JP6840232B2 - 真空チャンバ内でキャリアをアライメントするための装置、真空システム、ならびに真空チャンバ内でキャリアをアライメントする方法 - Google Patents
真空チャンバ内でキャリアをアライメントするための装置、真空システム、ならびに真空チャンバ内でキャリアをアライメントする方法 Download PDFInfo
- Publication number
- JP6840232B2 JP6840232B2 JP2019517292A JP2019517292A JP6840232B2 JP 6840232 B2 JP6840232 B2 JP 6840232B2 JP 2019517292 A JP2019517292 A JP 2019517292A JP 2019517292 A JP2019517292 A JP 2019517292A JP 6840232 B2 JP6840232 B2 JP 6840232B2
- Authority
- JP
- Japan
- Prior art keywords
- carrier
- alignment
- vacuum chamber
- support
- alignment system
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000000034 method Methods 0.000 title claims description 27
- 239000000969 carrier Substances 0.000 title claims description 26
- 239000000758 substrate Substances 0.000 claims description 97
- 238000005339 levitation Methods 0.000 claims description 72
- 238000013016 damping Methods 0.000 claims description 21
- 238000000151 deposition Methods 0.000 description 52
- 230000008021 deposition Effects 0.000 description 47
- 239000000463 material Substances 0.000 description 30
- 230000033001 locomotion Effects 0.000 description 13
- 239000011248 coating agent Substances 0.000 description 11
- 238000000576 coating method Methods 0.000 description 11
- CNQCVBJFEGMYDW-UHFFFAOYSA-N lawrencium atom Chemical compound [Lr] CNQCVBJFEGMYDW-UHFFFAOYSA-N 0.000 description 11
- 238000012546 transfer Methods 0.000 description 9
- 238000004519 manufacturing process Methods 0.000 description 8
- 239000011368 organic material Substances 0.000 description 6
- 230000008020 evaporation Effects 0.000 description 4
- 238000001704 evaporation Methods 0.000 description 4
- 238000002955 isolation Methods 0.000 description 4
- 230000009286 beneficial effect Effects 0.000 description 3
- 239000011521 glass Substances 0.000 description 3
- 230000005484 gravity Effects 0.000 description 3
- 238000001771 vacuum deposition Methods 0.000 description 3
- 238000005229 chemical vapour deposition Methods 0.000 description 2
- 230000007717 exclusion Effects 0.000 description 2
- 230000006870 function Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000005240 physical vapour deposition Methods 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 229920000049 Carbon (fiber) Polymers 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 239000005388 borosilicate glass Substances 0.000 description 1
- 239000004917 carbon fiber Substances 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 238000004590 computer program Methods 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000005137 deposition process Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- -1 etc.) Substances 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
- 239000011888 foil Substances 0.000 description 1
- 230000003100 immobilizing effect Effects 0.000 description 1
- 230000005415 magnetization Effects 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 230000015654 memory Effects 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000003014 reinforcing effect Effects 0.000 description 1
- 229910052594 sapphire Inorganic materials 0.000 description 1
- 239000010980 sapphire Substances 0.000 description 1
- 239000005361 soda-lime glass Substances 0.000 description 1
- 230000000087 stabilizing effect Effects 0.000 description 1
