JP6797638B2 - 画像測定装置 - Google Patents

画像測定装置 Download PDF

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Publication number
JP6797638B2
JP6797638B2 JP2016215545A JP2016215545A JP6797638B2 JP 6797638 B2 JP6797638 B2 JP 6797638B2 JP 2016215545 A JP2016215545 A JP 2016215545A JP 2016215545 A JP2016215545 A JP 2016215545A JP 6797638 B2 JP6797638 B2 JP 6797638B2
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image
unit
work
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contact
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Japanese (ja)
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JP2018072267A (ja
JP2018072267A5 (enrdf_load_stackoverflow
Inventor
正 橋本
正 橋本
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Keyence Corp
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Keyence Corp
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  • Length Measuring Devices By Optical Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
JP2016215545A 2016-11-02 2016-11-02 画像測定装置 Expired - Fee Related JP6797638B2 (ja)

Priority Applications (1)

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JP2016215545A JP6797638B2 (ja) 2016-11-02 2016-11-02 画像測定装置

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JP2016215545A JP6797638B2 (ja) 2016-11-02 2016-11-02 画像測定装置

Publications (3)

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JP2018072267A JP2018072267A (ja) 2018-05-10
JP2018072267A5 JP2018072267A5 (enrdf_load_stackoverflow) 2019-10-24
JP6797638B2 true JP6797638B2 (ja) 2020-12-09

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JP2016215545A Expired - Fee Related JP6797638B2 (ja) 2016-11-02 2016-11-02 画像測定装置

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JP (1) JP6797638B2 (enrdf_load_stackoverflow)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2019199663A (ja) * 2018-05-16 2019-11-21 Juki株式会社 検査装置
JP7296186B2 (ja) * 2019-05-31 2023-06-22 株式会社ミツトヨ 形状測定システムおよびその制御方法
CN115605724A (zh) 2020-05-14 2023-01-13 株式会社东京精密（Jp） 形状测量设备及其控制方法

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0988505B1 (de) * 1997-06-12 2002-01-09 Werth Messtechnik GmbH Koordinatenmessgerät mit biegeelastischer Tasterverlängerung und optischem Sensor
JP4132308B2 (ja) * 1998-11-20 2008-08-13 株式会社キーエンス 形状測定器
JP2003148942A (ja) * 2001-11-16 2003-05-21 Tokyo Seimitsu Co Ltd スタイラス先端子検査装置
CN1329711C (zh) * 2005-09-14 2007-08-01 哈尔滨工业大学 基于双光纤耦合的微小内腔体尺寸测量装置与方法
DE102006001531A1 (de) * 2005-09-20 2007-03-22 Werth Messtechnik Gmbh Verfahren und Anordnung zur Messung von Strukturen eines Objekts
JP5101955B2 (ja) * 2006-09-20 2012-12-19 株式会社ミツトヨ 形状測定方法及び形状測定装置
JP5545691B2 (ja) * 2008-04-14 2014-07-09 株式会社ミツトヨ 形状測定方法及び形状測定装置
JP6147998B2 (ja) * 2012-12-03 2017-06-14 株式会社ミツトヨ 表面性状測定装置、表面性状測定方法およびプログラム
JP2015219169A (ja) * 2014-05-20 2015-12-07 リョーエイ株式会社 真円度測定用プローブ、真円度測定装置、及び真円度測定方法
JP2016085057A (ja) * 2014-10-23 2016-05-19 株式会社キーエンス 座標測定装置

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JP2018072267A (ja) 2018-05-10

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