JP6812534B2 - ストリップ型超伝導体のパラメータを決定するための装置 - Google Patents

ストリップ型超伝導体のパラメータを決定するための装置 Download PDF

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JP6812534B2
JP6812534B2 JP2019500241A JP2019500241A JP6812534B2 JP 6812534 B2 JP6812534 B2 JP 6812534B2 JP 2019500241 A JP2019500241 A JP 2019500241A JP 2019500241 A JP2019500241 A JP 2019500241A JP 6812534 B2 JP6812534 B2 JP 6812534B2
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setting element
frequency setting
oscillator
receiver
strip
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JP2019527474A (ja
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ボルトンヤンスキー、アルノルト・レオニドビッチ
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State Atomic Energy Corp Rosatom
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State Atomic Energy Corp Rosatom
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/04Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
    • G01N27/14Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance of an electrically-heated body in dependence upon change of temperature
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/023Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance where the material is placed in the field of a coil
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01FMAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
    • H01F6/00Superconducting magnets; Superconducting coils
    • H01F6/06Coils, e.g. winding, insulating, terminating or casing arrangements therefor
    • HELECTRICITY
    • H02GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02HEMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
    • H02H9/00Emergency protective circuit arrangements for limiting excess current or voltage without disconnection
    • H02H9/02Emergency protective circuit arrangements for limiting excess current or voltage without disconnection responsive to excess current
    • H02H9/023Current limitation using superconducting elements
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N60/00Superconducting devices

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Electrochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Measuring Magnetic Variables (AREA)
  • Superconductor Devices And Manufacturing Methods Thereof (AREA)
  • Measuring Temperature Or Quantity Of Heat (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
JP2019500241A 2016-07-07 2017-07-07 ストリップ型超伝導体のパラメータを決定するための装置 Active JP6812534B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
RU2016127480A RU2628452C1 (ru) 2016-07-07 2016-07-07 Устройство для определения параметров ленточных сверхпроводников
RU2016127480 2016-07-07
PCT/RU2017/000501 WO2018009102A1 (ru) 2016-07-07 2017-07-07 Устройство для определения параметров ленточных сверхпроводников

Publications (2)

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JP2019527474A JP2019527474A (ja) 2019-09-26
JP6812534B2 true JP6812534B2 (ja) 2021-01-13

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JP2019500241A Active JP6812534B2 (ja) 2016-07-07 2017-07-07 ストリップ型超伝導体のパラメータを決定するための装置

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US (1) US10768134B2 (zh)
EP (1) EP3483597B1 (zh)
JP (1) JP6812534B2 (zh)
KR (1) KR102343670B1 (zh)
CN (1) CN109716120B (zh)
RU (1) RU2628452C1 (zh)
WO (1) WO2018009102A1 (zh)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU2628452C1 (ru) 2016-07-07 2017-08-16 Российская Федерация, от имени которой выступает Государственная корпорация по атомной энергии "Росатом" Устройство для определения параметров ленточных сверхпроводников

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1015153A (en) * 1961-09-26 1965-12-31 Standard Telephones Cables Ltd Rotation measuring device
US5015952A (en) * 1988-04-13 1991-05-14 University Of California Apparatus for characterizing conductivity of materials by measuring the effect of induced shielding currents therein
US5268646A (en) * 1988-04-13 1993-12-07 University Of California Patent, Trademark & Copyright Office Apparatus for characterizing conductivity of superconducting materials
DE3920076A1 (de) * 1989-06-20 1991-01-03 Siemens Ag Anordnung zur messung der sprungtemperatur von supraleitenden duennfilmen
US5134360A (en) * 1991-03-15 1992-07-28 The United States Of America As Represented By The United States Department Of Energy Apparatus and method for critical current measurements
RU2034286C1 (ru) * 1991-09-18 1995-04-30 Институт теплофизики Уральского отделения РАН Устройство для измерения объемной концентрации сверхпроводящих включений в высокотемпературных сверхпроводниковых материалах
JPH06117943A (ja) * 1992-10-02 1994-04-28 Canon Inc 温度測定方法、該温度測定方法を用いた装置およびエネルギー貯蔵装置
JP3867412B2 (ja) * 1998-09-03 2007-01-10 株式会社日立製作所 周波数変調信号受信方法及び装置
FR2810170B1 (fr) * 2000-06-09 2004-10-29 Thomson Csf Filtre coupe-bande autolimiteur
JP4149690B2 (ja) * 2000-08-30 2008-09-10 株式会社東芝 超電導フィルタ
CN1160565C (zh) * 2001-09-03 2004-08-04 西安交通大学 宽温窄阻带厚膜空/燃比传感器的制备方法
JP3845729B2 (ja) * 2002-06-10 2006-11-15 独立行政法人産業技術総合研究所 超伝導体の電流・電圧特性測定方法及び装置
JP3704549B2 (ja) * 2002-12-27 2005-10-12 独立行政法人産業技術総合研究所 超伝導膜の超伝導臨界電流特性の評価方法及びその装置
US8581587B2 (en) * 2011-05-10 2013-11-12 Vista Clara Inc. SNMR pulse sequence phase cycling
JP5904326B2 (ja) * 2012-01-06 2016-04-13 日本電子株式会社 Nmr装置のセットアップ方法
RU2556273C2 (ru) * 2013-11-05 2015-07-10 Российская Федерация, от имени которой выступает Государственная корпорация по атомной энергии "Росатом" Устройство для измерения температурных параметров сверхпроводников
CN204731348U (zh) * 2015-07-13 2015-10-28 天津大学 一种超导体特性测评仪
RU2628452C1 (ru) 2016-07-07 2017-08-16 Российская Федерация, от имени которой выступает Государственная корпорация по атомной энергии "Росатом" Устройство для определения параметров ленточных сверхпроводников

Also Published As

Publication number Publication date
KR102343670B1 (ko) 2021-12-24
US10768134B2 (en) 2020-09-08
EP3483597B1 (en) 2022-01-19
CN109716120A (zh) 2019-05-03
JP2019527474A (ja) 2019-09-26
KR20190026866A (ko) 2019-03-13
RU2628452C1 (ru) 2017-08-16
EP3483597A1 (en) 2019-05-15
WO2018009102A1 (ru) 2018-01-11
US20190145921A1 (en) 2019-05-16
EP3483597A4 (en) 2020-02-26
CN109716120B (zh) 2022-08-30

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