- 238000002207 thermal evaporation Methods 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/10—Deposition of organic active material
- H10K71/191—Deposition of organic active material characterised by provisions for the orientation or alignment of the layer to be deposited
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/04—Coating on selected surface areas, e.g. using masks
- C23C14/042—Coating on selected surface areas, e.g. using masks using masks
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/24—Vacuum evaporation
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/56—Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks
- C23C14/564—Means for minimising impurities in the coating chamber such as dust, moisture, residual gases
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/56—Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks
- C23C14/568—Transferring the substrates through a series of coating stations
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67259—Position monitoring, e.g. misposition detection or presence detection
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67703—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
- H01L21/67709—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations using magnetic elements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67703—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
- H01L21/67712—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations the substrate being handled substantially vertically
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
- H01L21/682—Mask-wafer alignment
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/10—Deposition of organic active material
- H10K71/16—Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering
- H10K71/164—Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering using vacuum deposition
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/10—Deposition of organic active material
- H10K71/16—Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering
- H10K71/166—Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering using selective deposition, e.g. using a mask
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Manufacturing & Machinery (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Physical Vapour Deposition (AREA)
- Electroluminescent Light Sources (AREA)
Description
Claims (14)
- 真空チャンバ(101)内でのキャリアアライメントのための装置(100)であって、
前記真空チャンバ(101)内で第1の方向(X)に延びる支持体(110)と、
第1のキャリア(10)を前記真空チャンバ(101)内で前記第1の方向(X)に搬送するように構成され、少なくとも1つの磁石ユニット(121)を備える磁気浮上システム(120)と、
前記第1のキャリア(10)をアライメントするためのアライメントシステム(130)であって、前記第1のキャリア(10)を前記アライメントシステム(130)に取り付けるための第1のマウント(152)と、本質的に水平であって前記第1の方向(X)を横切る第2の方向(Z)に前記第1のマウント(152)を移動させるように構成された第1のシフトデバイス(141)とを備える、アライメントシステム(130)と、
を備え、
前記少なくとも1つの磁石ユニット(121)および前記アライメントシステムが、前記支持体(110)に固定されている、装置(100)。 - 前記第1のシフトデバイス(141)の駆動ユニット(142)が、前記支持体(110)に固定された前記アライメントシステムの本体(131)に固定されており、前記第1のマウント(152)が、前記第1のシフトデバイス(141)の被駆動部(143)に設けられている、請求項1に記載の装置。
- 前記駆動ユニット(142)が、前記真空チャンバ(101)の外部に配置され、前記被駆動部(143)が、前記真空チャンバの側壁(102)を貫通して前記真空チャンバ(101)内に延びている、請求項2に記載の装置。
- 前記アライメントシステム(130)が、
前記第1のマウント(152)を少なくとも1つのアライメント方向に移動させるように構成されたアライメントデバイス(151)をさらに備え、前記第1のシフトデバイス(141)が、前記第1のマウント(152)と共に前記アライメントデバイス(151)を前記第2の方向(Z)に移動させるように構成されている、請求項1から3のいずれか一項に記載の装置。 - 前記アライメントシステム(130)が、前記真空チャンバの側壁(102)を貫通して延びており、少なくとも1つの振動減衰要素(103)を介して前記側壁に可撓的に接続されている、請求項1から4のいずれか一項に記載の装置。
- 前記支持体(110)が、前記真空チャンバ(101)の頂壁に固定された支持レールまたは支持桁として構成されている、請求項1から5のいずれか一項に記載の装置。
- 第2のキャリア(20)を前記第1のキャリア(10)と平行に前記第1の方向(X)に沿って搬送するように構成された第2の磁気浮上システム(122)をさらに備え、前記第2の磁気浮上システム(122)が、前記支持体(110)に固定された少なくとも1つの第2の磁石ユニット(123)を備える、請求項1から6のいずれか一項に記載の装置。
- 前記アライメントシステムが、
第2のキャリア(20)を前記アライメントシステムに取り付けるための第2のマウント(153)と、
前記第2のマウントを前記第2の方向(Z)に移動させるように構成された第2のシフトデバイス(144)と、
をさらに備える、請求項1から7のいずれか一項に記載の装置。 - 前記アライメントシステム(130)が、前記第1のキャリア(10)を、前記第1の方向(X)に対して横方向の第2の方向(Z)において、ならびに、前記第1の方向(X)ならびに前記第1および第2の方向に対して横方向の第3の方向(Y)のうちの少なくとも一方において、アライメントするための少なくとも1つのアライメントデバイス(151)を備える、請求項1または2に記載の装置。
- 頂壁および側壁(102)を有する真空チャンバ(101)と、
前記支持体(110)が、前記頂壁に設けられており、前記アライメントシステム(130)が、前記側壁を貫通して延び、前記側壁(102)に可撓的に接続されている、請求項1から9のいずれか一項に記載の装置と、
を備える真空システム。 - 真空チャンバ内でのキャリアアライメントのための装置(900)であって、
前記真空チャンバ(101)内で第1の方向(X)に延びる支持体(110)と、
第1のキャリア(10)を前記真空チャンバ(101)内で前記第1の方向(X)に搬送するように構成され、少なくとも1つの磁石ユニット(121)を備える磁気浮上システム(120)と、
第2のキャリア(20)を前記第1のキャリア(10)と平行に前記第1の方向(X)に搬送するように構成され、少なくとも1つの第2の磁石ユニット(123)を備える第2の磁気浮上システム(122)と、
前記第1のキャリア(10)を前記第2のキャリア(20)に対してアライメントするように構成されたアライメントシステム(130)であって、前記第1のキャリア(10)を前記アライメントシステム(130)に取り付けるための第1のマウント(152)と、本質的に水平であって前記第1の方向(X)を横切る第2の方向(Z)に前記第1のマウント(152)を移動させるように構成された第1のシフトデバイス(141)とを備える、アライメントシステム(130)と、
を備え、
前記少なくとも1つの磁石ユニット(121)および前記少なくとも1つの第2の磁石ユニット(123)が、前記支持体(110)に固定されている、装置(900)。 - 真空チャンバ(101)内でキャリアをアライメントする方法であって、
磁気浮上システム(120)を用いて、前記磁気浮上システムの少なくとも1つの磁石ユニット(121)が固定されている、第1の方向(X)に延びている支持体(110)に沿って、第1のキャリア(10)を前記第1の方向(X)に非接触で搬送することと、
前記支持体(110)に固定されているアライメントシステム(130)を用いて、前記第1のキャリア(10)を、本質的に水平であって前記第1の方向を横切る第2の方向(Z)において、アライメントすることであって、前記第1のキャリア(10)を前記アライメントシステム(130)の第1のマウント(152)に取り付けることと、前記アライメントシステム(130)の第1のシフトデバイス(141)を用いてマウントを前記第2の方向(Z)に移動させることとを含む、アライメントすることと、
を含む方法。 - アライメントすることが、
前記第1のシフトデバイスの被駆動部(143)に設けられたアライメントデバイス(151)を用いて前記第1のキャリアをアライメントすることをさらに含む、請求項12に記載の方法。 - 前記第1のキャリアが、基板(11)を保持する基板キャリアであり、前記第1のキャリアをアライメントすることが、第2のキャリア(20)に対して前記第1のキャリアをアライメントすることを含む、請求項12または13に記載の方法。
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/EP2018/058470 WO2019192679A1 (en) | 2018-04-03 | 2018-04-03 | Apparatus and vacuum system for carrier alignment in a vacuum chamber, and method of aligning a carrier |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2020518121A JP2020518121A (ja) | 2020-06-18 |
JP6840232B2 true JP6840232B2 (ja) | 2021-03-10 |
Family
ID=61911583
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2019517292A Active JP6840232B2 (ja) | 2018-04-03 | 2018-04-03 | 真空チャンバ内でキャリアをアライメントするための装置、真空システム、ならびに真空チャンバ内でキャリアをアライメントする方法 |
Country Status (6)
Country | Link |
---|---|
US (1) | US20210328146A1 (ja) |
JP (1) | JP6840232B2 (ja) |
KR (1) | KR102304434B1 (ja) |
CN (1) | CN110573646B (ja) |
TW (1) | TW201942405A (ja) |
WO (1) | WO2019192679A1 (ja) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102667205B1 (ko) * | 2019-06-14 | 2024-05-23 | 삼성디스플레이 주식회사 | 전자 부품 용 서포터 |
KR20210059549A (ko) * | 2019-11-15 | 2021-05-25 | 캐논 톡키 가부시키가이샤 | 성막장치 |
WO2021197586A1 (en) * | 2020-03-31 | 2021-10-07 | Applied Materials, Inc. | Carrier transportation apparatus, carrier transport system, processing system and method of transporting a carrier |
KR20220163265A (ko) * | 2021-06-02 | 2022-12-09 | 캐논 톡키 가부시키가이샤 | 반송 장치 및 성막 장치 |
JP7350104B2 (ja) * | 2021-06-02 | 2023-09-25 | キヤノントッキ株式会社 | 搬送装置及び成膜装置 |
JP7350029B2 (ja) * | 2021-06-15 | 2023-09-25 | キヤノントッキ株式会社 | 搬送装置及び成膜装置 |
