JP6869002B2 - 計測装置 - Google Patents

計測装置 Download PDF

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Publication number
JP6869002B2
JP6869002B2 JP2016207260A JP2016207260A JP6869002B2 JP 6869002 B2 JP6869002 B2 JP 6869002B2 JP 2016207260 A JP2016207260 A JP 2016207260A JP 2016207260 A JP2016207260 A JP 2016207260A JP 6869002 B2 JP6869002 B2 JP 6869002B2
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JP
Japan
Prior art keywords
unit
imaging
measuring device
region
image
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Active
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JP2016207260A
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English (en)
Japanese (ja)
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JP2018066712A5 (enExample
JP2018066712A (ja
Inventor
拓嗣 川中子
拓嗣 川中子
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Canon Inc
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Canon Inc
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Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP2016207260A priority Critical patent/JP6869002B2/ja
Priority to EP17195391.2A priority patent/EP3312591B1/en
Priority to US15/785,753 priority patent/US10634611B2/en
Publication of JP2018066712A publication Critical patent/JP2018066712A/ja
Publication of JP2018066712A5 publication Critical patent/JP2018066712A5/ja
Application granted granted Critical
Publication of JP6869002B2 publication Critical patent/JP6869002B2/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N21/474—Details of optical heads therefor, e.g. using optical fibres
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N7/00—Television systems
    • H04N7/18—Closed-circuit television [CCTV] systems, i.e. systems in which the video signal is not broadcast
    • H04N7/183—Closed-circuit television [CCTV] systems, i.e. systems in which the video signal is not broadcast for receiving images from a single remote source
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/57—Measuring gloss

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2016207260A 2016-10-21 2016-10-21 計測装置 Active JP6869002B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2016207260A JP6869002B2 (ja) 2016-10-21 2016-10-21 計測装置
EP17195391.2A EP3312591B1 (en) 2016-10-21 2017-10-09 Measuring apparatus
US15/785,753 US10634611B2 (en) 2016-10-21 2017-10-17 Measuring apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2016207260A JP6869002B2 (ja) 2016-10-21 2016-10-21 計測装置

Publications (3)

Publication Number Publication Date
JP2018066712A JP2018066712A (ja) 2018-04-26
JP2018066712A5 JP2018066712A5 (enExample) 2019-11-28
JP6869002B2 true JP6869002B2 (ja) 2021-05-12

Family

ID=60051400

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2016207260A Active JP6869002B2 (ja) 2016-10-21 2016-10-21 計測装置

Country Status (3)

Country Link
US (1) US10634611B2 (enExample)
EP (1) EP3312591B1 (enExample)
JP (1) JP6869002B2 (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6481188B1 (ja) * 2018-06-20 2019-03-13 スガ試験機株式会社 写像性測定器
US11034357B2 (en) 2018-09-14 2021-06-15 Honda Motor Co., Ltd. Scene classification prediction
US11195030B2 (en) 2018-09-14 2021-12-07 Honda Motor Co., Ltd. Scene classification
USD978685S1 (en) * 2020-02-14 2023-02-21 Proceq Ag Housing for glossmeter
USD962803S1 (en) * 2020-03-13 2022-09-06 Purdue Research Foundation Food allergen detector
JP2022187663A (ja) 2021-06-08 2022-12-20 富士フイルムビジネスイノベーション株式会社 表面検査装置及びプログラム
JP2023045476A (ja) * 2021-09-22 2023-04-03 富士フイルムビジネスイノベーション株式会社 表面検査装置及びプログラム

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5155558A (en) * 1990-09-19 1992-10-13 E. I. Du Pont De Nemours And Company Method and apparatus for analyzing the appearance features of a surface
JPH0771945A (ja) * 1992-08-07 1995-03-17 Kao Corp 表面性状測定方法及びその装置
JPH09178564A (ja) * 1995-12-21 1997-07-11 Shimadzu Corp 分光測定装置
DE69631475T2 (de) * 1996-07-16 2005-01-13 Perkin-Elmer Ltd., Beaconsfield Kontrolle einer Mikroskopblende
JP2001341288A (ja) * 2000-05-30 2001-12-11 Dainippon Printing Co Ltd 印刷物の測色方法及び装置
US6826424B1 (en) * 2000-12-19 2004-11-30 Haishan Zeng Methods and apparatus for fluorescence and reflectance imaging and spectroscopy and for contemporaneous measurements of electromagnetic radiation with multiple measuring devices
JP3470268B2 (ja) * 2001-07-17 2003-11-25 川崎重工業株式会社 目標抽出方法
DE102004034160A1 (de) * 2004-07-15 2006-02-09 Byk Gardner Gmbh Vorrichtung zur Untersuchung optischer Oberflächeneigenschaften
JP4797593B2 (ja) * 2005-03-10 2011-10-19 富士ゼロックス株式会社 光沢測定装置及びプログラム
JP2008151781A (ja) * 2007-12-03 2008-07-03 Olympus Corp 画像表示装置及び画像表示方法
JP5638234B2 (ja) * 2009-12-22 2014-12-10 ショットモリテックス株式会社 透明感測定装置および透明感測定方法
JP5738005B2 (ja) * 2011-03-01 2015-06-17 株式会社トプコン 光波距離測定装置
JP5989443B2 (ja) * 2012-07-31 2016-09-07 公立大学法人公立はこだて未来大学 半導体集積回路および物体距離計測装置
JP6049215B2 (ja) * 2014-01-16 2016-12-21 富士フイルム株式会社 光音響計測装置並びにそれに利用される信号処理装置および信号処理方法
JP6324114B2 (ja) * 2014-02-28 2018-05-16 キヤノン株式会社 光学系および光沢計
JP6099023B2 (ja) * 2014-05-29 2017-03-22 パナソニックＩｐマネジメント株式会社 プロジェクタシステム
US10798373B2 (en) * 2016-07-22 2020-10-06 Sharp Kabushiki Kaisha Display correction apparatus, program, and display correction system

Also Published As

Publication number Publication date
EP3312591B1 (en) 2020-12-16
US10634611B2 (en) 2020-04-28
EP3312591A1 (en) 2018-04-25
US20180113073A1 (en) 2018-04-26
JP2018066712A (ja) 2018-04-26

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