the optical axis L2 direction. Further, for example, the display 31 is provided with a drive mechanism 38 (for example, a motor or the like) for rotating (panning) the display 31 in the left-right direction. For example, the display 31 is rotated around an axis extending in the vertical direction from the center of the display 31 by the drive mechanism 38. The display 31 may rotate about an axis extending in the vertical direction from a position different from the center of the display 31. As a result, the display 31 is tilted to the left and right with respect to the optical axis L2 direction.

For example, the display 31 displays an inspection target such as a Randold ring optotype, a fixative for fixing the eye E to be inspected, and the like. For example, the target luminous flux from the display 31 is projected toward the eye E to be inspected. For example, in this embodiment, the following description will be given by taking as an example a case where an LCD (Liquid Crystal Display) is used as the display 31. As the display, an organic EL (Electro Luminescence) display, a plasma display, or the like can also be used.

For example, the correction optical system 60 is arranged in the optical path of the projection optical system 30. For example, the correction optical system 60 changes the optical characteristics of the optotype luminous flux. For example, the correction optical system 60 includes an astigmatism correction optical system 63 and a drive mechanism 39. For example, the astigmatism correction optical system 63 is arranged between the light projecting lens 33 and the light projecting lens 34. For example, the astigmatism correction optical system 63 is used to correct the columnar power, the columnar axis (astigmatism axis), and the like of the eye E to be inspected. For example, the astigmatism correction optical system 63 is composed of two positive cylindrical lenses 61a and 61b having the same focal length. The cylindrical lens 61a and the cylindrical lens 61b are independently rotated about the optical axis L2 by driving the rotation mechanisms 62a and 62b, respectively. In this embodiment, the configuration using two positive cylindrical lenses 61a and 61b as the astigmatism correction optical system 63 has been described as an example, but the present invention is not limited to this. The astigmatism correction optical system 63 may have a configuration capable of correcting the cylindrical power, the astigmatism axis, and the like. In this case, for example, the corrective lens may be inserted into and out of the optical path of the projection optical system 30.

For example, the drive mechanism 39 includes a motor and a slide mechanism. For example, the drive mechanism 39 integrally moves the display 31 in the direction of the optical axis L2. For example, at the time of subjective measurement, by moving the display 31, the presentation position (presentation distance) of the optotype with respect to the eye E to be inspected is optically changed, and the spherical refractive power of the eye E to be inspected is corrected. That is, the movement of the display 31 constitutes a spherical power correction optical system. Further, for example, at the time of objective measurement, the movement of the display 31 causes cloud fog to be applied to the eye E to be inspected. The spherical power correction optical system is not limited to this. For example, the spherical power correction optical system may have a large number of optical elements and may be configured to perform correction by arranging the optical elements in the optical path. Further, for example, the spherical power correction optical system may be configured to move the lens arranged in the optical path in the optical axis direction.

In this embodiment, a correction optical system for correcting a spherical power, a cylinder power, and a cylinder axis is described as an example, but the present invention is not limited to this. For example, a correction optical system that corrects the prism value may be provided. By providing the correction optical system for the prism value, even if the subject has an oblique eye, the target luminous flux can be corrected so as to be projected onto the eye E to be examined.

In this embodiment, the astigmatism correction optical system 63 for correcting the columnar power and the columnar axis (astigmatism axis) and the correction optical system (for example, the driving means 39) for correcting the spherical power are separately provided. The configuration to be provided has been described as an example, but the present invention is not limited to this. For example, the correction optical system may be configured to include a correction optical system that corrects the spherical power, the cylindricity, and the astigmatic axis. That is, the correction optical system in this embodiment may be an optical system that modulates the wavefront. Further, for example, the correction optical system may be an optical system that corrects spherical power, cylindrical power, astigmatic axis, and the like. In this case, for example, the correction optical system may include a lens disk in which a large number of optical elements (spherical lens, cylindrical lens, distributed prism, etc.) are arranged on the same circumference. The rotation of the lens disk is controlled by a drive unit (actuator, stepping motor, etc.), and the optical element (for example, cylindrical lens, cross-cylinder lens, rotary prism, etc.) desired by the examiner is rotated at the rotation angle desired by the examiner. It is arranged on the optical axis L2. For example, switching of the optical element arranged on the optical axis L2 may be performed by operating the monitor 4 or the like.

The lens disc comprises one lens disc or a plurality of lens discs. When a plurality of lens discs are arranged, a drive unit corresponding to each lens disc is provided. For example, as a lens disc group, each lens disc includes an aperture (or a 0D lens) and a plurality of optical elements. Typical types of lens discs are a spherical lens disc having a plurality of spherical lenses having different powers, a cylindrical lens disc having a plurality of cylindrical lenses having different powers, and an auxiliary lens disc having a plurality of types of auxiliary lenses. At least one of a red filter / green filter, a prism, a cross cylinder lens, a polarizing plate, a Maddox lens, and an auto cross cylinder lens is arranged on the auxiliary lens disk. Further, the cylindrical lens may be rotatably arranged around the optical axis L2 by the drive unit, and the rotary prism and the cross cylinder lens may be rotatably arranged around each optical axis by the drive unit.

For example, the correction optical system 90 is arranged between the objective lens 14 and the deflection mirror 81 described later. For example, the correction optical system 90 is used to correct optical aberrations (for example, astigmatism) that occur in subjective measurement. For example, the correction optical system 90 is composed of two positive cylindrical lenses 91a and 91b having the same focal length. For example, the correction optical system 90 corrects astigmatism by adjusting the cylindrical power and the astigmatic axis. The cylindrical lens 91a and the cylindrical lens 91b are independently rotated about the optical axis L3 by driving the rotation mechanisms 92a and 92b, respectively. In this embodiment, a configuration using two positive cylindrical lenses 91a and 91b as the correction optical system 90 has been described as an example, but the present invention is not limited to this. The correction optical system 90 may be configured as long as it can correct astigmatism. In this case, for example, the correction lens may be moved in and out of the optical axis L3.

In this embodiment, a configuration in which the correction optical system 90 is arranged separately from the correction optical system 60 has been described as an example, but the present invention is not limited to this. For example, the correction optical system 60 may be configured to also serve as the correction optical system 90. In this case, the cylindrical power and the cylindrical axis (astigmatic axis) of the eye E to be inspected are corrected according to the amount of astigmatism. That is, the correction optical system 60 is driven so as to correct the cylindrical power and the astigmatic axis in consideration of the amount of astigmatism. For example, by using the correction optical system 60 and the correction optical system 90 in combination, it is possible to correct optical aberrations with a simple configuration because complicated control is not required. Further, for example, by using the correction optical system 60 and the correction optical system 90 in combination, it is not necessary to separately provide a correction optical system for optical aberration, so that the optical aberration can be corrected with a simple configuration.

<Objective optical system>
For example, the objective measurement optical system 10 is used as a part of the configuration of the objective measurement means for objectively measuring the optical characteristics of the eye to be inspected (details will be described later). For example, the optical characteristics of the eye to be inspected E include an optical power, an axial length, a corneal shape, and the like. In this embodiment, an objective measuring means for measuring the refractive power of the eye to be inspected E will be described as an example. For example, the objective measurement optical system 10 is composed of a projection optical system 10a, a light receiving optical system 10b, and a correction optical system 90.

For example, the projection optical system (projection optical system) 10a projects a spot-shaped measurement index onto the fundus of the eye to be inspected E through the center of the pupil of the eye to be inspected E. For example, the light receiving optical system 10b takes out the fundus reflected light reflected from the fundus in a ring shape through the peripheral portion of the pupil, and causes the two-dimensional image pickup element 22 to image the ring-shaped fundus reflection image.

For example, the projection optical system 10a includes a measurement light source 11, a relay lens 12, a hole mirror 13, a prism 15, a drive unit (motor) 23, and a dichroic mirror 35 arranged on the optical axis L1 of the objective measurement optical system 10. Includes a dichroic mirror 29 and an objective lens 14. For example, the prism 15 is a luminous flux deflection member. For example, the drive unit 23 rotationally drives the prism 15 around the optical axis L1. For example, the light source 11 has a conjugate relationship with the fundus of the eye E to be inspected. Further, the hole portion of the hole mirror 13 has a conjugate relationship with the pupil of the eye E to be inspected. For example, the prism 15 is arranged at a position deviating from the position conjugate with the pupil of the eye E to be inspected, and eccentricizes the passing light flux with respect to the optical axis L1. Instead of the prism 15, a parallel flat plate may be diagonally arranged on the optical axis L1 as a luminous flux deflection member.

For example, the dichroic mirror 35 shares the optical path of the subjective measurement optical system 25 and the optical path of the objective measurement optical system 10. That is, for example, in the dichroic mirror 35, the optical axis L2 of the subjective measurement optical system 25 and the optical axis L1 of the objective measurement optical system 10 are coaxial. For example, the dichroic mirror 29, which is an optical path branching member, reflects the light flux measured by the subjective measurement optical system 25 and the light measured by the projection optical system 10a, and guides the light beam to the eye E to be inspected.

For example, the light receiving optical system 10b shares the objective lens 14, the dichroic mirror 29, the dichroic mirror 35, the prism 15, and the hole mirror 13 of the projection optical system 10a, and the relay lens 16 is arranged in the optical path in the reflection direction of the hole mirror 13. , A light receiving aperture 18, a collimator lens 19, a ring lens 20, a two-dimensional image pickup element 22 such as a CCD, which are arranged in an optical path in the reflection direction of the mirror 17. For example, the light receiving diaphragm 18 and the two-dimensional image sensor 22 have a conjugate relationship with the fundus of the eye E to be inspected. For example, the ring lens 20 is composed of a ring-shaped lens portion and a light-shielding portion in which a region other than the lens portion is coated with a light-shielding coating, and is optically conjugated to the pupil of the eye E to be inspected. It is a relationship. For example, the output from the two-dimensional image sensor 22 is input to the control unit 70.

For example, the dichroic mirror 29 reflects the reflected light of the measurement light from the projection optical system 10a guided to the fundus of the eye E to be inspected toward the light receiving optical system 10. Further, for example, the dichroic mirror 29 transmits the front eye portion observation light and the alignment light and guides them to the observation optical system 50. For example, the dichroic mirror 35 reflects the reflected light of the measurement light from the projection optical system 10a guided to the fundus of the eye E to be inspected toward the light receiving optical system 10.

The objective measurement optical system 10 is not limited to the above, and a ring-shaped measurement index is projected from the peripheral portion of the pupil onto the fundus to extract the fundus-reflected light from the central portion of the pupil, and the ring-shaped to the two-dimensional image pickup element 22. A well-known one such as a configuration for receiving a light-receiving image of the fundus of the fundus can be used.

The objective measurement optical system 10 is not limited to the above, and includes a projection optical system that projects the measurement light toward the fundus of the eye E to be inspected and a reflected light acquired by the reflection of the measurement light on the fundus. It may be any measurement optical system having a light receiving optical system that receives light by a light receiving element. For example, the optical power measuring optical system may be configured to include a Shack-Hartmann sensor. Of course, a device provided with another measurement method may be used (for example, a phase difference method device that projects a slit).

For example, the light source 11 of the projection optical system 10a, the light receiving diaphragm 18, the collimator lens 19, the ring lens 20, and the two-dimensional image pickup element 22 of the light receiving optical system 10b can be integrally moved in the optical axis direction. In this embodiment, for example, the light source 11 of the projection optical system 10a, the light receiving diaphragm 18 of the light receiving optical system 10b, the collimator lens 19, the ring lens 20, and the two-dimensional image pickup element 22 are provided by a drive mechanism 39 for driving the display 31. It is integrally moved in the direction of the optical axis L1. That is, the display 31, the light source 11 of the projection optical system 10a, the light receiving diaphragm 18 of the light receiving optical system 10b, the collimator lens 19, the ring lens 20, and the two-dimensional image pickup element 22 are synchronized and move integrally as the drive unit 95. Of course, each may be separately driven.

For example, the drive unit 95 moves a part of the objective measurement optical system 10 in the optical axis direction so that the outer ring light flux is incident on the two-dimensional image pickup device 22 in each meridian direction. That is, by moving a part of the objective measurement optical system 10 in the optical axis L1 direction according to the spherical refraction error (spherical refractive power) of the eye E to be inspected, the spherical refraction error is corrected and the fundus of the eye E to be inspected. The light source 11, the light receiving aperture 18, and the two-dimensional image pickup element 22 are optically coupled to each other. For example, the moving position of the drive mechanism 39 is detected by a potentiometer (not shown). The hole mirror 13 and the ring lens 20 are arranged so as to be conjugated with the pupil of the eye E to be inspected at a constant magnification regardless of the amount of movement of the drive unit 95.

In the above configuration, the measured luminous flux emitted from the light source 11 passes through the relay lens 12, the hole mirror 13, the prism 15, the dichroic mirror 35, the dichroic mirror 29, and the objective lens 14, and is spot-shaped on the fundus of the eye E to be inspected. Form a point light source image. At this time, the prism 15 rotating around the optical axis causes the pupil projection image (projected luminous flux on the pupil) of the hole portion in the hall mirror 13 to be eccentrically rotated at high speed. The point light source image projected on the fundus is reflected and scattered, emitted from the eye E to be inspected, condensed by the objective lens 14, and has a dichroic mirror 29, a dichroic mirror 35, a high-speed rotating prism 15, a hole mirror 13, and a relay lens. 16. The light is focused again at the position of the light receiving aperture 18 via the mirror 17, and a ring-shaped image is formed on the two-dimensional image pickup element 22 by the collimator lens 19 and the ring lens 20.

For example, the prism 15 is arranged in a common optical path of the projection optical system 10a and the light receiving optical system 10b. For example, since the reflected luminous flux from the fundus of the eye passes through the same prism 15 as the projected optical system 10a, in the subsequent optical systems, reverse scanning is performed as if there was no eccentricity of the projected luminous flux / reflected luminous flux (light-received luminous flux) on the pupil. Will be done.

For example, the correction optical system 90 is also used as the subjective measurement optical system 25. Of course, a correction optical system used in the objective measurement optical system 10 may be separately provided.

<1st index projection optical system and 2nd index projection optical system>
For example, in this embodiment, the first index projection optical system 45 and the second index projection optical system 46 are arranged between the correction optical system 90 and the deflection mirror 81. Of course, the arrangement positions of the first index projection optical system 45 and the second index projection optical system 46 are not limited to this. For example, the first index projection optical system 45 and the second index projection optical system 46 may be provided on the cover of the housing 2. For example, in this case, the first index projection optical system 45 and the second index projection optical system 46 may be arranged around the presentation window 3.

For example, in the first index projection optical system 45, a plurality of infrared light sources are arranged concentrically around the optical axis L3 at intervals of 45 degrees, and are arranged symmetrically with a vertical plane passing through the optical axis L3. ing. For example, the first index projection optical system 45 emits near-infrared light for projecting an alignment index on the cornea of the eye E to be inspected. For example, the second index projection optical system 46 includes six infrared light sources arranged at different positions from the first index projection optical system 45. In this case, the first index projection optical system 45 projects an index of infinity onto the cortex of the eye E to be inspected from the left and right, and the second index projection optical system 46 projects an index of finite distance onto the cortex of the eye E to be inspected in the vertical direction. Alternatively, it is configured to project from an oblique direction. For convenience, FIG. 2 illustrates only a part of the first index projection optical system 45 and the second index projection optical system 46. The second index projection optical system 46 is also used as anterior eye portion illumination for illuminating the anterior eye portion of the eye E to be inspected. Further, the second index projection optical system 46 can also be used as an index for measuring the shape of the cornea. The first index projection optical system 45 and the second index projection optical system 46 are not limited to the point light source. For example, it may be a ring-shaped light source or a line-shaped light source.

<Observation optical system>
For example, the observation optical system (imaging optical system) 50 shares the objective lens 14 and the dichroic mirror 29 in the subjective measurement optical system 25 and the objective measurement optical system 10, and includes an image pickup lens 51 and a two-dimensional image pickup element 52. .. For example, the image pickup device 52 has an image pickup surface arranged at a position substantially conjugate with the anterior eye portion of the eye E to be inspected. For example, the output from the image sensor 52 is input to the control unit 70. As a result, the image of the anterior eye portion of the eye E to be inspected is captured by the two-dimensional image sensor 52 and displayed on the monitor 4. The observation optical system 50 also serves as an optical system for detecting an alignment index image formed on the cornea of the eye E to be inspected by the first index projection optical system 45 and the second index projection optical system 46, and is controlled by the control unit 70. The position of the alignment index image is detected.

<Internal configuration of subjective optometry device>
Hereinafter, the internal configuration of the subjective optometry device 1 will be described. FIG. 3 is a schematic configuration diagram of the inside of the subjective optometry device 1 according to the present embodiment as viewed from the front direction (direction A in FIG. 1). FIG. 4 is a schematic configuration diagram of the inside of the subjective optometry device 1 according to the present embodiment as viewed from the side direction (direction B in FIG. 1). FIG. 5 is a schematic configuration diagram of the inside of the subjective optometry device 1 according to the present embodiment as viewed from the upper surface direction (direction C in FIG. 1). Note that FIGS. 4 and 5 show only the optical axis of the left eye measuring means 7L for convenience of explanation.

For example, the subjective optometry device 1 includes a subjective measuring means and an objective measuring means. For example, in the subjective measuring means and the objective measuring means, the target luminous flux from the measuring means 7 passes through an optical path deviating from the optical axis L of the optical member (for example, the concave mirror 85 described later) and is the eye to be inspected E. Guided to. For example, the optical axis L in this embodiment is an axis toward the center of the sphere of the concave mirror 85. That is, in this embodiment, the target luminous flux is irradiated from an oblique direction with respect to the optical axis L of the concave mirror 85, and the reflected luminous flux is guided to the eye E to be inspected.

For example, the subjective measuring means includes a measuring means 7, a deflection mirror 81, a driving means 82, a driving means 83, a reflection mirror 84, and a concave mirror 85. The subjective measuring means is not limited to this configuration. For example, the configuration may not have the reflection mirror 84. In this case, the luminous flux from the measuring means 7 may be irradiated from an oblique direction with respect to the optical axis L of the concave mirror 85 after passing through the polarizing mirror 81. Further, for example, a configuration having a half mirror may be used. In this case, the target luminous flux from the measuring means 7 may be irradiated obliquely with respect to the optical axis L of the concave mirror 85 via the half mirror, and the reflected luminous flux may be guided to the eye E to be inspected. .. Although the concave mirror 85 is arranged in this embodiment, a convex lens may be arranged instead of the concave mirror 85.

For example, the objective measuring means includes a measuring means 7, a deflection mirror 81, a reflection mirror 84, and a concave mirror 85. The objective measuring means is not limited to this configuration. For example, the configuration may not have the reflection mirror 84. In this case, the luminous flux from the measuring means 7 may be irradiated from an oblique direction with respect to the optical axis L of the concave mirror 85 after passing through the polarizing mirror 81. Further, for example, a configuration having a half mirror may be used. In this case, the target luminous flux from the measuring means 7 may be irradiated obliquely with respect to the optical axis L of the concave mirror 85 via the half mirror, and the reflected luminous flux may be guided to the eye E to be inspected. .. Although the concave mirror 85 is arranged in this embodiment, a convex lens may be arranged instead of the concave mirror 85.

For example, the subjective optometry device 1 has a left eye driving means 9L and a right eye driving means 9R, and can move the left eye measuring means 7L and the right eye measuring means 7R in the X direction, respectively. .. For example, by moving the measuring means 7L for the left eye and the measuring means 7R for the right eye, the distance between the deflection mirror 81 and the measuring means 7 is changed, and the presentation position of the luminous flux in the Z direction is changed. To. As a result, the target light flux corrected by the correction optical system 60 is guided to the eye E to be inspected, and the image of the target light flux corrected by the correction optical system 60 is measured so as to be formed on the fundus of the eye E to be inspected. The means 7 can be adjusted in the Z direction.