KR102647140B1 (ko) | 2023-11-14 | 2024-03-13 | 주식회사 월드씨엔에스 | IoT 기반 실시간 이상 모니터링 및 진단이 가능한 LED 등기구 장치 및 시스템 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4072889B2 (ja) * | 2001-03-19 | 2008-04-09 | 新明和工業株式会社 | 真空成膜装置 |
KR100639003B1 (ko) * | 2005-01-05 | 2006-10-26 | 삼성에스디아이 주식회사 | 기판트레이홀더용 정렬장치 |
US20100044213A1 (en) * | 2008-08-25 | 2010-02-25 | Applied Materials, Inc. | Coating chamber with a moveable shield |
KR101569796B1 (ko) * | 2009-06-23 | 2015-11-20 | 주성엔지니어링(주) | 기판 정렬 장치, 이를 포함하는 기판 처리 장치 및 기판 정렬 방법 |
JP2012140671A (ja) * | 2010-12-28 | 2012-07-26 | Canon Tokki Corp | 成膜装置 |
US9899635B2 (en) * | 2014-02-04 | 2018-02-20 | Applied Materials, Inc. | System for depositing one or more layers on a substrate supported by a carrier and method using the same |
WO2017125123A1 (en) * | 2016-01-18 | 2017-07-27 | Applied Materials, Inc. | Apparatus for transportation of a substrate carrier in a vacuum chamber, system for vacuum processing of a substrate, and method for transportation of a substrate carrier in a vacuum chamber |
CN109154062B (zh) * | 2016-05-18 | 2021-10-26 | 应用材料公司 | 无接触对齐载具组件的方法、处理载具组件的基板的方法、和无接触对齐载具组件的设备 |
JP6262811B2 (ja) * | 2016-07-08 | 2018-01-17 | キヤノントッキ株式会社 | 真空成膜装置 |
-
2018
- 2018-04-03 KR KR1020197010779A patent/KR102304434B1/ko active IP Right Grant
- 2018-04-03 JP JP2019517292A patent/JP6840232B2/ja active Active
- 2018-04-03 WO PCT/EP2018/058470 patent/WO2019192679A1/en active Application Filing
- 2018-04-03 CN CN201880010796.5A patent/CN110573646B/zh active Active
- 2018-04-03 US US16/335,231 patent/US20210328146A1/en not_active Abandoned
-
2019
- 2019-03-18 TW TW108109153A patent/TW201942405A/zh unknown
Also Published As
Publication number | Publication date |
---|---|
KR102304434B1 (ko) | 2021-09-17 |
KR20190116967A (ko) | 2019-10-15 |
US20210328146A1 (en) | 2021-10-21 |
CN110573646A (zh) | 2019-12-13 |
CN110573646B (zh) | 2021-08-27 |
TW201942405A (zh) | 2019-11-01 |
WO2019192679A1 (en) | 2019-10-10 |
JP2020518121A (ja) | 2020-06-18 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP6840232B2 (ja) | 真空チャンバ内でキャリアをアライメントするための装置、真空システム、ならびに真空チャンバ内でキャリアをアライメントする方法 | |
TWI635192B (zh) | 用於傳輸載具或基板的設備及方法 | |
TWI671848B (zh) | 處理基板的設備、處理基板的系統以及真空室中對準基板載體和遮罩載體的方法 | |
KR102107973B1 (ko) | 진공 챔버 내의 기판을 프로세싱하기 위한 장치 및 시스템, 및 마스크 캐리어에 대해 기판 캐리어를 정렬하는 방법 | |
TW201836042A (zh) | 用於基板之真空處理的設備、用於基板之真空處理的系統、及用於在真空腔室中輸送基板載具和遮罩載具之方法 | |
TW201842694A (zh) | 用於一基板載體及一遮罩載體之定位配置、用於一基板載體及一遮罩載體之傳送系統、應用其之真空處理系統、及用於其之方法 | |
US20210335640A1 (en) | Holding device for holding a carrier or a component in a vacuum chamber, use of a holding device for holding a carrier or a component in a vacuum chamber, apparatus for handling a carrier in a vacuum chamber, and vacuum deposition system | |
TWI678421B (zh) | 真空腔室內加工基板之設備和系統及真空腔室內運輸載體之方法 | |
KR102167534B1 (ko) | 진공 챔버에서의 캐리어 정렬을 위한 장치 및 진공 시스템, 및 캐리어의 정렬 방법 | |
KR102215483B1 (ko) | 진공 챔버에서 캐리어를 핸들링하기 위한 장치, 진공 증착 시스템, 및 진공 챔버에서 캐리어를 핸들링하는 방법 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20190624 |
|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20190624 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20200825 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20201120 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20210119 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20210216 |
|
R150 | Certificate of patent or registration of utility model |
Ref document number: 6840232 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |