JP6461481B2 - 電気的障害を検出または予測するための方法 - Google Patents
電気的障害を検出または予測するための方法 Download PDFInfo
- Publication number
- JP6461481B2 JP6461481B2 JP2014076587A JP2014076587A JP6461481B2 JP 6461481 B2 JP6461481 B2 JP 6461481B2 JP 2014076587 A JP2014076587 A JP 2014076587A JP 2014076587 A JP2014076587 A JP 2014076587A JP 6461481 B2 JP6461481 B2 JP 6461481B2
- Authority
- JP
- Japan
- Prior art keywords
- signal
- failure
- node
- transmission signal
- threshold
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/08—Locating faults in cables, transmission lines, or networks
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
- G01R31/67—Testing the correctness of wire connections in electric apparatus or circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16566—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533
- G01R19/1659—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533 to indicate that the value is within or outside a predetermined range of values (window)
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/005—Testing of electric installations on transport means
- G01R31/008—Testing of electric installations on transport means on air- or spacecraft, railway rolling stock or sea-going vessels
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Monitoring And Testing Of Exchanges (AREA)
- Telephonic Communication Services (AREA)
- Locating Faults (AREA)
- Emergency Protection Circuit Devices (AREA)
- Monitoring And Testing Of Transmission In General (AREA)
Description
4 ノード
6 基準伝送信号発生器
10 伝送ケーブル
12 伝送信号
14 伝送源
16 伝送先
18 障害予測回路
20 監視信号
22 基準伝送信号
24 解除信号入力
26 障害指示器出力
28 正DC電源
30 負DC電源
32 第1のダイオード
34 第2のダイオード
36 第1の抵抗器
38 第2の抵抗器
40 高障害閾値信号
42 低障害閾値信号
44 ハイサイドオペアンプ
46 ローサイドオペアンプ
48 逆バイアスのダイオード
50 障害ノード
52 ICチップ
54 記憶装置
Claims (9)
- ノード内の電気的障害を検出し予測する方法であって、
前記ノード上を伝送信号が伝送するステップと、
前記伝送信号の基準伝送信号を発生するステップと、
前記ノードの前記伝送信号に対する実際の伝送信号を示す監視信号を受け取るステップと、
障害予測回路により、前記監視信号を前記基準伝送信号と比較するステップと、
前記比較結果が障害閾値を満たすとき障害と判定するステップと、
少なくともその後の検索のために前記障害を記録することにより、前記障害であるとの前記判定を指示するステップと、
を含み、
前記障害予測回路が、正直流電源、高障害閾値信号ノード、低障害閾値信号ノードおよび負直流電源の直列構成を有し、
前記障害予測回路が、前記基準伝送信号を入力として受け取り、
前記障害予測回路がさらに、
前記監視信号と前記高障害閾値信号ノードとを入力として受け取るハイサイドオペアンプと、
前記監視信号と前記低障害閾値信号ノードとを入力として受け取るローサイドオペアンプと、
を含み、
前記直列構成が、前記監視信号と高障害閾値信号および低障害閾値信号との比較の許容限度の範囲を設定する要素をさらに有する、
方法。 - 前記受け取るステップが、前記障害予測回路により、前記理想的な基準伝送信号と共にリアルタイムで前記監視信号を受け取るステップを含む、請求項1に記載の方法。
- 前記受け取るステップが、前記障害予測回路により、前記実際の伝送信号を前記監視信号として受け取るステップを含む、請求項1または2に記載の方法。
- 前記基準伝送信号が、伝送信号にリンクされている、請求項1から3のいずれかに記載の方法。
- 前記障害を記録するステップが、前記障害をメモリデバイスに格納するステップを含む、請求項1から4のいずれかに記載の方法。
- 前記比較結果が障害閾値を満たすことが、前記監視信号が障害閾値範囲の外側にあることを含む、請求項1から5のいずれかに記載の方法。
- 前記比較結果が障害閾値を満たすことが、前記監視信号が高障害閾値より大きいことを含む、請求項1から6のいずれかに記載の方法。
- 前記比較結果が障害閾値を満たすことが、前記監視信号が低障害閾値より小さいことを含む、請求項7に記載の方法。
- 前記障害と判定するステップの後に前記障害の指示を解除するステップをさらに含む、請求項1から8のいずれかに記載の方法。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US13/860,853 | 2013-04-11 | ||
US13/860,853 US9519019B2 (en) | 2013-04-11 | 2013-04-11 | Method for detecting or predicting an electrical fault |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2014207670A JP2014207670A (ja) | 2014-10-30 |
JP2014207670A5 JP2014207670A5 (ja) | 2017-05-18 |
JP6461481B2 true JP6461481B2 (ja) | 2019-01-30 |
Family
ID=50442402
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2014076587A Expired - Fee Related JP6461481B2 (ja) | 2013-04-11 | 2014-04-03 | 電気的障害を検出または予測するための方法 |
Country Status (6)
Country | Link |
---|---|
US (1) | US9519019B2 (ja) |
EP (1) | EP2790026B1 (ja) |
JP (1) | JP6461481B2 (ja) |