For example, the deflection mirror 81 has a deflection mirror 81R for the right eye and a deflection mirror 81L for the left eye, which are provided in pairs on the left and right respectively. For example, the deflection mirror 81 is arranged between the correction optical system 60 and the eye E to be inspected. That is, the correction optical system 60 in this embodiment has a pair of left and right eye correction optical systems and a right eye correction optical system, and the left eye deflection mirror 81L has a left eye correction. It is placed between the optical system and the left eye ER, and the deflection mirror 81R for the right eye is placed between the corrective optical system for the right eye and the right eye ER. For example, the deflection mirror 81 is preferably arranged at the conjugate position of the pupil.

For example, the deflection mirror 81L for the left eye reflects the light flux projected from the measuring means 7L for the left eye and guides the light beam to the left eye subject EL. Further, for example, the deflection mirror 81L for the left eye reflects the reflected light reflected by the left eye subject EL and guides the light to the measuring means 7L for the left eye. For example, the deflection mirror 81R for the right eye reflects the light flux projected from the measuring means 7R for the right eye and guides the light beam to the right eye subject ER. Further, for example, the deflection mirror 81R for the right eye reflects the reflected light reflected by the right eye subject ER and guides the light to the measuring means 7R for the right eye. In this embodiment, a configuration in which a deflection mirror 81 is used as a deflection member that reflects the light flux projected from the measuring means 7 and guides the light beam to the eye E to be inspected is described as an example, but the present invention is limited to this. Not done. The deflection member may be any deflection member that reflects the light flux projected from the measuring means 7 and guides the light beam to the eye E to be inspected. For example, examples of the deflection member include a prism and a lens.

For example, the drive means 82 includes a motor (drive unit) and the like. For example, the driving means 82 includes a driving means 82L for driving the deflection mirror 81L for the left eye and a driving means 82R for driving the deflection mirror 81R for the right eye. For example, the deflection mirror 81 rotates and moves by driving the drive means 82. For example, the driving means 82 rotates the deflection mirror 81 with respect to the rotation axis in the horizontal direction (X direction) and the rotation axis in the vertical direction (Y direction). That is, the driving means 82 rotates the deflection mirror 81 in the XY directions. The rotation of the deflection mirror 81 may be in either the horizontal direction or the vertical direction.

For example, the drive means 83 includes a motor (drive unit) and the like. For example, the driving means 83 has a driving means 83L for driving the deflection mirror 81L for the left eye and a driving means 83R for driving the deflection mirror 81R for the right eye. For example, the deflection mirror 81 moves in the X direction by driving the drive means 83. For example, by moving the deflection mirror 81L for the left eye and the deflection mirror 81R for the right eye, the distance between the deflection mirror 81L for the left eye and the deflection mirror 81R for the right eye is changed, and the eye to be inspected. The distance in the X direction between the light path for the left eye and the light path for the right eye can be changed according to the interpupillary distance of E.

For example, a plurality of deflection mirrors 81 may be provided in each of the left eye optical path and the right eye optical path. For example, a configuration in which two deflection mirrors are provided in each of the left eye optical path and the right eye optical path (for example, two deflection mirrors in the left eye optical path) can be mentioned. In this case, one deflection mirror may be rotated in the X direction and the other deflection mirror may be rotated in the Y direction. For example, it is possible to optically correct the image formation position by deflecting the apparent luminous flux for forming the image of the correction optical system 60 in front of the eye to be inspected by rotating the deflection mirror 81. can.

For example, the concave mirror 85 is shared by the measuring means 7R for the right eye and the measuring means 7L for the left eye. For example, the concave mirror 85 is shared by an optical path for the right eye including a corrective optical system for the right eye and an optical path for the left eye including an optical path for the left eye. That is, the concave mirror 85 is arranged at a position that passes through both the optical path for the right eye including the correction optical system for the right eye and the optical path for the left eye including the correction optical system for the left eye. Of course, the concave mirror 85 does not have to be configured to be shared by the optical path for the right eye and the optical path for the left eye. That is, a concave mirror may be provided in each of the optical path for the right eye including the corrective optical system for the right eye and the optical path for the left eye including the corrective optical system for the left eye. For example, the concave mirror 85 guides the target luminous flux that has passed through the correction optical system to the eye E to be inspected, and forms an image of the target luminous flux that has passed through the correction optical system in front of the eye E to be inspected. In this embodiment, the configuration using the concave mirror 85 has been described as an example, but the present invention is not limited to this, and various optical members can be used. For example, as the optical member, a lens, a plane mirror, or the like can be used.

For example, the concave mirror 85 is used as both a subjective measuring means and an objective measuring means. For example, the target luminous flux projected from the subjective measurement optical system 25 is projected onto the eye E to be inspected via the concave mirror 85. For example, the measurement light projected from the objective measurement optical system 10 is projected onto the eye E to be inspected via the concave mirror 85. Further, for example, the reflected light of the measurement light projected from the objective measurement optical system 10 is guided to the light receiving optical system 10b of the objective measurement optical system 10 via the concave mirror 85. In this embodiment, a configuration in which the reflected light of the measurement light by the objective measurement optical system 10 is guided to the light receiving optical system 10b of the objective measurement optical system 10 via the concave mirror 85 is taken as an example. However, it is not limited to this. For example, the reflected light of the measurement light by the objective measurement optical system 10 may be configured not to pass through the concave mirror 85.

More specifically, for example, in the present embodiment, the optical axis between the concave mirror 85 and the eye E to be inspected in the subjective measuring means and the concave mirror 85 to the eye E in the objective measuring means. The optical axis is configured to be at least coaxial. For example, in this embodiment, the optical axis L2 of the subjective measurement optical system 25 and the optical axis L1 of the objective measurement optical system 10 are combined and coaxial with each other by the dichroic mirror 35.

<Optical path of subjective measurement means>
Hereinafter, the optical path of the subjective measurement means will be described. For example, the subjective measurement means guides the target light beam to the eye E to be inspected by reflecting the target light beam that has passed through the correction optical system 60 in the direction of the eye to be inspected by the concave mirror 85, and passes through the correction optical system 60. An image of the optotype beam is formed in front of the eye E to be inspected so as to optically have a predetermined inspection distance. For example, at this time, the target light beam passing through the correction optical system 60 passes through an optical path deviating from the optical axis L of the concave mirror 85, enters the concave mirror 85, and is an optical path deviating from the optical axis L of the concave mirror 85. It is reflected so as to pass through, and is guided to the eye E to be inspected. For example, the optotype image seen by the subject appears to be farther than the actual distance from the eye E to be examined to the display 31. That is, by using the concave mirror 85, the display distance of the optotype to the eye E to be inspected is extended, and the optotype image is presented to the subject so that the image of the luminous flux can be seen at the position of the predetermined inspection distance. Can be done.

It will be explained in more detail. In the following description, the optical path for the left eye will be described as an example, but the optical path for the right eye has the same configuration as the optical path for the left eye. For example, in the subjective measurement means for the left eye, the luminous flux projected from the display 31 of the measurement means 7L for the left eye is incident on the astigmatism correction optical system 63 via the projection lens 33. The luminous flux that has passed through the turbulence correction optical system 63 is incident on the correction optical system 90 via the reflection mirror 36, the dichroic mirror 35, the dichroic mirror 29, and the objective lens 14. The luminous flux that has passed through the correction optical system 90 is guided from the measuring means for the left eye 7L toward the deflection mirror 81L for the left eye. The luminous flux emitted from the measuring means 7L for the left eye and reflected by the deflection mirror 81 for the left eye is reflected toward the concave mirror 85 by the reflection mirror 84. For example, the luminous flux emitted from the display 31 reaches the left eye subject EL by passing through the optical member in this way.

As a result, an optotype image corrected by the orthodontic optical system 60 is formed on the fundus of the left eye to be inspected EL based on the spectacle wearing position of the left eye to be inspected EL (for example, about 12 mm from the apex position of the cornea). Therefore, the astigmatism correction optical system 63 was arranged in front of the eyes, and the spherical power was adjusted in front of the eyes by the correction optical system of the spherical power (in this embodiment, the drive mechanism 39 was driven). Is equivalent, and the subject can collimate the image of the optotype in a natural state through the concave mirror 85. In this embodiment, the optical path for the right eye has the same configuration as the optical path for the left eye, and is based on the spectacle wearing positions of both ERs and ELs (for example, about 12 mm from the apex position of the cornea). The optotype image corrected by the pair of left and right correction optical systems 60 is formed on the fundus of both eyes. In this way, the subject responds to the examiner while directly looking at the optotype in the state of natural vision, corrects by the correction optical system 60 until the inspection optotype looks appropriate, and is based on the correction value. The optical characteristics of the eye to be inspected are measured subjectively.

<Optical path of objective measuring means>
Next, the optical path of the objective measuring means will be described. In the following description, the optical path for the left eye will be described as an example, but the optical path for the right eye has the same configuration as the optical path for the left eye. For example, in the objective measuring means for the left eye, the measurement light emitted from the light source 11 of the projection optical system 10a in the objective measurement optical system 10 passes through the relay lens 12 to the objective lens 14 and is corrected by the correction optical system 90. Incident to. The measurement light that has passed through the correction optical system 90 is projected from the measurement means for the left eye 7L toward the deflection mirror 81L for the left eye. The measurement light emitted from the left-eye measuring means 7L and reflected by the left-eye deflection mirror 81 is reflected by the reflection mirror 84 toward the concave mirror 85. The measurement light reflected by the concave mirror passes through the reflection mirror 84 and reaches the left eye subject EL, and forms a spot-shaped point light source image on the fundus of the left eye subject EL. At this time, the prism 15 rotating around the optical axis causes the pupil projection image (projected luminous flux on the pupil) of the hole portion of the hall mirror 13 to be eccentrically rotated at high speed.

The light of the point light source image formed on the fundus of the left eye to be inspected EL is reflected and scattered to emit the eye to be inspected E, and is collected by the objective lens 14 through the optical path through which the measurement light has passed, and is collected by the objective lens 14 to be a dichroic mirror. 29, through the dichroic mirror 35, the prism 15, the hole mirror 13, the relay lens 16, and the mirror 17. The reflected light passing through the mirror 17 is collected again on the aperture of the light receiving diaphragm 18, is converted into a substantially parallel light flux (in the case of an emmetropic eye) by the collimator lens 19, and is taken out as a ring-shaped light flux by the ring lens 20. The light is received by the two-dimensional image pickup element 22 as a ring image. By analyzing the received ring image, the optical characteristics of the eye E to be inspected can be objectively measured.

