JP6880550B2 - 光干渉断層計 - Google Patents

光干渉断層計 Download PDF

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JP6880550B2
JP6880550B2 JP2016019365A JP2016019365A JP6880550B2 JP 6880550 B2 JP6880550 B2 JP 6880550B2 JP 2016019365 A JP2016019365 A JP 2016019365A JP 2016019365 A JP2016019365 A JP 2016019365A JP 6880550 B2 JP6880550 B2 JP 6880550B2
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JP2017136213A5 (https=
JP2017136213A (ja
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磯貝　直己
直己 磯貝
秀樹 青野
秀樹 青野
幸弘 樋口
幸弘 樋口
祐二 村瀬
祐二 村瀬
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Nidek Co Ltd
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Nidek Co Ltd
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Priority to US15/422,866 priority patent/US10238281B2/en
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JP2016019365A 2016-02-03 2016-02-03 光干渉断層計 Active JP6880550B2 (ja)

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JP2016019365A JP6880550B2 (ja) 2016-02-03 2016-02-03 光干渉断層計
US15/422,866 US10238281B2 (en) 2016-02-03 2017-02-02 Optical coherence tomography device

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JP2016019365A JP6880550B2 (ja) 2016-02-03 2016-02-03 光干渉断層計

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JP2017136213A JP2017136213A (ja) 2017-08-10
JP2017136213A5 JP2017136213A5 (https=) 2019-03-07
JP6880550B2 true JP6880550B2 (ja) 2021-06-02

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Families Citing this family (7)

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Publication number Priority date Publication date Assignee Title
JP7297133B2 (ja) * 2017-08-02 2023-06-23 株式会社トプコン 眼科情報処理装置及び眼科撮影装置
JP2019042264A (ja) * 2017-09-05 2019-03-22 株式会社トプコン 眼科撮影装置及び眼科情報処理装置
JP6976818B2 (ja) * 2017-10-30 2021-12-08 キヤノン株式会社 画像処理装置、画像処理方法及びプログラム
JP7135346B2 (ja) * 2018-03-06 2022-09-13 株式会社ニデック Ｏｃｔデータ処理装置およびｏｃｔデータ処理プログラム
CN115348833A (zh) * 2020-03-24 2022-11-15 徕卡仪器（新加坡）有限公司 手术显微镜系统和用于手术显微镜系统的系统、方法和计算机程序
EP4294254A1 (en) * 2021-02-22 2023-12-27 Alcon Inc. Tracking of retinal traction through digital image correlation
JP2022159135A (ja) * 2021-03-31 2022-10-17 株式会社ニデック Ｏｃｔ装置、ｏｃｔデータ処理方法、プログラム、および記録媒体

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* Cited by examiner, † Cited by third party
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JP2012156187A (ja) * 2011-01-24 2012-08-16 Canon Inc 光源装置及びこれを用いた撮像装置
JP2015134132A (ja) * 2014-01-20 2015-07-27 日立アロカメディカル株式会社 超音波診断装置
US11071452B2 (en) * 2014-06-30 2021-07-27 Nidek Co., Ltd. Optical coherence tomography device, optical coherence tomography calculation method, and optical coherence tomography calculation program
JP6535985B2 (ja) * 2014-06-30 2019-07-03 株式会社ニデック 光コヒーレンストモグラフィ装置、光コヒーレンストモグラフィ演算方法及び光コヒーレンストモグラフィ演算プログラム

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