JP5669636B2 - 荷電粒子線レンズおよびそれを用いた露光装置 - Google Patents
荷電粒子線レンズおよびそれを用いた露光装置 Download PDFInfo
- Publication number
- JP5669636B2 JP5669636B2 JP2011056812A JP2011056812A JP5669636B2 JP 5669636 B2 JP5669636 B2 JP 5669636B2 JP 2011056812 A JP2011056812 A JP 2011056812A JP 2011056812 A JP2011056812 A JP 2011056812A JP 5669636 B2 JP5669636 B2 JP 5669636B2
- Authority
- JP
- Japan
- Prior art keywords
- charged particle
- particle beam
- section
- potential
- lens
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
- H01J37/10—Lenses
- H01J37/12—Lenses electrostatic
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/04—Means for controlling the discharge
- H01J2237/049—Focusing means
- H01J2237/0492—Lens systems
- H01J2237/04924—Lens systems electrostatic
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/10—Lenses
- H01J2237/12—Lenses electrostatic
- H01J2237/1205—Microlenses
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/10—Lenses
- H01J2237/12—Lenses electrostatic
- H01J2237/1207—Einzel lenses
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/30—Electron or ion beam tubes for processing objects
- H01J2237/317—Processing objects on a microscale
- H01J2237/3175—Lithography
- H01J2237/31774—Multi-beam
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electron Beam Exposure (AREA)
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2011056812A JP5669636B2 (ja) | 2011-03-15 | 2011-03-15 | 荷電粒子線レンズおよびそれを用いた露光装置 |
| US14/005,175 US20140151571A1 (en) | 2011-03-15 | 2012-03-14 | Charged particle beam lens and exposure apparatus using the same |
| PCT/JP2012/001777 WO2012124320A1 (en) | 2011-03-15 | 2012-03-14 | Charged particle beam lens and exposure apparatus using the same |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2011056812A JP5669636B2 (ja) | 2011-03-15 | 2011-03-15 | 荷電粒子線レンズおよびそれを用いた露光装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2012195369A JP2012195369A (ja) | 2012-10-11 |
| JP2012195369A5 JP2012195369A5 (enExample) | 2014-05-01 |
| JP5669636B2 true JP5669636B2 (ja) | 2015-02-12 |
Family
ID=45932474
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2011056812A Expired - Fee Related JP5669636B2 (ja) | 2011-03-15 | 2011-03-15 | 荷電粒子線レンズおよびそれを用いた露光装置 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US20140151571A1 (enExample) |
| JP (1) | JP5669636B2 (enExample) |
| WO (1) | WO2012124320A1 (enExample) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2012195096A (ja) * | 2011-03-15 | 2012-10-11 | Canon Inc | 荷電粒子線レンズおよびそれを用いた露光装置 |
Family Cites Families (36)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3899711A (en) * | 1973-05-09 | 1975-08-12 | Gen Electric | Laminated multi-apertured electrode |
| US4200794A (en) * | 1978-11-08 | 1980-04-29 | Control Data Corporation | Micro lens array and micro deflector assembly for fly's eye electron beam tubes using silicon components and techniques of fabrication and assembly |
| US4409513A (en) * | 1980-04-30 | 1983-10-11 | Rca Corporation | Electrode for an electron gun |
| US4419182A (en) * | 1981-02-27 | 1983-12-06 | Veeco Instruments Inc. | Method of fabricating screen lens array plates |
| US4902898A (en) * | 1988-04-26 | 1990-02-20 | Microelectronics Center Of North Carolina | Wand optics column and associated array wand and charged particle source |
| US5155412A (en) * | 1991-05-28 | 1992-10-13 | International Business Machines Corporation | Method for selectively scaling a field emission electron gun and device formed thereby |
| JP3647128B2 (ja) * | 1996-03-04 | 2005-05-11 | キヤノン株式会社 | 電子ビーム露光装置とその露光方法 |
