JP6496092B1 - 窒化アルミニウム質焼結体、および半導体保持装置 - Google Patents
窒化アルミニウム質焼結体、および半導体保持装置 Download PDFInfo
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- JP6496092B1 JP6496092B1 JP2018546571A JP2018546571A JP6496092B1 JP 6496092 B1 JP6496092 B1 JP 6496092B1 JP 2018546571 A JP2018546571 A JP 2018546571A JP 2018546571 A JP2018546571 A JP 2018546571A JP 6496092 B1 JP6496092 B1 JP 6496092B1
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- aluminum nitride
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- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 title claims abstract description 75
- 239000004065 semiconductor Substances 0.000 title claims abstract description 15
- 229910052782 aluminium Inorganic materials 0.000 claims abstract description 152
- 239000002245 particle Substances 0.000 claims abstract description 144
- 239000013078 crystal Substances 0.000 claims abstract description 54
- 229910052761 rare earth metal Inorganic materials 0.000 claims abstract description 32
- 229910052749 magnesium Inorganic materials 0.000 claims abstract description 24
- 229910052751 metal Inorganic materials 0.000 claims abstract description 9
- 229910052760 oxygen Inorganic materials 0.000 claims description 21
- 238000001179 sorption measurement Methods 0.000 claims description 12
- 229910020068 MgAl Inorganic materials 0.000 claims description 10
- 238000000921 elemental analysis Methods 0.000 claims description 9
- 238000002441 X-ray diffraction Methods 0.000 claims description 8
- 229910052757 nitrogen Inorganic materials 0.000 claims description 6
- 239000002184 metal Substances 0.000 claims description 5
- 239000002131 composite material Substances 0.000 abstract description 52
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 128
- 239000011777 magnesium Substances 0.000 description 56
- 239000000843 powder Substances 0.000 description 29
- 238000000034 method Methods 0.000 description 23
- 210000002381 plasma Anatomy 0.000 description 17
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 14
- 150000001875 compounds Chemical class 0.000 description 14
- 239000001301 oxygen Substances 0.000 description 14
- 238000001816 cooling Methods 0.000 description 13
- 238000010304 firing Methods 0.000 description 13
- 239000000919 ceramic Substances 0.000 description 12
- 239000006104 solid solution Substances 0.000 description 10
- 239000000395 magnesium oxide Substances 0.000 description 9
- CPLXHLVBOLITMK-UHFFFAOYSA-N magnesium oxide Inorganic materials [Mg]=O CPLXHLVBOLITMK-UHFFFAOYSA-N 0.000 description 9
- AXZKOIWUVFPNLO-UHFFFAOYSA-N magnesium;oxygen(2-) Chemical compound [O-2].[Mg+2] AXZKOIWUVFPNLO-UHFFFAOYSA-N 0.000 description 9
- 230000000630 rising effect Effects 0.000 description 9
- 239000000758 substrate Substances 0.000 description 9
- 239000007789 gas Substances 0.000 description 8
- 238000009413 insulation Methods 0.000 description 8
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 description 6
- FYYHWMGAXLPEAU-UHFFFAOYSA-N Magnesium Chemical compound [Mg] FYYHWMGAXLPEAU-UHFFFAOYSA-N 0.000 description 6
- 230000007797 corrosion Effects 0.000 description 6
- 238000005260 corrosion Methods 0.000 description 6
- 229910052736 halogen Inorganic materials 0.000 description 6
- 150000002367 halogens Chemical class 0.000 description 6
- -1 rare earth compound Chemical class 0.000 description 6
- 238000006243 chemical reaction Methods 0.000 description 5
- 229910001404 rare earth metal oxide Inorganic materials 0.000 description 5
- 239000002994 raw material Substances 0.000 description 5
- 239000011230 binding agent Substances 0.000 description 4
