JP5723527B2 - 高パルス繰返し数パルスレーザのための帯域幅測定装置 - Google Patents
高パルス繰返し数パルスレーザのための帯域幅測定装置 Download PDFInfo
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- JP5723527B2 JP5723527B2 JP2009502896A JP2009502896A JP5723527B2 JP 5723527 B2 JP5723527 B2 JP 5723527B2 JP 2009502896 A JP2009502896 A JP 2009502896A JP 2009502896 A JP2009502896 A JP 2009502896A JP 5723527 B2 JP5723527 B2 JP 5723527B2
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Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/027—Control of working procedures of a spectrometer; Failure detection; Bandwidth calculation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J3/26—Generating the spectrum; Monochromators using multiple reflection, e.g. Fabry-Perot interferometer, variable interference filters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/2803—Investigating the spectrum using photoelectric array detector
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
- G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
- G01J9/0246—Measuring optical wavelength
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Spectrometry And Color Measurement (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US11/394,513 | 2006-03-31 | ||
| US11/394,513 US7733494B2 (en) | 2006-03-31 | 2006-03-31 | Bandwidth measuring device for high pulse repetition rate pulsed laser |
| PCT/US2007/007298 WO2007123623A2 (en) | 2006-03-31 | 2007-03-23 | Bandwidth measuring device for high pulse repetition rate pulsed laser |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2009532672A JP2009532672A (ja) | 2009-09-10 |
| JP2009532672A5 JP2009532672A5 (enExample) | 2010-05-13 |
| JP5723527B2 true JP5723527B2 (ja) | 2015-05-27 |
Family
ID=38558406
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2009502896A Active JP5723527B2 (ja) | 2006-03-31 | 2007-03-23 | 高パルス繰返し数パルスレーザのための帯域幅測定装置 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US7733494B2 (enExample) |
| EP (1) | EP2010861A4 (enExample) |
| JP (1) | JP5723527B2 (enExample) |
| KR (1) | KR101416111B1 (enExample) |
| TW (1) | TWI334018B (enExample) |
| WO (1) | WO2007123623A2 (enExample) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102008050867B4 (de) * | 2008-09-30 | 2011-12-08 | Carl Zeiss Laser Optics Gmbh | Verfahren zum Messen eines Spektrums einer schmalbandigen Lichtquelle sowie Spektrometeranordnung |
| US8953166B2 (en) * | 2010-08-20 | 2015-02-10 | Wetland Optics, Llc. | Extreme light pulse-front tilt and its application to single shot measurement of picosecond to nanosecond laser pulses |
| US9599510B2 (en) * | 2014-06-04 | 2017-03-21 | Cymer, Llc | Estimation of spectral feature of pulsed light beam |
| US9778108B2 (en) * | 2015-05-22 | 2017-10-03 | Cymer, Llc | Metrology system and method having a plurality of sensors for estimating a spectral feature of a pulsed light beam |
| JP6728016B2 (ja) * | 2016-06-24 | 2020-07-22 | 日置電機株式会社 | 光量測定装置 |
| TWI672484B (zh) * | 2018-05-25 | 2019-09-21 | 國立交通大學 | 光脈衝量測裝置以及光脈衝量測方法 |
Family Cites Families (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2657487B2 (ja) * | 1987-03-19 | 1997-09-24 | 株式会社小松製作所 | レーザの波長制御装置および方法 |
| US5243614A (en) * | 1990-11-28 | 1993-09-07 | Mitsubishi Denki Kabushiki Kaisha | Wavelength stabilizer for narrow bandwidth laser |
| JP2000092350A (ja) | 1998-09-10 | 2000-03-31 | Hitachi Ltd | 周期的な明暗パターンを有する対象の画像撮像方法，装置及びこれを用いた検査方法，装置 |
| US6359693B2 (en) | 1999-02-04 | 2002-03-19 | Cymer, Inc. | Double pass double etalon spectrometer |
| US6603549B2 (en) * | 2000-02-25 | 2003-08-05 | Cymer, Inc. | Convolution method for measuring laser bandwidth |
| US6912052B2 (en) * | 2000-11-17 | 2005-06-28 | Cymer, Inc. | Gas discharge MOPA laser spectral analysis module |
| US6713770B2 (en) * | 2001-01-29 | 2004-03-30 | Cymer, Inc. | High resolution spectral measurement device |
| JP2003207394A (ja) * | 2002-01-10 | 2003-07-25 | Yokogawa Electric Corp | 分光測定装置 |
| US20040141182A1 (en) * | 2002-12-16 | 2004-07-22 | Thomas Schroder | Monitoring of spectral purity and advanced spectral characteristics of a narrow bandwidth excimer laser |
| KR100471084B1 (ko) | 2002-12-16 | 2005-03-10 | 삼성전자주식회사 | 영상처리시스템 및 영상처리방법 |
| US6952267B2 (en) * | 2003-07-07 | 2005-10-04 | Cymer, Inc. | Method and apparatus for measuring bandwidth of a laser output |
| US7304748B2 (en) * | 2003-06-26 | 2007-12-04 | Cymer, Inc. | Method and apparatus for bandwidth measurement and bandwidth parameter calculation for laser light |
| TWI263412B (en) * | 2003-06-26 | 2006-10-01 | Cymer Inc | Improved bandwidth estimation |
| US7256893B2 (en) * | 2003-06-26 | 2007-08-14 | Cymer, Inc. | Method and apparatus for measuring bandwidth of an optical spectrum output of a very small wavelength very narrow bandwidth high power laser |
| US6894785B2 (en) * | 2003-09-30 | 2005-05-17 | Cymer, Inc. | Gas discharge MOPA laser spectral analysis module |
| JP2007127443A (ja) * | 2005-11-01 | 2007-05-24 | Tokyo Institute Of Technology | 光検出装置及び光検出方法 |
-
2006
- 2006-03-31 US US11/394,513 patent/US7733494B2/en active Active
-
2007
- 2007-03-03 TW TW096107345A patent/TWI334018B/zh active
- 2007-03-23 JP JP2009502896A patent/JP5723527B2/ja active Active
- 2007-03-23 EP EP07753888.2A patent/EP2010861A4/en not_active Withdrawn
- 2007-03-23 KR KR1020087026063A patent/KR101416111B1/ko active Active
- 2007-03-23 WO PCT/US2007/007298 patent/WO2007123623A2/en not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| WO2007123623A2 (en) | 2007-11-01 |
| JP2009532672A (ja) | 2009-09-10 |
| KR20080111503A (ko) | 2008-12-23 |
| TW200745523A (en) | 2007-12-16 |
| KR101416111B1 (ko) | 2014-07-08 |
| US7733494B2 (en) | 2010-06-08 |
| TWI334018B (en) | 2010-12-01 |
| EP2010861A4 (en) | 2013-05-01 |
| EP2010861A2 (en) | 2009-01-07 |
| US20070229849A1 (en) | 2007-10-04 |
| WO2007123623A3 (en) | 2008-11-20 |
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