JP6893003B2 - 冷却器、半導体モジュール - Google Patents
冷却器、半導体モジュール Download PDFInfo
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- 239000002184 metal Substances 0.000 description 19
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- 239000000463 material Substances 0.000 description 10
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- 238000005452 bending Methods 0.000 description 2
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- 239000000919 ceramic Substances 0.000 description 2
- 239000000110 cooling liquid Substances 0.000 description 2
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- 238000010292 electrical insulation Methods 0.000 description 2
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- 238000004088 simulation Methods 0.000 description 2
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- -1 Al N Inorganic materials 0.000 description 1
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- 238000002637 fluid replacement therapy Methods 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- JEIPFZHSYJVQDO-UHFFFAOYSA-N iron(III) oxide Inorganic materials O=[Fe]O[Fe]=O JEIPFZHSYJVQDO-UHFFFAOYSA-N 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/48—Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the subgroups H01L21/06 - H01L21/326
- H01L21/4814—Conductive parts
- H01L21/4871—Bases, plates or heatsinks
- H01L21/4882—Assembly of heatsink parts
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/46—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements involving the transfer of heat by flowing fluids
- H01L23/473—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements involving the transfer of heat by flowing fluids by flowing liquids
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/02—Containers; Seals
- H01L23/04—Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls
- H01L23/053—Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls the container being a hollow construction and having an insulating or insulated base as a mounting for the semiconductor body
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/16—Fillings or auxiliary members in containers or encapsulations, e.g. centering rings
- H01L23/18—Fillings characterised by the material, its physical or chemical properties, or its arrangement within the complete device
- H01L23/24—Fillings characterised by the material, its physical or chemical properties, or its arrangement within the complete device solid or gel at the normal operating temperature of the device
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
- H01L23/49822—Multilayer substrates
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
- H01L25/03—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
- H01L25/04—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
- H01L25/07—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L29/00
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
- H01L25/18—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof the devices being of types provided for in two or more different subgroups of the same main group of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K7/00—Constructional details common to different types of electric apparatus
- H05K7/20—Modifications to facilitate cooling, ventilating, or heating
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/32225—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/36—Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
