JP5878136B2 - レーザー投影システムを較正する装置及び方法 - Google Patents

レーザー投影システムを較正する装置及び方法 Download PDF

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Publication number
JP5878136B2
JP5878136B2 JP2013014942A JP2013014942A JP5878136B2 JP 5878136 B2 JP5878136 B2 JP 5878136B2 JP 2013014942 A JP2013014942 A JP 2013014942A JP 2013014942 A JP2013014942 A JP 2013014942A JP 5878136 B2 JP5878136 B2 JP 5878136B2
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Japan
Prior art keywords
dimensional
assembly
structural
laser projection
laser
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JP2013014942A
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English (en)
Japanese (ja)
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JP2013160762A (ja
JP2013160762A5 (enExample
Inventor
カーティス エム． アシュフォード，
カーティス エム． アシュフォード，
ブライアン エー． ボリンジャー，
ブライアン エー． ボリンジャー，
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Boeing Co
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Boeing Co
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Publication of JP2013160762A5 publication Critical patent/JP2013160762A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2504—Calibration devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/14—Measuring arrangements characterised by the use of optical techniques for measuring distance or clearance between spaced objects or spaced apertures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C15/00—Surveying instruments or accessories not provided for in groups G01C1/00 - G01C13/00
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C25/00—Manufacturing, calibrating, cleaning, or repairing instruments or devices referred to in the other groups of this subclass
    • G01C25/005—Manufacturing, calibrating, cleaning, or repairing instruments or devices referred to in the other groups of this subclass initial alignment, calibration or starting-up of inertial devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
    • G03F9/70—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
    • G03F9/7088—Alignment mark detection, e.g. TTR, TTL, off-axis detection, array detector, video detection

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Optical Distance (AREA)
  • Transforming Electric Information Into Light Information (AREA)
JP2013014942A 2012-02-03 2013-01-30 レーザー投影システムを較正する装置及び方法 Active JP5878136B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US13/366,260 US8780361B2 (en) 2012-02-03 2012-02-03 Apparatus and method for calibrating laser projection system
US13/366,260 2012-02-03

Publications (3)

Publication Number Publication Date
JP2013160762A JP2013160762A (ja) 2013-08-19
JP2013160762A5 JP2013160762A5 (enExample) 2014-07-17
JP5878136B2 true JP5878136B2 (ja) 2016-03-08

Family

ID=47721978

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2013014942A Active JP5878136B2 (ja) 2012-02-03 2013-01-30 レーザー投影システムを較正する装置及び方法

Country Status (6)

Country Link
US (1) US8780361B2 (enExample)
EP (1) EP2623930B1 (enExample)
JP (1) JP5878136B2 (enExample)
CN (1) CN103245289B (enExample)
BR (1) BR102013002577B1 (enExample)
CA (1) CA2795983C (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013070296A2 (en) * 2011-08-19 2013-05-16 Aerovironment, Inc. Aircraft system for reduced observer visibility
US9091530B1 (en) 2014-06-10 2015-07-28 The Boeing Company Calibration system and method for a three-dimensional measurement system
US10179710B2 (en) 2016-03-03 2019-01-15 Gpcp Ip Holdings Llc Automated loading system alignment assembly
US10239178B2 (en) * 2016-10-17 2019-03-26 Virtek Vision International, ULC Laser projector with dynamically adaptable focus
WO2019206633A1 (en) * 2018-04-23 2019-10-31 Robert Bosch Gmbh Portable vehicle sensor calibration apparatus having a suction mechanism
CN114132452B (zh) * 2021-12-23 2023-04-18 武昌船舶重工集团有限公司 一种用于船体轴承的同轴定位方法
CN114624899B (zh) * 2022-03-10 2023-09-29 歌尔光学科技有限公司 光学系统校准方法、光学系统校准装置以及存储介质

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03189504A (ja) * 1989-12-20 1991-08-19 Nissan Motor Co Ltd 光学式三次元測定装置
GB9401692D0 (en) 1994-01-28 1994-03-23 Renishaw Plc Performing measurement or calibration on positioning machines
JP2004271292A (ja) * 2003-03-07 2004-09-30 Meidensha Corp 校正器及びステレオカメラ位置姿勢校正装置
EP1719580B1 (en) * 2003-09-10 2012-06-27 Nikon Metrology NV Laser projection system
US7463368B2 (en) * 2003-09-10 2008-12-09 Metris Canada Inc Laser projection system, intelligent data correction system and method
US7489411B2 (en) 2005-07-27 2009-02-10 The Boeing Company Apparatus and methods for calibrating a laser projection device
CN100429476C (zh) * 2006-12-20 2008-10-29 北京航空航天大学 一种双传感器激光视觉三维测量系统校准方法
US7965396B2 (en) * 2008-03-14 2011-06-21 The Boeing Company Enhanced laser projector calibration wall

Also Published As

Publication number Publication date
CA2795983A1 (en) 2013-08-03
JP2013160762A (ja) 2013-08-19
BR102013002577A2 (pt) 2014-09-09
CN103245289B (zh) 2016-08-03
CA2795983C (en) 2015-02-24
US20130201491A1 (en) 2013-08-08
EP2623930A3 (en) 2014-03-12
BR102013002577B1 (pt) 2021-10-26
EP2623930A2 (en) 2013-08-07
CN103245289A (zh) 2013-08-14
EP2623930B1 (en) 2019-09-11
US8780361B2 (en) 2014-07-15

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