JP6273365B2 - サーモグラフィ検査システム - Google Patents

サーモグラフィ検査システム Download PDF

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Publication number
JP6273365B2
JP6273365B2 JP2016536829A JP2016536829A JP6273365B2 JP 6273365 B2 JP6273365 B2 JP 6273365B2 JP 2016536829 A JP2016536829 A JP 2016536829A JP 2016536829 A JP2016536829 A JP 2016536829A JP 6273365 B2 JP6273365 B2 JP 6273365B2
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Japan
Prior art keywords
heat source
inspection system
heat
thermographic inspection
heating elements
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JP2016536829A
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English (en)
Japanese (ja)
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JP2016539340A5 (enExample
JP2016539340A (ja
Inventor
ノスラティ，モハマド
スワンソン，カル
プタシエンスキ，ケヴィン
スミス，ケヴィン，アール
スタインハウザー，ルイス，ピー
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ワットロー，エレクトリック、マニュファクチュアリング，カンパニー
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G01N25/72—Investigating presence of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/48—Thermography; Techniques using wholly visual means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G01N25/18—Investigating or analyzing materials by the use of thermal means by investigating thermal conductivity
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/20—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from infrared radiation only

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Immunology (AREA)
  • General Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Multimedia (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
JP2016536829A 2013-12-04 2014-12-03 サーモグラフィ検査システム Active JP6273365B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US14/097,143 US9518946B2 (en) 2013-12-04 2013-12-04 Thermographic inspection system
US14/097,143 2013-12-04
PCT/US2014/068275 WO2015084909A1 (en) 2013-12-04 2014-12-03 Thermographic inspection system

Publications (3)

Publication Number Publication Date
JP2016539340A JP2016539340A (ja) 2016-12-15
JP2016539340A5 JP2016539340A5 (enExample) 2018-01-11
JP6273365B2 true JP6273365B2 (ja) 2018-01-31

Family

ID=52130860

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2016536829A Active JP6273365B2 (ja) 2013-12-04 2014-12-03 サーモグラフィ検査システム

Country Status (6)

Country Link
US (1) US9518946B2 (enExample)
EP (1) EP3077802B1 (enExample)
JP (1) JP6273365B2 (enExample)
KR (1) KR101927093B1 (enExample)
CN (2) CN105793699A (enExample)
WO (1) WO2015084909A1 (enExample)

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US10260953B2 (en) * 2016-08-11 2019-04-16 The Boeing Company Applique and method for thermographic inspection
US10168217B2 (en) 2016-09-28 2019-01-01 Amazon Technologies, Inc. Automated thermographic inspection for composite structures
US10175186B2 (en) * 2016-09-28 2019-01-08 Amazon Technologies, Inc. Thermographic inspection process for composite vehicle and components
US10634631B2 (en) * 2017-02-14 2020-04-28 Itt Manufacturing Enterprises Llc Methods and systems for detecting defects in layered devices and other materials
CN108760546B (zh) * 2018-08-14 2020-05-08 湖南大学 一种基于红外热像技术的疲劳裂纹扩展速率测量方法
US11474058B2 (en) * 2019-01-10 2022-10-18 General Electric Company Systems and methods for detecting water in a fan case
WO2021158174A1 (en) 2020-02-07 2021-08-12 Agency For Science, Technology And Research Active infrared thermography system and computer-implemented method for generating thermal image
WO2022087263A1 (en) * 2020-10-21 2022-04-28 The Regents Of The University Of California Surface sensitization for high-resolution thermal imaging

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Also Published As

Publication number Publication date
KR20160093701A (ko) 2016-08-08
US9518946B2 (en) 2016-12-13
EP3077802B1 (en) 2018-08-22
KR101927093B1 (ko) 2018-12-10
CN113252723A (zh) 2021-08-13
CN105793699A (zh) 2016-07-20
WO2015084909A1 (en) 2015-06-11
EP3077802A1 (en) 2016-10-12
US20150153293A1 (en) 2015-06-04
JP2016539340A (ja) 2016-12-15

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