JP6362480B2 - 半導体バックプレーンを製造するための方法およびシステム - Google Patents

半導体バックプレーンを製造するための方法およびシステム Download PDF

Info

Publication number
JP6362480B2
JP6362480B2 JP2014173705A JP2014173705A JP6362480B2 JP 6362480 B2 JP6362480 B2 JP 6362480B2 JP 2014173705 A JP2014173705 A JP 2014173705A JP 2014173705 A JP2014173705 A JP 2014173705A JP 6362480 B2 JP6362480 B2 JP 6362480B2
Authority
JP
Japan
Prior art keywords
substrate
semiconductor
layer
support member
semiconductor particles
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2014173705A
Other languages
English (en)
Japanese (ja)
Other versions
JP2015053481A5 (https=
JP2015053481A (ja
Inventor
ダグラス ダイカー
ダグラス ダイカー
Original Assignee
ディフテック レーザーズ インコーポレイテッド
ディフテック レーザーズ インコーポレイテッド
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ディフテック レーザーズ インコーポレイテッド, ディフテック レーザーズ インコーポレイテッド filed Critical ディフテック レーザーズ インコーポレイテッド
Publication of JP2015053481A publication Critical patent/JP2015053481A/ja
Publication of JP2015053481A5 publication Critical patent/JP2015053481A5/ja
Application granted granted Critical
Publication of JP6362480B2 publication Critical patent/JP6362480B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/20Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
    • H10P14/29Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials characterised by the substrates
    • H10P14/2901Materials
    • H10P14/2922Materials being non-crystalline insulating materials, e.g. glass or polymers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • H10D86/01Manufacture or treatment
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/04Apparatus for manufacture or treatment
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/04Apparatus for manufacture or treatment
    • H10P72/0428Apparatus for mechanical treatment or grinding or cutting
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/01Manufacture or treatment
    • H10W72/012Manufacture or treatment of bump connectors, dummy bumps or thermal bumps
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W74/00Encapsulations, e.g. protective coatings
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W74/00Encapsulations, e.g. protective coatings
    • H10W74/01Manufacture or treatment

Landscapes

  • Thin Film Transistor (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Photovoltaic Devices (AREA)
  • Recrystallisation Techniques (AREA)
  • Wire Bonding (AREA)
  • Laminated Bodies (AREA)
  • Electrostatic, Electromagnetic, Magneto- Strictive, And Variable-Resistance Transducers (AREA)
  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
JP2014173705A 2013-09-05 2014-08-28 半導体バックプレーンを製造するための方法およびシステム Active JP6362480B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US14/019,131 2013-09-05
US14/019,131 US9209019B2 (en) 2013-09-05 2013-09-05 Method and system for manufacturing a semi-conducting backplane

Publications (3)

Publication Number Publication Date
JP2015053481A JP2015053481A (ja) 2015-03-19
JP2015053481A5 JP2015053481A5 (https=) 2017-08-03
JP6362480B2 true JP6362480B2 (ja) 2018-07-25

Family

ID=51492169

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2014173705A Active JP6362480B2 (ja) 2013-09-05 2014-08-28 半導体バックプレーンを製造するための方法およびシステム

Country Status (4)

Country Link
US (1) US9209019B2 (https=)
EP (1) EP2846354B1 (https=)
JP (1) JP6362480B2 (https=)
CN (1) CN104576404B (https=)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9601329B2 (en) * 2014-06-04 2017-03-21 Diftek Lasers, Inc. Method of fabricating crystalline island on substrate
US10446629B2 (en) 2011-10-14 2019-10-15 Diftek Lasers, Inc. Electronic device and method of making thereof
US9859348B2 (en) 2011-10-14 2018-01-02 Diftek Lasers, Inc. Electronic device and method of making thereof
US20160257117A1 (en) * 2013-10-28 2016-09-08 Hewlett-Packard Development Company, L.P. Encapsulating a Bonded Wire with Low Profile Encapsulation
US9818903B2 (en) 2014-04-30 2017-11-14 Sunpower Corporation Bonds for solar cell metallization
EP2953158A3 (en) * 2014-06-04 2016-02-17 Diftek Lasers, Inc. Method of fabricating crystalline island on substrate
US9843024B2 (en) * 2014-12-03 2017-12-12 Universal Display Corporation Methods for fabricating OLEDs
EP3244453A1 (en) * 2015-10-09 2017-11-15 Diftek Lasers, Inc. An electronic device and method of making thereof
US10312310B2 (en) 2016-01-19 2019-06-04 Diftek Lasers, Inc. OLED display and method of fabrication thereof
US10199255B2 (en) * 2016-03-10 2019-02-05 Infineon Technologioes AG Method for providing a planarizable workpiece support, a workpiece planarization arrangement, and a chuck
WO2018094073A2 (en) * 2016-11-16 2018-05-24 Tokyo Electron Limited Methods of sub-resolution substrate patterning
DE102017213065B3 (de) * 2017-04-13 2018-07-05 Christian-Albrechts-Universität Zu Kiel Verfahren zur Herstellung von plankonvexen Linsenelementen und zur Herstellung eines gehäusten Bauelements auf Waferebene

