JP6886394B2 - 逐次比較レジスタ型アナログデジタル変換器におけるデジタルアナログ変換器のミスマッチ較正方法、及び逐次比較レジスタ型アナログデジタル変換器 - Google Patents
逐次比較レジスタ型アナログデジタル変換器におけるデジタルアナログ変換器のミスマッチ較正方法、及び逐次比較レジスタ型アナログデジタル変換器 Download PDFInfo
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- JP6886394B2 JP6886394B2 JP2017234289A JP2017234289A JP6886394B2 JP 6886394 B2 JP6886394 B2 JP 6886394B2 JP 2017234289 A JP2017234289 A JP 2017234289A JP 2017234289 A JP2017234289 A JP 2017234289A JP 6886394 B2 JP6886394 B2 JP 6886394B2
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Classifications
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/10—Calibration or testing
- H03M1/1009—Calibration
- H03M1/1014—Calibration at one point of the transfer characteristic, i.e. by adjusting a single reference value, e.g. bias or gain error
- H03M1/1023—Offset correction
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/10—Calibration or testing
- H03M1/1009—Calibration
- H03M1/1033—Calibration over the full range of the converter, e.g. for correcting differential non-linearity
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
- H03M1/0617—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence
- H03M1/0675—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence using redundancy
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/10—Calibration or testing
- H03M1/1009—Calibration
- H03M1/1033—Calibration over the full range of the converter, e.g. for correcting differential non-linearity
- H03M1/1038—Calibration over the full range of the converter, e.g. for correcting differential non-linearity by storing corrected or correction values in one or more digital look-up tables
- H03M1/1047—Calibration over the full range of the converter, e.g. for correcting differential non-linearity by storing corrected or correction values in one or more digital look-up tables using an auxiliary digital/analogue converter for adding the correction values to the analogue signal
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/10—Calibration or testing
- H03M1/1071—Measuring or testing
- H03M1/108—Converters having special provisions for facilitating access for testing purposes
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/34—Analogue value compared with reference values
- H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
- H03M1/46—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter
- H03M1/462—Details of the control circuitry, e.g. of the successive approximation register
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/34—Analogue value compared with reference values
- H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
- H03M1/46—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter
- H03M1/466—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter using switched capacitors
- H03M1/468—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter using switched capacitors in which the input S/H circuit is merged with the feedback DAC array
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/34—Analogue value compared with reference values
- H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
- H03M1/44—Sequential comparisons in series-connected stages with change in value of analogue signal
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/34—Analogue value compared with reference values
- H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
- H03M1/46—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter
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- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Power Engineering (AREA)
- Analogue/Digital Conversion (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP16202932.6A EP3334049B1 (en) | 2016-12-08 | 2016-12-08 | A method of digital-to-analog converter mismatch calibration in a successive approximation register analog-to-digital converter and a successive approximation register analog-to-digital converter |
| EP16202932.6 | 2016-12-08 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2018098790A JP2018098790A (ja) | 2018-06-21 |
| JP2018098790A5 JP2018098790A5 (enExample) | 2021-02-18 |
| JP6886394B2 true JP6886394B2 (ja) | 2021-06-16 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2017234289A Active JP6886394B2 (ja) | 2016-12-08 | 2017-12-06 | 逐次比較レジスタ型アナログデジタル変換器におけるデジタルアナログ変換器のミスマッチ較正方法、及び逐次比較レジスタ型アナログデジタル変換器 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US10027339B2 (enExample) |
| EP (1) | EP3334049B1 (enExample) |
| JP (1) | JP6886394B2 (enExample) |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10009036B2 (en) * | 2016-09-09 | 2018-06-26 | Samsung Electronics Co., Ltd | System and method of calibrating input signal to successive approximation register (SAR) analog-to-digital converter (ADC) in ADC-assisted time-to-digital converter (TDC) |
| US10425094B2 (en) * | 2017-12-01 | 2019-09-24 | Intel Corporation | Method and apparatus for preventing inherent error propagation of successive approximation register analog-to-digital converter through digital correction |
| CN108462492B (zh) * | 2018-07-04 | 2024-07-05 | 珠海一微半导体股份有限公司 | 一种sar_adc系统失调电压的校正电路及校正方法 |
| TWI722321B (zh) * | 2018-09-21 | 2021-03-21 | 瑞昱半導體股份有限公司 | 數位類比轉換器裝置與電流控制方法 |
| US10523228B1 (en) * | 2018-12-18 | 2019-12-31 | Ipgreat Incorporated | Method of capacitive DAC calibration for SAR ADC |
| US12478264B2 (en) * | 2019-06-27 | 2025-11-25 | Rensselaer Polytechnic Institute | System for sensing arterial pulse waveform |
| CN110504967B (zh) * | 2019-08-30 | 2022-04-22 | 电子科技大学 | 一种流水线adc的级间增益失配校正方法 |
| WO2021239242A1 (en) * | 2020-05-29 | 2021-12-02 | Telefonaktiebolaget Lm Ericsson (Publ) | Pipelined successive approximation register analog-to-digital converter gain error estimation |
| KR20220050663A (ko) * | 2020-10-16 | 2022-04-25 | 삼성전자주식회사 | 펄스 진폭 변조에 기반된 데이터 신호를 수신하는 수신기 및 이를 포함하는 전자 장치 |
| CN119892079B (zh) * | 2025-03-26 | 2025-06-20 | 华中科技大学 | 一种基于rram对逐次逼近型模数转换器的数字前台校准系统及方法 |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8269657B2 (en) | 2009-06-26 | 2012-09-18 | Intersil Americas Inc. | Background calibration of offsets in interleaved analog to digital converters |
| US8040264B2 (en) | 2010-03-04 | 2011-10-18 | Analog Devices, Inc. | Pipeline analog to digital converter and a residue amplifier for a pipeline analog to digital converter |
| TWI545903B (zh) * | 2011-03-17 | 2016-08-11 | 安娜卡敦設計公司 | 類比轉數位轉換器（ａｄｃ）之校正 |
| JP6111662B2 (ja) * | 2012-12-28 | 2017-04-12 | 富士通株式会社 | アナログ／デジタル変換器 |
| US9059730B2 (en) * | 2013-09-19 | 2015-06-16 | Qualcomm Incorporated | Pipelined successive approximation analog-to-digital converter |
| EP2953265B1 (en) * | 2014-06-06 | 2016-12-14 | IMEC vzw | Method and circuit for bandwidth mismatch estimation in an a/d converter |
| US9219492B1 (en) * | 2014-09-19 | 2015-12-22 | Hong Kong Applied Science & Technology Research Institute Company, Limited | Loading-free multi-stage SAR-assisted pipeline ADC that eliminates amplifier load by re-using second-stage switched capacitors as amplifier feedback capacitor |
| EP3059867B1 (en) * | 2015-02-19 | 2020-07-08 | Stichting IMEC Nederland | Circuit and method for dac mismatch error detection and correction in an adc |
-
2016
- 2016-12-08 EP EP16202932.6A patent/EP3334049B1/en active Active
-
2017
- 2017-12-06 US US15/833,796 patent/US10027339B2/en active Active
- 2017-12-06 JP JP2017234289A patent/JP6886394B2/ja active Active
Also Published As
| Publication number | Publication date |
|---|---|
| EP3334049B1 (en) | 2021-04-21 |
| US10027339B2 (en) | 2018-07-17 |
| US20180167078A1 (en) | 2018-06-14 |
| EP3334049A1 (en) | 2018-06-13 |
| JP2018098790A (ja) | 2018-06-21 |
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