JP5917323B2 - シンチレータパネル及び放射線検出器 - Google Patents
シンチレータパネル及び放射線検出器 Download PDFInfo
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- JP5917323B2 JP5917323B2 JP2012161762A JP2012161762A JP5917323B2 JP 5917323 B2 JP5917323 B2 JP 5917323B2 JP 2012161762 A JP2012161762 A JP 2012161762A JP 2012161762 A JP2012161762 A JP 2012161762A JP 5917323 B2 JP5917323 B2 JP 5917323B2
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- 230000005855 radiation Effects 0.000 title claims description 31
- 239000010410 layer Substances 0.000 claims description 127
- 239000000758 substrate Substances 0.000 claims description 100
- 239000011521 glass Substances 0.000 claims description 96
- 229920005989 resin Polymers 0.000 claims description 96
- 239000011347 resin Substances 0.000 claims description 96
- 239000011241 protective layer Substances 0.000 claims description 12
- -1 polyparaxylylene Polymers 0.000 claims description 7
- 229920000052 poly(p-xylylene) Polymers 0.000 claims description 5
- 229920002396 Polyurea Polymers 0.000 claims description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 3
- 239000003822 epoxy resin Substances 0.000 claims description 3
- 239000000463 material Substances 0.000 claims description 3
- 229920000647 polyepoxide Polymers 0.000 claims description 3
- 229910052710 silicon Inorganic materials 0.000 claims description 3
- 239000010703 silicon Substances 0.000 claims description 3
- 229920002803 thermoplastic polyurethane Polymers 0.000 claims description 3
- 239000010408 film Substances 0.000 description 20
- 238000004519 manufacturing process Methods 0.000 description 8
- 238000007740 vapor deposition Methods 0.000 description 6
- 230000000694 effects Effects 0.000 description 5
- 230000005540 biological transmission Effects 0.000 description 4
- 238000000034 method Methods 0.000 description 3
- 229920003207 poly(ethylene-2,6-naphthalate) Polymers 0.000 description 3
- 239000011112 polyethylene naphthalate Substances 0.000 description 3
- 229920000139 polyethylene terephthalate Polymers 0.000 description 3
- 239000005020 polyethylene terephthalate Substances 0.000 description 3
- 230000002159 abnormal effect Effects 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 229920001721 polyimide Polymers 0.000 description 2
- 230000002265 prevention Effects 0.000 description 2
- 239000007787 solid Substances 0.000 description 2
- 230000001629 suppression Effects 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 description 1
- 239000004642 Polyimide Substances 0.000 description 1
- 229910003481 amorphous carbon Inorganic materials 0.000 description 1
- 230000002238 attenuated effect Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 238000005336 cracking Methods 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 229910052731 fluorine Inorganic materials 0.000 description 1
- 239000011737 fluorine Substances 0.000 description 1
- 229910002804 graphite Inorganic materials 0.000 description 1
- 239000010439 graphite Substances 0.000 description 1
- 239000013307 optical fiber Substances 0.000 description 1
- 239000012044 organic layer Substances 0.000 description 1
- 239000009719 polyimide resin Substances 0.000 description 1
- 229920000098 polyolefin Polymers 0.000 description 1
- 230000003746 surface roughness Effects 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/202—Measuring radiation intensity with scintillation detectors the detector being a crystal
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C17/00—Surface treatment of glass, not in the form of fibres or filaments, by coating
- C03C17/34—Surface treatment of glass, not in the form of fibres or filaments, by coating with at least two coatings having different compositions
- C03C17/3405—Surface treatment of glass, not in the form of fibres or filaments, by coating with at least two coatings having different compositions with at least two coatings of organic materials
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2002—Optical details, e.g. reflecting or diffusing layers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20188—Auxiliary details, e.g. casings or cooling
- G01T1/20189—Damping or insulation against damage, e.g. caused by heat or pressure
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C2217/00—Coatings on glass
- C03C2217/70—Properties of coatings
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K4/00—Conversion screens for the conversion of the spatial distribution of X-rays or particle radiation into visible images, e.g. fluoroscopic screens
- G21K2004/02—Conversion screens for the conversion of the spatial distribution of X-rays or particle radiation into visible images, e.g. fluoroscopic screens characterised by the external panel structure
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K4/00—Conversion screens for the conversion of the spatial distribution of X-rays or particle radiation into visible images, e.g. fluoroscopic screens
- G21K2004/04—Conversion screens for the conversion of the spatial distribution of X-rays or particle radiation into visible images, e.g. fluoroscopic screens with an intermediate layer
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K4/00—Conversion screens for the conversion of the spatial distribution of X-rays or particle radiation into visible images, e.g. fluoroscopic screens
- G21K2004/10—Conversion screens for the conversion of the spatial distribution of X-rays or particle radiation into visible images, e.g. fluoroscopic screens with a protective film
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K4/00—Conversion screens for the conversion of the spatial distribution of X-rays or particle radiation into visible images, e.g. fluoroscopic screens
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/23—Sheet including cover or casing
- Y10T428/239—Complete cover or casing
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- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- High Energy & Nuclear Physics (AREA)
- General Physics & Mathematics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- General Engineering & Computer Science (AREA)
- General Health & Medical Sciences (AREA)
- Biochemistry (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analytical Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Geochemistry & Mineralogy (AREA)
- Materials Engineering (AREA)
- Organic Chemistry (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Measurement Of Radiation (AREA)
- Conversion Of X-Rays Into Visible Images (AREA)
Description
図1は、本発明の第1実施形態に係る放射線検出器の構成を示す断面図である。同図に示すように、放射線検出器1Aは、シンチレータパネル2Aに受光素子3を固定することによって構成されている。受光素子3は、例えばガラス基板上にフォトダイオード(PD)と薄膜トランジスタ(TFT)とを配列してなるTFTパネルである。
図2は、本発明の第2実施形態に係る放射線検出器の構成を示す断面図である。同図に示すように、第2実施形態に係る放射線検出器1B,1Cは、シンチレータパネル2B,2Cにおいて、有機樹脂層12が形成されたガラス基板11の外側に樹脂フィルム層16が更に配置されている点で、第1実施形態と異なっている。
図3は、本発明の第3実施形態に係る放射線検出器の構成を示す断面図である。同図に示すように、第3実施形態に係る放射線検出器1D,1Eは、シンチレータパネル2D,2Eにおいて、有機樹脂層12が形成されたガラス基板11の外側に有機樹脂層(第2の有機樹脂層)17が更に配置されている点で、第1実施形態と異なっている。
Claims (7)
- 放射線透過性を有する厚さ150μm以下のガラス基板と、
前記ガラス基板の表面全体を覆うように形成された第1の有機樹脂層と、
前記第1の有機樹脂層が形成された前記ガラス基板の一面側に形成されたシンチレータ層と、
前記第1の有機樹脂層が形成された前記ガラス基板と共に前記シンチレータ層を覆うように形成された耐湿性の保護層と、を備え、
前記第1の有機樹脂層が形成された前記ガラス基板の他面側と前記保護層との間に樹脂フィルム層が貼り付けられており、
前記樹脂フィルム層は前記ガラス基板の他面側全体を覆うように他面側のみに貼り付けられていることを特徴とするシンチレータパネル。 - 放射線透過性を有する厚さ150μm以下のガラス基板と、
前記ガラス基板の表面全体を覆うように形成された第1の有機樹脂層と、
前記第1の有機樹脂層が形成された前記ガラス基板の一面側に形成されたシンチレータ層と、
前記第1の有機樹脂層が形成された前記ガラス基板と共に前記シンチレータ層を覆うように形成された耐湿性の保護層と、を備え、
前記第1の有機樹脂層が形成された前記ガラス基板の他面側と側面側とを覆うように第2の有機樹脂層が形成されており、
前記第1の有機樹脂層と前記第2の有機樹脂層とは互いに異なる材料によって形成されていることを特徴とするシンチレータパネル。 - 放射線透過性を有する厚さ150μm以下のガラス基板と、
前記ガラス基板の表面全体を覆うように形成された第1の有機樹脂層と、
前記第1の有機樹脂層が形成された前記ガラス基板の一面側に形成されたシンチレータ層と、
前記第1の有機樹脂層が形成された前記ガラス基板と共に前記シンチレータ層を覆うように形成された耐湿性の保護層と、を備え、
前記第1の有機樹脂層が形成された前記ガラス基板の一面側と側面側とを覆うように第2の有機樹脂層が形成されており、
前記第1の有機樹脂層と前記第2の有機樹脂層とは互いに異なる材料によって形成されていることを特徴とするシンチレータパネル。 - 前記樹脂フィルム層は、PET、PEN、COP、及びPIから選択されることを特徴とする請求項1に記載のシンチレータパネル。
- 前記第1の有機樹脂層は、ポリパラキシリレン及びポリ尿素から選択されることを特徴とする請求項1〜4のいずれか一項に記載のシンチレータパネル。