<Control unit>
FIG. 6 is a diagram showing a control system of the subjective optometry device 1 according to the present embodiment. For example, the control unit 70 includes various members such as a monitor 4, a non-volatile memory 75 (hereinafter, memory 75), a measurement light source 11 included in the measuring means 7, a two-dimensional image pickup element 22, a display 31, and a two-dimensional image pickup element 52. It is electrically connected. Further, for example, the control unit 70 is electrically connected to a drive unit (not shown) provided with the drive means 9, the drive mechanism 39, the rotation mechanisms 62a and 62b, the drive means 83, and the rotation mechanisms 92a and 92b, respectively.

For example, the control unit 70 includes a CPU (processor), RAM, ROM, and the like. For example, the CPU controls each member in the subjective optometry device 1. For example, RAM temporarily stores various types of information. For example, the ROM stores various programs for controlling the operation of the subjective optometry device 1, optotype data for various examinations, initial values, and the like. The control unit 70 may be composed of a plurality of control units (that is, a plurality of processors).

For example, the memory 75 is a non-transient storage medium capable of retaining the storage contents even when the power supply is cut off. For example, as the memory 75, a hard disk drive, a flash ROM, a USB memory detachably attached to the subjective optometry device 1, and the like can be used. For example, the memory 75 stores a control program for controlling the subjective measuring means and the objective measuring means.

<Control operation>
The operation of the subjective optometry device 1 having the above configuration will be described. For example, in this embodiment, before starting the subjective measurement, the objective measurement for the eye E to be inspected is performed using the objective measurement optical system having the above-described configuration. In this case, for example, the control unit 70 acquires an objectively measured refractive power such as a spherical refractive power S, a cylindrical refractive power C, an astigmatic axis angle A, and a prism value Δ possessed by the eye E to be inspected. That is, the control unit 70 acquires the objective refractive power (objective value) of the eye to be inspected E. Further, for example, the control unit 70 stores an objective value in the memory 75.

For example, when the subjective measurement is started, the corrective optical system 60 is controlled based on the acquired objective refractive power (objective value) of the eye to be inspected E. For example, the control unit 70 illuminates the display 31 based on at least one of the objectively measured spherical refractive power S, columnar refractive power C, astigmatic axis angle A, prism value Δ, and the like of the eye to be inspected E. It is moved in the direction of the axis L2 to correct the refractive power of the eye to be inspected E.

For example, the arrangement position of the display 31 included in the floodlight optical system 30 changes depending on the optical refractive power of the eye E to be inspected. For example, the display 31 is arranged at a standby position for projecting an uncorrected target luminous flux (that is, a 0D target luminous flux) onto the eye E to be inspected. For example, for the eye E to be inspected having an optical power of 0D, the standby position of the display 31 is set as the initial position of the display 31. For example, for an eye E whose eye refractive power is not 0D, the display 31 is moved so as to correct the eye refractive power of the eye E to 0D, and the display 31 is moved to a position different from the standby position of the display 31. The initial position is set. For example, this allows the control unit 70 to acquire the correction power of the correction optical system 60. That is, the control unit 70 can acquire the correction power for correcting the eye E to be inspected to have an optical power of 0D from the arrangement position of the display 31.

Further, for example, when the subjective measurement is started, the control unit 70 displays a required visual acuity value visual acuity target (for example, a visual acuity value target of 1.0) on the display 31. For example, when the visual acuity value optotype is presented to the eye E to be inspected, the examiner performs a distance visual acuity measurement for the eye E to be inspected. For example, the visual acuity value optotype displayed on the display 31 can be switched by selecting a predetermined switch on the monitor 4. For example, if the subject's answer is correct, the examiner switches to a visual acuity value visual acuity target that is one step higher. On the other hand, if the subject's answer is incorrect, the visual acuity value target is switched to one step lower. That is, the control unit 70 switches the visual acuity target displayed on the display 31 based on the signal from the monitor 4 that changes the visual acuity value visual acuity target. In this embodiment, the distance vision measurement will be described as an example, but the present invention is not limited to this. For example, the near vision measurement can be performed in the same manner as the distance vision measurement.

For example, with the visual refractive power of the eye E to be examined corrected as described above and the required visual acuity value optotype displayed on the display 31, the examiner presents the subject with the jaw placed on the chin rest 5. Observe the window 3 and instruct to fix the optotype. For example, when the anterior eye portion of the eye to be inspected E is detected by the anterior eye portion imaging optical system 100, the control unit 70 starts alignment of the eye to be inspected E and the measuring means 7. That is, the control unit 70 starts automatic alignment.

FIG. 7 is a diagram showing an image of the anterior segment of the eye to be inspected E. For example, when the alignment state is detected, the light sources included in the first index projection optical system 45 and the second index projection optical system 46 are turned on. As a result, the index images Ma to Mh are projected on the eye E to be inspected in a ring shape. For example, the control unit 70 detects the XY center coordinates (cross mark shown in FIG. 7) in the index images Ma to Mh as the substantially corneal apex position K. For example, the index images Ma and Me are at infinity, and the index images Mh and Mf are finite.

For example, the alignment state of the eye E to be inspected in the left-right direction (X direction) and the up-down direction (Y direction) is determined using a preset alignment reference position O1 (see FIG. 8). For example, in this embodiment, such an alignment reference position O1 is the corneal apex position of the eye E to be inspected, the optical axis L4L or L4R of the luminous flux reflected by the concave mirror 85 and directed toward the eye E to be inspected. Is set to the matching position. Further, for example, a predetermined region centered on the alignment reference position O1 is set as an alignment allowable range A1 (see FIG. 8) for determining the suitability of alignment.

FIG. 8 is a diagram illustrating alignment control. For example, the control unit 70 determines the displacement amount Δd between the detected substantially corneal apex position K of the eye to be inspected E and the alignment reference position O1 to determine the positional deviation of the target luminous flux with respect to the eye to be inspected E in the XY direction. To detect. For example, when the positional deviation of the luminous flux with respect to the eye E to be inspected is detected, the control unit 70 moves the measuring means 7 based on the detection result. For example, in this embodiment, the deflection mirror 81 and the measuring means 7 can be integrally moved in the X direction to align the eye E to be inspected in the X direction (left-right direction). Further, for example, in the present embodiment, by integrally moving the polarizing mirror 81 and the measuring means 7 in the Z direction, the alignment of the eye E to be inspected E can be performed in the Y direction (vertical direction). The deflection mirror 81 and the measuring means 7 are not integrated, and may be configured to move separately. For example, the control unit 70 adjusts the alignment in the X direction and the Y direction so that the deviation amount Δd falls within the alignment allowable range A1.

For example, when the measuring means 7 moves with respect to the eye to be inspected E as described above and the alignment is completed, the subjective measurement for the eye to be inspected E is started.

<Correction of the image plane of the image in the luminous flux>
For example, in this embodiment, as shown in FIGS. 2 to 5, the target luminous flux emitted from the display 31 is the optical axis L2, the optical axis L3, and the optical axis L4 (optical axis L4L or optical axis L4R). Is guided in order to the eye E to be inspected. At this time, the luminous flux emitted from the display 31 passes through an optical path deviating from the optical axis L of the concave mirror 85 and is guided to the eye E to be inspected. Further, in this embodiment, the optical characteristics of the eye E to be inspected are subjectively measured by using the image of the luminous flux guided to the eye E to be inspected or the luminous flux guided to the eye E to be inspected. Will be done. For example, when the luminous flux of the optotype passes through an optical path deviated from the optical axis L of the optical member (concave mirror 85 in this embodiment) as in the subjective optometry device 1 in the present embodiment, the fundus of the eye to be inspected. The image plane I (see FIG. 9) of the image of the optometric luminous flux projected on the optical axis is not substantially perpendicular to the optical axis, and the image plane I is tilted. In other words, when the luminous flux passes through an optical path deviating from the optical axis L of the optical member, the image plane when the luminous flux is imaged in the fundus OF (see FIG. 9) of the eye E to be inspected is tilted.

FIG. 9 is a diagram illustrating the inclination of the image plane I of the image of the luminous flux. Note that, for convenience of explanation, only the left eye subject EL, the concave mirror 85, and the display 31 are shown in FIG. 9, and the other members are not shown. Further, the dotted line portion in FIG. 9 is an enlarged view of a part of the left eye subject EL. For example, the target luminous flux is emitted from the display 31 in various directions. For example, in this embodiment, the luminous flux emitted from the center of the display 31 is shown as the luminous flux from the central region of the display 31. For example, the condensing position CA in FIG. 9 is the condensing position of the target luminous flux emitted from the center of the display 31. Further, for example, in this embodiment, the luminous flux emitted from both ends of the display 31 in the vertical direction is shown as the luminous flux from the peripheral region of the display 31. For example, the condensing position PA1 in FIG. 9 is the condensing position of the target luminous flux emitted from the upper end of the display 31. Further, for example, the condensing position PA2 in FIG. 9 is the condensing position of the target luminous flux emitted from the lower end of the display 31.

For example, the image plane I of the image of the luminous flux of the optotype is tilted with respect to the optical axis direction of the optotype. For example, in FIG. 9, the case where the image plane I of the image of the luminous flux is tilted in the vertical direction (Y direction) with respect to the optical axis L4L is taken as an example. Although description is omitted in this embodiment, the image plane I of the image of the target luminous flux may be tilted in the left-right direction (X direction) with respect to the optical axis direction. For example, as shown in FIG. 9, the condensing position CA in the central region of the optotype luminous flux and the condensing positions PA1 and PA2 in the peripheral region of the optotype luminous flux are deviated from each other with respect to the fundus OF of the left eye subject EL. Then, the image plane I of the image of the luminous flux guided by the left eye subject EL is tilted. Therefore, for example, in the case of an optical system that focuses on the center of the optotype, an optotype that is in focus in the central region but not in the peripheral region is presented to the left eye subject EL. .. That is, the area around the optotype appears blurred in the left eye EL to be inspected.

Therefore, for example, the control unit 70 corrects the inclination of the image plane I of the image of the target luminous flux generated by the passage of the target luminous flux through an optical path deviated from the optical axis of the optical member. For example, in this embodiment, the inclination of the image plane I of the image of the target luminous flux is corrected so that the imaging performance of the target luminous flux (for example, spot diagram, MTF (Modulated Transfer Function), etc.) is optimized. To. For example, the inclination of the image plane I of the image of the luminous flux can be corrected by changing the angle of the plane of the display 31 with respect to the optical axis. In other words, the inclination of the image plane I of the image of the luminous flux can be corrected by inclining the display 31 (the surface of the display 31) with respect to the optical axis.

FIG. 10 is a diagram showing an image plane I of an image of an optotype luminous flux due to the inclination of the display 31. For example, when the display 31 is not tilted, the focusing position CA in the central region of the target luminous flux and the focusing positions PA1 and PA2 in the peripheral region are displaced in the fundus OF of the left eye subject EL, and the target luminous flux is displaced. The image plane I of the image is tilted with respect to the optical axis L4L (see FIG. 9). Therefore, for example, the control unit 70 in the present embodiment rotates the display 31 in the vertical direction (direction of arrow c in FIG. 10) with respect to the optical axis L4L in order to correct the inclination of the image plane I. Further, for example, the control unit 70 in the present embodiment rotates the display 31 in the left-right direction (direction of arrow d in FIG. 10) with respect to the optical axis L4L in order to correct the inclination of the image plane I. For example, when the control unit 70 rotates the display 31 in this way, the condensing position CA in the central region of the optotype light flux and the condensing positions PA1 and PA2 in the peripheral region are substantially perpendicular to the optical axis L4L. Therefore, the inclination of the image plane I of the image of the target luminous flux is corrected. That is, the image plane when the target luminous flux is imaged in the fundus OF of the left eye subject EL is corrected substantially vertically. Therefore, the left eye subject EL is presented with an optotype focused on the central region and the peripheral region of the optotype luminous flux.

Although description is omitted in this embodiment, the image plane I of the image of the target luminous flux is tilted in the vertical direction (Y direction) and the horizontal direction (X direction) with respect to the optical axis L4R even in the right eye-tested ER. .. For example, in this case, the inclination of the image plane I of the image of the target luminous flux can be corrected by changing the angle of the surface of the display 31 with respect to the optical axis L4R, as in the case of the left eye subject EL. ..

For example, the inclination of the image plane I of the image of the luminous flux changes depending on the position where the luminous flux emitted from the display 31 is incident on the concave mirror 85. For example, the position where the luminous flux is incident on the concave mirror differs depending on the change in the correction power for correcting the optical refractive power of the eye E to be inspected. That is, when the subjective measurement is started, the display 31 moves according to the optical refractive power of the eye E to be inspected, so that the position where the luminous flux is incident on the concave mirror 85 changes. Further, for example, the position where the luminous flux is incident on the concave mirror 85 differs depending on the alignment state between the eye E to be inspected and the measuring means 7. That is, when the subjective measurement is started, the measuring means 7 moves with respect to the eye E to be inspected to perform the positioning, so that the position where the luminous flux is incident on the concave mirror 85 changes. Of course, the inclination of the image plane I of the image of the target luminous flux occurs if the target light flux emitted from the display 31 changes the position when it is incident on the concave mirror 85. Therefore, when the luminous flux emitted from the display 31 changes the position when it is incident on the concave mirror 85, it is preferable to correct the inclination of the image plane I.

Hereinafter, a case where the image plane I of the image of the target luminous flux is tilted due to a change in the correction power and a case where the image plane I of the image of the target luminous flux is tilted depending on the alignment state will be described in order.

<Correction of image plane based on correction power>
For example, when the image plane I of the image of the target luminous flux is tilted due to the change in the correction power, the control unit 70 receives the image of the target light flux projected on the fundus of the eye to be inspected based on the correction power of the correction optical system 60. The inclination of the image plane I is corrected. At this time, for example, the control unit 70 sets a correction amount for correcting the inclination of the image plane I of the image of the target luminous flux based on the correction power of the correction optical system 60. That is, the control unit 70 sets a correction amount for correcting the inclination of the image plane I of the image of the target luminous flux based on the position of the display 31 moved according to the optical refractive power of the eye E to be inspected.

For example, the memory 75 included in the control unit 70 stores a correction table for converting the correction power of the correction optical system 60 into a correction amount for correcting the inclination of the image plane I of the image of the target luminous flux. There is. For example, such a correction table may be preset for each correction frequency by conducting an experiment or a simulation. For example, the control unit 70 sets a correction amount corresponding to the correction power of the correction optical system 60 based on the correction table. In this embodiment, in order to correct the inclination of the image plane I of the image of the optotype luminous flux, a configuration in which the correction amount is set for each correction power of the correction optical system 60 has been described as an example. Not limited. For example, the correction power of the correction optical system 60 may be divided into predetermined steps (for example, 5D steps such as 0D to 5D, 5D to 10D, etc.), and the correction amount may be set for each step. ..

Further, the control unit 70 corrects the inclination of the image plane I of the image of the target luminous flux based on the set correction amount. For example, in this embodiment, the control unit 70 changes the angle of the surface of the display 31 with respect to the optical axis in the vertical and horizontal directions as described above, and the optotype luminous flux is inclined according to the correction power of the correction optical system 60. The inclination of the image plane I of the image of is corrected. As a result, the image plane I of the image of the luminous flux becomes substantially perpendicular to the optical axis L4 (optical axis L4L or optical axis L4R), and the eye E to be inspected has both the central region and the peripheral region of the optical axis. An in-focus optotype is presented.

<Correction of image plane depending on alignment state>
For example, when the image plane I of the image of the target luminous flux is tilted due to the movement of the measuring means 7 (that is, when the image plane I of the image of the target luminous flux is tilted depending on the alignment state), the control unit 70 measures. Based on the position information of the means 7, the inclination of the image plane I of the image of the luminous flux projected on the fundus of the eye to be inspected is corrected. At this time, for example, the control unit 70 acquires the position information of the measuring means 7. For example, as the position information of the measuring means 7, the movement amount of the measuring means 7 may be acquired, or the position coordinates of the measuring means 7 may be acquired. Further, for example, as the position information of the measuring means 7, the relative position information between the concave mirror 85 and the measuring means 7 may be acquired, or the relative position information between the eye to be inspected E and the measuring means 7 may be acquired. good. For example, in this case, the control unit 70 acquires the relative positional relationship between the concave mirror 85 or the eye E to be inspected and the measuring means 7. For example, such relative position information may be acquired by the control unit 70 detecting the position of the concave mirror 85 or the eye E to be inspected and the position of the measuring means 7, respectively.

In addition, for example, the position information of the measuring means 7 may be configured to utilize the position information changed by adjusting the entire position of the measuring means 7. Further, for example, as the position information of the measuring means 7, the position information changed by adjusting the position of at least one member (for example, a lens, a display, etc.) of the projection optical system 30 included in the measuring means 7 is used. It may be configured.
In the above description, the configuration for acquiring the position information of the measuring means 7 has been described as an example, but the configuration for acquiring the position information of the deflection mirror 81 may be used. For example, in this embodiment, since the polarizing mirror 81 and the measuring means 7 move integrally with each other to align with the eye E to be inspected, the movement amount and the position coordinates of the deflection mirror 81 are used indirectly. The position information of the measuring means 7 may be acquired.

For example, the control unit 70 sets a correction amount for correcting the inclination of the image plane I of the image of the target luminous flux based on the acquired position information of the measuring means 7. For example, the memory 75 included in the control unit 70 stores a correction table for converting the position information of the measuring means 7 into a correction amount for correcting the inclination of the image plane I of the image of the target luminous flux. .. For example, such a correction table may be preset by performing an experiment or a simulation. For example, the control unit 70 sets a correction amount corresponding to the position information of the measuring means 7 based on the correction table.

Further, for example, the control unit 70 corrects the inclination of the image plane I of the image of the target luminous flux based on the set correction amount. For example, in this embodiment, the control unit 70 changes the angle of the surface of the display 31 with respect to the optical axis in the vertical and horizontal directions as described above, and tilts the image plane of the image of the target luminous flux tilted depending on the alignment state. Correct I. As a result, the image plane I of the image of the luminous flux becomes substantially perpendicular to the optical axis L4 (optical axis L4L or optical axis L4R), and the eye E to be inspected has both the central region and the peripheral region of the optical axis. An in-focus optotype is presented.

In this embodiment, the image plane I of the image of the optotype light beam is tilted depending on the correction power of the correction optical system 60 and the alignment state between the eye E to be inspected and the measuring means 7. The explanation has been given with an example of correction in each case, but the present invention is not limited to this. Of course, in the subjective optometry device 1 in this embodiment, the image plane I of the image in the optotype luminous flux is determined in consideration of both the correction power of the correction optical system 60 and the alignment state between the eye to be inspected E and the measuring means 7. It may be configured to correct.

<Correction of distortion in the luminous flux>
For example, when the luminous flux passes through an optical path off the optical axis of the optical member (concave mirror 85 in this embodiment), the luminous flux projected on the fundus of the eye to be inspected is distorted. Therefore, in the following, correction of distortion in the target luminous flux projected on the fundus of the eye to be inspected will be described.

