JP6160827B2 - 光コヒーレンストモグラフィー装置 - Google Patents

光コヒーレンストモグラフィー装置 Download PDF

Info

Publication number
JP6160827B2
JP6160827B2 JP2013205061A JP2013205061A JP6160827B2 JP 6160827 B2 JP6160827 B2 JP 6160827B2 JP 2013205061 A JP2013205061 A JP 2013205061A JP 2013205061 A JP2013205061 A JP 2013205061A JP 6160827 B2 JP6160827 B2 JP 6160827B2
Authority
JP
Japan
Prior art keywords
detector
light
interference signal
interference
balanced
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2013205061A
Other languages
English (en)
Japanese (ja)
Other versions
JP2015068775A (ja
JP2015068775A5 (enExample
Inventor
康寛 古内
康寛 古内
昌明 羽根渕
昌明 羽根渕
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nidek Co Ltd
Original Assignee
Nidek Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nidek Co Ltd filed Critical Nidek Co Ltd
Priority to JP2013205061A priority Critical patent/JP6160827B2/ja
Priority to EP14186899.2A priority patent/EP2860488B1/en
Priority to US14/499,735 priority patent/US9921047B2/en
Publication of JP2015068775A publication Critical patent/JP2015068775A/ja
Publication of JP2015068775A5 publication Critical patent/JP2015068775A5/ja
Application granted granted Critical
Publication of JP6160827B2 publication Critical patent/JP6160827B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02055—Reduction or prevention of errors; Testing; Calibration
    • G01B9/02075—Reduction or prevention of errors; Testing; Calibration of particular errors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/0209—Low-coherence interferometers
    • G01B9/02091—Tomographic interferometers, e.g. based on optical coherence
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B3/00—Apparatus for testing the eyes; Instruments for examining the eyes
    • A61B3/10—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions
    • A61B3/102—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions for optical coherence tomography [OCT]
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B5/00—Measuring for diagnostic purposes; Identification of persons
    • A61B5/0059—Measuring for diagnostic purposes; Identification of persons using light, e.g. diagnosis by transillumination, diascopy, fluorescence
    • A61B5/0062—Arrangements for scanning
    • A61B5/0066—Optical coherence imaging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
    • G01B9/02002—Interferometers characterised by controlling or generating intrinsic radiation properties using two or more frequencies
    • G01B9/02004—Interferometers characterised by controlling or generating intrinsic radiation properties using two or more frequencies using frequency scans
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02055—Reduction or prevention of errors; Testing; Calibration
    • G01B9/02062—Active error reduction, i.e. varying with time
    • G01B9/02067—Active error reduction, i.e. varying with time by electronic control systems, i.e. using feedback acting on optics or light
    • G01B9/02069—Synchronization of light source or manipulator and detector
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/25—Fabry-Perot in interferometer, e.g. etalon, cavity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/45—Multiple detectors for detecting interferometer signals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/70—Using polarization in the interferometer

Landscapes

  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Engineering & Computer Science (AREA)
  • Biophysics (AREA)
  • Molecular Biology (AREA)
  • Veterinary Medicine (AREA)
  • Public Health (AREA)
  • Biomedical Technology (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Medical Informatics (AREA)
  • Animal Behavior & Ethology (AREA)
  • Surgery (AREA)
  • Ophthalmology & Optometry (AREA)
  • Optics & Photonics (AREA)
  • Automation & Control Theory (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Eye Examination Apparatus (AREA)
JP2013205061A 2013-09-30 2013-09-30 光コヒーレンストモグラフィー装置 Expired - Fee Related JP6160827B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2013205061A JP6160827B2 (ja) 2013-09-30 2013-09-30 光コヒーレンストモグラフィー装置
EP14186899.2A EP2860488B1 (en) 2013-09-30 2014-09-29 Using fixed pattern noise for sampling in swept-source optical coherence tomography
US14/499,735 US9921047B2 (en) 2013-09-30 2014-09-29 Optical coherence tomography device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2013205061A JP6160827B2 (ja) 2013-09-30 2013-09-30 光コヒーレンストモグラフィー装置

Publications (3)

Publication Number Publication Date
JP2015068775A JP2015068775A (ja) 2015-04-13
JP2015068775A5 JP2015068775A5 (enExample) 2016-09-15
JP6160827B2 true JP6160827B2 (ja) 2017-07-12

Family

ID=51687813

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2013205061A Expired - Fee Related JP6160827B2 (ja) 2013-09-30 2013-09-30 光コヒーレンストモグラフィー装置

Country Status (3)

Country Link
US (1) US9921047B2 (enExample)
EP (1) EP2860488B1 (enExample)
JP (1) JP6160827B2 (enExample)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6180877B2 (ja) * 2013-10-02 2017-08-16 株式会社トプコン 光画像計測装置
JP6357346B2 (ja) * 2014-05-02 2018-07-11 株式会社トーメーコーポレーション 眼科装置
JP6805539B2 (ja) 2015-05-01 2020-12-23 株式会社ニデック 眼科撮像装置
US10463247B2 (en) * 2015-06-22 2019-11-05 The Regents Of The University Of California Automatic three-dimensional segmentation method for OCT and doppler OCT angiography
CN105030201B (zh) * 2015-07-27 2017-10-13 浙江大学 基于静态区域信息的扫频oct数字相位矫正方法与系统
JP6619202B2 (ja) * 2015-10-29 2019-12-11 株式会社トプコン 眼科撮影装置
WO2017097886A1 (en) * 2015-12-09 2017-06-15 Carl Zeiss Meditec Ag Balanced detection systems
JP2019513449A (ja) * 2016-03-31 2019-05-30 バイオ−ツリー システムズ， インコーポレイテッド 光干渉断層撮影イメージから３ｄ網膜血管形態を得る方法及びこれらを分析する方法
JP6812740B2 (ja) 2016-10-13 2021-01-13 株式会社ニデック Ｏｃｔ装置
JP6790879B2 (ja) * 2017-02-01 2020-11-25 株式会社ニデック Ｏｃｔ装置
JP7119286B2 (ja) * 2017-03-31 2022-08-17 株式会社ニデック Ｏｃｔ装置
JP2017185342A (ja) * 2017-07-18 2017-10-12 株式会社トプコン 光画像計測装置
JP7031205B2 (ja) 2017-09-29 2022-03-08 株式会社ニデック Ｏｃｔ装置
JP2019150381A (ja) * 2018-03-05 2019-09-12 株式会社トーメーコーポレーション 干渉計
ES3007235T3 (en) * 2018-11-28 2025-03-19 Alcon Inc Optical coherence tomography receiver
JP7600819B2 (ja) * 2021-03-30 2024-12-17 株式会社ニデック Ｏｃｔ装置
JP7600818B2 (ja) * 2021-03-30 2024-12-17 株式会社ニデック Ｏｃｔ装置
CN113397474A (zh) * 2021-07-13 2021-09-17 上海美沃精密仪器股份有限公司 一种生物测量仪
KR20250097427A (ko) * 2023-12-21 2025-06-30 재단법인대구경북과학기술원 광섬유 기반 힘과 거리 동시 측정 센서 및 이의 제조방법

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2009009801A1 (en) * 2007-07-12 2009-01-15 Volcano Corporation Apparatus and methods for uniform frequency sample clocking
US8059277B2 (en) 2007-08-27 2011-11-15 Axsun Technologies, Inc. Mode hopping swept frequency laser for FD OCT and method of operation
JP5529384B2 (ja) * 2007-09-28 2014-06-25 テルモ株式会社 光ロータリアダプタおよびこれを用いる光断層画像化装置
US8125645B2 (en) * 2008-03-31 2012-02-28 Fujifilm Corporation Optical tomographic imaging system, tomographic image acquiring method, and optical tomographic image forming method
JP5242473B2 (ja) 2009-03-23 2013-07-24 株式会社ニデック 眼科撮影装置、及び眼科撮影装置のキャリブレーション方法
JP5666617B2 (ja) * 2010-03-17 2015-02-12 ライトラボ・イメージング・インコーポレーテッド 干渉センシングおよび画像取得システムのための強度雑音を低減する方法および装置
JP5679686B2 (ja) * 2010-03-18 2015-03-04 キヤノン株式会社 光干渉断層撮像装置
US8678594B2 (en) * 2010-07-13 2014-03-25 University Of Kent At Canterbury Apparatus and method of monitoring and measurement using spectral low coherence interferometry
US8437007B2 (en) * 2010-12-30 2013-05-07 Axsun Technologies, Inc. Integrated optical coherence tomography system
US9433353B2 (en) 2011-06-23 2016-09-06 Nidek Co., Ltd. Optical coherence tomography apparatus
JP5903903B2 (ja) * 2012-01-19 2016-04-13 株式会社ニデック 光コヒーレンストモグラフィー装置
JP5938926B2 (ja) * 2012-01-31 2016-06-22 株式会社ニデック 光断層像撮影装置及びノイズ除去方法

Also Published As

Publication number Publication date
EP2860488A1 (en) 2015-04-15
JP2015068775A (ja) 2015-04-13
US9921047B2 (en) 2018-03-20
EP2860488B1 (en) 2016-07-13
US20150094978A1 (en) 2015-04-02

Similar Documents

Publication Publication Date Title
JP6160827B2 (ja) 光コヒーレンストモグラフィー装置
US10101148B2 (en) OCT apparatus
US9058652B2 (en) Method for reducing noise in tomographic image and recording medium having noise reducing program stored therein
JP5605999B2 (ja) 光干渉断層撮像方法および装置
EP2574273B1 (en) Optical coherence tomography apparatus
JP5591798B2 (ja) サンプル測定用のｓｓ−ｏｃｔ干渉法
US9820645B2 (en) Ophthalmologic apparatus
US10674905B2 (en) OCT apparatus
US9310187B2 (en) Image capturing apparatus, image capturing method, and storage medium
JP5903903B2 (ja) 光コヒーレンストモグラフィー装置
US9709383B2 (en) Optical coherence tomography apparatus
JP2011526159A5 (enExample)
JP5772284B2 (ja) 光コヒーレンストモグラフィ装置
JP2017029483A (ja) 眼科撮影装置
JP5990932B2 (ja) 眼光断層画像撮像装置
JP5987355B2 (ja) 眼光断層画像撮像装置
JP2018171168A (ja) Ｏｃｔ装置
JP6790879B2 (ja) Ｏｃｔ装置
JP7119286B2 (ja) Ｏｃｔ装置
JP2022117663A (ja) Ｏｃｔ装置
JP6601189B2 (ja) 光コヒーレンストモグラフィ装置および干渉信号処理プログラム
JP2018171348A (ja) Ｏｃｔ装置

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20160729

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20160729

A871 Explanation of circumstances concerning accelerated examination

Free format text: JAPANESE INTERMEDIATE CODE: A871

Effective date: 20160729

A975 Report on accelerated examination

Free format text: JAPANESE INTERMEDIATE CODE: A971005

Effective date: 20160909

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20160913

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20161114

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20170131

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20170403

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20170517

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20170530

R150 Certificate of patent or registration of utility model

Ref document number: 6160827

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

LAPS Cancellation because of no payment of annual fees