- 前記第2の有機樹脂層は、シリコン樹脂、ウレタン樹脂、エポキシ樹脂、及びフッ素樹脂から選択されることを特徴とする請求項2又は3に記載のシンチレータパネル。
- 請求項1〜6のいずれか一項に記載のシンチレータパネルと、
前記保護層が形成された前記シンチレータ層に対向して配置された受光素子と、を備えたことを特徴とする放射線検出器。
Priority Applications (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012161762A JP5917323B2 (ja) | 2012-07-20 | 2012-07-20 | シンチレータパネル及び放射線検出器 |
KR20147034257A KR20150032835A (ko) | 2012-07-20 | 2013-04-18 | 신틸레이터 패널 및 방사선 검출기 |
PCT/JP2013/061509 WO2014013771A1 (ja) | 2012-07-20 | 2013-04-18 | シンチレータパネル及び放射線検出器 |
EP13819853.6A EP2876647B1 (en) | 2012-07-20 | 2013-04-18 | Scintillator panel and radiation detector |
CN201380038628.4A CN104488039B (zh) | 2012-07-20 | 2013-04-18 | 闪烁器面板以及放射线检测器 |
US14/414,956 US9316584B2 (en) | 2012-07-20 | 2013-04-18 | Scintillator panel and radiation detector |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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JP2012161762A JP5917323B2 (ja) | 2012-07-20 | 2012-07-20 | シンチレータパネル及び放射線検出器 |
Publications (2)
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JP2014021002A JP2014021002A (ja) | 2014-02-03 |
JP5917323B2 true JP5917323B2 (ja) | 2016-05-11 |
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US (1) | US9316584B2 (ja) |
EP (1) | EP2876647B1 (ja) |
JP (1) | JP5917323B2 (ja) |
KR (1) | KR20150032835A (ja) |
CN (1) | CN104488039B (ja) |
WO (1) | WO2014013771A1 (ja) |
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JP6549950B2 (ja) * | 2015-09-15 | 2019-07-24 | 浜松ホトニクス株式会社 | シンチレータパネル、及び、放射線検出器 |
KR102285706B1 (ko) * | 2019-08-21 | 2021-08-04 | 동국대학교 산학협력단 | 신틸레이터 및 이의 제조방법 |
Family Cites Families (13)
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US3855035A (en) * | 1972-06-22 | 1974-12-17 | Varian Associates | Image intensifier plate and method and compositions for manufacturing same |
JP4057316B2 (ja) * | 2002-03-07 | 2008-03-05 | 浜松ホトニクス株式会社 | シンチレータパネルおよびその製造方法 |
US7034306B2 (en) * | 1998-06-18 | 2006-04-25 | Hamamatsu Photonics K.K. | Scintillator panel and radiation image sensor |
JP4099206B2 (ja) | 2001-01-30 | 2008-06-11 | 浜松ホトニクス株式会社 | シンチレータパネル及び放射線イメージセンサ |
JP4298177B2 (ja) * | 2001-02-07 | 2009-07-15 | キヤノン株式会社 | シンチレータパネル、放射線検出装置及びシステム |
JP4059184B2 (ja) * | 2003-10-10 | 2008-03-12 | コニカミノルタエムジー株式会社 | 放射線画像変換パネル |
JP4594188B2 (ja) * | 2004-08-10 | 2010-12-08 | キヤノン株式会社 | 放射線検出装置及び放射線検出システム |
JP4012182B2 (ja) * | 2004-08-19 | 2007-11-21 | キヤノン株式会社 | カセッテ型x線画像撮影装置 |
DE102006022138A1 (de) * | 2006-05-11 | 2007-11-15 | Siemens Ag | Szintillatorplatte |
JP5597354B2 (ja) * | 2007-03-27 | 2014-10-01 | 株式会社東芝 | シンチレータパネル及び放射線検出器 |
WO2009028275A1 (ja) * | 2007-08-28 | 2009-03-05 | Konica Minolta Medical & Graphic, Inc. | シンチレータパネル |
JP5178900B2 (ja) * | 2010-11-08 | 2013-04-10 | 富士フイルム株式会社 | 放射線検出器 |
JP2012172971A (ja) * | 2011-02-17 | 2012-09-10 | Konica Minolta Medical & Graphic Inc | シンチレータパネル、その製造方法、フラットパネルディテクタ及びその製造方法 |
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2012
- 2012-07-20 JP JP2012161762A patent/JP5917323B2/ja active Active
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2013
- 2013-04-18 CN CN201380038628.4A patent/CN104488039B/zh active Active
- 2013-04-18 WO PCT/JP2013/061509 patent/WO2014013771A1/ja active Application Filing
- 2013-04-18 KR KR20147034257A patent/KR20150032835A/ko not_active Application Discontinuation
- 2013-04-18 EP EP13819853.6A patent/EP2876647B1/en active Active
- 2013-04-18 US US14/414,956 patent/US9316584B2/en active Active
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Publication number | Publication date |
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EP2876647A4 (en) | 2016-03-16 |
CN104488039B (zh) | 2016-12-21 |
KR20150032835A (ko) | 2015-03-30 |
WO2014013771A1 (ja) | 2014-01-23 |
US20150198529A1 (en) | 2015-07-16 |
US9316584B2 (en) | 2016-04-19 |
EP2876647A1 (en) | 2015-05-27 |
CN104488039A (zh) | 2015-04-01 |
JP2014021002A (ja) | 2014-02-03 |
EP2876647B1 (en) | 2018-09-12 |
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