JP2018066712A5 - - Google Patents
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- JP2018066712A5 JP2018066712A5 JP2016207260A JP2016207260A JP2018066712A5 JP 2018066712 A5 JP2018066712 A5 JP 2018066712A5 JP 2016207260 A JP2016207260 A JP 2016207260A JP 2016207260 A JP2016207260 A JP 2016207260A JP 2018066712 A5 JP2018066712 A5 JP 2018066712A5
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- JP
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- Prior art keywords
- imaging
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- image
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- 238000003384 imaging method Methods 0.000 claims 20
- 238000005259 measurement Methods 0.000 claims 17
- 238000001514 detection method Methods 0.000 claims 7
- 230000001678 irradiating effect Effects 0.000 claims 2
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2016207260A JP6869002B2 (ja) | 2016-10-21 | 2016-10-21 | 計測装置 |
| EP17195391.2A EP3312591B1 (en) | 2016-10-21 | 2017-10-09 | Measuring apparatus |
| US15/785,753 US10634611B2 (en) | 2016-10-21 | 2017-10-17 | Measuring apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2016207260A JP6869002B2 (ja) | 2016-10-21 | 2016-10-21 | 計測装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2018066712A JP2018066712A (ja) | 2018-04-26 |
| JP2018066712A5 true JP2018066712A5 (enExample) | 2019-11-28 |
| JP6869002B2 JP6869002B2 (ja) | 2021-05-12 |
Family
ID=60051400
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2016207260A Active JP6869002B2 (ja) | 2016-10-21 | 2016-10-21 | 計測装置 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US10634611B2 (enExample) |
| EP (1) | EP3312591B1 (enExample) |
| JP (1) | JP6869002B2 (enExample) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6481188B1 (ja) * | 2018-06-20 | 2019-03-13 | スガ試験機株式会社 | 写像性測定器 |
| US11034357B2 (en) | 2018-09-14 | 2021-06-15 | Honda Motor Co., Ltd. | Scene classification prediction |
| US11195030B2 (en) | 2018-09-14 | 2021-12-07 | Honda Motor Co., Ltd. | Scene classification |
| USD978685S1 (en) * | 2020-02-14 | 2023-02-21 | Proceq Ag | Housing for glossmeter |
| USD962803S1 (en) * | 2020-03-13 | 2022-09-06 | Purdue Research Foundation | Food allergen detector |
| JP2022187663A (ja) | 2021-06-08 | 2022-12-20 | 富士フイルムビジネスイノベーション株式会社 | 表面検査装置及びプログラム |
| JP2023045476A (ja) * | 2021-09-22 | 2023-04-03 | 富士フイルムビジネスイノベーション株式会社 | 表面検査装置及びプログラム |
Family Cites Families (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5155558A (en) * | 1990-09-19 | 1992-10-13 | E. I. Du Pont De Nemours And Company | Method and apparatus for analyzing the appearance features of a surface |
| JPH0771945A (ja) * | 1992-08-07 | 1995-03-17 | Kao Corp | 表面性状測定方法及びその装置 |
| JPH09178564A (ja) * | 1995-12-21 | 1997-07-11 | Shimadzu Corp | 分光測定装置 |
| DE69631475T2 (de) * | 1996-07-16 | 2005-01-13 | Perkin-Elmer Ltd., Beaconsfield | Kontrolle einer Mikroskopblende |
| JP2001341288A (ja) * | 2000-05-30 | 2001-12-11 | Dainippon Printing Co Ltd | 印刷物の測色方法及び装置 |
| US6826424B1 (en) * | 2000-12-19 | 2004-11-30 | Haishan Zeng | Methods and apparatus for fluorescence and reflectance imaging and spectroscopy and for contemporaneous measurements of electromagnetic radiation with multiple measuring devices |
| JP3470268B2 (ja) * | 2001-07-17 | 2003-11-25 | 川崎重工業株式会社 | 目標抽出方法 |
| DE102004034160A1 (de) * | 2004-07-15 | 2006-02-09 | Byk Gardner Gmbh | Vorrichtung zur Untersuchung optischer Oberflächeneigenschaften |
| JP4797593B2 (ja) * | 2005-03-10 | 2011-10-19 | 富士ゼロックス株式会社 | 光沢測定装置及びプログラム |
| JP2008151781A (ja) * | 2007-12-03 | 2008-07-03 | Olympus Corp | 画像表示装置及び画像表示方法 |
| JP5638234B2 (ja) * | 2009-12-22 | 2014-12-10 | ショットモリテックス株式会社 | 透明感測定装置および透明感測定方法 |
| JP5738005B2 (ja) * | 2011-03-01 | 2015-06-17 | 株式会社トプコン | 光波距離測定装置 |
| JP5989443B2 (ja) * | 2012-07-31 | 2016-09-07 | 公立大学法人公立はこだて未来大学 | 半導体集積回路および物体距離計測装置 |
| JP6049215B2 (ja) * | 2014-01-16 | 2016-12-21 | 富士フイルム株式会社 | 光音響計測装置並びにそれに利用される信号処理装置および信号処理方法 |
| JP6324114B2 (ja) * | 2014-02-28 | 2018-05-16 | キヤノン株式会社 | 光学系および光沢計 |
| JP6099023B2 (ja) * | 2014-05-29 | 2017-03-22 | パナソニックＩｐマネジメント株式会社 | プロジェクタシステム |
| US10798373B2 (en) * | 2016-07-22 | 2020-10-06 | Sharp Kabushiki Kaisha | Display correction apparatus, program, and display correction system |
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2016
- 2016-10-21 JP JP2016207260A patent/JP6869002B2/ja active Active
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2017
- 2017-10-09 EP EP17195391.2A patent/EP3312591B1/en active Active
- 2017-10-17 US US15/785,753 patent/US10634611B2/en active Active