JP7012451B2 - 付加製造のための断層撮影スキャナを用いる欠陥補正 - Google Patents
付加製造のための断層撮影スキャナを用いる欠陥補正 Download PDFInfo
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Description
[実施態様1]
付加製造システムフォーマットになっている物体の意図する3次元(3D)モデルに基づき、付加製造システム(100)を用いて物体(102)の部分(182)を形成することと、
断層撮影スキャナ(190)を用いて物体(102)の部分(182)をスキャンして、断層撮影スキャナ(190)フォーマットになっている物体(102)の部分(182)のスキャナモデル(180)を取得することと、
スキャナモデル(180)を断層撮影スキャナ(190)フォーマットから付加製造システム(100)フォーマットへと変換して、変換された断層撮影モデル(180)を取得することと、
変換された断層撮影モデル(180)を意図する3Dモデル(180)と比較して、物体(102)の部分(182)の欠陥(188)を特定することと、
物体(102)の部分(182)の欠陥(188)に対処するように意図する3Dモデル(180)を補正する、物体(102)の修正された3Dモデル(180)を生成することと、
を含む方法。
[実施態様2]
物体(102)の修正された3Dモデル(180)に基づき、付加製造システム(100)を用いて物体(102)の部分(182)を形成することをさらに含む、実施態様1記載の方法。
[実施態様3]
物体(102)の部分(182)が物体(102)の内部部分(182)を含み、変換された断層撮影モデル(180)が物体(102)の内部部分(182)のモデル(180)を含む、実施態様1記載の方法。
[実施態様4]
断層撮影スキャナ(190)がコンピュータ断層撮影(CT)スキャナを含む、実施態様1記載の方法。
[実施態様5]
スキャンすることが、スキャン中に、CTスキャナまたは物体(102)の少なくとも一方を回転させることを含む、実施態様4記載の方法。
[実施態様6]
断層撮影スキャナ(190)が、フェーズドアレイ超音波検査スキャナ、渦電流スキャナ、座標測定機械、構造化光スキャナ、フォトグラメトリシステム(100)、および放射線撮影システム(100)からなる組から選択される、実施態様1記載の方法。
[実施態様7]
スキャナモデル(180)および変換された断層撮影モデル(180M)が、部分(182)の3次元モデルを含む、実施態様1記載の方法。
[実施態様8]
付加製造システム(100)フォーマットが、Standard Tessellation Language(STL)フォーマットおよび付加製造ファイル(AMF)フォーマットから成る組から選択される、実施態様1記載の方法。
[実施態様9]
物体(102)の部分(182)の欠陥(188)に対処するように意図する3Dモデル(180)を補正する、物体(102)の修正された3Dモデル(180)を前記生成することが、意図する3Dモデル(180)において、寸法、表面仕上げ、張り出しの品質、および特徴分解能のうちの少なくとも1つを修正することを含む、実施態様1記載の方法。
[実施態様10]
付加製造システムフォーマットになっている物体の意図する3次元(3D)モデルに基づき、付加製造システム(100)を用いて物体(102)の部分(182)を形成することと、
コンピュータ断層撮影(CT)スキャナを用いて物体(102)の部分(182)をスキャンして、CTスキャナフォーマットになっている物体(102)の部分(182)のCTモデル(180C)を取得することと、
前記CTモデル(180C)をCTスキャナフォーマットから付加製造システム(100)フォーマットへと変換して、変換されたCTモデル(180C)を取得することと、
変換されたCTモデル(180C)を意図する3Dモデル(180)と比較して、物体(102)の部分(182)の欠陥(188)を特定することと、
物体(102)の部分(182)の欠陥(188)に対処するように意図する3Dモデル(180)を補正する、物体(102)の修正された3Dモデル(180)を生成することと、
を含む方法。
[実施態様11]
物体(102)の修正された3Dモデル(180)に基づき、付加製造システム(100)を用いて物体(102)の部分(182)を形成することをさらに含む、実施態様10記載の方法。
[実施態様12]
物体(102)の部分(182)が物体(102)の内部部分(182)を含み、CTモデル(180)が物体(102)の内部部分(182)のモデル(180)を含む、実施態様10記載の方法。
[実施態様13]
スキャンすることが、スキャン中に、CTスキャナのx線源または物体(102)の少なくとも一方を回転させることを含む、実施態様10記載の方法。
[実施態様14]
CTモデル(180C)および変換されたCTモデル(180C)が、部分(182)の3次元モデルを含む、実施態様10記載の方法。
[実施態様15]
付加製造システム(100)フォーマットが、Standard Tessellation Language(STL)フォーマットおよび付加製造ファイル(AMF)フォーマットから成る組から選択される、実施態様10記載の方法。
[実施態様16]
物体(102)の部分(182)の欠陥(188)に対処するように意図する3Dモデル(180)を補正する、物体(102)の修正された3Dモデル(180)を前記生成することが、意図する3Dモデル(180)において、寸法、表面仕上げ、張り出しの品質、および特徴分解能のうちの少なくとも1つを修正することを含む、実施態様10記載の方法。
102 物体
104 制御システム
106 AMプリンタ
108 コード
110 コンピュータ
111 モデル補正
112 メモリ
