JP6896459B2 - 自動分析装置及び自動分析方法 - Google Patents

自動分析装置及び自動分析方法 Download PDF

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JP6896459B2
JP6896459B2 JP2017042716A JP2017042716A JP6896459B2 JP 6896459 B2 JP6896459 B2 JP 6896459B2 JP 2017042716 A JP2017042716 A JP 2017042716A JP 2017042716 A JP2017042716 A JP 2017042716A JP 6896459 B2 JP6896459 B2 JP 6896459B2
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JP2018146431A (ja
JP2018146431A5 (https=
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信彦 佐々木
信彦 佐々木
創 山崎
創 山崎
飯島　昌彦
昌彦 飯島
佑斗 風間
佑斗 風間
足立　作一郎
作一郎 足立
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Hitachi High Tech Corp
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JP2017042716A 2017-03-07 2017-03-07 自動分析装置及び自動分析方法 Active JP6896459B2 (ja)

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JP2018146431A5 JP2018146431A5 (https=) 2020-01-30
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CN111595823A (zh) * 2020-03-09 2020-08-28 宁波普瑞柏生物技术股份有限公司 一种散射比浊测量仪
CN116625894A (zh) * 2023-05-26 2023-08-22 光子集成(温州)创新研究院 一种颗粒物检测系统与方法

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JPS61129153U (https=) * 1985-01-30 1986-08-13
CN102159934A (zh) * 2008-09-26 2011-08-17 株式会社堀场制作所 颗粒物性测量装置
JP5216051B2 (ja) * 2010-06-23 2013-06-19 株式会社日立ハイテクノロジーズ 自動分析装置および自動分析方法
CN103238062B (zh) * 2010-12-08 2016-04-20 株式会社日立高新技术 自动分析装置
EP2863206A4 (en) * 2012-06-14 2016-05-11 Nanjing Tuozhu Pharmaceutical & Tech Co Ltd SYSTEMS FOR ENDOTOXIN DETECTION AND DETECTION METHOD THEREFOR
JP6013796B2 (ja) * 2012-06-25 2016-10-25 株式会社日立ハイテクノロジーズ 自動分析装置及び試料測定方法
JP6183826B2 (ja) * 2013-03-12 2017-08-23 国立大学法人 筑波大学 光散乱体の光学的測定方法、光学的測定装置及び光学的記録媒体

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