JP6323060B2 - 成分分析装置、成分分析方法 - Google Patents

成分分析装置、成分分析方法 Download PDF

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JP6323060B2
JP6323060B2 JP2014033780A JP2014033780A JP6323060B2 JP 6323060 B2 JP6323060 B2 JP 6323060B2 JP 2014033780 A JP2014033780 A JP 2014033780A JP 2014033780 A JP2014033780 A JP 2014033780A JP 6323060 B2 JP6323060 B2 JP 6323060B2
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light
wavelength
component
region
wavelength range
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JP2015158439A5 (enrdf_load_stackoverflow
JP2015158439A (ja
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祐一 鹿川
祐一 鹿川
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Seiko Epson Corp
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JP2014033780A 2014-02-25 2014-02-25 成分分析装置、成分分析方法 Active JP6323060B2 (ja)

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JP2015158439A JP2015158439A (ja) 2015-09-03
JP2015158439A5 JP2015158439A5 (enrdf_load_stackoverflow) 2017-03-02
JP6323060B2 true JP6323060B2 (ja) 2018-05-16

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Families Citing this family (7)

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Publication number Priority date Publication date Assignee Title
JP6641883B2 (ja) * 2015-10-28 2020-02-05 セイコーエプソン株式会社 測定装置、電子機器、及び測定方法
JP6806326B2 (ja) * 2016-10-25 2021-01-06 株式会社オリエンテック 危険予知通報システム
US11218644B2 (en) 2016-11-30 2022-01-04 Sherpa Space Inc. Image-based component measurement system using light emitting device that outputs variable wavelength and method thereof, and method of plant cultivation method using the same
KR101743125B1 (ko) * 2017-02-27 2017-06-02 주식회사 쉘파스페이스 가변 파장을 출력하는 발광부를 이용한 영상 기반 성분 측정 시스템 및 그 방법과 이를 이용한 식물 재배 방법
JP6948069B2 (ja) * 2018-06-29 2021-10-13 メディカルフォトニクス株式会社 脂質計測装置及びその方法
JP7521354B2 (ja) * 2020-09-25 2024-07-24 セイコーエプソン株式会社 分光カメラ
US20240079097A1 (en) * 2021-02-26 2024-03-07 Hilachi, Ltd. Material identification assistance device, method, and program

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JPH0827235B2 (ja) * 1987-11-17 1996-03-21 倉敷紡績株式会社 糖類濃度の分光学的測定法
JPH01301147A (ja) * 1988-05-28 1989-12-05 Mitsui Mining & Smelting Co Ltd 青果物の品質測定法およびその装置
JPH0634531A (ja) * 1992-07-14 1994-02-08 Yokogawa Electric Corp 赤外線水分計
US5747806A (en) * 1996-02-02 1998-05-05 Instrumentation Metrics, Inc Method and apparatus for multi-spectral analysis in noninvasive nir spectroscopy
JP2013181912A (ja) * 2012-03-02 2013-09-12 Seiko Epson Corp 成分分析装置
JP2013253845A (ja) * 2012-06-06 2013-12-19 Jvc Kenwood Corp 食味測定装置および食味測定方法

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