JP5863614B2 - 研磨装置 - Google Patents
研磨装置 Download PDFInfo
- Publication number
- JP5863614B2 JP5863614B2 JP2012215592A JP2012215592A JP5863614B2 JP 5863614 B2 JP5863614 B2 JP 5863614B2 JP 2012215592 A JP2012215592 A JP 2012215592A JP 2012215592 A JP2012215592 A JP 2012215592A JP 5863614 B2 JP5863614 B2 JP 5863614B2
- Authority
- JP
- Japan
- Prior art keywords
- phase
- current
- electric motor
- polishing
- polishing apparatus
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000005498 polishing Methods 0.000 title claims description 178
- 238000001514 detection method Methods 0.000 claims description 115
- 238000004804 winding Methods 0.000 claims description 30
- 230000008859 change Effects 0.000 claims description 20
- 239000000758 substrate Substances 0.000 claims description 11
- 230000007274 generation of a signal involved in cell-cell signaling Effects 0.000 claims description 8
- 239000002131 composite material Substances 0.000 claims description 4
- 230000001360 synchronised effect Effects 0.000 claims description 4
- 230000006698 induction Effects 0.000 claims description 3
- 230000005611 electricity Effects 0.000 claims 1
- 239000004065 semiconductor Substances 0.000 description 53
- 238000006243 chemical reaction Methods 0.000 description 19
- 238000010586 diagram Methods 0.000 description 15
- 230000007704 transition Effects 0.000 description 10
- 239000000463 material Substances 0.000 description 7
- 238000000034 method Methods 0.000 description 6
- 239000004744 fabric Substances 0.000 description 4
- 239000006185 dispersion Substances 0.000 description 3
- 239000003990 capacitor Substances 0.000 description 2
- 230000000052 comparative effect Effects 0.000 description 2
- 239000004020 conductor Substances 0.000 description 2
- 239000012212 insulator Substances 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 239000002002 slurry Substances 0.000 description 2
- 230000009466 transformation Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 1
- 238000009499 grossing Methods 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 230000001939 inductive effect Effects 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000002194 synthesizing effect Effects 0.000 description 1
Images
Landscapes
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Priority Applications (7)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2012215592A JP5863614B2 (ja) | 2012-09-28 | 2012-09-28 | 研磨装置 |
| TW102134253A TWI530360B (zh) | 2012-09-28 | 2013-09-24 | 研磨裝置 |
| US14/040,449 US9132525B2 (en) | 2012-09-28 | 2013-09-27 | Polishing apparatus for flattening surface of workpiece |
| CN201310450332.5A CN103707173B (zh) | 2012-09-28 | 2013-09-27 | 研磨装置 |
| KR1020130115603A KR20140042748A (ko) | 2012-09-28 | 2013-09-27 | 연마 장치 |
| KR1020160023436A KR101925675B1 (ko) | 2012-09-28 | 2016-02-26 | 연마 장치 |
| KR1020160096928A KR101899210B1 (ko) | 2012-09-28 | 2016-07-29 | 연마 장치 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2012215592A JP5863614B2 (ja) | 2012-09-28 | 2012-09-28 | 研磨装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2014069256A JP2014069256A (ja) | 2014-04-21 |
| JP2014069256A5 JP2014069256A5 (enExample) | 2015-11-12 |
| JP5863614B2 true JP5863614B2 (ja) | 2016-02-16 |
Family
ID=50744962
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2012215592A Active JP5863614B2 (ja) | 2012-09-28 | 2012-09-28 | 研磨装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP5863614B2 (enExample) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20170282325A1 (en) * | 2014-09-02 | 2017-10-05 | Ebara Corporation | End point detection method, polishing apparatus, and polishing method |
