JP5669629B2 - テラヘルツ波の測定装置及び測定方法 - Google Patents

テラヘルツ波の測定装置及び測定方法 Download PDF

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Publication number
JP5669629B2
JP5669629B2 JP2011047736A JP2011047736A JP5669629B2 JP 5669629 B2 JP5669629 B2 JP 5669629B2 JP 2011047736 A JP2011047736 A JP 2011047736A JP 2011047736 A JP2011047736 A JP 2011047736A JP 5669629 B2 JP5669629 B2 JP 5669629B2
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current
unit
terahertz wave
detection unit
time waveform
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JP2011047736A
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Japanese (ja)
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JP2012002798A (ja
JP2012002798A5 (enExample
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井辻　健明
健明 井辻
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Canon Inc
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Canon Inc
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Priority to JP2011047736A priority Critical patent/JP5669629B2/ja
Priority to US13/096,916 priority patent/US8513940B2/en
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Publication of JP2012002798A5 publication Critical patent/JP2012002798A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/20—Cathode-ray oscilloscopes
    • G01R13/22—Circuits therefor
    • G01R13/34—Circuits for representing a single waveform by sampling, e.g. for very high frequencies
    • G01R13/347—Circuits for representing a single waveform by sampling, e.g. for very high frequencies using electro-optic elements

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2011047736A 2010-05-18 2011-03-04 テラヘルツ波の測定装置及び測定方法 Expired - Fee Related JP5669629B2 (ja)

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Application Number Priority Date Filing Date Title
JP2011047736A JP5669629B2 (ja) 2010-05-18 2011-03-04 テラヘルツ波の測定装置及び測定方法
US13/096,916 US8513940B2 (en) 2010-05-18 2011-04-28 Method of measuring terahertz wave and apparatus therefor

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2010113829 2010-05-18
JP2010113829 2010-05-18
JP2011047736A JP5669629B2 (ja) 2010-05-18 2011-03-04 テラヘルツ波の測定装置及び測定方法

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JP2012002798A JP2012002798A (ja) 2012-01-05
JP2012002798A5 JP2012002798A5 (enExample) 2014-04-17
JP5669629B2 true JP5669629B2 (ja) 2015-02-12

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US (1) US8513940B2 (enExample)
JP (1) JP5669629B2 (enExample)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2541193A1 (de) * 2011-06-27 2013-01-02 Hexagon Technology Center GmbH Interferometrisches Entfernungsmessverfahren zum Vermessen von Oberflächen und ebensolche Messanordnung
JP5882786B2 (ja) * 2012-02-28 2016-03-09 株式会社Ｓｃｒｅｅｎホールディングス 電磁波応答測定装置
JP2014106127A (ja) * 2012-11-28 2014-06-09 Pioneer Electronic Corp テラヘルツ波計測装置及び方法
US20140151581A1 (en) * 2012-12-03 2014-06-05 Yael Nemirovsky Terahertz source
JP2014115189A (ja) * 2012-12-10 2014-06-26 Pioneer Electronic Corp テラヘルツ波計測装置
CN110854653A (zh) * 2018-08-20 2020-02-28 苏州曼德特光电技术有限公司 一种基于非线性光学整流过程的宽带太赫兹光源
CN112506867B (zh) * 2020-11-18 2022-02-18 中国南方电网有限责任公司 一种基于时间偏差管理的录波比对分析方法
JP7516240B2 (ja) * 2020-12-24 2024-07-16 横河電機株式会社 光測定装置
CN116718987A (zh) * 2023-06-30 2023-09-08 成都中微达信科技有限公司 一种256通道微弱信号采集处理装置
CN116609578B (zh) * 2023-07-06 2024-04-16 深圳柯力三电科技有限公司 一种高精度数字电流传感器及其测试方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04348258A (ja) * 1991-05-27 1992-12-03 Kowa Co 多チャンネル光学測定装置
JP4237363B2 (ja) * 1999-11-10 2009-03-11 日本分光株式会社 赤外分光装置
JP2004163282A (ja) * 2002-11-13 2004-06-10 Tochigi Nikon Corp テラヘルツ受信回路を有するテラヘルツパルス光計測装置
JP2004296771A (ja) * 2003-03-27 2004-10-21 Renesas Technology Corp 半導体検査装置及び検査方法
JP2007292600A (ja) * 2006-04-25 2007-11-08 Matsushita Electric Ind Co Ltd 電磁波イメージング装置
US7282926B1 (en) * 2006-06-05 2007-10-16 Jan Verspecht Method and an apparatus for characterizing a high-frequency device-under-test in a large signal impedance tuning environment
JP4654996B2 (ja) 2006-07-12 2011-03-23 株式会社島津製作所 テラヘルツ波応答測定装置
JP5438327B2 (ja) * 2009-01-23 2014-03-12 キヤノン株式会社 テラヘルツ波を用いる測定装置
JP5489906B2 (ja) * 2010-08-05 2014-05-14 キヤノン株式会社 テラヘルツ波トランシーバ及び断層像取得装置

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US8513940B2 (en) 2013-08-20
JP2012002798A (ja) 2012-01-05
US20110285383A1 (en) 2011-11-24

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