JP6482886B2 - 分光特性測定装置及びその調整方法 - Google Patents

分光特性測定装置及びその調整方法 Download PDF

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JP6482886B2
JP6482886B2 JP2015015735A JP2015015735A JP6482886B2 JP 6482886 B2 JP6482886 B2 JP 6482886B2 JP 2015015735 A JP2015015735 A JP 2015015735A JP 2015015735 A JP2015015735 A JP 2015015735A JP 6482886 B2 JP6482886 B2 JP 6482886B2
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movable
fixed
reflecting surface
reflection surface
measurement light
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JP2016142523A (ja
JP2016142523A5 (enExample
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伊知郎 石丸
伊知郎 石丸
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Kagawa University NUC
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Kagawa University NUC
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JP2015015735A 2015-01-29 2015-01-29 分光特性測定装置及びその調整方法 Active JP6482886B2 (ja)

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JP2015015735A JP6482886B2 (ja) 2015-01-29 2015-01-29 分光特性測定装置及びその調整方法

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JP2016142523A JP2016142523A (ja) 2016-08-08
JP2016142523A5 JP2016142523A5 (enExample) 2017-11-30
JP6482886B2 true JP6482886B2 (ja) 2019-03-13

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Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7422413B2 (ja) * 2019-02-28 2024-01-26 国立大学法人 香川大学 分光測定装置

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6038625A (ja) * 1983-08-12 1985-02-28 Hitachi Ltd 二光束干渉計
JPS63168502A (ja) * 1986-12-30 1988-07-12 Shimadzu Corp 干渉計の調整装置
JPS63168522A (ja) * 1986-12-30 1988-07-12 Shimadzu Corp 干渉計の調整装置
JP2582007Y2 (ja) * 1991-02-27 1998-09-30 株式会社東芝 干渉計
US5546185A (en) * 1994-09-23 1996-08-13 Kabushiki Kaisha Toshiba Angle detecting apparatus for detecting angle of inclination of scanning mirror provided on michelson interferometer
JP5078004B2 (ja) * 2007-06-15 2012-11-21 国立大学法人 香川大学 分光計測装置及び分光計測方法
JP5648961B2 (ja) * 2011-02-28 2015-01-07 国立大学法人 香川大学 分光特性測定装置及びその校正方法
EP2982949B1 (en) * 2012-10-05 2020-04-15 National University Corporation Kagawa University Spectroscopic measurement device

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