JP6114635B2 - 放射線検出器およびその製造方法 - Google Patents

放射線検出器およびその製造方法 Download PDF

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Publication number
JP6114635B2
JP6114635B2 JP2013119455A JP2013119455A JP6114635B2 JP 6114635 B2 JP6114635 B2 JP 6114635B2 JP 2013119455 A JP2013119455 A JP 2013119455A JP 2013119455 A JP2013119455 A JP 2013119455A JP 6114635 B2 JP6114635 B2 JP 6114635B2
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array substrate
adhesive
moisture
radiation detector
proof body
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JP2013119455A
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English (en)
Japanese (ja)
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JP2014238271A (ja
JP2014238271A5 (zh
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克久 本間
克久 本間
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Canon Electron Tubes and Devices Co Ltd
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Toshiba Electron Tubes and Devices Co Ltd
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Application filed by Toshiba Electron Tubes and Devices Co Ltd filed Critical Toshiba Electron Tubes and Devices Co Ltd
Priority to JP2013119455A priority Critical patent/JP6114635B2/ja
Priority to TW103119813A priority patent/TWI591368B/zh
Priority to CN201410250430.9A priority patent/CN104241199B/zh
Publication of JP2014238271A publication Critical patent/JP2014238271A/ja
Publication of JP2014238271A5 publication Critical patent/JP2014238271A5/ja
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/20Measuring radiation intensity with scintillation detectors
    • G01T1/202Measuring radiation intensity with scintillation detectors the detector being a crystal
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144Devices controlled by radiation
    • H01L27/1443Devices controlled by radiation with at least one potential jump or surface barrier

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Chemical & Material Sciences (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Electromagnetism (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
JP2013119455A 2013-06-06 2013-06-06 放射線検出器およびその製造方法 Active JP6114635B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2013119455A JP6114635B2 (ja) 2013-06-06 2013-06-06 放射線検出器およびその製造方法
TW103119813A TWI591368B (zh) 2013-06-06 2014-06-06 Radiation detector and manufacturing method thereof
CN201410250430.9A CN104241199B (zh) 2013-06-06 2014-06-06 放射线检测器的制造方法以及放射线检测器

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2013119455A JP6114635B2 (ja) 2013-06-06 2013-06-06 放射線検出器およびその製造方法

Publications (3)

Publication Number Publication Date
JP2014238271A JP2014238271A (ja) 2014-12-18
JP2014238271A5 JP2014238271A5 (zh) 2016-07-07
JP6114635B2 true JP6114635B2 (ja) 2017-04-12

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JP2013119455A Active JP6114635B2 (ja) 2013-06-06 2013-06-06 放射線検出器およびその製造方法

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JP (1) JP6114635B2 (zh)
CN (1) CN104241199B (zh)
TW (1) TWI591368B (zh)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016128779A (ja) * 2015-01-09 2016-07-14 株式会社東芝 放射線検出器及びその製造方法
JP6749038B2 (ja) * 2016-04-07 2020-09-02 キヤノン電子管デバイス株式会社 放射線検出器、及びその製造方法
JP2017192090A (ja) * 2016-04-15 2017-10-19 東芝電子管デバイス株式会社 放射線検出器
JP2017203672A (ja) * 2016-05-11 2017-11-16 東芝電子管デバイス株式会社 放射線検出器
JP6818617B2 (ja) * 2017-04-03 2021-01-20 キヤノン電子管デバイス株式会社 放射線検出器、放射線検出器の製造装置、および放射線検出器の製造方法
CN111801599B (zh) * 2018-02-28 2023-06-06 富士胶片株式会社 放射线检测器、放射线图像摄影装置及放射线检测器的制造方法
JPWO2019244610A1 (ja) * 2018-06-22 2021-07-08 富士フイルム株式会社 放射線検出器及び放射線画像撮影装置
CN110849918B (zh) * 2019-10-31 2021-11-09 北京时代民芯科技有限公司 一种倒装焊器件焊点缺陷无损检测方法和系统

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA2260041C (en) * 1997-02-14 2001-10-09 Hamamatsu Photonics K.K. Radiation detection device and method of producing the same
JP3405706B2 (ja) * 1997-02-14 2003-05-12 浜松ホトニクス株式会社 放射線検出素子
JP2002181949A (ja) * 2000-12-08 2002-06-26 Canon Inc 放射線検出装置及びそれを用いた放射線撮像システム
JP4612876B2 (ja) * 2004-08-10 2011-01-12 キヤノン株式会社 放射線検出装置、シンチレータパネル、これらの製造方法及び放射線検出システム
JP2006058171A (ja) * 2004-08-20 2006-03-02 Fuji Photo Film Co Ltd マンモグラフィ用放射線画像変換パネルおよびその製造方法
JP4819344B2 (ja) * 2004-11-24 2011-11-24 キヤノン株式会社 半導体装置、放射線撮像装置、及びその製造方法
JP4764407B2 (ja) * 2007-11-20 2011-09-07 東芝電子管デバイス株式会社 放射線検出器及びその製造方法
CN101900824B (zh) * 2010-06-24 2012-05-09 江苏康众数字医疗设备有限公司 闪烁体封装薄膜及封装方法
JP2012052965A (ja) * 2010-09-02 2012-03-15 Toshiba Corp 放射線検出器及びその製造方法
JP2012088152A (ja) * 2010-10-19 2012-05-10 Toshiba Electron Tubes & Devices Co Ltd 放射線検出装置
JP5728250B2 (ja) * 2011-03-01 2015-06-03 キヤノン株式会社 放射線検出装置、シンチレータパネル、それらの製造方法、および放射線検出システム
JP5905672B2 (ja) * 2011-06-28 2016-04-20 株式会社東芝 放射線検出器及びその製造方法
JP2013038346A (ja) * 2011-08-10 2013-02-21 Olympus Corp 光学装置

Also Published As

Publication number Publication date
CN104241199A (zh) 2014-12-24
JP2014238271A (ja) 2014-12-18
TW201506434A (zh) 2015-02-16
TWI591368B (zh) 2017-07-11
CN104241199B (zh) 2017-09-12

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