JP6173457B2 - 微分位相コントラスト撮像における複数オーダの位相調整のためのソース格子対位相格子距離の位置合わせ - Google Patents

微分位相コントラスト撮像における複数オーダの位相調整のためのソース格子対位相格子距離の位置合わせ Download PDF

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JP6173457B2
JP6173457B2 JP2015527994A JP2015527994A JP6173457B2 JP 6173457 B2 JP6173457 B2 JP 6173457B2 JP 2015527994 A JP2015527994 A JP 2015527994A JP 2015527994 A JP2015527994 A JP 2015527994A JP 6173457 B2 JP6173457 B2 JP 6173457B2
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source
detector
phase
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JP2015529510A (ja
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ゲルハルト メルテンス
ゲルハルト メルテンス
ハイナー デア
ハイナー デア
トーマス デトレフ イステル
トーマス デトレフ イステル
エワルド レッスル
エワルド レッスル
ステーベンダール ウド バン
ステーベンダール ウド バン
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Koninklijke Philips NV
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    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/48—Diagnostic techniques
    • A61B6/484—Diagnostic techniques involving phase contrast X-ray imaging
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/58—Testing, adjusting or calibrating thereof
    • A61B6/587—Alignment of source unit to detector unit
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/58—Testing, adjusting or calibrating thereof
    • A61B6/588—Setting distance between source unit and detector unit
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/58—Testing, adjusting or calibrating thereof
    • A61B6/589—Setting distance between source unit and patient
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20025—Sample holders or supports therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20075—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by measuring interferences of X-rays, e.g. Borrmann effect
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/58—Testing, adjusting or calibrating thereof
    • A61B6/582—Calibration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/643—Specific applications or type of materials object on conveyor

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  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Medical Informatics (AREA)
  • Pathology (AREA)
  • General Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Biophysics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Biomedical Technology (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Surgery (AREA)
  • Animal Behavior & Ethology (AREA)
  • Optics & Photonics (AREA)
  • Public Health (AREA)
  • Veterinary Medicine (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP2015527994A 2012-08-20 2013-08-20 微分位相コントラスト撮像における複数オーダの位相調整のためのソース格子対位相格子距離の位置合わせ Active JP6173457B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201261684869P 2012-08-20 2012-08-20
US61/684,869 2012-08-20
PCT/IB2013/056748 WO2014030115A1 (en) 2012-08-20 2013-08-20 Aligning source-grating-to-phase-grating distance for multiple order phase tuning in differential phase contrast imaging

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JP2015529510A JP2015529510A (ja) 2015-10-08
JP2015529510A5 JP2015529510A5 (https=) 2017-07-06
JP6173457B2 true JP6173457B2 (ja) 2017-08-02

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US (1) US9717470B2 (https=)
EP (1) EP2884899B1 (https=)
JP (1) JP6173457B2 (https=)
CN (1) CN104582573B (https=)
BR (1) BR112015003425A2 (https=)
RU (1) RU2631183C2 (https=)
WO (1) WO2014030115A1 (https=)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10837922B2 (en) 2017-09-01 2020-11-17 Shimadzu Corporation X-ray imaging apparatus

Families Citing this family (39)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU2572644C2 (ru) 2010-10-19 2016-01-20 Конинклейке Филипс Электроникс Н.В. Формирование дифференциальных фазово-контрастных изображений
US9907524B2 (en) 2012-12-21 2018-03-06 Carestream Health, Inc. Material decomposition technique using x-ray phase contrast imaging system
US10096098B2 (en) 2013-12-30 2018-10-09 Carestream Health, Inc. Phase retrieval from differential phase contrast imaging
US9357975B2 (en) * 2013-12-30 2016-06-07 Carestream Health, Inc. Large FOV phase contrast imaging based on detuned configuration including acquisition and reconstruction techniques
US10578563B2 (en) 2012-12-21 2020-03-03 Carestream Health, Inc. Phase contrast imaging computed tomography scanner
US9700267B2 (en) 2012-12-21 2017-07-11 Carestream Health, Inc. Method and apparatus for fabrication and tuning of grating-based differential phase contrast imaging system
US9494534B2 (en) 2012-12-21 2016-11-15 Carestream Health, Inc. Material differentiation with phase contrast imaging
US9724063B2 (en) 2012-12-21 2017-08-08 Carestream Health, Inc. Surrogate phantom for differential phase contrast imaging
JP6247423B2 (ja) * 2014-08-05 2017-12-13 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． Ｘ線イメージング装置用のグレーティング装置
US10945690B2 (en) 2015-06-30 2021-03-16 Koninklijke Philips N.V. Scanning X-ray apparatus with full-field detector
CN107850680B (zh) * 2015-07-21 2021-09-21 皇家飞利浦有限公司 用于相位对比和/或暗场成像的x射线探测器
WO2017212000A1 (en) * 2016-06-08 2017-12-14 Koninklijke Philips N.V. Analyzing grid for phase contrast imaging and/or dark-field imaging
WO2018016369A1 (ja) 2016-07-20 2018-01-25 株式会社島津製作所 Ｘ線位相差撮像装置
CN109690627A (zh) * 2016-09-08 2019-04-26 皇家飞利浦有限公司 改进的相衬和暗场ct重建算法
JP6656391B2 (ja) * 2016-09-27 2020-03-04 株式会社島津製作所 放射線位相差撮影装置
US10809210B2 (en) 2016-11-22 2020-10-20 Shimadzu Corporation X-ray phase imaging apparatus
US11026643B2 (en) * 2016-12-06 2021-06-08 Koninklijke Philips N.V. Interferometer grating support for grating-based x-ray imaging and/or a support bracket therefor
JP6683118B2 (ja) * 2016-12-20 2020-04-15 株式会社島津製作所 Ｘ線位相撮影装置
EP3378397A1 (en) * 2017-03-24 2018-09-26 Koninklijke Philips N.V. Sensitivity optimized patient positioning system for dark-field x-ray imaging
EP3391821B1 (en) 2017-04-20 2024-05-08 Shimadzu Corporation X-ray phase contrast imaging system
JP6780592B2 (ja) 2017-06-22 2020-11-04 株式会社島津製作所 Ｘ線位相差イメージング装置
EP3459461A1 (en) * 2017-09-25 2019-03-27 Koninklijke Philips N.V. X-ray imaging reference scan
CN107748341B (zh) * 2017-10-23 2024-08-13 中国科学院苏州生物医学工程技术研究所 高衬度低剂量相位衬度ct成像装置
US11013482B2 (en) 2017-10-31 2021-05-25 Shimadzu Corporation Phase contrast X-ray imaging system
WO2019111505A1 (ja) * 2017-12-06 2019-06-13 株式会社島津製作所 Ｘ線位相差撮像システム
WO2019123758A1 (ja) * 2017-12-22 2019-06-27 株式会社島津製作所 Ｘ線位相差撮像システム
CN108469443A (zh) * 2018-04-18 2018-08-31 北京航空航天大学 基于二维错位吸收光栅的x射线光栅差分相位衬度成像方法及装置
JP6881682B2 (ja) * 2018-05-16 2021-06-02 株式会社島津製作所 Ｘ線イメージング装置
WO2020039654A1 (ja) * 2018-08-22 2020-02-27 株式会社島津製作所 Ｘ線位相イメージング装置
JP7111166B2 (ja) * 2018-08-22 2022-08-02 株式会社島津製作所 Ｘ線位相イメージング装置
WO2020054151A1 (ja) * 2018-09-11 2020-03-19 株式会社島津製作所 Ｘ線位相イメージング装置
CN109273131B (zh) * 2018-10-31 2024-07-02 同方威视技术股份有限公司 准直器组件和射线检测设备
CN111721786B (zh) * 2019-03-22 2023-05-26 中国科学院深圳先进技术研究院 一种x射线干涉仪及成像系统
JP7200816B2 (ja) * 2019-04-22 2023-01-10 株式会社島津製作所 Ｘ線位相イメージング装置およびｘ線位相コントラスト画像生成方法
JP7180566B2 (ja) * 2019-07-25 2022-11-30 株式会社島津製作所 Ｘ線イメージング装置およびｘ線イメージング方法
EP3782551A1 (en) 2019-08-23 2021-02-24 Koninklijke Philips N.V. System for x-ray dark-field, phase contrast and attenuation image acquisition
EP3821810A1 (en) * 2019-11-13 2021-05-19 Koninklijke Philips N.V. Active gratings position tracking in gratings-based phase-contrast and dark-field imaging
CN111839579B (zh) * 2020-09-02 2025-06-27 上海联影医疗科技股份有限公司 一种x射线成像设备的限束器及x射线成像设备
CN116626739A (zh) * 2023-05-11 2023-08-22 中国工程物理研究院流体物理研究所 一种x射线光栅干涉仪能谱特性测量装置及测量方法

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4445397B2 (ja) * 2002-12-26 2010-04-07 敦 百生 Ｘ線撮像装置および撮像方法
EP1731099A1 (en) * 2005-06-06 2006-12-13 Paul Scherrer Institut Interferometer for quantitative phase contrast imaging and tomography with an incoherent polychromatic x-ray source
EP1879020A1 (en) 2006-07-12 2008-01-16 Paul Scherrer Institut X-ray interferometer for phase contrast imaging
US8411816B2 (en) * 2007-02-21 2013-04-02 Konica Minolta Medical & Graphic, Inc. Radiological image capturing apparatus and radiological image capturing system
JP2008200361A (ja) * 2007-02-21 2008-09-04 Konica Minolta Medical & Graphic Inc Ｘ線撮影システム
CN101576515B (zh) * 2007-11-23 2012-07-04 同方威视技术股份有限公司 X射线光栅相衬成像系统及方法
CN102365687B (zh) * 2009-03-27 2015-08-19 皇家飞利浦电子股份有限公司 消色差的相衬成像
CN102802529B (zh) * 2009-06-16 2015-09-16 皇家飞利浦电子股份有限公司 用于微分相衬成像的校正方法
US8989474B2 (en) * 2010-03-18 2015-03-24 Konica Minolta Medical & Graphic, Inc. X-ray image capturing system
JP5548085B2 (ja) * 2010-03-30 2014-07-16 富士フイルム株式会社 回折格子の調整方法
JP2012024339A (ja) * 2010-07-23 2012-02-09 Fujifilm Corp 放射線画像撮影システム及びコリメータユニット
WO2012029340A1 (ja) * 2010-08-31 2012-03-08 コニカミノルタエムジー株式会社 Ｘ線撮影システム
JP5150711B2 (ja) * 2010-12-07 2013-02-27 富士フイルム株式会社 放射線撮影装置及び放射線撮影システム
JP2012148068A (ja) 2010-12-27 2012-08-09 Fujifilm Corp 放射線画像取得方法および放射線画像撮影装置
CN103648388B (zh) 2011-07-04 2017-05-03 皇家飞利浦有限公司 相位对比度成像设备
RU2624513C2 (ru) 2012-01-24 2017-07-04 Конинклейке Филипс Н.В. Мультинаправленная фазоконтрастная рентгеновская визуализация
JP2014178130A (ja) * 2013-03-13 2014-09-25 Canon Inc Ｘ線撮像装置及びｘ線撮像システム

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10837922B2 (en) 2017-09-01 2020-11-17 Shimadzu Corporation X-ray imaging apparatus

Also Published As

Publication number Publication date
BR112015003425A2 (pt) 2017-07-04
JP2015529510A (ja) 2015-10-08
CN104582573A (zh) 2015-04-29
RU2015109738A (ru) 2016-10-10
WO2014030115A1 (en) 2014-02-27
EP2884899B1 (en) 2017-04-26
RU2631183C2 (ru) 2017-09-19
US9717470B2 (en) 2017-08-01
EP2884899A1 (en) 2015-06-24
CN104582573B (zh) 2018-09-28
US20150216499A1 (en) 2015-08-06

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