JP6320267B2 - 光学式位置測定装置 - Google Patents
光学式位置測定装置 Download PDFInfo
- Publication number
- JP6320267B2 JP6320267B2 JP2014204525A JP2014204525A JP6320267B2 JP 6320267 B2 JP6320267 B2 JP 6320267B2 JP 2014204525 A JP2014204525 A JP 2014204525A JP 2014204525 A JP2014204525 A JP 2014204525A JP 6320267 B2 JP6320267 B2 JP 6320267B2
- Authority
- JP
- Japan
- Prior art keywords
- scanning
- optical
- measuring device
- position measuring
- grating
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/14—Measuring arrangements characterised by the use of optical techniques for measuring distance or clearance between spaced objects or spaced apertures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02049—Interferometers characterised by particular mechanical design details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02083—Interferometers characterised by particular signal processing and presentation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
- G01D5/26—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light
- G01D5/32—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light
- G01D5/34—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells
- G01D5/36—Forming the light into pulses
- G01D5/38—Forming the light into pulses by diffraction gratings
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Signal Processing (AREA)
- Optical Transform (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE102013220184 | 2013-10-07 | ||
| DE102013220184.2 | 2013-10-07 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2015075486A JP2015075486A (ja) | 2015-04-20 |
| JP2015075486A5 JP2015075486A5 (enExample) | 2017-11-16 |
| JP6320267B2 true JP6320267B2 (ja) | 2018-05-09 |
Family
ID=51541018
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2014204525A Active JP6320267B2 (ja) | 2013-10-07 | 2014-10-03 | 光学式位置測定装置 |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US9410797B2 (enExample) |
| EP (1) | EP2857802B1 (enExample) |
| JP (1) | JP6320267B2 (enExample) |
| KR (1) | KR102088869B1 (enExample) |
| CN (1) | CN104515468B (enExample) |
| DE (1) | DE102014218623A1 (enExample) |
| ES (1) | ES2604157T3 (enExample) |
| TW (1) | TWI627379B (enExample) |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102013220214A1 (de) | 2013-10-07 | 2015-04-09 | Dr. Johannes Heidenhain Gmbh | Anordnung zur Positionierung eines Werkzeugs relativ zu einem Werkstück |
| US9829409B2 (en) * | 2015-04-28 | 2017-11-28 | Sumix Corporation | Interferometric measurement method for guide holes and fiber holes parallelism and position in multi-fiber ferrules |
| DE102016200847A1 (de) * | 2016-01-21 | 2017-07-27 | Dr. Johannes Heidenhain Gesellschaft Mit Beschränkter Haftung | Optische Positionsmesseinrichtung |
| DE102017209093A1 (de) * | 2017-05-31 | 2018-12-06 | Osram Gmbh | Lichtleiteranordnung für ein mobiles kommunikationsgerät zur optischen datenübertragung, mobiles kommunikationsgerät und verfahren zur optischen datenübertragung |
| DE102017213330A1 (de) * | 2017-08-02 | 2019-02-07 | Dr. Johannes Heidenhain Gmbh | Abtastplatte für eine optische Positionsmesseinrichtung |
| JP7060370B2 (ja) * | 2017-12-18 | 2022-04-26 | 株式会社ミツトヨ | スケールおよびその製造方法 |
| FR3090904B1 (fr) * | 2018-12-19 | 2021-02-19 | Office National Detudes Rech Aerospatiales | Composant optique monolithique a plusieurs voies |
