CN105338901B - 狭缝扫描相位衬度成像中的校正 - Google Patents

狭缝扫描相位衬度成像中的校正 Download PDF

Info

Publication number
CN105338901B
CN105338901B CN201480036955.0A CN201480036955A CN105338901B CN 105338901 B CN105338901 B CN 105338901B CN 201480036955 A CN201480036955 A CN 201480036955A CN 105338901 B CN105338901 B CN 105338901B
Authority
CN
China
Prior art keywords
ray
grating
filter
calibration
contrast imaging
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN201480036955.0A
Other languages
English (en)
Chinese (zh)
Other versions
CN105338901A (zh
Inventor
E·勒斯尔
G·马滕斯
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Koninklijke Philips Electronics NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninklijke Philips Electronics NV filed Critical Koninklijke Philips Electronics NV
Publication of CN105338901A publication Critical patent/CN105338901A/zh
Application granted granted Critical
Publication of CN105338901B publication Critical patent/CN105338901B/zh
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/58—Testing, adjusting or calibrating thereof
    • A61B6/582—Calibration
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/48—Diagnostic techniques
    • A61B6/484—Diagnostic techniques involving phase contrast X-ray imaging
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/52—Devices using data or image processing specially adapted for radiation diagnosis
    • A61B6/5258—Devices using data or image processing specially adapted for radiation diagnosis involving detection or reduction of artifacts or noise
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/58—Testing, adjusting or calibrating thereof
    • A61B6/582—Calibration
    • A61B6/583—Calibration using calibration phantoms
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20075—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by measuring interferences of X-rays, e.g. Borrmann effect
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/10—Scattering devices; Absorbing devices; Ionising radiation filters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/303—Accessories, mechanical or electrical features calibrating, standardising
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/18—Diffraction gratings
    • G02B5/1838—Diffraction gratings for use with ultraviolet radiation or X-rays
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2207/00—Particular details of imaging devices or methods using ionizing electromagnetic radiation such as X-rays or gamma rays
    • G21K2207/005—Methods and devices obtaining contrast from non-absorbing interaction of the radiation with matter, e.g. phase contrast

Landscapes

  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Medical Informatics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Pathology (AREA)
  • General Health & Medical Sciences (AREA)
  • Surgery (AREA)
  • Radiology & Medical Imaging (AREA)
  • Biomedical Technology (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Molecular Biology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Animal Behavior & Ethology (AREA)
  • Biophysics (AREA)
  • Public Health (AREA)
  • Veterinary Medicine (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
CN201480036955.0A 2013-06-28 2014-06-27 狭缝扫描相位衬度成像中的校正 Expired - Fee Related CN105338901B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP13174345 2013-06-28
EP13174345.2 2013-06-28
PCT/EP2014/063679 WO2014207193A1 (en) 2013-06-28 2014-06-27 Correction in slit-scanning phase contrast imaging

Publications (2)

Publication Number Publication Date
CN105338901A CN105338901A (zh) 2016-02-17
CN105338901B true CN105338901B (zh) 2019-03-08

Family

ID=48699640

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201480036955.0A Expired - Fee Related CN105338901B (zh) 2013-06-28 2014-06-27 狭缝扫描相位衬度成像中的校正

Country Status (5)

Country Link
US (1) US9839407B2 (enExample)
EP (1) EP3013233B1 (enExample)
JP (1) JP6261730B2 (enExample)
CN (1) CN105338901B (enExample)
WO (1) WO2014207193A1 (enExample)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2015165765A1 (en) * 2014-05-02 2015-11-05 Koninklijke Philips N.V. Method to calibrate a photon detector, absorption filter assembly and imaging apparatus
JP2017516558A (ja) * 2014-05-27 2017-06-22 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 差動位相コントラストイメージング用の較正ハードウェアファントム
JP6451400B2 (ja) * 2015-02-26 2019-01-16 コニカミノルタ株式会社 画像処理システム及び画像処理装置
US10779776B2 (en) * 2015-12-01 2020-09-22 Koninklijke Philips N.V. Apparatus for X-ray imaging an object
WO2017216354A1 (en) * 2016-06-16 2017-12-21 Koninklijke Philips N.V. Apparatus for x-ray imaging an object
CN107543835B (zh) * 2016-06-27 2021-05-14 上海一影信息科技有限公司 多能成像方法、装置及其系统
EP3468472B1 (en) * 2016-12-22 2019-09-25 Koninklijke Philips N.V. Phantom device, dark field imaging system and method for acquiring a dark field image
US11073487B2 (en) * 2017-05-11 2021-07-27 Kla-Tencor Corporation Methods and systems for characterization of an x-ray beam with high spatial resolution
JP6844461B2 (ja) * 2017-07-20 2021-03-17 株式会社島津製作所 Ｘ線位相イメージング装置および情報取得手法
EP3459461A1 (en) * 2017-09-25 2019-03-27 Koninklijke Philips N.V. X-ray imaging reference scan
EP3498170A1 (en) * 2017-12-12 2019-06-19 Koninklijke Philips N.V. Device and method for aligning an x-ray grating to an x-ray radiation source, and x-ray image acquisition system
US10816486B2 (en) * 2018-03-28 2020-10-27 Kla-Tencor Corporation Multilayer targets for calibration and alignment of X-ray based measurement systems
JP2021156578A (ja) * 2018-06-27 2021-10-07 株式会社ニコン Ｘ線装置、ｘ線画像生成方法および構造物の製造方法
CN111096761B (zh) * 2018-10-29 2024-03-08 上海西门子医疗器械有限公司 修正楔形滤波器散射的方法、装置和相关设备
EP3821810A1 (en) * 2019-11-13 2021-05-19 Koninklijke Philips N.V. Active gratings position tracking in gratings-based phase-contrast and dark-field imaging
EP4147641B1 (en) * 2020-06-10 2024-12-04 Siemens Shanghai Medical Equipment Ltd. Method and device for determining target position of single-slot collimating plate, and collimator assembly

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20110243305A1 (en) * 2010-03-30 2011-10-06 Fujifilm Corporation Radiographic system, radiographic method and computer readable medium
WO2012080900A1 (en) * 2010-12-13 2012-06-21 Koninklijke Philips Electronics N.V. Method and device for analysing a region of interest in an object using x-rays
WO2013004574A1 (en) * 2011-07-04 2013-01-10 Koninklijke Philips Electronics N.V Phase contrast imaging apparatus

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102802529B (zh) 2009-06-16 2015-09-16 皇家飞利浦电子股份有限公司 用于微分相衬成像的校正方法
RU2545319C2 (ru) * 2009-12-10 2015-03-27 Конинклейке Филипс Электроникс Н.В. Формирование фазово-контрастных изображений
CN102651994A (zh) 2009-12-10 2012-08-29 皇家飞利浦电子股份有限公司 微分相位对比成像系统的校准
CN102221565B (zh) 2010-04-19 2013-06-12 清华大学 X射线源光栅步进成像系统与成像方法
JP2012143549A (ja) * 2010-12-21 2012-08-02 Fujifilm Corp 放射線画像生成方法および放射線画像撮影装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20110243305A1 (en) * 2010-03-30 2011-10-06 Fujifilm Corporation Radiographic system, radiographic method and computer readable medium
WO2012080900A1 (en) * 2010-12-13 2012-06-21 Koninklijke Philips Electronics N.V. Method and device for analysing a region of interest in an object using x-rays
WO2013004574A1 (en) * 2011-07-04 2013-01-10 Koninklijke Philips Electronics N.V Phase contrast imaging apparatus

Also Published As

Publication number Publication date
US20160128665A1 (en) 2016-05-12
US9839407B2 (en) 2017-12-12
CN105338901A (zh) 2016-02-17
JP6261730B2 (ja) 2018-01-17
EP3013233B1 (en) 2017-11-15
EP3013233A1 (en) 2016-05-04
JP2016523157A (ja) 2016-08-08
WO2014207193A1 (en) 2014-12-31

Similar Documents

Publication Publication Date Title
CN105338901B (zh) 狭缝扫描相位衬度成像中的校正
CN103648388B (zh) 相位对比度成像设备
US8972191B2 (en) Low dose single step grating based X-ray phase contrast imaging
EP2586373B1 (en) X-ray interferometer
CN107567640B (zh) 用于扫描暗场和相位对比成像的射束硬化校正
US9494534B2 (en) Material differentiation with phase contrast imaging
JP5389138B2 (ja) Ｘ線撮像装置およびｘ線撮像方法
CN110049725B (zh) X射线相位成像装置
US9269469B2 (en) Arrangement and method for inverse X-ray phase contrast imaging
JP2007203066A (ja) Ｘ線装置の焦点‐検出器装置のｘ線光学透過格子
ITBO20110085A1 (it) Apparecchiatura per la tomosintesi e la mammografia.
JP6816144B2 (ja) 被検体をｘ線撮像する装置
JP2019519273A (ja) 暗視野又は位相コントラストｘ線撮像における特徴抑制
JP6750310B2 (ja) タルボ撮影装置
JP6844461B2 (ja) Ｘ線位相イメージング装置および情報取得手法
EP2810600A1 (en) Medical imaging method varying collimation of emitted radiation beam
CN114269250B (zh) 用于x射线暗场、相位对比和衰减图像采集的系统
Pyakurel et al. Phase and dark‐field imaging with mesh‐based structured illumination and polycapillary optics
CN109561868B (zh) 用于采集暗场图像的体模设备、暗场成像系统和方法
Viermetz et al. Dark-field imaging on a clinical CT system: realization of Talbot-Lau interferometry in a gantry
JP2011232163A (ja) Ｘ線撮像装置
Nelson et al. Visibility guided phase contrast denoising
JP2008043820A (ja) Ｘ線ｃｔ装置
Bruyndonckx et al. Single grating phase contrast imaging for x-ray microscopy and microtomography
Viermetz et al. Dark-Field for Human CT–Realization of a Talbot-Lau Interferometer in a Clinical CT Gantry

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20190308

Termination date: 20210627

CF01 Termination of patent right due to non-payment of annual fee