JP6339883B2 - イオン化装置、それを有する質量分析装置及び画像作成システム - Google Patents

イオン化装置、それを有する質量分析装置及び画像作成システム Download PDF

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Publication number
JP6339883B2
JP6339883B2 JP2014146622A JP2014146622A JP6339883B2 JP 6339883 B2 JP6339883 B2 JP 6339883B2 JP 2014146622 A JP2014146622 A JP 2014146622A JP 2014146622 A JP2014146622 A JP 2014146622A JP 6339883 B2 JP6339883 B2 JP 6339883B2
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voltage
probe
sample
mass
pulse
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Japanese (ja)
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JP2015046381A (ja
JP2015046381A5 (enExample
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正文 教學
正文 教學
大塚　洋一
洋一 大塚
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Canon Inc
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Canon Inc
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q10/00—Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe
    • G01Q10/04—Fine scanning or positioning
    • G01Q10/06—Circuits or algorithms therefor
    • G01Q10/065—Feedback mechanisms, i.e. wherein the signal for driving the probe is modified by a signal coming from the probe itself
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0459—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for solid samples
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0004—Imaging particle spectrometry

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2014146622A 2013-08-02 2014-07-17 イオン化装置、それを有する質量分析装置及び画像作成システム Active JP6339883B2 (ja)

Priority Applications (1)

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JP2014146622A JP6339883B2 (ja) 2013-08-02 2014-07-17 イオン化装置、それを有する質量分析装置及び画像作成システム

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2013160898 2013-08-02
JP2013160898 2013-08-02
JP2014146622A JP6339883B2 (ja) 2013-08-02 2014-07-17 イオン化装置、それを有する質量分析装置及び画像作成システム

Publications (3)

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JP2015046381A JP2015046381A (ja) 2015-03-12
JP2015046381A5 JP2015046381A5 (enExample) 2017-08-24
JP6339883B2 true JP6339883B2 (ja) 2018-06-06

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JP2014146622A Active JP6339883B2 (ja) 2013-08-02 2014-07-17 イオン化装置、それを有する質量分析装置及び画像作成システム

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US (1) US8957370B1 (enExample)
JP (1) JP6339883B2 (enExample)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8519330B2 (en) * 2010-10-01 2013-08-27 Ut-Battelle, Llc Systems and methods for laser assisted sample transfer to solution for chemical analysis
JP5955033B2 (ja) * 2012-03-01 2016-07-20 キヤノン株式会社 イオン化方法、質量分析方法、抽出方法及び精製方法
US9269557B2 (en) * 2012-09-07 2016-02-23 Canon Kabushiki Kaisha Ionization device, mass spectrometer including the ionization device, and image generation system including the ionization device
JP2015032463A (ja) * 2013-08-02 2015-02-16 キヤノン株式会社 質量分析装置、質量分析方法および画像化システム
CA2932378A1 (en) * 2013-12-24 2015-07-02 Dh Technologies Development Pte. Ltd. High speed polarity switch time-of-flight spectrometer
JP2015107391A (ja) * 2015-03-09 2015-06-11 株式会社大一商会 遊技機
JP6470852B2 (ja) * 2015-12-09 2019-02-13 株式会社日立製作所 イオン化装置
EP3745445A4 (en) 2018-01-26 2021-01-27 Shimadzu Corporation PROBE ELECTRONEBULIZATION IONIZATION MASS SPECTROMETRY DEVICE
EP3805749A4 (en) * 2018-05-31 2021-07-07 Shimadzu Corporation MASS SPECTROMETRY AT IONIZATION BY ELECTRONEBULIZATION WITH PROBE
US11600481B2 (en) * 2019-07-11 2023-03-07 West Virginia University Devices and processes for mass spectrometry utilizing vibrating sharp-edge spray ionization

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5396065A (en) * 1993-12-21 1995-03-07 Hewlett-Packard Company Sequencing ion packets for ion time-of-flight mass spectrometry
JP4167593B2 (ja) * 2002-01-31 2008-10-15 株式会社日立ハイテクノロジーズ エレクトロスプレイイオン化質量分析装置及びその方法
JP2005098909A (ja) * 2003-09-26 2005-04-14 Shimadzu Corp イオン化装置およびこれを用いた質量分析装置
EP1782451A2 (en) * 2004-07-01 2007-05-09 Ciphergen Biosystems, Inc. Dynamic biasing of ion optics in a mass spectrometer
US7408151B2 (en) * 2004-07-01 2008-08-05 Bio-Rad Laboratories, Inc. Dynamic biasing of ion optics in a mass spectrometer
JP2007165116A (ja) * 2005-12-14 2007-06-28 Shimadzu Corp 質量分析装置
JP2009074987A (ja) * 2007-09-21 2009-04-09 Sii Nanotechnology Inc 走査型プローブ顕微鏡及び表面情報測定方法
JP5955033B2 (ja) 2012-03-01 2016-07-20 キヤノン株式会社 イオン化方法、質量分析方法、抽出方法及び精製方法
JP5955032B2 (ja) 2012-03-01 2016-07-20 キヤノン株式会社 イオン化方法、質量分析方法、抽出方法及び精製方法
US9269557B2 (en) * 2012-09-07 2016-02-23 Canon Kabushiki Kaisha Ionization device, mass spectrometer including the ionization device, and image generation system including the ionization device
US8710436B2 (en) * 2012-09-07 2014-04-29 Canon Kabushiki Kaisha Ionization device, mass spectrometer including the ionization device, and image generation system including the ionization device
US9058966B2 (en) * 2012-09-07 2015-06-16 Canon Kabushiki Kaisha Ionization device, mass spectrometer including ionization device, image display system including mass spectrometer, and analysis method

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Publication number Publication date
US8957370B1 (en) 2015-02-17
JP2015046381A (ja) 2015-03-12
US20150034821A1 (en) 2015-02-05

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