| US10744617B2 (en) | 2015-10-16 | 2020-08-18 | Ebara Corporation | Polishing endpoint detection method |
| US11260499B2 (en) | 2015-10-16 | 2022-03-01 | Ebara Corporation | Polishing apparatus and polishing method |
| US12131923B2 (en) | 2017-10-31 | 2024-10-29 | Ebara Corporation | Polishing apparatus and polishing method |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6377463B2 (ja) * | 2014-09-02 | 2018-08-22 | 株式会社荏原製作所 | 終点検出方法、及び、研磨装置 |
| JP6727761B2 (ja) * | 2015-05-15 | 2020-07-22 | 株式会社荏原製作所 | 研磨装置、及び、研磨方法 |
| JP7403213B2 (ja) * | 2017-10-31 | 2023-12-22 | 株式会社荏原製作所 | 研磨装置、及び研磨方法 |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2607267B2 (ja) * | 1988-05-11 | 1997-05-07 | 不二越機械工業株式会社 | 研磨量検出方法と自動定寸研磨機 |
| JPH10180625A (ja) * | 1996-12-26 | 1998-07-07 | Toshiba Corp | 研磨方法および研磨装置 |
| JPH10202523A (ja) * | 1997-01-22 | 1998-08-04 | Ebara Corp | ポリッシングの終点検知方法 |
-
2012
- 2012-09-28 JP JP2012215592A patent/JP5863614B2/ja active Active
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20170282325A1 (en) * | 2014-09-02 | 2017-10-05 | Ebara Corporation | End point detection method, polishing apparatus, and polishing method |
| US10759019B2 (en) * | 2014-09-02 | 2020-09-01 | Ebara Corporation | End point detection method, polishing apparatus, and polishing method |
| US20200346318A1 (en) * | 2014-09-02 | 2020-11-05 | Ebara Corporation | End point detection method, polishing apparatus, and polishing method |
| US12285836B2 (en) * | 2014-09-02 | 2025-04-29 | Ebara Corporation | End point detection method, polishing apparatus, and polishing method |
| US10744617B2 (en) | 2015-10-16 | 2020-08-18 | Ebara Corporation | Polishing endpoint detection method |
| US11260499B2 (en) | 2015-10-16 | 2022-03-01 | Ebara Corporation | Polishing apparatus and polishing method |
| US12131923B2 (en) | 2017-10-31 | 2024-10-29 | Ebara Corporation | Polishing apparatus and polishing method |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2014069256A (ja) | 2014-04-21 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP5863614B2 (ja) | 研磨装置 | |
| TWI530360B (zh) | 研磨裝置 | |
| JP5990074B2 (ja) | 研磨装置 | |
| US12285836B2 (en) | End point detection method, polishing apparatus, and polishing method | |
| CN103684209B (zh) | 永磁同步电动机的控制装置及具备该控制装置的控制系统 | |
| JP6327958B2 (ja) | 研磨装置 | |
| JP4918483B2 (ja) | インバータ装置 | |
| JP4912516B2 (ja) | 電力変換装置 | |
| JP2014069256A5 (enExample) | ||
| JP2009183051A (ja) | 同期機の制御装置 | |
| JP4501955B2 (ja) | 交流電動機の制御方法 | |
| US8988033B2 (en) | Machine tool | |
| JPH10202523A (ja) | ポリッシングの終点検知方法 | |
| JP6377463B2 (ja) | 終点検出方法、及び、研磨装置 | |
| JP6682313B2 (ja) | モータ制御装置 | |
| JP2016215288A (ja) | 研磨装置、及び、研磨方法 | |
| JP2011147216A (ja) | 電動機駆動装置 | |
| JP5502044B2 (ja) | 回転電機の制御装置および制御方法 | |
| JP5634693B2 (ja) | モータの電流制御方法及び制御装置 | |
| KR20130131331A (ko) | 모터의 전류 제어 방법 및 제어 장치 | |
| JP2008306904A (ja) | リニア誘導機の定数測定装置 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20150918 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20150918 |
|
| A871 | Explanation of circumstances concerning accelerated examination |
Free format text: JAPANESE INTERMEDIATE CODE: A871 Effective date: 20150918 |
|
| A975 | Report on accelerated examination |
Free format text: JAPANESE INTERMEDIATE CODE: A971005 Effective date: 20151019 |
|
| TRDD | Decision of grant or rejection written | ||
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20151127 |
|
| A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20151222 |
|
| R150 | Certificate of patent or registration of utility model |
Ref document number: 5863614 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |