JP6505538B2 - 自動分析装置、遺伝子検査装置及び温度制御方法 - Google Patents

自動分析装置、遺伝子検査装置及び温度制御方法 Download PDF

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JP6505538B2
JP6505538B2 JP2015146963A JP2015146963A JP6505538B2 JP 6505538 B2 JP6505538 B2 JP 6505538B2 JP 2015146963 A JP2015146963 A JP 2015146963A JP 2015146963 A JP2015146963 A JP 2015146963A JP 6505538 B2 JP6505538 B2 JP 6505538B2
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信彦 佐々木
信彦 佐々木
航 佐藤
航 佐藤
磯島　宣之
宣之 磯島
洋一郎 鈴木
洋一郎 鈴木
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Hitachi High Tech Corp
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JP2015146963A 2015-07-24 2015-07-24 自動分析装置、遺伝子検査装置及び温度制御方法 Active JP6505538B2 (ja)

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WO2021149465A1 (ja) * 2020-01-22 2021-07-29 富士フイルム株式会社 処理装置および測定システム
US20230107314A1 (en) 2020-03-17 2023-04-06 Hitachi High-Tech Corporation Automatic analyzer
WO2022210861A1 (ja) * 2021-03-31 2022-10-06 積水メディカル株式会社 自動分析装置の温調システム
JP7664106B2 (ja) * 2021-07-15 2025-04-17 株式会社日立ハイテク 自動分析装置
CN114964539B (zh) * 2022-05-18 2024-11-08 国创移动能源创新中心(江苏)有限公司 充电接口的健康状态检测方法、装置、车辆和充电桩
CN116219665B (zh) * 2023-02-09 2025-06-27 青岛富润达纺织有限公司 基于温速调节的染液工艺温度跟随控制方法

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JPS5862565A (ja) * 1981-10-09 1983-04-14 Sekonitsuku:Kk 液体温度制御方法
US9387478B2 (en) * 2012-08-17 2016-07-12 Lexmark International, Inc. Micro-fluidic modules on a chip for diagnostic applications
JP6078346B2 (ja) * 2013-01-07 2017-02-08 株式会社日立ハイテクノロジーズ 核酸増幅装置、温度制御方法、及び温度制御装置
JP6030490B2 (ja) * 2013-03-29 2016-11-24 株式会社日立ハイテクノロジーズ 核酸分析装置及びその温度制御方法

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