- H01L23/373—Cooling facilitated by selection of materials for the device or materials for thermal expansion adaptation, e.g. carbon
- H01L23/3735—Laminates or multilayers, e.g. direct bond copper ceramic substrates
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- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Chemical & Material Sciences (AREA)
- Dispersion Chemistry (AREA)
- Thermal Sciences (AREA)
- Manufacturing & Machinery (AREA)
- Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
- Cooling Or The Like Of Electrical Apparatus (AREA)
Description
次に、図2〜図3Bを参照して、本発明の実施の形態1に係る冷却器の詳細を説明する。なお、後述する冷却器の形状パラメータは、熱流体解析ソフトにより本発明の流路部の形状パラメータ等を変化させて、温度及び圧力損失を評価し、さらに、流路部を試作して検証することにより求めた。
次に、図4A〜図6を参照して、本発明の実施の形態2に係る冷却器の詳細を説明する。
2a〜2c 金属接合部材
3 配線基板
4 ピン
5 積層基板
7 冷却器
7a 天板
7b 底板
7c 側面枠
7d,7d’ 流路部
7d1〜7d6 板状フィン
7e 流入口
7f 流出口
8 樹脂
9 ケース
51 第1導電性板
52 絶縁基板
53 第2導電性板
100 半導体モジュール
Claims (7)
- 少なくとも天板と、底板とからなる流路部を有し、前記天板と前記底板との間に流体が流れる連続的な溝状の流路が形成された、半導体素子を冷却する冷却器において、
前記流路は、前記天板と平行でかつ前記流路に対して交差する方向から見たとき、前記流路の前記天板側の面及び前記底板側の面が、前記天板側及び前記底板側に同期して屈曲する波型形状をなし、
前記流路部は、前記天板と前記底板との間に配置された少なくとも1枚の板状フィンを有し、前記天板と前記底板との間に前記板状フィンで仕切られた複数の流路が上下方向に並列して形成され、
前記複数の流路は、前記天板と平行でかつ前記複数の流路に対して交差する方向から見たとき、前記複数の流路の前記天板側の面及び前記底板側の面が、前記天板側、前記底板側及び前記板状フィンの上下面に同期して屈曲する波型形状をなしていることを特徴とする冷却器。 - 少なくとも天板と、底板とからなる流路部を有し、前記天板と前記底板との間に流体が流れる連続的な溝状の流路が形成された、半導体素子を冷却する冷却器において、
前記流路は、前記天板と平行でかつ前記流路に対して交差する方向から見たとき、前記流路の前記天板側の面及び前記底板側の面が、前記天板側及び前記底板側に同期して屈曲する波型形状をなし、前記天板に対して垂直方向から見たとき、前記流路の両側面が同期して屈曲する波型形状をなしていることを特徴とする冷却器。 - 前記天板に対して垂直方向から見たときの前記流路の山と谷の間の間隔y1と、前記天板に対して平行でかつ前記流路に対して交差する方向から見たときの前記流路の山と谷の間の間隔y2とが等しいことを特徴とする請求項1又は2に記載の冷却器。
- 前記天板に対して垂直な方向から見たときの前記流路の波型形状と、前記天板に対して平行でかつ前記流路に対して交差する方向から見たときの前記流路の波型形状との位相差φが、0°+90°n≦φ≦30°+90°n、又は60°+90°n≦φ≦90°+90°n(n=0,1,2,3)の関係にあることを特徴とする請求項2又は3に記載の冷却器。
- 前記天板に対して垂直な方向から見たときの前記流路の振幅をx1、前記天板に対して平行でかつ前記流路に対して交差する方向から見たときの前記流路の振幅をz1としたとき、z1≦x1≦3z1の関係にあることを特徴とする請求項2から4のいずれか1項に記載の冷却器。
- 前記天板に対して垂直な方向から見たときの隣り合う前記流路の間隔をx2、前記流路の幅をx3としたとき、2x3≦x2の関係にあることを特徴とする請求項2から5のいずれか1項に記載の冷却器。
- 半導体素子と、
前記半導体素子を搭載し、絶縁基板の上面及び下面を導電性板で挟んだ積層基板と、
前記積層基板の前記半導体素子を搭載していない側と接合し、前記半導体素子を冷却する流体が流れる冷却器と、を備え、
前記冷却器は、請求項1から6のいずれか1項に記載の冷却器であることを特徴とする半導体モジュール。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
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JP2018150206 | 2018-08-09 | ||
JP2018150206 | 2018-08-09 | ||
PCT/JP2019/029428 WO2020031753A1 (ja) | 2018-08-09 | 2019-07-26 | 冷却器、半導体モジュール |
Publications (2)
Publication Number | Publication Date |
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JPWO2020031753A1 JPWO2020031753A1 (ja) | 2020-12-17 |
JP6893003B2 true JP6893003B2 (ja) | 2021-06-23 |
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JP2020536471A Active JP6893003B2 (ja) | 2018-08-09 | 2019-07-26 | 冷却器、半導体モジュール |
Country Status (4)
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US (1) | US11075144B2 (ja) |
JP (1) | JP6893003B2 (ja) |
CN (1) | CN111699554B (ja) |
WO (1) | WO2020031753A1 (ja) |
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2019
- 2019-07-26 WO PCT/JP2019/029428 patent/WO2020031753A1/ja active Application Filing
- 2019-07-26 CN CN201980011462.4A patent/CN111699554B/zh active Active
- 2019-07-26 JP JP2020536471A patent/JP6893003B2/ja active Active
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JPWO2020031753A1 (ja) | 2020-12-17 |
WO2020031753A1 (ja) | 2020-02-13 |
CN111699554A (zh) | 2020-09-22 |
CN111699554B (zh) | 2022-06-17 |
US20200365487A1 (en) | 2020-11-19 |
US11075144B2 (en) | 2021-07-27 |
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