| US6195214B1 (en) * | 1999-07-30 | 2001-02-27 | Etec Systems, Inc. | Microcolumn assembly using laser spot welding |
| JP3763446B2 (ja) * | 1999-10-18 | 2006-04-05 | キヤノン株式会社 | 静電レンズ、電子ビーム描画装置、荷電ビーム応用装置、および、デバイス製造方法 |
| JP4947842B2 (ja) * | 2000-03-31 | 2012-06-06 | キヤノン株式会社 | 荷電粒子線露光装置 |
| JP4585661B2 (ja) * | 2000-03-31 | 2010-11-24 | キヤノン株式会社 | 電子光学系アレイ、荷電粒子線露光装置およびデバイス製造方法 |
| JP4947841B2 (ja) * | 2000-03-31 | 2012-06-06 | キヤノン株式会社 | 荷電粒子線露光装置 |
| US20020125440A1 (en) * | 2001-03-07 | 2002-09-12 | Applied Materials, Inc. | Method for fabrication of silicon octopole deflectors and electron column employing same |
| NZ537145A (en) * | 2002-06-15 | 2006-09-29 | Nfab Ltd | Charged particle beam generator |
| JP4252813B2 (ja) * | 2003-01-30 | 2009-04-08 | キヤノン株式会社 | 荷電ビーム用レンズ、荷電ビーム露光装置及びデバイス製造方法 |
| JP3834271B2 (ja) * | 2002-07-16 | 2006-10-18 | キヤノン株式会社 | マルチ荷電ビームレンズ及びこれを用いた荷電粒子線露光装置ならびにデバイス製造方法 |
| JP4298399B2 (ja) * | 2003-06-26 | 2009-07-15 | キヤノン株式会社 | 電子線装置及び該電子線装置を用いた電子線描画装置 |
| JP4459568B2 (ja) * | 2003-08-06 | 2010-04-28 | キヤノン株式会社 | マルチ荷電ビームレンズおよびそれを用いた荷電ビーム露光装置 |
| KR100496643B1 (ko) * | 2003-10-25 | 2005-06-20 | 한국전자통신연구원 | 마이크로칼럼 전자빔 장치의 자체정렬 적층 금속 박막전자빔 렌즈 및 그 제작방법 |
| EP1557866B1 (en) * | 2004-01-21 | 2011-03-16 | ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH | Beam optical component having a charged particle lens |
| GB2412232A (en) * | 2004-03-15 | 2005-09-21 | Ims Nanofabrication Gmbh | Particle-optical projection system |
| US7045794B1 (en) * | 2004-06-18 | 2006-05-16 | Novelx, Inc. | Stacked lens structure and method of use thereof for preventing electrical breakdown |
| JP4541798B2 (ja) * | 2004-08-06 | 2010-09-08 | キヤノン株式会社 | 荷電粒子線レンズアレイ、及び該荷電粒子線レンズアレイを用いた荷電粒子線露光装置 |
| JP2006049703A (ja) * | 2004-08-06 | 2006-02-16 | Canon Inc | 荷電粒子線レンズアレイ、及び該荷電粒子線レンズアレイを用いた荷電粒子線露光装置 |
| JP4745739B2 (ja) | 2005-07-06 | 2011-08-10 | キヤノン株式会社 | 静電レンズ装置、露光装置、及びデバイス製造方法 |
| US8134135B2 (en) * | 2006-07-25 | 2012-03-13 | Mapper Lithography Ip B.V. | Multiple beam charged particle optical system |
| US8013289B2 (en) * | 2006-11-15 | 2011-09-06 | Ether Precision, Inc. | Lens array block for image capturing unit and methods of fabrication |
| US8089056B2 (en) * | 2008-02-26 | 2012-01-03 | Mapper Lithography Ip B.V. | Projection lens arrangement |
| DE102008037698B4 (de) * | 2008-08-14 | 2012-08-16 | Carl Zeiss Nts Gmbh | Elektronenmikroskop mit ringförmiger Beleuchtungsapertur |
| TWI479530B (zh) * | 2008-10-01 | 2015-04-01 | Mapper Lithography Ip Bv | 靜電透鏡結構、靜電透鏡陣列、帶電粒子的子束微影系統以及製造絕緣結構的方法 |
| JP4811962B2 (ja) | 2009-09-10 | 2011-11-09 | 住友ゴム工業株式会社 | インナーライナー用ポリマーシートの製造方法および空気入りタイヤの製造方法 |
| KR101041369B1 (ko) * | 2009-11-19 | 2011-06-15 | 한국기초과학지원연구원 | 초고속 대량 시료 분석을 위한 장치 및 방법 |
| US8785850B2 (en) * | 2010-01-19 | 2014-07-22 | National Research Counsel Of Canada | Charging of a hole-free thin film phase plate |
| CN102484066B (zh) * | 2010-01-26 | 2014-11-19 | 株式会社爱发科 | 干式蚀刻法 |
| JP2012195097A (ja) * | 2011-03-15 | 2012-10-11 | Canon Inc | 荷電粒子線レンズおよびそれを用いた露光装置 |
| JP5744579B2 (ja) * | 2011-03-15 | 2015-07-08 | キヤノン株式会社 | 荷電粒子線レンズおよびそれを用いた露光装置 |
-
2011
- 2011-03-15 JP JP2011056812A patent/JP5669636B2/ja not_active Expired - Fee Related
-
2012
- 2012-03-14 US US14/005,175 patent/US20140151571A1/en not_active Abandoned
- 2012-03-14 WO PCT/JP2012/001777 patent/WO2012124320A1/en not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| US20140151571A1 (en) | 2014-06-05 |
| JP2012195369A (ja) | 2012-10-11 |
| WO2012124320A1 (en) | 2012-09-20 |
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