JP6261730B2 - スリット走査位相コントラストイメージングにおける補正 - Google Patents

スリット走査位相コントラストイメージングにおける補正 Download PDF

Info

Publication number
JP6261730B2
JP6261730B2 JP2016522531A JP2016522531A JP6261730B2 JP 6261730 B2 JP6261730 B2 JP 6261730B2 JP 2016522531 A JP2016522531 A JP 2016522531A JP 2016522531 A JP2016522531 A JP 2016522531A JP 6261730 B2 JP6261730 B2 JP 6261730B2
Authority
JP
Japan
Prior art keywords
ray
diffraction grating
filter
calibration
phase contrast
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2016522531A
Other languages
English (en)
Japanese (ja)
Other versions
JP2016523157A (ja
JP2016523157A5 (enExample
Inventor
レッスル，エヴァルト
マルテンス，ゲルハルト
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Koninklijke Philips NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninklijke Philips NV filed Critical Koninklijke Philips NV
Publication of JP2016523157A publication Critical patent/JP2016523157A/ja
Publication of JP2016523157A5 publication Critical patent/JP2016523157A5/ja
Application granted granted Critical
Publication of JP6261730B2 publication Critical patent/JP6261730B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/58—Testing, adjusting or calibrating thereof
    • A61B6/582—Calibration
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/48—Diagnostic techniques
    • A61B6/484—Diagnostic techniques involving phase contrast X-ray imaging
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/52—Devices using data or image processing specially adapted for radiation diagnosis
    • A61B6/5258—Devices using data or image processing specially adapted for radiation diagnosis involving detection or reduction of artifacts or noise
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/58—Testing, adjusting or calibrating thereof
    • A61B6/582—Calibration
    • A61B6/583—Calibration using calibration phantoms
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20075—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by measuring interferences of X-rays, e.g. Borrmann effect
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/10—Scattering devices; Absorbing devices; Ionising radiation filters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/303—Accessories, mechanical or electrical features calibrating, standardising
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/18—Diffraction gratings
    • G02B5/1838—Diffraction gratings for use with ultraviolet radiation or X-rays
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2207/00—Particular details of imaging devices or methods using ionizing electromagnetic radiation such as X-rays or gamma rays
    • G21K2207/005—Methods and devices obtaining contrast from non-absorbing interaction of the radiation with matter, e.g. phase contrast

Landscapes

  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Medical Informatics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Pathology (AREA)
  • General Health & Medical Sciences (AREA)
  • Surgery (AREA)
  • Radiology & Medical Imaging (AREA)
  • Biomedical Technology (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Molecular Biology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Animal Behavior & Ethology (AREA)
  • Biophysics (AREA)
  • Public Health (AREA)
  • Veterinary Medicine (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP2016522531A 2013-06-28 2014-06-27 スリット走査位相コントラストイメージングにおける補正 Expired - Fee Related JP6261730B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP13174345.2 2013-06-28
EP13174345 2013-06-28
PCT/EP2014/063679 WO2014207193A1 (en) 2013-06-28 2014-06-27 Correction in slit-scanning phase contrast imaging

Publications (3)

Publication Number Publication Date
JP2016523157A JP2016523157A (ja) 2016-08-08
JP2016523157A5 JP2016523157A5 (enExample) 2017-08-10
JP6261730B2 true JP6261730B2 (ja) 2018-01-17

Family

ID=48699640

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2016522531A Expired - Fee Related JP6261730B2 (ja) 2013-06-28 2014-06-27 スリット走査位相コントラストイメージングにおける補正

Country Status (5)

Country Link
US (1) US9839407B2 (enExample)
EP (1) EP3013233B1 (enExample)
JP (1) JP6261730B2 (enExample)
CN (1) CN105338901B (enExample)
WO (1) WO2014207193A1 (enExample)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2015165765A1 (en) * 2014-05-02 2015-11-05 Koninklijke Philips N.V. Method to calibrate a photon detector, absorption filter assembly and imaging apparatus
EP3149459A1 (en) * 2014-05-27 2017-04-05 Koninklijke Philips N.V. Calibration hardware phantom for differential phase contrast imaging
JP6451400B2 (ja) * 2015-02-26 2019-01-16 コニカミノルタ株式会社 画像処理システム及び画像処理装置
US10779776B2 (en) * 2015-12-01 2020-09-22 Koninklijke Philips N.V. Apparatus for X-ray imaging an object
WO2017216354A1 (en) * 2016-06-16 2017-12-21 Koninklijke Philips N.V. Apparatus for x-ray imaging an object
CN107543835B (zh) * 2016-06-27 2021-05-14 上海一影信息科技有限公司 多能成像方法、装置及其系统
WO2018114734A1 (en) * 2016-12-22 2018-06-28 Koninklijke Philips N.V. Phantom device, dark field imaging system and method for acquiring a dark field image
US11073487B2 (en) * 2017-05-11 2021-07-27 Kla-Tencor Corporation Methods and systems for characterization of an x-ray beam with high spatial resolution
JP6844461B2 (ja) * 2017-07-20 2021-03-17 株式会社島津製作所 Ｘ線位相イメージング装置および情報取得手法
EP3459461A1 (en) * 2017-09-25 2019-03-27 Koninklijke Philips N.V. X-ray imaging reference scan
EP3498170A1 (en) * 2017-12-12 2019-06-19 Koninklijke Philips N.V. Device and method for aligning an x-ray grating to an x-ray radiation source, and x-ray image acquisition system
US10816486B2 (en) * 2018-03-28 2020-10-27 Kla-Tencor Corporation Multilayer targets for calibration and alignment of X-ray based measurement systems
JP2021156578A (ja) * 2018-06-27 2021-10-07 株式会社ニコン Ｘ線装置、ｘ線画像生成方法および構造物の製造方法
CN111096761B (zh) * 2018-10-29 2024-03-08 上海西门子医疗器械有限公司 修正楔形滤波器散射的方法、装置和相关设备
EP3821810A1 (en) * 2019-11-13 2021-05-19 Koninklijke Philips N.V. Active gratings position tracking in gratings-based phase-contrast and dark-field imaging
US12232896B2 (en) * 2020-06-10 2025-02-25 Siemens Shanghai Medical Equipment Ltd. Method and apparatus for determining target location of single-slot collimating plate and collimator assembly