- 239000002223 garnet Substances 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- 239000011812 mixed powder Substances 0.000 description 4
- 150000003839 salts Chemical class 0.000 description 4
- 238000000177 wavelength dispersive X-ray spectroscopy Methods 0.000 description 4
- 230000015572 biosynthetic process Effects 0.000 description 3
- 230000007423 decrease Effects 0.000 description 3
- 238000010438 heat treatment Methods 0.000 description 3
- VTHJTEIRLNZDEV-UHFFFAOYSA-L magnesium dihydroxide Chemical compound [OH-].[OH-].[Mg+2] VTHJTEIRLNZDEV-UHFFFAOYSA-L 0.000 description 3
- 239000000347 magnesium hydroxide Substances 0.000 description 3
- 229910001862 magnesium hydroxide Inorganic materials 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
- 229910052727 yttrium Inorganic materials 0.000 description 3
- 229910052581 Si3N4 Inorganic materials 0.000 description 2
- 239000000654 additive Substances 0.000 description 2
- 230000000996 additive effect Effects 0.000 description 2
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 2
- 238000004458 analytical method Methods 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 2
- 239000007767 bonding agent Substances 0.000 description 2
- 238000004140 cleaning Methods 0.000 description 2
- 238000000280 densification Methods 0.000 description 2
- 238000005530 etching Methods 0.000 description 2
- 229910052731 fluorine Inorganic materials 0.000 description 2
- 238000005755 formation reaction Methods 0.000 description 2
- ZLNQQNXFFQJAID-UHFFFAOYSA-L magnesium carbonate Chemical compound [Mg+2].[O-]C([O-])=O ZLNQQNXFFQJAID-UHFFFAOYSA-L 0.000 description 2
- 229910001719 melilite Inorganic materials 0.000 description 2
- 150000002739 metals Chemical class 0.000 description 2
- 229910052750 molybdenum Inorganic materials 0.000 description 2
- 238000000465 moulding Methods 0.000 description 2
- 239000012299 nitrogen atmosphere Substances 0.000 description 2
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 2
- 230000035939 shock Effects 0.000 description 2
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 2
- 239000000243 solution Substances 0.000 description 2
- 229910052719 titanium Inorganic materials 0.000 description 2
- 239000010936 titanium Substances 0.000 description 2
- 229910052721 tungsten Inorganic materials 0.000 description 2
- 238000007088 Archimedes method Methods 0.000 description 1
- 229910052684 Cerium Inorganic materials 0.000 description 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 229910052692 Dysprosium Inorganic materials 0.000 description 1
- 229910052691 Erbium Inorganic materials 0.000 description 1
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 description 1
- 229910052765 Lutetium Inorganic materials 0.000 description 1
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 1
- 229910052779 Neodymium Inorganic materials 0.000 description 1
- 229910052772 Samarium Inorganic materials 0.000 description 1
- 229910004166 TaN Inorganic materials 0.000 description 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- 229910052769 Ytterbium Inorganic materials 0.000 description 1
- WBWJXRJARNTNBL-UHFFFAOYSA-N [Fe].[Cr].[Co] Chemical compound [Fe].[Cr].[Co] WBWJXRJARNTNBL-UHFFFAOYSA-N 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 239000011324 bead Substances 0.000 description 1
- 238000005219 brazing Methods 0.000 description 1
- 229910052791 calcium Inorganic materials 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 238000001739 density measurement Methods 0.000 description 1
- 238000007606 doctor blade method Methods 0.000 description 1
