JP5726763B2 - 電界放出陰極を具えるx線源 - Google Patents
電界放出陰極を具えるx線源 Download PDFInfo
- Publication number
- JP5726763B2 JP5726763B2 JP2011549528A JP2011549528A JP5726763B2 JP 5726763 B2 JP5726763 B2 JP 5726763B2 JP 2011549528 A JP2011549528 A JP 2011549528A JP 2011549528 A JP2011549528 A JP 2011549528A JP 5726763 B2 JP5726763 B2 JP 5726763B2
- Authority
- JP
- Japan
- Prior art keywords
- ray
- ray source
- anode
- cathode
- field emission
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 229910052751 metal Inorganic materials 0.000 claims description 11
- 239000002184 metal Substances 0.000 claims description 11
- 239000007787 solid Substances 0.000 claims description 8
- 150000001875 compounds Chemical class 0.000 claims description 7
- 238000001514 detection method Methods 0.000 claims description 7
- 239000006260 foam Substances 0.000 claims description 7
- 238000000605 extraction Methods 0.000 claims description 6
- 238000001816 cooling Methods 0.000 claims description 5
- 230000005540 biological transmission Effects 0.000 claims description 3
- 239000011521 glass Substances 0.000 claims description 3
- 239000007788 liquid Substances 0.000 claims description 3
- 229910044991 metal oxide Inorganic materials 0.000 claims description 3
- 150000004706 metal oxides Chemical class 0.000 claims description 3
- 239000000203 mixture Substances 0.000 claims description 3
- 239000005011 phenolic resin Substances 0.000 claims description 3
- 150000003839 salts Chemical class 0.000 claims description 3
- 238000013480 data collection Methods 0.000 claims description 2
- 230000003595 spectral effect Effects 0.000 claims description 2
- 238000010894 electron beam technology Methods 0.000 description 8
- 238000004846 x-ray emission Methods 0.000 description 6
- 238000010586 diagram Methods 0.000 description 5
- 230000005855 radiation Effects 0.000 description 5
- 238000005265 energy consumption Methods 0.000 description 4
- 238000003384 imaging method Methods 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- 230000005684 electric field Effects 0.000 description 3
- KXGFMDJXCMQABM-UHFFFAOYSA-N 2-methoxy-6-methylphenol Chemical compound [CH]OC1=CC=CC([CH])=C1O KXGFMDJXCMQABM-UHFFFAOYSA-N 0.000 description 2
- 229910052790 beryllium Inorganic materials 0.000 description 2
- ATBAMAFKBVZNFJ-UHFFFAOYSA-N beryllium atom Chemical compound [Be] ATBAMAFKBVZNFJ-UHFFFAOYSA-N 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000007689 inspection Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000007246 mechanism Effects 0.000 description 2
- 229920001568 phenolic resin Polymers 0.000 description 2
- 230000004044 response Effects 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 238000004590 computer program Methods 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 230000001066 destructive effect Effects 0.000 description 1
- 238000003745 diagnosis Methods 0.000 description 1
- 238000002059 diagnostic imaging Methods 0.000 description 1
- 238000000295 emission spectrum Methods 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 238000012854 evaluation process Methods 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- 239000000284 extract Substances 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 239000005355 lead glass Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 239000013307 optical fiber Substances 0.000 description 1
- 238000003908 quality control method Methods 0.000 description 1
- 239000008259 solid foam Substances 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 230000007847 structural defect Effects 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J35/00—X-ray tubes
- H01J35/02—Details
- H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
- H01J35/06—Cathodes
- H01J35/065—Field emission, photo emission or secondary emission cathodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J35/00—X-ray tubes
- H01J35/02—Details
- H01J35/14—Arrangements for concentrating, focusing, or directing the cathode ray
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2235/00—X-ray tubes
- H01J2235/06—Cathode assembly
- H01J2235/062—Cold cathodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2235/00—X-ray tubes
- H01J2235/06—Cathode assembly
- H01J2235/068—Multi-cathode assembly
Landscapes
- X-Ray Techniques (AREA)
Description
Claims (10)
- X線源であって、
電界放出陰極と、
陽極と、
前記陰極および前記陽極間に高電位差を適用してX線ビームの放射を可能にするコネクタと、
自身の内部に前記陽極および前記陰極が配置される真空チャンバとを具え、
前記電界放出陰極が連続したセル構造を有する炭化固体化合物発泡体から成り、前記炭化固体化合物発泡体はフェノール樹脂と、金属塩、金属酸化物の少なくとも1つとを含む液体混合物から変化させており、前記連続したセル構造は、前記高電位差が適用されたときに前記陽極に電子放出する鋭い先端として形成された複数の放出部位を提供し、
前記真空チャンバ(108)が、10−4パスカル以下の圧力を有しており、
前記X線源が、さらに、前記電界放出陰極によって放出された電子を集束させる集束電極を具えており、前記集束電極がグリッドメッシュ構造を有することを特徴とするX線源。 - 請求項1に記載のX線源において、前記真空チャンバがガラスまたは金属から成り、X線透過窓を有することを特徴とするX線源。
- 請求項1に記載のX線源がさらに、前記陽極を冷却する冷却構造を具えることを特徴とするX線源。
- 請求項1に記載のX線源において、さらに、陰極から陽極の方向に電子を抽出する引出電極を具えており、
前記陽極、前記陰極、および引出電極がともに三極管構造を形成していることを特徴とするX線源。 - 請求項1に記載のX線源が、複数の制御可能な電界放出陰極を具えることを特徴とするX線源。
- 請求項1に記載のX線源が、1mA未満の電流を提供するときに約20keVでX線ビームにスペクトルピークを生成することを特徴とするX線源。
- X線システムであって、
請求項2に記載のX線源と、
X線検出部と、
走査すべき物体を受ける物体ホルダであって、前記X線透過窓と前記X線検出部との間に配置された物体ホルダと、
前記X線の放射を制御し、前記X線検出部からデータを収集する制御部とを具えることを特徴とするX線システム。 - 請求項7に記載のX線システムにおいて、前記物体ホルダの位置が前記制御部によって回転可能であり、これにより異なる視角から前記物体のデータ収集を可能にしていることを特徴とするX線システム。
- 請求項7に記載のX線システムがさらに、前記X線源で生成されたX線量を検出する線量センサを具え、前記制御部が前記線量センサから線量情報を受信して前記X線システムを制御するよう適合されていることを特徴とするX線システム。
- 請求項7に記載のX線システムにおいて、前記X線システムがバッテリ電源を具え、携帯可能であることを特徴とするX線システム。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP09153101.2 | 2009-02-18 | ||
EP09153101A EP2221848A1 (en) | 2009-02-18 | 2009-02-18 | X-ray source comprising a field emission cathode |
PCT/EP2010/051481 WO2010094588A2 (en) | 2009-02-18 | 2010-02-08 | X-ray source comprising a field emission cathode |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2012521614A JP2012521614A (ja) | 2012-09-13 |
JP5726763B2 true JP5726763B2 (ja) | 2015-06-03 |
Family
ID=40758699
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2011549528A Active JP5726763B2 (ja) | 2009-02-18 | 2010-02-08 | 電界放出陰極を具えるx線源 |
Country Status (6)
Country | Link |
---|---|
US (1) | US20110305312A1 (ja) |
EP (1) | EP2221848A1 (ja) |
JP (1) | JP5726763B2 (ja) |
CN (1) | CN102301444A (ja) |
TW (1) | TWI399780B (ja) |
WO (1) | WO2010094588A2 (ja) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2012165911A2 (ko) | 2011-06-01 | 2012-12-06 | 한국화학연구원 | 다공성 유무기 혼성체의 제조방법 |
CN102339713B (zh) * | 2011-11-01 | 2013-07-10 | 电子科技大学 | 一种光-栅复合控制的场致发射x射线管 |
EP2750797B1 (en) | 2011-11-08 | 2020-04-01 | Univation Technologies, LLC | Methods of preparing a catalyst system |
JP5540033B2 (ja) * | 2012-03-05 | 2014-07-02 | 双葉電子工業株式会社 | X線管 |
JP6316019B2 (ja) * | 2013-03-06 | 2018-04-25 | キヤノン株式会社 | X線発生管、該x線発生管を備えたx線発生装置及びx線撮影システム |
EP2991094A1 (en) * | 2014-09-01 | 2016-03-02 | LightLab Sweden AB | X-ray source and system comprising an x-ray source |
US10993679B2 (en) | 2015-06-30 | 2021-05-04 | Vatech Co., Ltd. | Portable x-ray generation device having electric field emission x-ray source |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63217676A (ja) * | 1987-03-06 | 1988-09-09 | Toshiba Corp | パルスガスレ−ザ装置 |
JP3439590B2 (ja) * | 1995-12-22 | 2003-08-25 | 株式会社荏原製作所 | X線源 |
US6054801A (en) * | 1998-02-27 | 2000-04-25 | Regents, University Of California | Field emission cathode fabricated from porous carbon foam material |
US6064718A (en) * | 1998-09-29 | 2000-05-16 | The United States Of America As Represented By The Secretary Of The Navy | Field emission tube for a mobile X-ray unit |
JP4526107B2 (ja) * | 2000-07-21 | 2010-08-18 | 株式会社日立メディコ | X線ct装置 |
US7227924B2 (en) * | 2000-10-06 | 2007-06-05 | The University Of North Carolina At Chapel Hill | Computed tomography scanning system and method using a field emission x-ray source |
US7826595B2 (en) * | 2000-10-06 | 2010-11-02 | The University Of North Carolina | Micro-focus field emission x-ray sources and related methods |
US6876724B2 (en) * | 2000-10-06 | 2005-04-05 | The University Of North Carolina - Chapel Hill | Large-area individually addressable multi-beam x-ray system and method of forming same |
US6556651B1 (en) * | 2002-01-25 | 2003-04-29 | Photoelectron Corporation | Array of miniature radiation sources |
