JP6841091B2 - 自覚式検眼装置 - Google Patents

自覚式検眼装置 Download PDF

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Publication number
JP6841091B2
JP6841091B2 JP2017042455A JP2017042455A JP6841091B2 JP 6841091 B2 JP6841091 B2 JP 6841091B2 JP 2017042455 A JP2017042455 A JP 2017042455A JP 2017042455 A JP2017042455 A JP 2017042455A JP 6841091 B2 JP6841091 B2 JP 6841091B2
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Japan
Prior art keywords
eye
inspected
optical system
correction
luminous flux
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Active
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JP2017042455A
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English (en)
Japanese (ja)
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JP2018143554A (ja
JP2018143554A5 (enExample
Inventor
通浩 滝井
通浩 滝井
昌明 羽根渕
昌明 羽根渕
永 越智
永 越智
献 立花
献 立花
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nidek Co Ltd
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Nidek Co Ltd
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Application filed by Nidek Co Ltd filed Critical Nidek Co Ltd
Priority to JP2017042455A priority Critical patent/JP6841091B2/ja
Priority to US15/913,029 priority patent/US10537239B2/en
Publication of JP2018143554A publication Critical patent/JP2018143554A/ja
Publication of JP2018143554A5 publication Critical patent/JP2018143554A5/ja
Application granted granted Critical
Publication of JP6841091B2 publication Critical patent/JP6841091B2/ja
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  • Eye Examination Apparatus (AREA)
JP2017042455A 2017-03-07 2017-03-07 自覚式検眼装置 Active JP6841091B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2017042455A JP6841091B2 (ja) 2017-03-07 2017-03-07 自覚式検眼装置
US15/913,029 US10537239B2 (en) 2017-03-07 2018-03-06 Subjective optometry apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2017042455A JP6841091B2 (ja) 2017-03-07 2017-03-07 自覚式検眼装置

Publications (3)

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JP2018143554A JP2018143554A (ja) 2018-09-20
JP2018143554A5 JP2018143554A5 (enExample) 2020-03-26
JP6841091B2 true JP6841091B2 (ja) 2021-03-10

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ID=63589029

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JP2017042455A Active JP6841091B2 (ja) 2017-03-07 2017-03-07 自覚式検眼装置

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JP (1) JP6841091B2 (enExample)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7223424B2 (ja) * 2019-07-12 2023-02-16 株式会社Ｑｄレーザ 視覚検査装置
US12285218B2 (en) 2019-08-22 2025-04-29 Zhejiang Aizhitong Medical Technology Co., Ltd. Subjective and objective integrated precise optometry device, and optometry method
GB2640379A (en) * 2020-06-26 2025-10-15 6Over6 Vision Ltd Subjective refraction exam system
JP7632073B2 (ja) 2021-05-21 2025-02-19 株式会社ニデック 自覚式検眼装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09253049A (ja) * 1996-03-27 1997-09-30 Canon Inc 検眼装置
JPH1147094A (ja) * 1997-08-05 1999-02-23 Canon Inc 検眼装置
JP5079575B2 (ja) * 2008-03-31 2012-11-21 株式会社ニデック 視標呈示装置
US9241624B2 (en) * 2013-10-31 2016-01-26 Huvitz Co., Ltd. Binocular visual simulator

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JP2018143554A (ja) 2018-09-20

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