Family Cites Families (38)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3025335A (en) 1960-02-29 1962-03-13 Hoffman Electronics Corp Flexible solar energy converter panel
NL154876B (nl) 1966-04-14 1977-10-17 Philips Nv Werkwijze voor het vervaardigen van elektrisch werkzame inrichtingen met monokorrellagen met actieve korrels in een isolerende vulstof, alsmede volgens deze werkwijze verkregen elektrisch werkzame inrichting.
US3998659A (en) 1974-01-28 1976-12-21 Texas Instruments Incorporated Solar cell with semiconductor particles and method of fabrication
US4270263A (en) 1977-02-14 1981-06-02 Texas Instruments Incorporated Glass support light energy converter
US4614835A (en) 1983-12-15 1986-09-30 Texas Instruments Incorporated Photovoltaic solar arrays using silicon microparticles
US4470874A (en) 1983-12-15 1984-09-11 International Business Machines Corporation Planarization of multi-level interconnected metallization system
US5069740A (en) 1984-09-04 1991-12-03 Texas Instruments Incorporated Production of semiconductor grade silicon spheres from metallurgical grade silicon particles
US4637855A (en) 1985-04-30 1987-01-20 Texas Instruments Incorporated Process for producing crystalline silicon spheres
US4872607A (en) 1988-02-04 1989-10-10 Texas Instruments Incorporated Method of bonding semiconductor material to an aluminum foil
US5091319A (en) 1989-07-31 1992-02-25 Hotchkiss Gregory B Method of affixing silicon spheres to a foil matrix
US5086003A (en) * 1989-07-31 1992-02-04 Texas Instruments Incorporated Method for applying an organic insulator to a solar array
US5256562A (en) 1990-12-31 1993-10-26 Kopin Corporation Method for manufacturing a semiconductor device using a circuit transfer film
US5469020A (en) 1994-03-14 1995-11-21 Massachusetts Institute Of Technology Flexible large screen display having multiple light emitting elements sandwiched between crossed electrodes
AU715515B2 (en) 1996-10-09 2000-02-03 Sphelar Power Corporation Semiconductor device
US5955776A (en) 1996-12-04 1999-09-21 Ball Semiconductor, Inc. Spherical shaped semiconductor integrated circuit
US6657225B1 (en) 1998-03-25 2003-12-02 Seiko Epson Corporation Semiconductor component, active matrix substrate for a liquid crystal display, and methods of manufacturing such component and substrate
US6350388B1 (en) 1999-08-19 2002-02-26 Micron Technology, Inc. Method for patterning high density field emitter tips
JP2001210843A (ja) 1999-11-17 2001-08-03 Fuji Mach Mfg Co Ltd 光発電パネルおよびその製造方法
JP3847514B2 (ja) * 2000-02-14 2006-11-22 株式会社三井ハイテック ボール・ダイオード基板の製造方法。
TW505942B (en) 2000-06-29 2002-10-11 Matsushita Electric Industrial Co Ltd Method and apparatus for forming pattern onto panel substrate
JP2002083876A (ja) 2000-09-07 2002-03-22 Sanyo Electric Co Ltd 半導体集積回路装置の製造方法
JP2002111021A (ja) * 2000-09-26 2002-04-12 Mitsui High Tec Inc 太陽電池の製造方法
WO2002035613A1 (fr) 2000-10-20 2002-05-02 Josuke Nakata Module a semi-conducteur emetteur ou recepteur de lumiere et procede de fabrication dudit module
AU773312B2 (en) 2000-10-20 2004-05-20 Sphelar Power Corporation Light-emitting or light-receiving semiconductor device and method for fabricating the same
US20040016456A1 (en) 2002-07-25 2004-01-29 Clean Venture 21 Corporation Photovoltaic device and method for producing the same
KR100499129B1 (ko) 2002-09-02 2005-07-04 삼성전기주식회사 발광 다이오드 및 그 제조방법
US20070069642A1 (en) 2003-09-05 2007-03-29 Adrian Kitai Sphere-supported thin film phosphor electroluminescent devices
TW200637037A (en) 2005-02-18 2006-10-16 Sumitomo Chemical Co Semiconductor light-emitting element and fabrication method thereof
EP1693903B1 (en) * 2005-02-18 2011-05-18 Clean Venture 21 Corporation Array of spherical solar cells and its method of fabrication
US20080121987A1 (en) 2006-11-06 2008-05-29 Yijian Chen Nanodot and nanowire based MOSFET structures and fabrication processes
DE102006054206A1 (de) 2006-11-15 2008-05-21 Till Keesmann Feldemissionsvorrichtung
KR100907787B1 (ko) 2007-05-29 2009-07-15 재단법인서울대학교산학협력재단 패턴-천공된 마스크를 이용하는 하전입자의 집속 패터닝방법 및 이에 사용되는 마스크
JP5157843B2 (ja) 2007-12-04 2013-03-06 住友電気工業株式会社 炭化ケイ素半導体装置およびその製造方法
KR101039630B1 (ko) 2009-02-18 2011-06-08 성균관대학교산학협력단 기판 상에 나노구조체를 선택적으로 위치시키는 방법 및 이에 의해 형성된 나노구조체를 포함하는 나노-분자 소자
US8575471B2 (en) 2009-08-31 2013-11-05 Alliance For Sustainable Energy, Llc Lattice matched semiconductor growth on crystalline metallic substrates
JP2011181534A (ja) 2010-02-26 2011-09-15 Hitachi Ltd 球状化合物半導体セル及びモジュールの製造方法
CN103858221B (zh) 2011-10-14 2017-02-15 迪夫泰克激光公司 位于衬底上的平坦化半导体颗粒
US8999742B1 (en) * 2013-12-10 2015-04-07 Nthdegree Technologies Worldwide Inc. Silicon microsphere fabrication

Also Published As

Publication number Publication date
US20150064883A1 (en) 2015-03-05
EP2846354A2 (en) 2015-03-11
CN104576404A (zh) 2015-04-29
JP2015053481A (ja) 2015-03-19
EP2846354A3 (en) 2015-08-12
US9209019B2 (en) 2015-12-08
EP2846354B1 (en) 2019-05-22
HK1207207A1 (en) 2016-01-22
CN104576404B (zh) 2019-08-09

Similar Documents

Publication Publication Date Title
JP6362480B2 (ja) 半導体バックプレーンを製造するための方法およびシステム
CN103858221B (zh) 位于衬底上的平坦化半导体颗粒
JP6537043B2 (ja) 伸張可能及び折畳み可能な電子デバイス
US8101457B2 (en) Mounting method, mounted structure, manufacturing method for electronic equipment, electronic equipment, manufacturing method for light-emitting diode display, and light-emitting diode display
US6731353B1 (en) Method and apparatus for transferring blocks
US20100264423A1 (en) Thinned Semiconductor Components Having Lasered Features And Methods For Fabricating Semiconductor Components Using Back Side Laser Processing
CN111295873B (zh) 一种图像传感器模组的形成方法
CN111295759A (zh) 图像传感器模组及其形成方法
US10446629B2 (en) Electronic device and method of making thereof
US9859348B2 (en) Electronic device and method of making thereof
TW201839923A (zh) 半導體封裝
TW201933555A (zh) 密封材料組合物、半導體封裝及其製造方法
JP5574699B2 (ja) イメージセンサパッケージのガラス取付けのための技術
HK1207207B (zh) 一种制作半导体底板的方法及系统
US12142510B2 (en) Carrier for microelectronic assemblies having direct bonding
JP6231641B2 (ja) 電子デバイスおよびそれを作製する方法
US9455307B2 (en) Active matrix electro-optical device and method of making thereof
TW201628140A (zh) 具有可調整熱膨脹係數的複合介面材料
HK1201100B (en) Planarized semiconductor particles positioned on a substrate
EP3244453A1 (en) An electronic device and method of making thereof
HK1242048A1 (en) An electronic device and method of making thereof
HK1242048B (zh) 电子器件及其制造方法

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20170623

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20170623

A871 Explanation of circumstances concerning accelerated examination

Free format text: JAPANESE INTERMEDIATE CODE: A871

Effective date: 20170623

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20170925

A975 Report on accelerated examination

Free format text: JAPANESE INTERMEDIATE CODE: A971005

Effective date: 20171018

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20171024

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20180117

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20180423

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20180529

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20180626

R150 Certificate of patent or registration of utility model

Ref document number: 6362480

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250