CN (1) | CN104101798A (ja) |
BR (1) | BR102014007710A2 (ja) |
CA (1) | CA2848086A1 (ja) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105765812B (zh) * | 2013-11-22 | 2018-11-20 | 通用电气航空系统有限公司 | 用于检测电路中的电气故障的方法 |
US9791485B2 (en) * | 2014-03-10 | 2017-10-17 | Silver Spring Networks, Inc. | Determining electric grid topology via a zero crossing technique |
US20160103162A1 (en) * | 2014-10-14 | 2016-04-14 | The Boeing Company | Vehicle power flow monitoring |
JP6478200B2 (ja) * | 2014-10-17 | 2019-03-06 | 株式会社ケーヒン | 電源電圧検出装置 |
US10164422B2 (en) * | 2015-06-02 | 2018-12-25 | Signalchip Innovations Private Limited | Protection circuit for low voltage devices driven by a high voltage circuit |
US11256245B2 (en) * | 2018-12-26 | 2022-02-22 | General Electric Company | Model for predicting distress on a component |
US11716015B2 (en) * | 2021-02-11 | 2023-08-01 | Rockwell Automation Technologies, Inc. | Low quiescent current startup circuit |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
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US4591940A (en) * | 1982-07-13 | 1986-05-27 | Westinghouse Electric Corp. | Signal quality monitor for protective relay system |
JPS60256248A (ja) * | 1984-06-01 | 1985-12-17 | Toshiba Corp | 情報伝送システム |
DE58907901D1 (de) * | 1989-03-03 | 1994-07-21 | Siemens Ag | Verfahren und Schaltungsanordnung zum Weiterleiten von auf Zubringerleitungen übertragenen Nachrichtenpaketen über eine Paketvermittlungseinrichtung. |
JPH03162155A (ja) * | 1989-11-21 | 1991-07-12 | Fujitsu Ltd | 伝送路の断線検出方式 |
JPH08146070A (ja) * | 1994-11-28 | 1996-06-07 | Sumitomo Wiring Syst Ltd | ワイヤーハーネス検査装置 |
JP3237529B2 (ja) | 1996-07-22 | 2001-12-10 | 安藤電気株式会社 | 伝送線路伝搬遅延時間測定装置 |
JP3553385B2 (ja) * | 1998-08-31 | 2004-08-11 | 三菱電機株式会社 | 光スイッチング装置 |
US6639411B1 (en) * | 2000-09-05 | 2003-10-28 | Hutchinson Technology Incorporated | Microactuated suspension motor failure detection system |
US6714021B2 (en) | 2001-01-11 | 2004-03-30 | Sun Microsystems, Inc. | Integrated time domain reflectometry (TDR) tester |
US7631230B2 (en) * | 2004-11-19 | 2009-12-08 | Sun Microsystems, Inc. | Method and apparatus for testing a transmission path |
DE102007001413A1 (de) * | 2007-01-09 | 2008-07-10 | Siemens Ag | Vorrichtung |
CN101266277B (zh) * | 2008-04-24 | 2010-06-16 | 中兴通讯股份有限公司 | 一种直流开关保护电路的通断检测装置和方法 |
DE102009010906A1 (de) * | 2009-03-02 | 2010-09-16 | Siemens Aktiengesellschaft | Vorrichtungen zur Detektion des Belegt- oder Freizustandes eines Gleisabschnitts sowie Verfahren zum Betreiben solcher Vorrichtungen |
CN201993422U (zh) * | 2010-12-20 | 2011-09-28 | 北京航空航天大学 | 一种对数字集成电路焊点健康状态实时监测的装置 |
-
2013
- 2013-04-11 US US13/860,853 patent/US9519019B2/en active Active
-
2014
- 2014-03-31 BR BR102014007710A patent/BR102014007710A2/pt active Search and Examination
- 2014-04-03 JP JP2014076587A patent/JP6461481B2/ja not_active Expired - Fee Related
- 2014-04-03 CA CA2848086A patent/CA2848086A1/en not_active Abandoned
- 2014-04-09 EP EP14164000.3A patent/EP2790026B1/en not_active Not-in-force
- 2014-04-11 CN CN201410144116.2A patent/CN104101798A/zh active Pending
Also Published As
Publication number | Publication date |
---|---|
JP2014207670A (ja) | 2014-10-30 |
EP2790026B1 (en) | 2016-06-08 |
CN104101798A (zh) | 2014-10-15 |
BR102014007710A2 (pt) | 2015-11-03 |
US20140306717A1 (en) | 2014-10-16 |
EP2790026A1 (en) | 2014-10-15 |
CA2848086A1 (en) | 2014-10-11 |
US9519019B2 (en) | 2016-12-13 |
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