JP6389081B2 - 形状測定装置、塗布装置および形状測定方法 - Google Patents
形状測定装置、塗布装置および形状測定方法 Download PDFInfo
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- JP6389081B2 JP6389081B2 JP2014161422A JP2014161422A JP6389081B2 JP 6389081 B2 JP6389081 B2 JP 6389081B2 JP 2014161422 A JP2014161422 A JP 2014161422A JP 2014161422 A JP2014161422 A JP 2014161422A JP 6389081 B2 JP6389081 B2 JP 6389081B2
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Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Coating Apparatus (AREA)
- Instruments For Measurement Of Length By Optical Means (AREA)
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2014161422A JP6389081B2 (ja) | 2014-08-07 | 2014-08-07 | 形状測定装置、塗布装置および形状測定方法 |
| PCT/JP2015/069618 WO2016021359A1 (ja) | 2014-08-07 | 2015-07-08 | 形状測定装置、塗布装置および形状測定方法 |
| CN201580042360.0A CN106662431B (zh) | 2014-08-07 | 2015-07-08 | 形状测定装置、涂敷装置及形状测定方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2014161422A JP6389081B2 (ja) | 2014-08-07 | 2014-08-07 | 形状測定装置、塗布装置および形状測定方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2016038284A JP2016038284A (ja) | 2016-03-22 |
| JP2016038284A5 JP2016038284A5 (enExample) | 2017-09-07 |
| JP6389081B2 true JP6389081B2 (ja) | 2018-09-12 |
Family
ID=55263633
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2014161422A Expired - Fee Related JP6389081B2 (ja) | 2014-08-07 | 2014-08-07 | 形状測定装置、塗布装置および形状測定方法 |
Country Status (3)
| Country | Link |
|---|---|
| JP (1) | JP6389081B2 (enExample) |
| CN (1) | CN106662431B (enExample) |
| WO (1) | WO2016021359A1 (enExample) |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106197310A (zh) * | 2016-06-29 | 2016-12-07 | 中国科学院光电技术研究所 | 一种基于调制度的宽光谱微纳结构三维形貌检测方法 |
| JP6333351B1 (ja) | 2016-12-27 | 2018-05-30 | Ntn株式会社 | 測定装置、塗布装置、および膜厚測定方法 |
| CN109084678B (zh) * | 2018-09-03 | 2021-09-28 | 深圳中科飞测科技股份有限公司 | 一种光学检测装置和光学检测方法 |
| KR102541847B1 (ko) | 2018-07-27 | 2023-06-14 | 스카이버스 테크놀로지 씨오., 엘티디. | 발광 장치, 광학 검출 시스템, 광학 검출 장치 및 광학 검출 방법 |
| CN111213029A (zh) * | 2018-09-27 | 2020-05-29 | 合刃科技(深圳)有限公司 | 检测透明/半透明材料缺陷的方法、装置及系统 |
| CN111076659B (zh) * | 2019-12-02 | 2022-05-24 | 深圳市太赫兹科技创新研究院有限公司 | 一种信号处理方法、装置、终端和计算机可读存储介质 |
| JP7615776B2 (ja) * | 2021-03-09 | 2025-01-17 | 日本電気株式会社 | 画像処理装置、画像処理方法及び画像処理プログラム |
| KR102805953B1 (ko) * | 2022-11-16 | 2025-05-14 | 주식회사 크레셈 | 튜너블 렌즈를 이용한 초점 가변 검사장치 및 이를 이용한 검사방법 |
| JP2025136384A (ja) * | 2024-03-07 | 2025-09-19 | Towa株式会社 | 切断装置及び切断品の製造方法 |
| CN118243010A (zh) * | 2024-03-21 | 2024-06-25 | 华中科技大学 | 一种新型显示喷印制造中薄膜形貌的白光干涉检测方法 |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3203397B2 (ja) * | 1992-08-25 | 2001-08-27 | 松下電器産業株式会社 | はんだ付け状態検査装置とはんだ付け状態検査方法 |
| JP2935412B2 (ja) * | 1995-06-13 | 1999-08-16 | 東レ株式会社 | 薄膜の厚さ測定方法および測定装置ならびに光学フィルターの製造方法 |
| JP2004340680A (ja) * | 2003-05-14 | 2004-12-02 | Toray Eng Co Ltd | 表面形状および/または膜厚測定方法及びその装置 |
| US7483147B2 (en) * | 2004-11-10 | 2009-01-27 | Korea Advanced Institute Of Science And Technology (Kaist) | Apparatus and method for measuring thickness and profile of transparent thin film using white-light interferometer |
| CN100582655C (zh) * | 2005-07-29 | 2010-01-20 | 大日本网目版制造株式会社 | 不均匀检查装置及不均匀检查方法 |
| DE102006016131A1 (de) * | 2005-09-22 | 2007-03-29 | Robert Bosch Gmbh | Interferometrische Messvorrichtung |
| KR101010189B1 (ko) * | 2008-06-30 | 2011-01-21 | 에스엔유 프리시젼 주식회사 | 두께 또는 표면형상 측정방법 |
| JP2012021781A (ja) * | 2010-07-12 | 2012-02-02 | Asahi Glass Co Ltd | 表面形状の評価方法および評価装置 |
| CN102445167A (zh) * | 2010-09-30 | 2012-05-09 | 旭硝子株式会社 | 表面形状的评价方法以及评价装置 |
| JP2012127675A (ja) * | 2010-12-13 | 2012-07-05 | Asahi Glass Co Ltd | 表面形状の評価方法および評価装置 |
| JP6189102B2 (ja) * | 2013-06-25 | 2017-08-30 | Ntn株式会社 | 塗布装置および高さ検出方法 |
-
2014
- 2014-08-07 JP JP2014161422A patent/JP6389081B2/ja not_active Expired - Fee Related
-
2015
- 2015-07-08 CN CN201580042360.0A patent/CN106662431B/zh active Active
- 2015-07-08 WO PCT/JP2015/069618 patent/WO2016021359A1/ja not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| WO2016021359A1 (ja) | 2016-02-11 |
| CN106662431B (zh) | 2019-10-25 |
| CN106662431A (zh) | 2017-05-10 |
| JP2016038284A (ja) | 2016-03-22 |
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