JP5715186B2 - サイリスタバルブの合成試験装置 - Google Patents
サイリスタバルブの合成試験装置 Download PDFInfo
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- JP5715186B2 JP5715186B2 JP2013106240A JP2013106240A JP5715186B2 JP 5715186 B2 JP5715186 B2 JP 5715186B2 JP 2013106240 A JP2013106240 A JP 2013106240A JP 2013106240 A JP2013106240 A JP 2013106240A JP 5715186 B2 JP5715186 B2 JP 5715186B2
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- voltage
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- 238000012360 testing method Methods 0.000 title claims description 77
- 230000015572 biosynthetic process Effects 0.000 title description 21
- 238000003786 synthesis reaction Methods 0.000 title description 21
- 239000003990 capacitor Substances 0.000 claims description 23
- 238000010586 diagram Methods 0.000 description 13
- 230000005540 biological transmission Effects 0.000 description 7
- 238000000034 method Methods 0.000 description 4
- 230000007423 decrease Effects 0.000 description 3
- 101100112673 Rattus norvegicus Ccnd2 gene Proteins 0.000 description 2
- 230000000903 blocking effect Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/263—Circuits therefor for testing thyristors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
- G01R31/333—Testing of the switching capacity of high-voltage circuit-breakers ; Testing of breaking capacity or related variables, e.g. post arc current or transient recovery voltage
- G01R31/3333—Apparatus, systems or circuits therefor
- G01R31/3336—Synthetic testing, i.e. with separate current and voltage generators simulating distance fault conditions
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31924—Voltage or current aspects, e.g. driver, receiver
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/40—Testing power supplies
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Power Conversion In General (AREA)
Description
20 電圧源回路
30 補助回路
VT 試験バルブ
Va1 第1補助バルブ
Claims (10)
- サイリスタバルブを試験する装置であって、
試験対象のサイリスタバルブがオンになると電流を供給する電流源回路と、
前記サイリスタバルブがオフになると逆方向電圧又は順方向電圧を供給する電圧源回路と、
前記サイリスタバルブと前記電圧源回路との接続点と、前記電流源回路との間に備えられ、前記電流源回路を前記電圧源回路から絶縁して、前記電流源回路を前記電圧源回路の高電圧から保護するための第1補助バルブと、を備え、
前記電流源回路は、
直流電圧を変化させ、前記サイリスタバルブに供給される電流の増加率を制御しつつ、前記直流電圧を供給する、第1直流源回路部と、
前記第1直流源回路部の出力電圧を降圧するチョッパ回路と、を備える、装置。 - 前記チョッパ回路は、
前記第1直流源回路部の正極出力端子に一端が接続される第1スイッチと、
前記第1スイッチと前記第1直流源回路部の負極出力端子との間に備えられる第1ダイオードと、
前記第1スイッチと前記第1ダイオードとの接続点に接続される第1インダクタと、
前記第1インダクタと前記第1補助バルブとの間に備えられる第3スイッチと、
を含むことを特徴とする、請求項1に記載の装置。 - 前記第1直流源回路部は、6パルス位相制御整流器、12パルス位相制御整流器及び18パルス位相制御整流器のいずれか一つによって構成されることを特徴とする、請求項1に記載の装置。
- 前記サイリスタバルブがオフになると、前記第1補助バルブを強制的にオフ制御する補助回路を更に含むことを特徴とする、請求項1又は3に記載の装置。
- 前記補助回路は、
前記第1補助バルブをオフにするための直流電圧を発生する第2直流源回路部と、
前記第2直流源回路部の正極出力端子に一端が接続され、前記電流源回路に他端が接続される補助スイッチと、
前記補助スイッチに一端が接続され、前記電流源回路と前記第1補助バルブとの接続点に他端が接続されるコンデンサと、
を含むことを特徴とする、請求項4に記載の装置。 - 前記第1直流源回路部は、交流電圧を直流電圧に変換する6パルス位相制御整流器、12パルス位相制御整流器及び18パルス位相制御整流器のいずれか一つによって構成されることを特徴とする、請求項3に記載の装置。
- 前記チョッパ回路は、単相チョッパ回路又は多相チョッパ回路によって構成されることを特徴とする、請求項3に記載の装置。
- 前記第1スイッチ及び第2スイッチはそれぞれ、絶縁ゲートバイポーラトランジスタ(IGBT)及び集積ゲート整流サイリスタ(IGCT)のいずれか一つによって構成されることを特徴とする、請求項3に記載の装置。
- 前記第2直流源回路部は、交流電圧を直流電圧に変換する6パルスダイオード整流器、12パルスダイオード整流器及び18パルスダイオード整流器のいずれか一つによって構成されることを特徴とする、請求項5に記載の装置。
- 前記補助スイッチは、絶縁ゲートバイポーラトランジスタ(IGBT)又は集積ゲート整流サイリスタ(IGCT)であることを特徴とする、請求項5に記載の装置。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020120054159A KR101326327B1 (ko) | 2012-05-22 | 2012-05-22 | 사이리스터 밸브의 합성 시험 장치 |
KR10-2012-0054159 | 2012-05-22 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2013243917A JP2013243917A (ja) | 2013-12-05 |
JP5715186B2 true JP5715186B2 (ja) | 2015-05-07 |
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2013106240A Active JP5715186B2 (ja) | 2012-05-22 | 2013-05-20 | サイリスタバルブの合成試験装置 |
Country Status (5)
Country | Link |
---|---|
US (1) | US9310421B2 (ja) |
EP (1) | EP2667210A3 (ja) |
JP (1) | JP5715186B2 (ja) |
KR (1) | KR101326327B1 (ja) |
CN (1) | CN103424679B (ja) |
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CN103675660B (zh) * | 2013-11-27 | 2016-04-06 | 中国西电电气股份有限公司 | 特高压换流阀恢复期瞬态正向电压试验回路及其试验方法 |
US9793813B1 (en) * | 2014-03-07 | 2017-10-17 | Bassam Marawi | Step-down power conversion with zero current switching |
EP2975420A1 (en) * | 2014-07-18 | 2016-01-20 | Alstom Technology Ltd | Synthetic test circuit |
WO2016009081A1 (en) * | 2014-07-18 | 2016-01-21 | Alstom Technology Ltd | Synthetic test circuit |
EP3183589A1 (en) * | 2014-08-19 | 2017-06-28 | General Electric Technology GmbH | Synthetic test circuit |
WO2016046047A1 (en) * | 2014-09-22 | 2016-03-31 | Alstom Technology Ltd | Synthetic test circuit |
KR101980691B1 (ko) * | 2015-06-18 | 2019-05-22 | 엘에스산전 주식회사 | 초고압직류송전의 밸브 성능 시험을 위한 합성시험 회로 |
CN106324464B (zh) * | 2015-07-08 | 2023-06-27 | 南京南瑞继保电气有限公司 | 晶闸管阀合成试验电路及方法 |
KR101666762B1 (ko) * | 2015-09-03 | 2016-10-14 | 엘에스산전 주식회사 | 시험 밸브의 합성 시험을 위한 전압 공급 회로 |
CN105277866B (zh) * | 2015-09-11 | 2018-07-20 | 中冶宝钢技术服务有限公司 | 晶闸管检测器和该检测器的晶闸管检测方法 |
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CN106646181B (zh) * | 2016-11-24 | 2024-04-19 | 瑞能半导体科技股份有限公司 | 晶闸管测试电路和测试方法 |
CN108344941A (zh) * | 2018-01-10 | 2018-07-31 | 中国电力科学研究院有限公司 | 一种测试混合式有载分接开关晶闸管模块性能的系统和方法 |
CN108663583B (zh) * | 2018-02-27 | 2020-11-06 | 宁波央腾汽车电子有限公司 | 一种功率器件电应力测试系统及方法 |
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-
2012
- 2012-05-22 KR KR1020120054159A patent/KR101326327B1/ko active IP Right Grant
-
2013
- 2013-05-08 US US13/890,059 patent/US9310421B2/en active Active
- 2013-05-14 EP EP13167596.9A patent/EP2667210A3/en not_active Withdrawn
- 2013-05-20 JP JP2013106240A patent/JP5715186B2/ja active Active
- 2013-05-22 CN CN201310192739.2A patent/CN103424679B/zh active Active
Also Published As
Publication number | Publication date |
---|---|
US9310421B2 (en) | 2016-04-12 |
JP2013243917A (ja) | 2013-12-05 |
US20130314111A1 (en) | 2013-11-28 |
KR101326327B1 (ko) | 2013-11-11 |
EP2667210A2 (en) | 2013-11-27 |
EP2667210A3 (en) | 2017-08-02 |
CN103424679B (zh) | 2016-12-28 |
CN103424679A (zh) | 2013-12-04 |
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