JP6911873B2 - 画像処理装置、顕微鏡システム、画像処理方法、及びプログラム - Google Patents

画像処理装置、顕微鏡システム、画像処理方法、及びプログラム Download PDF

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JP6911873B2
JP6911873B2 JP2018561782A JP2018561782A JP6911873B2 JP 6911873 B2 JP6911873 B2 JP 6911873B2 JP 2018561782 A JP2018561782 A JP 2018561782A JP 2018561782 A JP2018561782 A JP 2018561782A JP 6911873 B2 JP6911873 B2 JP 6911873B2
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microscope
image
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JPWO2018131172A1 (ja
Inventor
一郎 佐瀬
一郎 佐瀬
佐々木　豊
豊 佐々木
岡本　高明
高明 岡本
勇輝 照井
勇輝 照井
功記 小西
功記 小西
三村　正文
正文 三村
マーティン ベルガー，
マーティン ベルガー，
ペトル ガザック，
ペトル ガザック，
ミロスラフ スヴォボダ，
ミロスラフ スヴォボダ，
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Nikon Corp
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    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6456—Spatial resolved fluorescence measurements; Imaging
    • G01N21/6458—Fluorescence microscopy
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes
    • G02B21/367—Control or image processing arrangements for digital or video microscopes providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T5/00—Image enhancement or restoration
    • G06T5/50—Image enhancement or restoration using two or more images, e.g. averaging or subtraction
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/30—Determination of transform parameters for the alignment of images, i.e. image registration
    • G06T7/37—Determination of transform parameters for the alignment of images, i.e. image registration using transform domain methods
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/22—Optical, image processing or photographic arrangements associated with the tube
    • H01J37/222—Image processing arrangements associated with the tube
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
    • H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0076—Optical details of the image generation arrangements using fluorescence or luminescence
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/58—Optics for apodization or superresolution; Optical synthetic aperture systems
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10056—Microscopic image
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20048—Transform domain processing
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20212—Image combination
    • G06T2207/20221—Image fusion; Image merging
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/22—Treatment of data
    • H01J2237/226—Image reconstruction

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Multimedia (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Optics & Photonics (AREA)
  • Health & Medical Sciences (AREA)
  • Theoretical Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Image Processing (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Image Analysis (AREA)
JP2018561782A 2017-01-16 2017-01-16 画像処理装置、顕微鏡システム、画像処理方法、及びプログラム Active JP6911873B2 (ja)

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PCT/JP2017/001289 WO2018131172A1 (ja) 2017-01-16 2017-01-16 画像処理装置、顕微鏡システム、画像処理方法、及びプログラム

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US (1) US11442262B2 (https=)
EP (1) EP3570087A4 (https=)
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WO2022155096A1 (en) * 2021-01-12 2022-07-21 University Of Washington Apparatuses, systems and methods for generating synethettc image sets
JP7330240B2 (ja) * 2021-08-30 2023-08-21 本田技研工業株式会社 解析装置、解析方法、およびプログラム
DE112021008418T5 (de) * 2021-11-02 2024-08-22 Leica Microsystems Cms Gmbh Verfahren zur Bereitstellung von Positionsinformationen zum Auffinden einer Zielposition in einer mikroskopischen Probe, Verfahren zur Untersuchung und/oder Verarbeitung einer solchen Zielposition und Mittel zur Durchführung dieser Verfahren
JP7811608B2 (ja) * 2023-04-03 2026-02-05 エヴィデント テクノロジー センター ヨーロッパ ゲーエムベーハー 合成顕微鏡画像を記録するための方法、顕微鏡システム、およびコンピュータプログラム製品

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JP3350071B2 (ja) 1991-09-21 2002-11-25 株式会社東芝 磁気共鳴イメージング装置
US7738688B2 (en) * 2000-05-03 2010-06-15 Aperio Technologies, Inc. System and method for viewing virtual slides
US6683316B2 (en) * 2001-08-01 2004-01-27 Aspex, Llc Apparatus for correlating an optical image and a SEM image and method of use thereof
WO2005119575A2 (en) 2004-05-27 2005-12-15 Aperio Technologies, Inc Systems and methods for creating and viewing three dimensional virtual slides
AU2006203027B2 (en) * 2006-07-14 2009-11-19 Canon Kabushiki Kaisha Improved two-dimensional measurement system
DE102008054317A1 (de) * 2008-11-03 2010-05-06 Carl Zeiss Microlmaging Gmbh Kombinationsmikroskopie
JP2013152426A (ja) 2011-12-27 2013-08-08 Canon Inc 画像処理装置、画像処理システム、画像処理方法、およびプログラム
EP2929507A1 (en) 2012-12-07 2015-10-14 Canon Kabushiki Kaisha Image generating apparatus and image generating method
JP2015057682A (ja) 2013-08-12 2015-03-26 キヤノン株式会社 画像生成装置および画像生成方法
DE102014004249A1 (de) 2014-03-24 2015-09-24 Carl Zeiss Microscopy Gmbh Konfokales Mikroskop mit Aperturkorrelation
US9786057B2 (en) 2014-09-19 2017-10-10 Lasertec Coporation Inspection apparatus, coordinate detection apparatus, coordinate detection method, and wavefront aberration correction method
JP5843179B1 (ja) 2014-09-19 2016-01-13 レーザーテック株式会社 検査装置、及び波面収差補正方法

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JP2021184264A (ja) 2021-12-02
JPWO2018131172A1 (ja) 2019-12-12
EP3570087A1 (en) 2019-11-20
US20200218054A1 (en) 2020-07-09
US11442262B2 (en) 2022-09-13
EP3570087A4 (en) 2020-08-26
WO2018131172A1 (ja) 2018-07-19

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