FIG. 11 is a diagram illustrating the distortion of the luminous flux. In this embodiment, for convenience of explanation, a grid BF having a basic shape having the same vertical size and horizontal size is displayed on the display 31 as an optotype and guided to the eye E to be inspected. do. For example, when the target luminous flux is distorted, even if the grid BF of the basic shape shown by the dotted line is displayed on the display 31, it seems that the grid TF of the deformed shape shown by the solid line is projected on the eye E to be inspected. That is, it seems that a grid whose vertical size and horizontal size are deformed due to the distortion of the target luminous flux is projected on the eye E to be inspected. Further, it seems that a grid moved in the rotational direction about the center S of the optotype is projected on the eye E to be inspected. For example, in FIG. 11, the size in the vertical direction is smaller than the size in the vertical direction and the size in the horizontal direction is larger than the grid BF of the basic shape, and the grid TF having a deformed shape rotated counterclockwise around the center S of the optotype is It looks like it is displayed on the display 31. The grid (target) projected on the eye E to be inspected is not necessarily deformed in all of the vertical, horizontal, and rotational directions, and the target light flux emitted from the display 31 is incident on the concave mirror 85. At least one of them is deformed depending on the position to be used.

Therefore, for example, the control unit 70 corrects the distortion of the target luminous flux caused by the passage of the target luminous flux through an optical path deviated from the optical axis of the optical member. In other words, for example, the control unit 70 corrects the distortion of the luminous flux projected on the fundus of the eye to be inspected. For example, in this embodiment, by deforming the optotype displayed on the display 31, it is possible to correct the distortion of the optotype luminous flux projected on the fundus of the eye to be inspected. More specifically, the optotype is deformed by performing at least one of processing of changing the vertical size of the optotype displayed on the display 31, changing the size in the horizontal direction, and moving the optotype. However, the distortion of the target luminous flux can be corrected.

FIG. 12 is a diagram illustrating correction of distortion in the target luminous flux. In FIG. 12, the grid (target) displayed on the display 31 is represented by a dotted line, and the grid (target) projected on the eye E to be inspected is represented by a solid line. For example, as described with reference to FIG. 11, even if the grid BF having a basic shape is displayed on the display 31, the target luminous flux is distorted, so that the grid TF having a deformed shape is projected on the eye E to be inspected. Therefore, for example, the control unit 70 displays on the display 31 an optotype for canceling such a distortion of the optotype luminous flux. For example, in this embodiment, the control unit 70 has a larger vertical size and a smaller horizontal size than the grid BF of the basic shape, and is further rotated clockwise around the center S of the optotype. The grid RF is displayed on the display 31 in advance. As a result, it is possible to correct the distortion of the target luminous flux guided toward the eye E to be inspected. That is, the correction grid RF displayed on the display 31 is distorted in its luminous flux, but the grid BF of the basic shape is projected on the eye E to be inspected.

Although not described in this embodiment, a correction grid RF that considers not only the distortion that deforms in the vertical, horizontal, and rotational directions of the optotype but also the distortion that deforms into a pincushion type or a barrel shape is displayed. It may be displayed in 31.

For example, as described above, the position where the luminous flux emitted from the display 31 is incident on the concave mirror 85 differs depending on the correction degree for correcting the optical refractive power of the eye E to be inspected. Further, as described above, the position where the luminous flux emitted from the display 31 is incident on the concave mirror 85 differs depending on the alignment state between the eye E to be inspected and the measuring means 7. Hereinafter, a case where the luminous flux is distorted due to a change in the correction power and a case where the luminous flux is distorted due to an alignment state will be described in order.

<Correction of distortion based on correction power>
For example, when the target luminous flux is distorted due to a change in the correction power, the control unit 70 corrects the distortion of the target light flux projected on the fundus of the eye to be inspected based on the correction power of the correction optical system 60. At this time, for example, the control unit 70 sets a correction amount for correcting the distortion of the target luminous flux based on the correction power of the correction optical system 60. That is, the control unit 70 sets a correction amount for correcting the distortion of the target luminous flux based on the position of the display 31 moved according to the optical refractive power of the eye E to be inspected.

For example, the memory 75 included in the control unit 70 stores a correction table for converting the correction power of the correction optical system 60 into a correction amount for correcting the distortion of the target luminous flux. For example, such a correction table may be preset by performing an experiment or a simulation. For example, the control unit 70 sets a correction amount corresponding to the correction power of the correction optical system 60 based on the correction table.

Further, the control unit 70 corrects the distortion of the luminous flux based on the set correction amount. For example, in the present embodiment, the control unit 70 performs a process of changing at least one of the vertical size, the horizontal size, and the movement of the optotype as described above. , Correct the distortion of the target luminous flux. As a result, the display 31 displays the correction grid RF for canceling the distortion of the target luminous flux that changes depending on the correction power of the correction optical system 60, and the grid BF of the basic shape is projected on the eye E to be inspected.

<Correction of distortion due to alignment state>
For example, when the luminous flux is distorted due to the alignment state (that is, when the luminous flux is distorted due to the movement of the measuring means 7 with respect to the eye E to be inspected), the control unit 70 is based on the position information of the measuring means 7. , Corrects the distortion of the luminous flux projected on the fundus of the eye to be inspected. For example, the alignment state is determined using the above-mentioned index images Ma to Mh (see FIG. 7), and the position of the measuring means 7 with respect to the eye E to be inspected is adjusted. For example, the control unit 70 acquires the position information of the measuring means 7 at this time. As the position information of the measuring means 7, the movement amount and the position coordinates of the measuring means 7 may be used as in the case of correcting the image plane I of the image of the optotype luminous flux, and the eye E to be inspected and the measuring means 7 may be used. You may use the position information relative to. Further, the position information of the measuring means 7 may be indirectly acquired by obtaining the position information of the deflection mirror 81.

For example, when the control unit 70 acquires the position information of the measuring means 7, the control unit 70 sets a correction amount for correcting the distortion of the luminous flux based on the position information. For example, the memory 75 included in the control unit 70 stores a correction table for converting the position information of the measuring means 7 into a correction amount for correcting the distortion of the target luminous flux. For example, such a correction table may be preset by performing an experiment or a simulation. For example, the control unit 70 sets a correction amount corresponding to the position information of the measuring means 7 based on the correction table.

Further, for example, the control unit 70 corrects the distortion of the target luminous flux based on the set correction amount. For example, in the present embodiment, the control unit 70 performs a process of changing at least one of the vertical size, the horizontal size, and the movement of the optotype as described above. , Correct the distortion of the target luminous flux. As a result, the display 31 displays the correction grid RF for canceling the distortion of the target luminous flux that changes depending on the alignment state, and the grid BF of the basic shape is projected on the eye E to be inspected.

In this embodiment, there is an example in which the distortion of the optotype luminous flux generated in each of the change in the correction power of the correction optical system 60 and the change in the alignment state between the eye E to be inspected and the measuring means 7 is corrected. However, it is not limited to this. Of course, in the subjective optometry device 1 in this embodiment, the distortion of the optotype luminous flux is corrected in consideration of both the correction power of the correction optical system 60 and the alignment state between the eye to be inspected E and the measuring means 7. May be good.

As described above, for example, the subjective optometry apparatus in the present embodiment corrects the inclination of the image plane of the image of the target luminous flux generated by the passage of the target luminous flux through an optical path off the optical axis of the optical member. Provide correction means. This makes it possible to subjectively measure the optical characteristics of the eye to be inspected in a state where the inclination of the image plane of the image of the luminous flux is reduced. Therefore, the examiner can accurately perform the subjective measurement for the eye to be inspected.

Further, for example, the subjective optometry apparatus in the present embodiment includes a correction means for correcting the distortion of the target luminous flux caused by the passage of the target luminous flux through an optical path deviated from the optical axis of the optical member. This makes it possible to subjectively measure the optical characteristics of the eye to be inspected in a state where the distortion of the luminous flux is reduced. Therefore, the examiner can accurately perform the subjective measurement for the eye to be inspected.

Further, for example, the subjective optometry apparatus in this embodiment corrects the inclination of the image plane of the image of the optotype luminous flux based on the correction power of the correction optical system. As a result, it is possible to suppress the inclination of the image plane of the image of the target luminous flux generated by changing the correction power of the correction optical system according to the refractive power of the eye to be inspected. Therefore, the examiner can accurately perform the subjective measurement for the eye to be inspected.

Further, for example, the subjective optometry apparatus in this embodiment corrects the distortion of the optotype light flux based on the correction power of the correction optical system. As a result, it is possible to suppress the distortion of the target luminous flux caused by the correction power of the correction optical system changing according to the refractive power of the eye to be inspected. Therefore, the examiner can accurately perform the subjective measurement for the eye to be inspected.

Further, for example, in the subjective optometry device in the present embodiment, the deviation detecting means for detecting the positional deviation of the target luminous flux, the moving means for moving the measuring unit based on the detection result of the displacement detecting means, and the position of the measuring unit. It is provided with a position information acquisition means for acquiring information. As a result, it is possible to suppress the inclination of the image plane of the image of the luminous flux that occurs when the eye to be inspected and the measuring means are aligned. Further, this makes it possible to suppress the distortion of the luminous flux of the optotype that occurs when the eye to be inspected and the measuring means are aligned. Therefore, the examiner can accurately perform the subjective measurement for the eye to be inspected.

Further, for example, the subjective optometry device in the present embodiment changes the angle of the surface of the display with respect to the optical axis based on the set correction amount. As a result, the examiner can easily correct the inclination of the image plane of the image of the luminous flux.
Further, for example, the subjective optometry device in the present embodiment deforms the optotype displayed on the display based on the set correction amount. This allows the examiner to easily correct the distortion of the luminous flux.

Further, for example, the subjective optometry device in the present embodiment uses an optical member to guide the target luminous flux or the image of the target luminous flux to the eye to be inspected so as to optically reach a predetermined inspection distance. Can be done. Therefore, the device can be miniaturized without requiring an extra member or space for guiding the image of the luminous flux to the eye to be inspected at an actual distance.

<Example of transformation>
The size of the optotype displayed on the display 31 seems to be slightly different depending on whether the eye E to be inspected looks at the display 31 from the front direction or the eye E to be inspected looks at the display 31 from an oblique direction. In some cases. That is, the optotype when the eye to be inspected E sees the display 31 from an oblique direction may look vertically or horizontally as compared to the optotype when the eye to be inspected E sees the display 31 from the front direction. For example, in this embodiment, the display 31 is arranged perpendicular to the optical axis, and the eye E to be inspected can see the display 31 from the front direction. However, for example, when correcting the inclination of the image plane I of the image in the luminous flux of the optotype, the angle of the surface of the display 31 with respect to the optical axis is changed, so that the eye E to be inspected is the optotype displayed on the display 31. Is viewed from an oblique direction, and the size of the optotype may appear to change.

