JP6294241B2 - 多結晶ダイヤモンドを分析するためのキャパシタンスの使用 - Google Patents
多結晶ダイヤモンドを分析するためのキャパシタンスの使用 Download PDFInfo
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- JP6294241B2 JP6294241B2 JP2014558803A JP2014558803A JP6294241B2 JP 6294241 B2 JP6294241 B2 JP 6294241B2 JP 2014558803 A JP2014558803 A JP 2014558803A JP 2014558803 A JP2014558803 A JP 2014558803A JP 6294241 B2 JP6294241 B2 JP 6294241B2
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- component
- leached
- brewed
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
- G01N27/22—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating capacitance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/40—Grinding-materials
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- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
Description
C=εr(A/4nd)
であり、上記式中、
Cはキャパシタンスであり、
Aは2つの板のオーバラップ面積であり、
εrは、相対静的誘電率(relative static permittivity)(誘電率(dielectric constant)と呼ばれるときもある)であり、
dは板間の間隔である。
このように、「d」又は実際の浸出深さ720が増大するのに伴って、キャパシタンス710は低減する。そして逆のことも言える。図7において逆の現象が発生しているのは、浸出済層354(図3)とともに存在する副産物材料398(図3)が測定中に分極されるようになり、ひいては相対静的誘電率が一定でなくなるからである。
Claims (12)
- 多結晶構造の品質を特徴づける方法であって、
触媒材料の少なくとも一部が除去されたそれぞれの浸出済層と、該浸出済層に隣接して位置決めされた未浸出層とを含み、それぞれ浸出済多結晶構造を含む、浸出済構成部分のバッチを得るステップと、
当該バッチから、複数の前記浸出済構成部分の破壊テストによる、実際の浸出深さの較正データを得るステップと、
前記バッチから、手を付けられていない、すなわち破壊テストを行っていない、浸出済構成部分のキャパシタンス値を測定するステップと、
当該測定したキャパシタンス値と前記較正データを用いて、前記手を付けられていない浸出済構成部分の予測される浸出深さを決定するステップと、からなる方法。 - さらに、前記較正データから較正曲線を得るステップからなり、前記較正曲線が前記予測される浸出深さを決定するのに用いられる、請求項1に記載の方法。
- 複数のキャパシタンス値は、前記手を付けられていない浸出済構成部分から測定され、
当該方法は、さらに前記測定した複数のキャパシタンス値の平均値を決定し、そして
当該平均値を、予測される浸出深さを決定することに使用される、請求項1に記載の方法。 - さらに前記手を付けられていない浸出済構成部分を脱分極するステップを含む、請求項1に記載の方法。
- 前記手を付けられていない浸出済構成部分を脱分極するステップは、前記キャパシタンス値の測定の前、及び前記キャパシタンス値の測定の後、の少なくとも一方で実施される、請求項4に記載の方法。
- 前記手を付けられていない浸出済構成部分を脱分極するステップは、前記浸出済構成部分の接地、脱分極材料内の前記浸出済構成部分のラッピング、前記浸出済構成部分の熱処理、塩溶液中に前記浸出済構成部分を設置すること、及び所定の時間にわたる待機、のうちの少なくとも1つを含む、請求項4に記載の方法。
- さらに、前記触媒材料の少なくとも一部を除去して前記浸出済構成部分を形成する浸出プロセス中に、前記手を付けられていない浸出済構成部分の多結晶構造内に堆積された、1種以上の副産物材料から前記多結晶構造を清浄化するステップを含む、請求項1に記載の方法。
- 前記手を付けられていない浸出済構成部分の、複数のキャパシタンス値を測定するステップを含み、さらに、
前記バッチの中から、第2の手を付けられていない浸出済構成部分の、複数のキャパシタンス値を測定するステップを含み、そして
前記測定した複数のキャパシタンス値を用いて、前記第2の手を付けられていない浸出済構成部分の、第2の前記多結晶構造のミクロ構造の品質を決定するステップを含む、請求項1に記載の方法。 - さらに、
前記測定した複数のキャパシタンス値から、前記手を付けられていない浸出済構成部分のそれぞれについて、データ散乱範囲を割り出すステップを含み、
前記データ散乱範囲を用いて第2の品質が決定され、そして
前記ミクロ構造は、前記データ散乱範囲が他の前記手を付けられていない浸出済構成部分のデータ散乱範囲と比較して小さいときに多孔率が低い、請求項8に記載の方法。 - 前記手を付けられていない浸出済構成部分の浸出済層から、副産物材料の少なくとも一部が除去されている、請求項1に記載の方法。
- さらに、
前記バッチの中の、前記手を付けられていない浸出済構成部分の、残りの部分のキャパシタンス値を測定し、
前記手を付けられていない浸出済構成部分の、残りの部分の推定浸出深さを、それぞれの測定されたキャパシタンス値と較正データを用いて決定し、
前記推定浸出深さを用いて、許容範囲にある、手を付けられていない浸出済構成部分を選び出し、そして
前記許容範囲にある、前記手を付けられていない浸出済構成部分の、少なくとも一部を工具に取り付けることを含む、請求項1に記載の方法。 - 前記破壊テストは、
それぞれの浸出済構成部分を切断し、
それぞれの切断構成部分の切断エッジを磨き、そして
拡大装置を用いてそれぞれの磨いたエッジの、前記実際の浸出深さを視覚的に測定する、
請求項1に記載の方法。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US13/401,188 US9423370B2 (en) | 2012-02-21 | 2012-02-21 | Use of capacitance to analyze polycrystalline diamond |
US13/401,188 | 2012-02-21 | ||
PCT/US2013/026918 WO2013126436A1 (en) | 2012-02-21 | 2013-02-20 | Use of capacitance to analyze polycrystalline diamond |
Publications (2)
Publication Number | Publication Date |
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JP2015509590A JP2015509590A (ja) | 2015-03-30 |
JP6294241B2 true JP6294241B2 (ja) | 2018-03-14 |
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JP2014558803A Expired - Fee Related JP6294241B2 (ja) | 2012-02-21 | 2013-02-20 | 多結晶ダイヤモンドを分析するためのキャパシタンスの使用 |
Country Status (8)
Country | Link |
---|---|
US (1) | US9423370B2 (ja) |
EP (1) | EP2631638B1 (ja) |
JP (1) | JP6294241B2 (ja) |
KR (1) | KR102001276B1 (ja) |
CN (1) | CN104246109B (ja) |
RU (1) | RU2610041C2 (ja) |
WO (1) | WO2013126436A1 (ja) |
ZA (1) | ZA201406091B (ja) |
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US10406501B2 (en) | 2015-06-03 | 2019-09-10 | Halliburton Energy Services, Inc. | Electrochemical removal of metal or other material from polycrystalline diamond |
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US20130213720A1 (en) | 2012-02-21 | 2013-08-22 | Varel International Ind., L.P. | Method And Apparatus To Improve The Performance Of A Leached Cutter |
US9128031B2 (en) | 2012-02-21 | 2015-09-08 | Varel International Ind., L.P. | Method to improve the leaching process |
US9423370B2 (en) | 2012-02-21 | 2016-08-23 | Varel International Ind., L.P | Use of capacitance to analyze polycrystalline diamond |
US9377428B2 (en) | 2012-02-21 | 2016-06-28 | Varel International Ind., L.P. | Non-destructive leaching depth measurement using capacitance spectroscopy |
US20130213433A1 (en) | 2012-02-21 | 2013-08-22 | Varel International Ind., L.P. | Method to Improve the Performance of a Leached Cutter |
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-
2012
- 2012-02-21 US US13/401,188 patent/US9423370B2/en active Active
-
2013
- 2013-02-20 WO PCT/US2013/026918 patent/WO2013126436A1/en active Application Filing
- 2013-02-20 CN CN201380021023.4A patent/CN104246109B/zh not_active Expired - Fee Related
- 2013-02-20 JP JP2014558803A patent/JP6294241B2/ja not_active Expired - Fee Related
- 2013-02-20 KR KR1020147026119A patent/KR102001276B1/ko active IP Right Grant
- 2013-02-20 RU RU2013107542A patent/RU2610041C2/ru not_active IP Right Cessation
- 2013-02-21 EP EP13156142.5A patent/EP2631638B1/en not_active Not-in-force
-
2014
- 2014-08-19 ZA ZA2014/06091A patent/ZA201406091B/en unknown
Also Published As
Publication number | Publication date |
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WO2013126436A1 (en) | 2013-08-29 |
US20130214799A1 (en) | 2013-08-22 |
EP2631638A2 (en) | 2013-08-28 |
CN104246109A (zh) | 2014-12-24 |
US9423370B2 (en) | 2016-08-23 |
KR20140128438A (ko) | 2014-11-05 |
EP2631638B1 (en) | 2017-09-13 |
ZA201406091B (en) | 2017-09-27 |
JP2015509590A (ja) | 2015-03-30 |
RU2013107542A (ru) | 2014-08-27 |
KR102001276B1 (ko) | 2019-07-17 |
CN104246109B (zh) | 2017-04-19 |
RU2610041C2 (ru) | 2017-02-07 |
EP2631638A3 (en) | 2014-04-30 |
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