| DE102019210023A1 (de) * | 2019-07-08 | 2021-01-14 | Dr. Johannes Heidenhain Gmbh | Positionsmesseinrichtung |
| CN120112768A (zh) * | 2022-11-10 | 2025-06-06 | Asml荷兰有限公司 | 位置测量系统和光刻设备 |
| CN115900782B (zh) * | 2022-12-30 | 2025-05-27 | 四川云盾光电科技有限公司 | 一种绝对式测角装置及方法 |
Family Cites Families (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6249626B1 (en) * | 1998-03-06 | 2001-06-19 | Lucent Technologies, Inc. | Multimode fiber optical power monitoring tap for optical transmission systems |
| DE10235669B4 (de) * | 2002-08-03 | 2016-11-17 | Dr. Johannes Heidenhain Gmbh | Positionsmesseinrichtung |
| JP2005147828A (ja) * | 2003-11-14 | 2005-06-09 | Mitsutoyo Corp | 変位検出装置 |
| DE102005029917A1 (de) * | 2005-06-28 | 2007-01-04 | Dr. Johannes Heidenhain Gmbh | Positionsmesseinrichtung |
| DE102005043569A1 (de) * | 2005-09-12 | 2007-03-22 | Dr. Johannes Heidenhain Gmbh | Positionsmesseinrichtung |
| US7602489B2 (en) | 2006-02-22 | 2009-10-13 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| US7483120B2 (en) | 2006-05-09 | 2009-01-27 | Asml Netherlands B.V. | Displacement measurement system, lithographic apparatus, displacement measurement method and device manufacturing method |
| JP2008098604A (ja) * | 2006-09-12 | 2008-04-24 | Canon Inc | 露光装置及びデバイス製造方法 |
| DE102006042743A1 (de) * | 2006-09-12 | 2008-03-27 | Dr. Johannes Heidenhain Gmbh | Positionsmesseinrichtung |
| US20080079920A1 (en) * | 2006-09-29 | 2008-04-03 | Heiko Hommen | Wafer exposure device and method |
| DE102008007319A1 (de) * | 2008-02-02 | 2009-08-06 | Dr. Johannes Heidenhain Gmbh | Optische Positionsmesseinrichtung |
| JP5602420B2 (ja) | 2009-12-10 | 2014-10-08 | キヤノン株式会社 | 変位測定装置、露光装置、及び精密加工機器 |
| US8829420B2 (en) * | 2010-06-09 | 2014-09-09 | Nikon Corporation | Two dimensional encoder system and method |
| US20130001412A1 (en) * | 2011-07-01 | 2013-01-03 | Mitutoyo Corporation | Optical encoder including passive readhead with remote contactless excitation and signal sensing |
| DE102013203211A1 (de) * | 2012-06-15 | 2013-12-19 | Dr. Johannes Heidenhain Gmbh | Vorrichtung zur interferentiellen Abstandsmessung |
-
2014
- 2014-09-03 TW TW103130408A patent/TWI627379B/zh active
- 2014-09-17 ES ES14185047.9T patent/ES2604157T3/es active Active
- 2014-09-17 EP EP14185047.9A patent/EP2857802B1/de active Active
- 2014-09-17 DE DE102014218623.4A patent/DE102014218623A1/de not_active Withdrawn
- 2014-09-23 KR KR1020140126684A patent/KR102088869B1/ko active Active
- 2014-10-03 JP JP2014204525A patent/JP6320267B2/ja active Active
- 2014-10-07 US US14/508,097 patent/US9410797B2/en active Active
- 2014-10-08 CN CN201410525795.8A patent/CN104515468B/zh active Active
Also Published As
| Publication number | Publication date |
|---|---|
| KR102088869B1 (ko) | 2020-03-16 |
| JP2015075486A (ja) | 2015-04-20 |
| EP2857802B1 (de) | 2016-09-14 |
| DE102014218623A1 (de) | 2015-04-09 |
| US9410797B2 (en) | 2016-08-09 |
| EP2857802A3 (de) | 2015-07-01 |
| CN104515468A (zh) | 2015-04-15 |
| EP2857802A2 (de) | 2015-04-08 |
| ES2604157T3 (es) | 2017-03-03 |
| KR20150040744A (ko) | 2015-04-15 |
| TWI627379B (zh) | 2018-06-21 |
| TW201527712A (zh) | 2015-07-16 |
| US20150098090A1 (en) | 2015-04-09 |
| CN104515468B (zh) | 2018-04-10 |
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