Therefore, for example, the control unit 70 may be configured to correct the change in the size of the optotype as described above by adjusting the size of the optotype displayed on the display 31. For example, in this case, the control unit 70 may acquire a correction amount for correcting a change in the size of the optotype based on the angle at which the display 31 is tilted. Further, for example, the control unit 70 may adjust the size of the optotype displayed on the display 31 based on the acquired correction amount. As a result, even if the display 31 is tilted to correct the tilt of the image plane I of the image in the luminous flux, the eye E can be presented with an optotype having the same size as when the display 31 is viewed from the front. can.

In this embodiment, the configuration in which the control unit 70 acquires the correction amount corresponding to the correction power of the correction optical system 60 by using the correction table has been described as an example, but the present invention is not limited to this. For example, the control unit 70 may be configured to acquire a correction amount corresponding to the correction power of the correction optical system 60 from the calculation formula. In this case, for example, the arithmetic expression for performing the arithmetic processing is set by performing an experiment or a simulation in advance, and is stored in the memory 75 provided in the control unit 70. For example, the control unit 70 may be configured to acquire a correction amount corresponding to the correction power by using a calculation formula and perform calculation processing for correcting the image plane I of the image of the optotype luminous flux. Further, for example, the control unit 70 may be configured to acquire a correction amount corresponding to the correction power by using an arithmetic expression and perform arithmetic processing for correcting the distortion of the visual target luminous flux.

Similarly, in the present embodiment, the configuration in which the control unit 70 acquires the correction amount corresponding to the position information of the measuring means 7 by using the correction table has been described as an example, but it corresponds to the position information of the measuring means 7. It may be configured to acquire the corrected amount from the calculation formula. In this case, for example, the control unit 70 may perform arithmetic processing for correcting the image plane I of the image of the target luminous flux by using the arithmetic expression. Further, for example, the control unit 70 may perform arithmetic processing for correcting the distortion of the luminous flux using the arithmetic expression.

In this embodiment, a configuration in which the inclination of the image plane I of the image in the target luminous flux is corrected based on the correction power of the correction optical system 60 or according to the alignment state of the eye E to be inspected is given as an example. I explained, but it is not limited to this. For example, in this embodiment, the inclination of the image plane I of the image in the target luminous flux may be corrected based on the interpupillary distance of the eye E to be inspected. For example, the interpupillary distance of the eye E to be inspected is measured at the time of objective measurement and stored in the memory 75 included in the control unit 70.

For example, at the start of subjective measurement, the control unit 70 calls the interpupillary distance of the eye E to be inspected from the memory 75 and sets it. The interpupillary distance of the eye to be inspected E may be set by the examiner inputting the interpupillary distance to the monitor 4, or may be set by receiving the interpupillary distance acquired by another device. Alternatively, the configuration may be such that a predetermined interpupillary distance (for example, the average human interpupillary distance) is automatically set.

For example, the control unit 70 integrally moves the deflection mirror 81 and the measuring means 7 in the X direction according to the set interpupillary distance of the eye E to be inspected, and rotates the deflection mirror 81. For example, this causes the deflection mirror 81L for the left eye and the deflection mirror 81R for the right eye to move, respectively, and changes the distance between the deflection mirror 81L for the left eye and the deflection mirror 81R for the right eye. Therefore, the distance in the X direction between the optical path for the left eye and the optical path for the right eye can be changed according to the interpupillary distance of the eye E to be inspected.

For example, since the measuring means 7 moves depending on the interpupillary distance of the eye E to be inspected, the position where the luminous flux is incident on the concave mirror 85 changes, and the image plane I of the image of the luminous flux is tilted. .. Therefore, for example, the control unit 70 may use the position information of the measuring means 7 (for example, the movement amount and the position coordinates of the measuring means 7, the eye E to be inspected, and the measuring means 7) in the same manner as the correction of the image plane I due to the alignment state. The display 31 may be tilted based on (relative position information, etc.) to correct the tilt of the image plane I of the image of the optometric luminous flux.

In the above, the inclination of the image plane I of the image of the target luminous flux is corrected based on the interpupillary distance of the eye E to be inspected, but when the measuring means 7 moves depending on the interpupillary distance of the eye E to be inspected, The position where the luminous flux is incident on the concave mirror 85 changes, and the luminous flux is distorted. Therefore, for example, the control unit 70 determines the vertical size, the horizontal size, and the movement of the optotype based on the position information of the measuring means 7 in the same manner as the correction of the distortion due to the alignment state. And, at least one of them may be changed to correct the distortion of the target luminous flux.

Further, in this embodiment, a configuration in which the inclination of the image plane I of the image in the visual target light flux is corrected based on the correction power of the correction optical system 60 or according to the alignment state of the eye E to be inspected is given as an example. I explained, but it is not limited to this. For example, in this embodiment, the inclination of the image plane I of the image in the target luminous flux may be corrected based on the amount of convergence of the projection optical system 30.

For example, in this embodiment, the inclination of the image plane I of the image in the target luminous flux may be corrected based on the convergence angle. For example, the control unit 70 may control the projection optical system 30 to change the convergence angle of the deflection mirror 81. That is, the control unit 70 may change the amount of convergence (convergence angle) of the projection optical system 30 by rotating the deflection mirror 81.

For example, when the amount of congestion is changed, the polarizing mirror 81 rotates as described above, so that the position where the luminous flux is incident on the concave mirror 85 changes, and the image plane I of the image of the luminous flux is tilted. .. Therefore, for example, the control unit 70 may correct the inclination of the image plane I of the image in the target luminous flux based on the amount of convergence of the projection optical system 30. For example, in this embodiment, the control unit 70 uses both the amount of rotation of the deflection mirror 81 (for example, rotation angle, position information, position coordinates, etc.) and the position information of the measuring means 7, and the optotype. A correction amount for correcting the inclination of the image plane I of the image of the luminous flux is set. For example, the control unit 70 acquires and sets a correction amount according to the rotation amount of the deflection mirror 81 and the position information of the measuring means 7 from the memory 75. Note that, for example, the memory 75 may store a correction table for acquiring such a correction amount, or may store an arithmetic expression. As a result, the rotation amount of the deflection mirror 81 and the position information of the measuring means 7 are converted into the correction amount. Further, for example, the control unit 70 corrects the inclination of the image plane I of the image of the target luminous flux based on the set correction amount. For example, in this embodiment, as described above, the control unit 70 may correct the inclination I of the image plane of the image of the optotype luminous flux by changing the angle of the surface of the display 31 based on the correction amount. can.

In the above, the inclination of the image plane I of the image of the target luminous flux is corrected based on the amount of convergence of the projection optical system 30, but when the polarizing mirror 81 rotates with the change of the amount of convergence, The position where the luminous flux is incident on the concave mirror 85 changes, and the luminous flux is distorted. Therefore, for example, the control unit 70 may set a correction amount for correcting the distortion of the luminous flux using both the rotation amount of the deflection mirror 81 and the position information of the measuring means 7. .. For example, a correction table or an arithmetic expression for acquiring such a correction amount may be stored in the memory 75, and the rotation amount of the deflection mirror 81 and the position information of the measuring means 7 may be converted into the correction amount. For example, the control unit 70 performs a process of changing at least one of the vertical size, the horizontal size, and the movement of the optotype based on the set correction amount, and the optotype luminous flux is changed. Distortion can be corrected.

In this embodiment, the alignment state of the measuring means 7 in the left-right direction (X direction) and the vertical direction (Y direction) of the eye E to be inspected has been described, but the measuring means 7 in the front-back direction (Z direction) of the eye E to be inspected E has been described. The alignment state of may be taken into account. For example, in a state where the measuring means 7 is aligned in the Z direction of the eye E to be examined, the image interval a from the index image Ma to Me at infinity and the image from the index image Mh to Mf at finite distance shown in FIG. The interval b is set to have a certain ratio. For example, when the measuring means 7 is not aligned in the Z direction of the eye E to be infinity, the image spacing from the index image Ma to Me at infinity hardly changes, but the image from the index image Mh to Mf at finite distance. The interval changes. For example, the control unit 70 compares the image ratio (that is, a / b) between the image spacing a of the index images Ma and Me at infinity and the image spacing b of the index images Mh and Mf at finite distance. , It is possible to detect the positional deviation of the target luminous flux with respect to the eye E to be inspected in the Z direction. For details of the above configuration, refer to Japanese Patent Application Laid-Open No. 6-46999.

For example, the control unit 70 detects the positional deviation of the target luminous flux with respect to the eye E to be inspected in the X direction, the Y direction, and the Z direction, and moves the measuring means 7 based on this, and causes the eye to be inspected E and the measuring means 7 to move. You may try to align the. For example, in this embodiment, by integrally moving the polarizing mirror 81 and the measuring means 7 in the optical axis L4 direction, the alignment of the eye E to be inspected E can be performed in the Z direction (front-back direction).

For example, when the measuring means 7 moves in the X direction, the Y direction, and the Z direction, the position of the target luminous flux incident on the concave mirror 85 changes, so that the image of the target luminous flux guided to the eye E to be inspected changes. The image plane I is tilted. Therefore, for example, the control unit 70 may be configured to correct the image plane I of the image of the target luminous flux by using the position information of the measuring means 7 with respect to the eye E to be inspected in the X direction, the Y direction, and the Z direction. good. Similarly, for example, when the measuring means 7 moves in the X direction, the Y direction, and the Z direction, the position of the target luminous flux incident on the concave mirror 85 changes, so that the target luminous flux guided to the eye E to be inspected changes. Is distorted. Therefore, for example, the control unit 70 may be configured to correct the distortion of the target luminous flux by using the position information of the measuring means 7 with respect to the eye E to be inspected in the X direction, the Y direction, and the Z direction.