- 238000001312 dry etching Methods 0.000 description 1
- 238000001035 drying Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 238000001125 extrusion Methods 0.000 description 1
- 238000011049 filling Methods 0.000 description 1
- 239000011737 fluorine Substances 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000009775 high-speed stirring Methods 0.000 description 1
- 230000002706 hydrostatic effect Effects 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-M hydroxide Chemical compound [OH-] XLYOFNOQVPJJNP-UHFFFAOYSA-M 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 229910052746 lanthanum Inorganic materials 0.000 description 1
- 239000001095 magnesium carbonate Substances 0.000 description 1
- 229910000021 magnesium carbonate Inorganic materials 0.000 description 1
- 229910052748 manganese Inorganic materials 0.000 description 1
- 238000001465 metallisation Methods 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 239000011733 molybdenum Substances 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 239000012188 paraffin wax Substances 0.000 description 1
- 239000011238 particulate composite Substances 0.000 description 1
- 238000005240 physical vapour deposition Methods 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 229910052697 platinum Inorganic materials 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 238000005096 rolling process Methods 0.000 description 1
- 229910052594 sapphire Inorganic materials 0.000 description 1
- 239000010980 sapphire Substances 0.000 description 1
- 238000001004 secondary ion mass spectrometry Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 238000004611 spectroscopical analysis Methods 0.000 description 1
- 230000001629 suppression Effects 0.000 description 1
- 229910052718 tin Inorganic materials 0.000 description 1
- 239000011135 tin Substances 0.000 description 1
- 210000001519 tissue Anatomy 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
- 239000011800 void material Substances 0.000 description 1
- VWQVUPCCIRVNHF-UHFFFAOYSA-N yttrium atom Chemical compound [Y] VWQVUPCCIRVNHF-UHFFFAOYSA-N 0.000 description 1
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Abstract
Description
2:窒化アルミニウムの結晶粒子
3:希土類元素とAlとを含む複合酸化物の粒子
4:MgとAlとを含む複合酸窒化物の粒子
11:静電チャック
12:基体
13:静電吸着用電極
14:誘電体層
15:被固定物
16:吸着面
17:給電端子
18:接合材
Claims (4)
- Mgを含む窒化アルミニウムの結晶粒子と、
ガーネット型の結晶構造を有し、希土類元素とAlとを含む複合酸化物と、
局所元素分析によってMg、Al、OおよびNが検出され、MgAl 2 O 4 結晶とX線回折のピークが重なる粒子と、を含み、
前記窒化アルミニウムの結晶粒子間に、粒子状の前記複合酸化物、および前記局所元素分析によってMg、Al、OおよびNが検出され、MgAl 2 O 4 結晶とX線回折のピークが重なる粒子が点在している、窒化アルミニウム質焼結体。 - 前記複合酸化物が、前記希土類元素としてYを含む、請求項1に記載の窒化アルミニウム質焼結体。
- 前記窒化アルミニウムの結晶粒子に含まれる全金属元素を100mol%としたとき、前記窒化アルミニウムの結晶粒子に含まれるMgが、0.1mol%以上1.0mol%以下である、請求項1または2に記載の窒化アルミニウム質焼結体。
- 窒化アルミニウム質焼結体と、静電吸着用電極とを備え、
前記窒化アルミニウム質焼結体が、請求項1〜3の何れかに記載の窒化アルミニウム質焼結体である、半導体保持装置。
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JP2002220282A (ja) * | 2001-01-24 | 2002-08-09 | Tokuyama Corp | 窒化アルミニウム焼結体とその製造方法 |
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JP2014058418A (ja) * | 2012-09-14 | 2014-04-03 | Ngk Insulators Ltd | 積層構造体、半導体製造装置用部材及び積層構造体の製造方法 |
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JPH09263452A (ja) * | 1996-03-27 | 1997-10-07 | Kyocera Corp | 窒化アルミニウム質焼結体及びその製造方法 |
JP2002220282A (ja) * | 2001-01-24 | 2002-08-09 | Tokuyama Corp | 窒化アルミニウム焼結体とその製造方法 |
WO2012056917A1 (ja) * | 2010-10-25 | 2012-05-03 | 日本碍子株式会社 | 加熱装置 |
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JP2014058418A (ja) * | 2012-09-14 | 2014-04-03 | Ngk Insulators Ltd | 積層構造体、半導体製造装置用部材及び積層構造体の製造方法 |
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