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2442722B1 (en) 2009-06-16 2017-03-29 Koninklijke Philips N.V. Correction method for differential phase contrast imaging
JP2013513418A (ja) * 2009-12-10 2013-04-22 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 微分位相コントラストイメージングシステム
CN102781327B (zh) * 2009-12-10 2015-06-17 皇家飞利浦电子股份有限公司 相衬成像
JP2012090944A (ja) 2010-03-30 2012-05-17 Fujifilm Corp 放射線撮影システム及び放射線撮影方法
CN102221565B (zh) 2010-04-19 2013-06-12 清华大学 X射线源光栅步进成像系统与成像方法
BR112013014562A2 (pt) * 2010-12-13 2017-07-04 Koninl Philips Electronics Nv método de análise de uma região de interesse em um objeto, dispositivo de análise de uma região de interesse em um objeto, produto de programa de computador e meio legível por computador
JP2012143549A (ja) 2010-12-21 2012-08-02 Fujifilm Corp 放射線画像生成方法および放射線画像撮影装置
JP6353361B2 (ja) 2011-07-04 2018-07-04 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 位相コントラストイメージング装置

Also Published As

Publication number Publication date
US20160128665A1 (en) 2016-05-12
EP3013233A1 (en) 2016-05-04
JP2016523157A (ja) 2016-08-08
CN105338901B (zh) 2019-03-08
WO2014207193A1 (en) 2014-12-31
EP3013233B1 (en) 2017-11-15
US9839407B2 (en) 2017-12-12
CN105338901A (zh) 2016-02-17

Similar Documents

Publication Publication Date Title
JP6261730B2 (ja) スリット走査位相コントラストイメージングにおける補正
US9795350B2 (en) Material differentiation with phase contrast imaging
EP2400891B1 (en) Low dose single step grating based x-ray phase contrast imaging
JP5059107B2 (ja) 位相コントラストイメージング用のｘ線干渉計
EP2586373B1 (en) X-ray interferometer
CN103648388B (zh) 相位对比度成像设备
US20130279659A1 (en) Method and a system for image integration using constrained optimization for phase contrast imaging with an arragement of gratings
JP6187298B2 (ja) Ｘ線撮影システム及び画像処理方法
JP2012090945A (ja) 放射線検出装置、放射線撮影装置、放射線撮影システム
JP2012200567A (ja) 放射線撮影システム及び放射線撮影方法
WO2014206841A1 (en) Correction in phase contrast imaging
Viermetz et al. Initial characterization of dark-field CT on a clinical gantry
JP5526775B2 (ja) 放射線撮像装置
CN114269250A (zh) 用于x射线暗场、相位对比和衰减图像采集的系统
EP3468472B1 (en) Phantom device, dark field imaging system and method for acquiring a dark field image
US8348508B2 (en) Wave ramp test method and apparatus
KR102426991B1 (ko) 방사선 화상 생성 장치
JP5733908B2 (ja) Ｘ線撮像装置
JP2013106883A (ja) 放射線撮影装置及び画像処理方法
Nelson Complementarity of Multiple X-Ray Contrasts in Characterization of Pulmonary Fibrosis with Grating Interferometer Micro-CT
JP2008073318A (ja) 放射線画像復元システム、放射線画像復元方法及び放射線画像復元装置

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20160106

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20170626

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20170626

A871 Explanation of circumstances concerning accelerated examination

Free format text: JAPANESE INTERMEDIATE CODE: A871

Effective date: 20170626

A975 Report on accelerated examination

Free format text: JAPANESE INTERMEDIATE CODE: A971005

Effective date: 20170823

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20170829

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20171020

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20171114

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20171212

R150 Certificate of patent or registration of utility model

Ref document number: 6261730

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

LAPS Cancellation because of no payment of annual fees