JP3763026B2 (ja) * | 2003-03-06 | 2006-04-05 | 松下電器産業株式会社 | 電子放射素子、蛍光体発光素子及び画像描画装置 |
JP2004357724A (ja) * | 2003-05-30 | 2004-12-24 | Toshiba Corp | X線ct装置、x線発生装置及びx線ct装置のデータ収集方法 |
US20050135560A1 (en) * | 2003-12-17 | 2005-06-23 | Ehud Dafni | Portable computed tomography scanner and methods thereof |
JP4264382B2 (ja) * | 2004-04-30 | 2009-05-13 | 株式会社モリタ製作所 | 撮影画像の自動露出制御方法及びその方法を用いた自動露出制御装置 |
US7412026B2 (en) | 2004-07-02 | 2008-08-12 | The Board Of Regents Of The University Of Oklahoma | Phase-contrast x-ray imaging systems and methods |
JP2006084275A (ja) * | 2004-09-15 | 2006-03-30 | Hitachi Ltd | 爆発物等の探知方法および装置 |
US7123689B1 (en) * | 2005-06-30 | 2006-10-17 | General Electric Company | Field emitter X-ray source and system and method thereof |
EP1744343B1 (en) * | 2005-07-14 | 2009-12-30 | LightLab Sweden AB | Carbon based field emission cathode and method of manufacturing the same |
-
2009
- 2009-02-18 EP EP09153101A patent/EP2221848A1/en not_active Withdrawn
-
2010
- 2010-02-08 US US13/141,941 patent/US20110305312A1/en not_active Abandoned
- 2010-02-08 CN CN2010800060873A patent/CN102301444A/zh active Pending
- 2010-02-08 JP JP2011549528A patent/JP5726763B2/ja active Active
- 2010-02-08 WO PCT/EP2010/051481 patent/WO2010094588A2/en active Application Filing
- 2010-02-12 TW TW099104815A patent/TWI399780B/zh active
Also Published As
Publication number | Publication date |
---|---|
WO2010094588A3 (en) | 2010-10-21 |
WO2010094588A2 (en) | 2010-08-26 |
TWI399780B (zh) | 2013-06-21 |
US20110305312A1 (en) | 2011-12-15 |
JP2012521614A (ja) | 2012-09-13 |
CN102301444A (zh) | 2011-12-28 |
EP2221848A1 (en) | 2010-08-25 |
TW201103062A (en) | 2011-01-16 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP5726763B2 (ja) | 電界放出陰極を具えるx線源 | |
JP4878311B2 (ja) | マルチx線発生装置 | |
RU2635372C2 (ru) | Многокатодный распределенный рентгеновский аппарат с управлением катодом и устройство компьютерной томографии, имеющее упомянутый аппарат | |
US8666024B2 (en) | Multi-X-ray generating apparatus and X-ray imaging apparatus | |
JP2007265981A5 (ja) | ||
US20060104418A1 (en) | Wide scanning x-ray source | |
US8509385B2 (en) | X-ray tube with improved vacuum processing | |
JP2014130815A (ja) | 分散型x線を発生するデバイス及びその方法 | |
US8488737B2 (en) | Medical X-ray imaging system | |
JP2015180859A (ja) | フォトンカウンティングct装置 | |
CN111448481A (zh) | X射线断层扫描检查系统及方法 | |
US9431206B2 (en) | X-ray generation tube, X-ray generation device including the X-ray generation tube, and X-ray imaging system | |
US20150030119A1 (en) | Multi-source radiation generator and radiographic imaging system | |
KR20100071564A (ko) | 엑스선 튜브 | |
US8295434B2 (en) | X-ray imaging method and x-ray imaging system | |
JP3439590B2 (ja) | X線源 | |
JP5312555B2 (ja) | マルチx線発生装置 | |
JP2019029273A (ja) | X線管、x線検査装置、およびx線検査方法 | |
US20210272766A1 (en) | Fluid-cooled compact x-ray tube and system including the same | |
US9601300B2 (en) | Cathode element for a microfocus x-ray tube | |
CN117062289A (zh) | 基于金属丝靶的射线源 | |
JP2013228333A (ja) | 粒子線分布の測定方法及び装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20130125 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20131213 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20131217 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20140317 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20141104 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20141113 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20150331 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20150401 |
|
R150 | Certificate of patent or registration of utility model |
Ref document number: 5726763 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
S531 | Written request for registration of change of domicile |
Free format text: JAPANESE INTERMEDIATE CODE: R313531 |
|
S533 | Written request for registration of change of name |
Free format text: JAPANESE INTERMEDIATE CODE: R313533 |
|
R350 | Written notification of registration of transfer |
Free format text: JAPANESE INTERMEDIATE CODE: R350 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |