JP5973832B2 - 増幅器及び放射線検出器 - Google Patents
増幅器及び放射線検出器 Download PDFInfo
- Publication number
- JP5973832B2 JP5973832B2 JP2012172332A JP2012172332A JP5973832B2 JP 5973832 B2 JP5973832 B2 JP 5973832B2 JP 2012172332 A JP2012172332 A JP 2012172332A JP 2012172332 A JP2012172332 A JP 2012172332A JP 5973832 B2 JP5973832 B2 JP 5973832B2
- Authority
- JP
- Japan
- Prior art keywords
- amplifier circuit
- amplifier
- preamplifier
- radiation
- time
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 230000005855 radiation Effects 0.000 title claims description 52
- 238000001514 detection method Methods 0.000 claims description 26
- 239000003990 capacitor Substances 0.000 claims description 14
- 238000007599 discharging Methods 0.000 claims description 3
- 230000010355 oscillation Effects 0.000 description 11
- 238000010586 diagram Methods 0.000 description 4
- 238000004876 x-ray fluorescence Methods 0.000 description 3
- 238000000034 method Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 238000004904 shortening Methods 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 238000002083 X-ray spectrum Methods 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/04—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements with semiconductor devices only
- H03F3/08—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements with semiconductor devices only controlled by light
- H03F3/087—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements with semiconductor devices only controlled by light with IC amplifier blocks
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/17—Circuit arrangements not adapted to a particular type of detector
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F1/00—Details of amplifiers with only discharge tubes, only semiconductor devices or only unspecified devices as amplifying elements
- H03F1/02—Modifications of amplifiers to raise the efficiency, e.g. gliding Class A stages, use of an auxiliary oscillation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
- G01J1/46—Electric circuits using a capacitor
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2200/00—Indexing scheme relating to amplifiers
- H03F2200/261—Amplifier which being suitable for instrumentation applications
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Amplifiers (AREA)
- Measurement Of Radiation (AREA)
Description
図1は、本発明の放射線検出器の模式的回路図である。放射線検出器は、X線等の放射線を検出するための放射線検出素子2を備えている。放射線検出素子2は、SDD等の半導体検出素子である。放射線検出素子2は、放射線が入射した場合に、放射線のエネルギーに比例した電荷信号を発生する。放射線検出素子2の出力端には、プリアンプ1が接続されている。プリアンプ1は本発明の増幅器である。放射線検出素子2からは電荷信号が出力され、プリアンプ1は、放射線検出素子2からの電荷信号を、放射線のエネルギーに比例した電圧信号に変換する。プリアンプ1の出力端には、放射線検出器の出力端が接続されている。
11 第1増幅回路
12 第2増幅回路
13 キャパシタ
14 スイッチ
2 放射線検出素子
Claims (2)
- 第1増幅回路と、該第1増幅回路の入力端及び出力端の間に接続されたキャパシタと、該キャパシタを放電させるためのスイッチとを備える増幅器において、
1倍よりも小さい正の利得を有する第2増幅回路を備え、
該第2増幅回路の入力端が前記第1増幅回路の出力端に接続され、
前記第2増幅回路の出力端と前記第1増幅回路の入力端との間に前記スイッチが接続されており、
前記第1増幅回路の入力端に信号が入力され、前記第1増幅回路の出力端から外部へ信号を出力するようにしてあること
を特徴とする増幅器。 - 放射線検出時に電荷信号を発生する放射線検出素子と、
該放射線検出素子が発生した電荷信号を入力され、入力された電荷信号を電圧信号に変換する請求項1に記載の増幅器と
を備えることを特徴とする放射線検出器。
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012172332A JP5973832B2 (ja) | 2012-08-02 | 2012-08-02 | 増幅器及び放射線検出器 |
DE102013215177.2A DE102013215177A1 (de) | 2012-08-02 | 2013-08-01 | Verstärker und Strahlungsdetektor |
US13/956,856 US9411054B2 (en) | 2012-08-02 | 2013-08-01 | Amplifier and radiation detector |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012172332A JP5973832B2 (ja) | 2012-08-02 | 2012-08-02 | 増幅器及び放射線検出器 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2014033315A JP2014033315A (ja) | 2014-02-20 |
JP5973832B2 true JP5973832B2 (ja) | 2016-08-23 |
Family
ID=49944200
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2012172332A Active JP5973832B2 (ja) | 2012-08-02 | 2012-08-02 | 増幅器及び放射線検出器 |
Country Status (3)
Country | Link |
---|---|
US (1) | US9411054B2 (ja) |
JP (1) | JP5973832B2 (ja) |
DE (1) | DE102013215177A1 (ja) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP3758223A1 (en) * | 2019-06-25 | 2020-12-30 | Oxford Instruments Technologies Oy | A preamplifier circuit |
IT201900025402A1 (it) * | 2019-12-23 | 2021-06-23 | Milano Politecnico | Apparato di rivelazione di radiazioni |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3582675A (en) * | 1968-05-03 | 1971-06-01 | Teledyne Inc | Electronic switching arrangement |
CH682276A5 (ja) * | 1991-04-02 | 1993-08-13 | Kk Holding Ag | |
JP2000147367A (ja) | 1998-11-13 | 2000-05-26 | Olympus Optical Co Ltd | 測距装置 |
JP3705422B2 (ja) * | 2001-01-25 | 2005-10-12 | 株式会社アドバンテスト | 電流−電圧変換装置 |
US6803555B1 (en) * | 2001-09-07 | 2004-10-12 | Indigo Systems Corporation | Two-stage auto-zero amplifier circuit for electro-optical arrays |
JP2009222480A (ja) | 2008-03-14 | 2009-10-01 | Olympus Corp | 光電流積分回路 |
JP5296612B2 (ja) | 2009-06-22 | 2013-09-25 | 浜松ホトニクス株式会社 | 積分回路および光検出装置 |
JP5702704B2 (ja) * | 2010-11-26 | 2015-04-15 | 富士フイルム株式会社 | 放射線画像検出装置、及び放射線画像撮影システム |
-
2012
- 2012-08-02 JP JP2012172332A patent/JP5973832B2/ja active Active
-
2013
- 2013-08-01 US US13/956,856 patent/US9411054B2/en active Active
- 2013-08-01 DE DE102013215177.2A patent/DE102013215177A1/de active Pending
Also Published As
Publication number | Publication date |
---|---|
DE102013215177A1 (de) | 2014-02-06 |
JP2014033315A (ja) | 2014-02-20 |
US9411054B2 (en) | 2016-08-09 |
US20140217285A1 (en) | 2014-08-07 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
USRE49401E1 (en) | Radiation imaging apparatus and radiation imaging system | |
US8415635B2 (en) | Particle-counting apparatus with pulse shortening | |
US11303831B2 (en) | Radiation imaging apparatus and radiation imaging method | |
JP6920515B2 (ja) | フォトンカウンティング装置およびフォトンカウンティング方法 | |
US8817148B2 (en) | Method for acquiring data with an image sensor | |
JP5502946B2 (ja) | タッチパネルの制御回路及び制御方法 | |
KR20130032644A (ko) | 이미지 센서 및 이를 포함하는 엑스-레이 이미지 센싱 모듈 | |
WO2017187972A1 (ja) | 放射線検出装置及び放射線検出用信号処理装置 | |
JPWO2010023706A1 (ja) | 四重極型質量分析装置及び四重極型質量分析装置の調整方法 | |
JP2018014757A (ja) | 増幅器及び放射線検出器 | |
JP5973832B2 (ja) | 増幅器及び放射線検出器 | |
EP2645706A2 (en) | Programmable readout integrated circuit for an ionizing radiation sensor | |
JP4448042B2 (ja) | 信号検出方法および装置並びに放射線画像信号検出方法およびシステム | |
US9817048B2 (en) | Image sensor power supply noise detection | |
KR101824629B1 (ko) | 이극 펄스 특성을 이용한 행성탐사용 감마선 분광계 및 그 감마선 신호처리 방법 | |
JP2016114554A (ja) | 中性子測定装置および中性子測定方法 | |
WO2017187971A1 (ja) | 放射線検出装置及び放射線検出用信号処理装置 | |
JP2008035340A (ja) | ノイズ低減回路 | |
JP6380882B2 (ja) | 信号検出回路 | |
JP6999593B2 (ja) | 検出装置及びスペクトル生成装置 | |
US20130147648A1 (en) | Asynchronous digitisation of transient signals from radiation detectors | |
Jaffari et al. | Zero-pole modulation and demodulation for noise reduction in charge amplifiers | |
JP2014025705A (ja) | 入力信号レベル検出器 | |
JP2007336053A (ja) | 撮像信号前処理装置及びこれを備えた撮像装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20150625 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20160216 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20160223 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20160518 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20160621 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20160715 |
|
R150 | Certificate of patent or registration of utility model |
Ref document number: 5973832 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |