JP6879592B2 - 半導体モジュール - Google Patents
半導体モジュール Download PDFInfo
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- JP6879592B2 JP6879592B2 JP2019521924A JP2019521924A JP6879592B2 JP 6879592 B2 JP6879592 B2 JP 6879592B2 JP 2019521924 A JP2019521924 A JP 2019521924A JP 2019521924 A JP2019521924 A JP 2019521924A JP 6879592 B2 JP6879592 B2 JP 6879592B2
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- 239000004065 semiconductor Substances 0.000 title claims description 23
- 230000015654 memory Effects 0.000 claims description 71
- 238000004891 communication Methods 0.000 claims description 21
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 6
- 229910052802 copper Inorganic materials 0.000 description 6
- 239000010949 copper Substances 0.000 description 6
- 239000000758 substrate Substances 0.000 description 4
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 3
- 229910052782 aluminium Inorganic materials 0.000 description 3
- 230000000694 effects Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
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- G06F1/02—Digital function generators
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- G11—INFORMATION STORAGE
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- G11C5/00—Details of stores covered by group G11C11/00
- G11C5/06—Arrangements for interconnecting storage elements electrically, e.g. by wiring
- G11C5/063—Voltage and signal distribution in integrated semi-conductor memory access lines, e.g. word-line, bit-line, cross-over resistance, propagation delay
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Description
そこで、メモリバンド幅を広げることができるとともに、消費電力を低減することで、データ転送効率を向上することができれば非常に有用である。
本実施形態に係る半導体モジュール1は、例えば、演算装置(以下、MPUという)と、積層型DRAMとをインタポーザ上に配置したSIP(system in a package)である。半導体モジュール1は、他のインタポーザ又はパッケージ基板上に配置され、マイクロバンプを用いて電気的に接続される。半導体モジュール1は、他のインタポーザ又はパッケージ基板から電源を得るとともに、他のインタポーザ又はパッケージ基板との間でデータ送受信が可能な装置である。
インタポーザ10は、板状に形成され、一方の面がバンプM1を用いて他のインタポーザ又はパッケージ基板に電気的に接続される。インタポーザ10は、後述する複数のルータ部30との間を接続する通信線12を他方の面に備える。通信線12は、インタポーザ10の板面に沿う第1方向F1に沿って配置される。また、インタポーザ10は、後述する演算部23と後述するメモリ部24とを接続する配線部26を備える。配線部26の詳細については後述する。
配線部26は、インタポーザ10上に構成される配線であり、インタポーザ10上において層状に配置される。配線部26は、第1方向F1において、サブセット部22の1つの演算部23の一端部と、1つのメモリ部24の一端部とを電気的に接続する。また、配線部26は、第2方向F2において、並設されるサブセット部22のそれぞれの位置に合わせて複数配置される。本実施形態において、配線部26は、2つの2μmピッチの銅パッド(図示せず)と、1μmピッチの銅又はアルミ配線(図示せず)とにより構成される。銅パッドは、1つのサブセット部22において、1つの演算部23の一端部と、1つのメモリ部24の一端部とのそれぞれに接続され、銅又はアルミ配線の両端部のそれぞれが2つの銅パッドに接続される。銅又はアルミ配線は、第1方向F1において、例えば0.2mmの長さL2で形成される。
図5に示すように、1つのサブセット部22において、演算部23及びメモリ部24は、配線部26により、メモリバンド幅128GB/sで接続される。1つのサブセット部22において、配線部26の第1方向F1一端から最も遠い位置に配置されたコア25までの距離L1は、1mmとなる。また、配線部26の第1方向F1に沿う長さL2は、0.2mmとなる。また、メモリ部24の厚さ方向の最大長さL3は、0.1mmとなる。そして、第2インタフェース部28から第1方向F1に沿って最も遠い位置のメモリブロックまでの距離L4は、1mmとなる。従って、1つのサブセット部22において、最大配線長は、2.3mmとなる。
(1)半導体モジュール1を、インタポーザ10と、インタポーザ10の板面に沿う第1方向F1に並設される複数の処理部本体21を有し、インタポーザ10に載置されるとともに、インタポーザ10と電気的に接続される処理部20と、を含んで構成した。また、処理部本体21を、少なくとも1つのコア25を含む1つの演算部23と積層型RAMモジュールで構成され、演算部23の第1方向F1に並設される1つのメモリ部24とを有するサブセット部22を複数含んで構成した。そして、複数のサブセット部22を、第1方向F1に対して交差する第2方向F2に並設した。これにより、演算部23のコア25とメモリ部24とを近接配置できるので、両者の接続距離を短くすることができる。これによりメモリバンド幅を広げることができ、データ通信に要する電力を削減できるので、データ転送効率を向上することができる。
10 インタポーザ
20 処理部
21 処理部本体
22 サブセット部
23 演算部
24 メモリ部
25 コア
27 第1インタフェース部
28 第2インタフェース部
F1 第1方向
F2 第2方向
Claims (2)
- インタポーザと、
前記インタポーザの板面に沿う第1方向に並設される複数の処理部本体と、前記処理部本体の第2方向に並設され、複数の前記処理部本体の間のデータ通信を中継するルータ部とを有する処理部であって、前記インタポーザに載置されるとともに、前記インタポーザと電気的に接続される処理部と、
を備え、
前記処理部本体は、少なくとも1つのコアを含む1つの演算部と積層型RAMモジュールで構成され前記演算部の第1方向に並設される1つのメモリ部とを有するサブセット部を複数備え、
前記インタポーザは、複数の前記ルータ部を接続する通信線を備え、
複数の前記サブセット部は、第1方向に対して交差する第2方向に並設されることを特徴とする半導体モジュール。 - 前記演算部は、並設される前記メモリ部に隣接する一端部に第1インタフェース部を備え、
前記メモリ部は、並設される前記演算部に隣接する一端部に第2インタフェース部を備える請求項1に記載の半導体モジュール。
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JP2021072722A JP7149647B2 (ja) | 2017-06-02 | 2021-04-22 | 半導体モジュール |
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PCT/JP2017/020690 WO2018220849A1 (ja) | 2017-06-02 | 2017-06-02 | 半導体モジュール |
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JP2021072722A Division JP7149647B2 (ja) | 2017-06-02 | 2021-04-22 | 半導体モジュール |
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JPWO2018220849A1 JPWO2018220849A1 (ja) | 2020-04-16 |
JP6879592B2 true JP6879592B2 (ja) | 2021-06-02 |
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JP2021072722A Active JP7149647B2 (ja) | 2017-06-02 | 2021-04-22 | 半導体モジュール |
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US11520388B2 (en) * | 2017-12-27 | 2022-12-06 | Intel Corporation | Systems and methods for integrating power and thermal management in an integrated circuit |
US20240318014A1 (en) | 2021-07-09 | 2024-09-26 | Tokyo Electron Limited | Pattern forming method and plasma processing method |
WO2024057707A1 (ja) * | 2022-09-12 | 2024-03-21 | 先端システム技術研究組合 | 半導体モジュール及びその製造方法 |
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JP2561261B2 (ja) * | 1987-02-18 | 1996-12-04 | 株式会社日立製作所 | バッファ記憶アクセス方法 |
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JP2006127460A (ja) * | 2004-06-09 | 2006-05-18 | Renesas Technology Corp | 半導体装置、半導体信号処理装置、およびクロスバースイッチ |
JP2006053662A (ja) * | 2004-08-10 | 2006-02-23 | Matsushita Electric Ind Co Ltd | 多重プロセッサ |
JP4989899B2 (ja) * | 2006-01-27 | 2012-08-01 | ルネサスエレクトロニクス株式会社 | 半導体演算処理装置 |
JP4989900B2 (ja) * | 2006-01-31 | 2012-08-01 | ルネサスエレクトロニクス株式会社 | 並列演算処理装置 |
JP5003097B2 (ja) * | 2006-10-25 | 2012-08-15 | ソニー株式会社 | 半導体チップ |
US9229887B2 (en) * | 2008-02-19 | 2016-01-05 | Micron Technology, Inc. | Memory device with network on chip methods, apparatus, and systems |
JP2010039625A (ja) * | 2008-08-01 | 2010-02-18 | Renesas Technology Corp | 並列演算装置 |
US8493089B2 (en) * | 2011-04-06 | 2013-07-23 | International Business Machines Corporation | Programmable logic circuit using three-dimensional stacking techniques |
US8704384B2 (en) * | 2012-02-17 | 2014-04-22 | Xilinx, Inc. | Stacked die assembly |
EP2812919B1 (en) * | 2012-02-08 | 2021-07-07 | Xilinx, Inc. | Stacked die assembly with multiple interposers |
US8704364B2 (en) * | 2012-02-08 | 2014-04-22 | Xilinx, Inc. | Reducing stress in multi-die integrated circuit structures |
US8984368B2 (en) * | 2012-10-11 | 2015-03-17 | Advanced Micro Devices, Inc. | High reliability memory controller |
US9024657B2 (en) * | 2012-10-11 | 2015-05-05 | Easic Corporation | Architectural floorplan for a structured ASIC manufactured on a 28 NM CMOS process lithographic node or smaller |
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JP7149647B2 (ja) | 2022-10-07 |
JP2021114353A (ja) | 2021-08-05 |
WO2018220849A1 (ja) | 2018-12-06 |
CN110730988A (zh) | 2020-01-24 |
JPWO2018220849A1 (ja) | 2020-04-16 |
CN110730988B (zh) | 2023-07-11 |
CN116884452A (zh) | 2023-10-13 |
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