JP7021468B2 - レンズ測定装置 - Google Patents

レンズ測定装置 Download PDF

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Publication number
JP7021468B2
JP7021468B2 JP2017146366A JP2017146366A JP7021468B2 JP 7021468 B2 JP7021468 B2 JP 7021468B2 JP 2017146366 A JP2017146366 A JP 2017146366A JP 2017146366 A JP2017146366 A JP 2017146366A JP 7021468 B2 JP7021468 B2 JP 7021468B2
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Prior art keywords
lens
light
wavelength
light source
image
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JP2017146366A
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Japanese (ja)
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JP2018036255A (ja
JP2018036255A5 (enExample
Inventor
利朗 松本
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Nidek Co Ltd
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Nidek Co Ltd
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Priority to CN201710761802.8A priority Critical patent/CN107796596A/zh
Priority to EP17188491.9A priority patent/EP3290892B1/en
Publication of JP2018036255A publication Critical patent/JP2018036255A/ja
Publication of JP2018036255A5 publication Critical patent/JP2018036255A5/ja
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JP2017146366A 2016-08-30 2017-07-28 レンズ測定装置 Active JP7021468B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
CN201710761802.8A CN107796596A (zh) 2016-08-30 2017-08-30 透镜测定装置及透镜测定装置用标识板
EP17188491.9A EP3290892B1 (en) 2016-08-30 2017-08-30 Lens measurement device

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2016167996 2016-08-30
JP2016167996 2016-08-30

Publications (3)

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JP2018036255A JP2018036255A (ja) 2018-03-08
JP2018036255A5 JP2018036255A5 (enExample) 2020-08-06
JP7021468B2 true JP7021468B2 (ja) 2022-02-17

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JP2017146366A Active JP7021468B2 (ja) 2016-08-30 2017-07-28 レンズ測定装置

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JP (1) JP7021468B2 (enExample)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7143652B2 (ja) 2018-07-02 2022-09-29 株式会社ニデック 眼鏡測定システム及び眼鏡測定プログラム
CN114902030B (zh) * 2019-12-26 2025-08-19 尼德克株式会社 眼镜镜片测定装置及存储介质
JP7552016B2 (ja) * 2019-12-26 2024-09-18 株式会社ニデック 眼鏡レンズ測定装置
JP7574536B2 (ja) * 2019-12-26 2024-10-29 株式会社ニデック 眼鏡レンズ測定装置及び眼鏡レンズ測定プログラム

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1997025647A1 (en) 1996-01-10 1997-07-17 Kabushiki Kaisha Topcon Layout judgement apparatus and layout judgement system
JP2000079545A (ja) 1998-08-31 2000-03-21 Nidek Co Ltd カップ取付装置
JP2005091025A (ja) 2003-09-12 2005-04-07 Seiko Epson Corp レンズの固着装置及び方法
JP2007526996A (ja) 2003-07-17 2007-09-20 カール ツァイス ビジョン ゲーエムベーハー 眼鏡レンズ上のマークを可視化する方法および装置
US20150204756A1 (en) 2013-03-11 2015-07-23 Lumetrics, Inc. Apparatus and method for evaluation of optical elements

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2878583B2 (ja) * 1994-02-24 1999-04-05 株式会社トプコン レンズメータ
JPH10132707A (ja) * 1996-09-05 1998-05-22 Topcon Corp 隠しマーク観察装置とレンズメータ
JP3685886B2 (ja) * 1996-09-30 2005-08-24 株式会社トプコン レンズメーター
JPH10104120A (ja) * 1996-09-30 1998-04-24 Topcon Corp レンズメーター

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1997025647A1 (en) 1996-01-10 1997-07-17 Kabushiki Kaisha Topcon Layout judgement apparatus and layout judgement system
JP2000079545A (ja) 1998-08-31 2000-03-21 Nidek Co Ltd カップ取付装置
JP2007526996A (ja) 2003-07-17 2007-09-20 カール ツァイス ビジョン ゲーエムベーハー 眼鏡レンズ上のマークを可視化する方法および装置
JP2005091025A (ja) 2003-09-12 2005-04-07 Seiko Epson Corp レンズの固着装置及び方法
US20150204756A1 (en) 2013-03-11 2015-07-23 Lumetrics, Inc. Apparatus and method for evaluation of optical elements

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