JP6870406B2 - タンデム四重極型質量分析装置および該装置の制御パラメータ最適化方法 - Google Patents

タンデム四重極型質量分析装置および該装置の制御パラメータ最適化方法 Download PDF

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JP6870406B2
JP6870406B2 JP2017053970A JP2017053970A JP6870406B2 JP 6870406 B2 JP6870406 B2 JP 6870406B2 JP 2017053970 A JP2017053970 A JP 2017053970A JP 2017053970 A JP2017053970 A JP 2017053970A JP 6870406 B2 JP6870406 B2 JP 6870406B2
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measurement
quadrupole mass
value
voltage
mass filter
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JP2018156879A (ja
JP2018156879A5 (enrdf_load_stackoverflow
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善樹 田井中
善樹 田井中
博史 菅原
博史 菅原
徹 塩浜
徹 塩浜
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Shimadzu Corp
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JP2017053970A 2017-03-21 2017-03-21 タンデム四重極型質量分析装置および該装置の制御パラメータ最適化方法 Active JP6870406B2 (ja)

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CN113711332B (zh) 2019-06-06 2024-03-08 株式会社岛津制作所 质量分析装置及质量分析方法

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JP4822346B2 (ja) * 2006-10-31 2011-11-24 アジレント・テクノロジーズ・インク 誘導結合プラズマ質量分析装置のための診断及び較正システム
WO2013065173A1 (ja) * 2011-11-04 2013-05-10 株式会社島津製作所 質量分析装置
WO2013140558A1 (ja) * 2012-03-22 2013-09-26 株式会社島津製作所 質量分析装置
JP6176049B2 (ja) * 2013-10-11 2017-08-09 株式会社島津製作所 タンデム四重極型質量分析装置
CN105849858A (zh) * 2013-12-31 2016-08-10 Dh科技发展私人贸易有限公司 用于从多极装置移除所俘获的离子的方法

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