In this embodiment, a configuration in which the deflection mirror 81 and the measuring means 7 are integrally driven to adjust the alignment in the X direction, the Y direction, and the Z direction has been described as an example, but the present invention is limited to this. Not done. For example, in this embodiment, the positional relationship between the eye E to be inspected and the subjective measuring means and the objective measuring means may be adjusted by driving the deflection mirror 81 and the measuring means 7. That is, the configuration may be such that the X direction, the Y direction, and the Z direction can be adjusted so that the target luminous flux from the projection optical system 30 is formed on the fundus of the eye E to be inspected. For example, in this case, the optometry device 1 may be moved in the XYZ direction by providing the chin rest 5 with a structure in which the optometry device 1 can be moved. Further, for example, the deflection mirror 81 may be fixedly arranged and only the measuring means 7 may move. Further, for example, the X-direction, the Y-direction, and the Z-direction may be adjusted only by the deflection mirror 81. In this case, for example, the deflection mirror 81 may be rotationally driven and moved in the Z direction to change the distance between the deflection mirror 81 and the measuring means 7.

In this embodiment, the configuration in which the optical refractive power of the eye to be inspected E is acquired by the objective measurement optical system included in the subjective eye examination device 1 has been described as an example, but the present invention is not limited to this. For example, the optical power of the eye to be inspected E may be configured to be acquired by the subjective measurement optical system included in the subjective eye examination device 1. In this case, the correction power of the correction optical system 60 can be obtained by using the objective eye refractive power (objective value) as described in this embodiment, and the subjective eye refractive power obtained in the subjective measurement can be obtained. It can also be obtained using (awareness value). For example, the subjective value acquired during the subjective measurement may be stored in the memory 75 at any time, and the control unit 70 may call the subjective value according to the alignment state between the eye to be inspected E and the measuring means 7.

Further, in the present embodiment, the configuration in which the optical refractive power of the eye to be inspected E is acquired by the objective measurement optical system included in the subjective eye examination device 1 has been described as an example, but the present invention is not limited to this. For example, as the optical refractive power of the eye to be inspected E, the objective value or the subjective value of the eye to be inspected E acquired by another device may be used. For example, in this case, there is a configuration in which the subjective optometry device 1 is provided with a receiving function for receiving an optical refractive power from another device. Further, for example, in this case, the examiner may input the optical refractive power of the eye to be inspected E.

In this embodiment, a configuration in which the alignment between the eye to be inspected E and the measuring means 7 is performed before the start of the subjective measurement has been described as an example, but the present invention is not limited to this. For example, the alignment between the eye to be inspected E and the measuring means 7 may be configured to be performed even during the subjective measurement. For example, in this case, the control unit 70 detects the misalignment between the eye to be inspected E and the measuring means 7 at any time even after the alignment of the measuring means 7 with respect to the eye to be inspected E is completed, and XYZ of the eye to be inspected E. Tracking control (tracking) that constantly detects movement in a direction may be performed. For example, in the case of the subjective optometry device 1 having such a configuration, the control unit 70 constantly corrects the inclination of the image plane I of the image of the target luminous flux projected on the optometry subject as the optometry unit E moves. be able to. Further, in the case of the subjective optometry device 1 having such a configuration, the control unit 70 can always correct the distortion of the target luminous flux projected on the optometry object with the movement of the optometry E.

In this embodiment, a configuration in which the inclination of the image plane I of the image of the optotype luminous flux is corrected by changing the angle of the surface of the display 31 with respect to the optical axis has been described as an example. Not limited. For example, in this embodiment, the inclination of the image plane I of the image of the target luminous flux may be corrected by moving the optical member based on the set correction amount. For example, in this case, the optical member included in the floodlight optical system 30 may be used, or the optical member may be separately provided.

For example, when correcting the inclination of the image plane I of the image of the target light beam by using the optical member included in the light projecting optical system 30, the optical member is projected based on the correction amount set by the control unit 70. The optical system 30 may be tilted in the optical axis direction. For example, in this embodiment, the light projecting lens 33, the light projecting lens 34, the objective lens 14, and the like can be tilted as the optical member. In addition, these floodlight lenses and objective lenses may be configured to incline either of them, or may be configured to incline a plurality of them in combination.

Further, for example, when the inclination of the image plane I of the image of the target luminous flux is corrected by separately providing the optical member, the optical member is placed in the optical axis of the projection optical system 30 based on the set correction amount. You may insert and remove it. For example, the optical member may be inserted or removed anywhere on the optical axis through which the luminous flux guided from the display 31 to the eye E to be inspected passes. In other words, the optical member may be inserted or removed anywhere on the optical axis L2 and on the optical axis L3. For example, as such an optical member, a lens (convex lens, concave lens), a prism, a mirror, or the like can be used.

As described above, for example, the subjective optometry apparatus according to the present embodiment includes a moving optical member that can be moved in the optical path of the floodlight optical system and a driving means for moving the mobile optical member in the optical path of the floodlight optical system. Further, for example, the subjective optometry device in the present embodiment can move the moving optical member based on the correction amount. Therefore, the examiner can accurately correct the inclination of the image plane of the image of the luminous flux by arranging the optical member at an appropriate position with respect to the eye to be inspected.

In this embodiment, a configuration for correcting the distortion of the luminous flux of the optotype by deforming the optotype displayed on the display 31 in advance has been described as an example, but the present invention is not limited to this. For example, in this embodiment, the distortion of the luminous flux is corrected by moving the optical member based on the set correction amount, as in the case of correcting the inclination of the image plane I of the image of the luminous flux. You may. For example, in this case as well, the optical member included in the floodlight optical system 30 may be used, or the optical member may be provided separately.

For example, when the distortion of the target light beam is corrected by using the optical member included in the projectile optical system 30, any one of the projectile lens 33, the projectile lens 34, the objective lens 14, and the like is tilted. It may be a configuration in which a plurality of lenses are combined and tilted. Further, for example, when the distortion of the target luminous flux is corrected by separately providing an optical member, a lens (convex lens, concave lens), a prism, a mirror, or the like is inserted or removed on the optical axis through which the target luminous flux passes. May be. For example, the distortion of the luminous flux may be corrected by the control unit 70 tilting or inserting / removing the optical member based on the correction amount set in this way.

As described above, for example, the subjective optometry apparatus according to the present embodiment includes a moving optical member that can be moved in the optical path of the floodlight optical system and a driving means for moving the mobile optical member in the optical path of the floodlight optical system. Further, for example, the subjective optometry device in the present embodiment can move the moving optical member based on the correction amount. Therefore, the examiner can arrange the optical member at an appropriate position with respect to the eye to be inspected and correct the distortion of the luminous flux with high accuracy.

In this embodiment, the optotype light flux is generated by passing through an optical path deviating from the optical axis L of the optical member (concave mirror 85 in this embodiment) based on the correction dioptric power of the correction optical system 60. The configuration for correcting distortion has been described as an example, but the present invention is not limited to this. For example, when the optotype light beam passes through an optical path deviating from the optical axis L of the optical member, various aberrations such as astigmatism, spherical aberration, coma, chromatic aberration, and distortion are generated. For example, the control unit 70 in this embodiment may be configured to correct the above-mentioned aberration based on the correction power of the correction optical system 60.

1 Subjective eye examination device 2 Housing 4 Monitor 5 Jaw stand 7 Measuring means 10 Objective measurement optical system 25 Subjective measurement optical system 30 Floodlight optical system 45 1st index projection optical system 46 2nd index projection optical system 50 Observation optics System 60 Corrective optical system 70 Control unit 75 Memory 81 Deflection mirror 84 Reflection mirror 85 Concave mirror 90 Corrective optical system 100 Front eye image pickup optical system

Claims (6)

A projection optical system that projects the luminous flux toward the eye to be inspected,
A correction optical system arranged in the optical path of the projection optical system and changing the optical characteristics of the target luminous flux, and a correction optical system.
An optical member that guides the target luminous flux corrected by the correction optical system to the eye to be inspected, and an optical member.
Equipped with
The target luminous flux passes through an optical path off the optical axis of the optical member and is guided to the eye to be inspected, and the optical target light flux guided to the eye to be inspected is used to subjectively detect the optical characteristics of the eye to be inspected. It is a subjective optometry device for measuring light flux.
Based on the correction power of the correction optical system, a correction means for correcting the distortion of the target light flux caused by the target light flux passing through an optical path off the optical axis of the optical member, and a correction means.
A subjective optometry device characterized by being equipped with. In the subjective optometry device of claim 1,
A measurement unit that houses the floodlight optical system and
A deviation detecting means for detecting a positional deviation of the target luminous flux with respect to the eye to be inspected, and a deviation detecting means.
Equipped with
The correction means is a subjective optometry apparatus characterized in that distortion of the target luminous flux is corrected based on the detection result detected by the deviation detecting means. A projection optical system that projects the luminous flux toward the eye to be inspected,
A correction optical system arranged in the optical path of the projection optical system and changing the optical characteristics of the target luminous flux, and a correction optical system.
An optical member that guides the target luminous flux corrected by the correction optical system to the eye to be inspected, and an optical member.
Equipped with
The target luminous flux passes through an optical path off the optical axis of the optical member and is guided to the eye to be inspected, and the optical target light flux guided to the eye to be inspected is used to subjectively detect the optical characteristics of the eye to be inspected. It is a subjective optometry device for measuring light flux.
A measurement unit that houses the floodlight optical system and
A deviation detecting means for detecting a positional deviation of the target luminous flux with respect to the eye to be inspected, and a deviation detecting means.
Based on the detection result detected by the deviation detecting means, a correction means for correcting the distortion of the target luminous flux caused by the passage of the target luminous flux off an optical path off the optical axis of the optical member.
A subjective optometry device characterized by being equipped with. In the subjective optometry device according to any one of claims 1 to 3.
The floodlight optical system has a display, and when the optotype is displayed on the display, the optotype luminous flux is emitted.
The correction means is a subjective optometry apparatus characterized in that distortion of the target luminous flux is corrected by deforming the target displayed on the display. In the subjective optometry device according to any one of claims 1 to 4.
The correction means is a subjective optometry apparatus characterized in that it corrects an aberration caused by the target luminous flux passing through an optical path off the optical axis of the optical member based on the correction power of the correction optical system. .. A optometry program for operating a computer as the correction means in the optometry device according to any one of claims 1 to 5.

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