JP6894360B2 - 逐次比較レジスタ型ａｄ変換器における利得較正方法、及び逐次比較レジスタ型アナログデジタル変換器 - Google Patents

逐次比較レジスタ型ａｄ変換器における利得較正方法、及び逐次比較レジスタ型アナログデジタル変換器 Download PDF

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JP6894360B2
JP6894360B2 JP2017234085A JP2017234085A JP6894360B2 JP 6894360 B2 JP6894360 B2 JP 6894360B2 JP 2017234085 A JP2017234085 A JP 2017234085A JP 2017234085 A JP2017234085 A JP 2017234085A JP 6894360 B2 JP6894360 B2 JP 6894360B2
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calibration
gain
signal
module
code
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JP2018098788A5 (enExample
JP2018098788A (ja
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ディン・ミン
ピーテル・ハルペ
リィ・ハンユエ
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Stichting Imec Nederland
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    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1009—Calibration
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1009—Calibration
    • H03M1/1014—Calibration at one point of the transfer characteristic, i.e. by adjusting a single reference value, e.g. bias or gain error
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/34—Analogue value compared with reference values
    • H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
    • H03M1/44—Sequential comparisons in series-connected stages with change in value of analogue signal
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/34—Analogue value compared with reference values
    • H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
    • H03M1/46—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Analogue/Digital Conversion (AREA)
JP2017234085A 2016-12-08 2017-12-06 逐次比較レジスタ型ａｄ変換器における利得較正方法、及び逐次比較レジスタ型アナログデジタル変換器 Active JP6894360B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP16202934.2A EP3334047B1 (en) 2016-12-08 2016-12-08 A method of gain calibration in a two-stage pipelined successive approximation register analog-to-digital converter and a two-stage pipelined successive approximation register analog-to-digital converter
EP16202934.2 2016-12-08

Publications (3)

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JP2018098788A JP2018098788A (ja) 2018-06-21
JP2018098788A5 JP2018098788A5 (enExample) 2021-02-25
JP6894360B2 true JP6894360B2 (ja) 2021-06-30

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US (1) US10050638B2 (enExample)
EP (1) EP3334047B1 (enExample)
JP (1) JP6894360B2 (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10425094B2 (en) * 2017-12-01 2019-09-24 Intel Corporation Method and apparatus for preventing inherent error propagation of successive approximation register analog-to-digital converter through digital correction
US10686463B1 (en) * 2019-02-14 2020-06-16 United States Of America As Represented By The Secretary Of The Air Force Method for calibration of digital readout with split counter and residual bits
CN110768671B (zh) * 2019-10-17 2022-04-22 西安交通大学 一种用于逐次逼近型模数转换器的片外校准方法及系统
CN112600557B (zh) * 2020-12-16 2023-08-01 东南大学 一种流水线adc数字域增益校准方法
CN113114247B (zh) * 2021-04-19 2022-05-24 电子科技大学 基于比较时间探测器的流水线adc级间增益校准方法

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5272481A (en) * 1991-07-02 1993-12-21 David Sarnoff Research Center, Inc. Successive approximation analog to digital converter employing plural feedback digital to analog converters
US7221299B2 (en) * 2004-06-12 2007-05-22 Nordic Semiconductor Asa Method and apparatus for an ADC circuit with wider input signal swing
US7378999B1 (en) * 2007-03-06 2008-05-27 Xilinx, Inc. Method and apparatus for digital calibration of an analog-to-digital converter
US8269657B2 (en) * 2009-06-26 2012-09-18 Intersil Americas Inc. Background calibration of offsets in interleaved analog to digital converters
US8040264B2 (en) * 2010-03-04 2011-10-18 Analog Devices, Inc. Pipeline analog to digital converter and a residue amplifier for a pipeline analog to digital converter
TWI545903B (zh) * 2011-03-17 2016-08-11 安娜卡敦設計公司 類比轉數位轉換器（ａｄｃ）之校正
US9059730B2 (en) * 2013-09-19 2015-06-16 Qualcomm Incorporated Pipelined successive approximation analog-to-digital converter
EP2953265B1 (en) * 2014-06-06 2016-12-14 IMEC vzw Method and circuit for bandwidth mismatch estimation in an a/d converter
US9219492B1 (en) * 2014-09-19 2015-12-22 Hong Kong Applied Science & Technology Research Institute Company, Limited Loading-free multi-stage SAR-assisted pipeline ADC that eliminates amplifier load by re-using second-stage switched capacitors as amplifier feedback capacitor
EP3059867B1 (en) * 2015-02-19 2020-07-08 Stichting IMEC Nederland Circuit and method for dac mismatch error detection and correction in an adc
JP2017005332A (ja) * 2015-06-05 2017-01-05 日本放送協会 巡回型ａｄ変換器、並びに巡回型ａｄ変換器用のデジタル補正器及びその方法
US9584150B2 (en) * 2015-07-07 2017-02-28 Infineon Technologies Ag Gain calibration for ADC with external reference
US9654132B2 (en) * 2015-07-08 2017-05-16 Marvell World Trade Ltd. Hybrid charge-sharing charge-redistribution DAC for successive approximation analog-to-digital converters
US9432044B1 (en) * 2015-12-18 2016-08-30 Texas Instruments Incorporated Mismatch correction of attenuation capacitor in a successive approximation register analog to digital converter
US9602119B1 (en) * 2016-02-09 2017-03-21 Applied Micro Circuits Corporation Gain calibration by applying a portion of an input voltage to voltage associated with a capacitor array

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Publication number Publication date
EP3334047B1 (en) 2021-04-21
US20180175874A1 (en) 2018-06-21
JP2018098788A (ja) 2018-06-21
US10050638B2 (en) 2018-08-14
EP3334047A1 (en) 2018-06-13

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