114 プロセッサ
116 入力/出力I/Oインタフェース
118 バス
120 I/Oデバイス
122 保存システム
130 処理チャンバ
132 金属粉末ベッド
134 レーザ
136 レーザ
138 レーザ光線
140 適用装置
142 原材料
144 チャンバ
150 ポンプ
152 流量弁システム
154 不活性ガス
160 気体混合物
170 フィルタ
180 モデル
182 部分
184 冷却ピラー
186 隣接するピラー
188 熱的欠陥
190 断層撮影スキャナ
102C 物体
102M 物体
108O コード
108S コンピュータ実行可能命令
138’ 仮想線のレーザ光線
180C モデル
180M 断層撮影モデル
182C 部分
182M 部分
Claims (11)
- 付加製造システムフォーマットの形態の物体(102)の所期の3次元(3D)モデル(180)に基づいて、付加製造システム(100)を用いて前記物体(102)の部分(182)を形成するステップと、
断層撮影スキャナ(190)を用いて前記物体(102)の前記部分(182)をスキャンして、断層撮影スキャナフォーマットの形態の前記物体(102)の前記部分(182)のスキャナモデル(180)を取得するステップと、
前記スキャナモデル(180)を断層撮影スキャナフォーマットから付加製造システムフォーマットへと変換して、変換された断層撮影モデル(180)を取得するステップと、
変換された断層撮影モデル(180)を所期の3Dモデル(180)と比較して、前記物体(102)の前記部分(182)の欠陥(188)を特定するステップと、
前記物体(102)の前記部分(182)の前記欠陥(188)に対処するように所期の3Dモデル(180)を補正するための前記物体(102)の修正された3Dモデル(180)を生成するステップと
を含む方法であって、
前記物体(102)の前記部分(182)が前記物体(102)の内部部分を含んでいて、前記変換された断層撮影モデル(180)が前記物体(102)の前記内部部分のモデル(180)を含み、
前記スキャナモデル(180)及び前記変換された断層撮影モデル(180M)が、前記部分(182)の3次元モデルを含む、方法。 - 前記物体(102)の修正された3Dモデル(180)に基づいて、付加製造システム(100)を用いて前記物体(102)の前記部分(182)を形成するステップをさらに含む、請求項1に記載の方法。
- 前記断層撮影スキャナ(190)がコンピュータ断層撮影(CT)スキャナを含む、請求項1又は請求項2に記載の方法。
- 前記スキャンするステップが、前記スキャン中に、前記CTスキャナ又は前記物体(102)の少なくとも一方を回転させるステップを含む、請求項3に記載の方法。
- 前記断層撮影スキャナ(190)が、フェーズドアレイ超音波検査スキャナ、渦電流スキャナ、座標測定機械、構造化光スキャナ、フォトグラメトリシステム(100)及び放射線撮影システム(100)からなる群から選択される、請求項1に記載の方法。
- 前記付加製造システムフォーマットが、Standard Tessellation Language(STL)フォーマット及び付加製造ファイル(AMF)フォーマットから成る組から選択される、請求項1に記載の方法。
- 前記物体(102)の前記部分(182)の前記欠陥(188)に対処するように所期の3Dモデル(180)を補正するための前記物体(102)の修正された3Dモデル(180)を生成するステップが、所期の3Dモデル(180)において、寸法、表面仕上げ、張り出しの品質及び特徴分解能のうちの少なくとも1つを修正するステップを含む、請求項1乃至請求項6のいずれか1項に記載の方法。
- 付加製造システムフォーマットの形態の物体(102)の所期の3次元(3D)モデル(180)に基づいて、付加製造システム(100)を用いて前記物体(102)の部分(182)を形成するステップと、
コンピュータ断層撮影(CT)スキャナを用いて前記物体(102)の前記部分(182)をスキャンして、CTスキャナフォーマットの形態の前記物体(102)の前記部分(182)のCTモデル(180C)を取得するステップと、
前記CTモデル(180C)を前記CTスキャナフォーマットから前記付加製造システムフォーマットへと変換して、変換されたCTモデル(180C)を取得するステップと、
前記変換されたCTモデル(180C)を所期の3Dモデル(180)と比較して、前記物体(102)の前記部分(182)の欠陥(188)を特定するステップと、
前記物体(102)の前記部分(182)の前記欠陥(188)に対処するように所期の3Dモデル(180)を補正する、前記物体(102)の修正された3Dモデル(180)を生成するステップと
を含む方法であって、前記物体(102)の前記部分(182C)が前記物体(102)の内部部分を含み、前記CTモデル(180C)が前記物体(102)の前記内部部分のモデル(180)を含み、
前記CTモデル(180C)及び前記変換されたCTモデル(180C)が、前記部分(182)の3次元モデルを含む、方法。 - 前記物体(102)の修正された3Dモデル(180)に基づいて、前記付加製造システム(100)を用いて前記物体(102)の前記部分(182)を形成するステップをさらに含む、請求項8に記載の方法。
- 前記スキャンするステップが、前記スキャン中に、前記CTスキャナのx線源又は前記物体(102)の少なくとも一方を回転させるステップを含む、請求項8に記載の方法。
- 前記付加製造システムフォーマットが、Standard Tessellation Language(STL)フォーマット及び付加製造ファイル(AMF)フォーマットから成る組から選択される、請求項8に記載の方法。
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