JP5890782B2 - 携帯用質量分析のための装置および方法 - Google Patents

携帯用質量分析のための装置および方法 Download PDF

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JP5890782B2
JP5890782B2 JP2012546200A JP2012546200A JP5890782B2 JP 5890782 B2 JP5890782 B2 JP 5890782B2 JP 2012546200 A JP2012546200 A JP 2012546200A JP 2012546200 A JP2012546200 A JP 2012546200A JP 5890782 B2 JP5890782 B2 JP 5890782B2
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analyte
source
frequency
mass
ion trap
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JP2013516036A5 (cg-RX-API-DMAC7.html
JP2013516036A (ja
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チャン−シュアン チェン，
チャン−シュアン チェン，
ジョン−リー リン，
ジョン−リー リン，
ミン−リー チュー，
ミン−リー チュー，
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Academia Sinica
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Academia Sinica
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0022—Portable spectrometers, e.g. devices comprising independent power supply, constructional details relating to portability
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/426—Methods for controlling ions
    • H01J49/427—Ejection and selection methods
    • H01J49/429—Scanning an electric parameter, e.g. voltage amplitude or frequency
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/424—Three-dimensional ion traps, i.e. comprising end-cap and ring electrodes

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2012546200A 2009-12-23 2010-12-22 携帯用質量分析のための装置および方法 Active JP5890782B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US28953109P 2009-12-23 2009-12-23
US61/289,531 2009-12-23
PCT/US2010/061821 WO2011079202A1 (en) 2009-12-23 2010-12-22 Apparatuses and methods for portable mass spectrometry

Publications (3)

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JP2013516036A JP2013516036A (ja) 2013-05-09
JP2013516036A5 JP2013516036A5 (cg-RX-API-DMAC7.html) 2014-03-06
JP5890782B2 true JP5890782B2 (ja) 2016-03-22

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JP2012546200A Active JP5890782B2 (ja) 2009-12-23 2010-12-22 携帯用質量分析のための装置および方法

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US (1) US9224586B2 (cg-RX-API-DMAC7.html)
EP (1) EP2517223A4 (cg-RX-API-DMAC7.html)
JP (1) JP5890782B2 (cg-RX-API-DMAC7.html)
TW (1) TWI512783B (cg-RX-API-DMAC7.html)
WO (1) WO2011079202A1 (cg-RX-API-DMAC7.html)

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US10242857B2 (en) 2017-08-31 2019-03-26 The University Of North Carolina At Chapel Hill Ion traps with Y-directional ion manipulation for mass spectrometry and related mass spectrometry systems and methods
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JP7369486B2 (ja) * 2020-03-02 2023-10-26 国立研究開発法人物質・材料研究機構 観測対象ガスの透過拡散経路観測装置及び観測対象ガスの計測方法、点欠陥位置検出装置及び点欠陥位置検出方法、並びに観測用の試料
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Also Published As

Publication number Publication date
CN102754181A (zh) 2012-10-24
US9224586B2 (en) 2015-12-29
WO2011079202A1 (en) 2011-06-30
TWI512783B (zh) 2015-12-11
TW201135794A (en) 2011-10-16
EP2517223A4 (en) 2015-11-18
EP2517223A1 (en) 2012-10-31
JP2013516036A (ja) 2013-05-09
US20110147581A1 (en) 2011-06-23

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