JP5666013B2 - 物体のモデルの表面の欠陥を判断するための方法およびシステム - Google Patents

物体のモデルの表面の欠陥を判断するための方法およびシステム Download PDF

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JP5666013B2
JP5666013B2 JP2013542708A JP2013542708A JP5666013B2 JP 5666013 B2 JP5666013 B2 JP 5666013B2 JP 2013542708 A JP2013542708 A JP 2013542708A JP 2013542708 A JP2013542708 A JP 2013542708A JP 5666013 B2 JP5666013 B2 JP 5666013B2
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pixel
determining
normal vector
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JP2014508979A (ja
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サリバン、アラン
ヨガナンダ、アラン・アール
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Mitsubishi Electric Research Laboratories Inc
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Mitsubishi Electric Research Laboratories Inc
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    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Programme-control systems
    • G05B19/02—Programme-control systems electric
    • G05B19/18—Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of programme data in numerical form
    • G05B19/406—Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of programme data in numerical form characterised by monitoring or safety
    • G05B19/4069—Simulating machining process on screen
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/35—Nc in input of data, input till input file format
    • G05B2219/35303—Dry run, compare simulated output with desired finished profile, alarm, inhibit
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30164—Workpiece; Machine component
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Human Computer Interaction (AREA)
  • Manufacturing & Machinery (AREA)
  • Automation & Control Theory (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Numerical Control (AREA)
  • Image Analysis (AREA)
  • Image Generation (AREA)
JP2013542708A 2011-08-04 2011-08-04 物体のモデルの表面の欠陥を判断するための方法およびシステム Active JP5666013B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2011/068338 WO2013018235A1 (en) 2011-08-04 2011-08-04 Method and system for determining defect of surface of model of object

Publications (2)

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JP2014508979A JP2014508979A (ja) 2014-04-10
JP5666013B2 true JP5666013B2 (ja) 2015-02-04

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JP2013542708A Active JP5666013B2 (ja) 2011-08-04 2011-08-04 物体のモデルの表面の欠陥を判断するための方法およびシステム

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Country Link
JP (1) JP5666013B2 (zh)
CN (1) CN103733223B (zh)
DE (1) DE112011105499T5 (zh)
WO (1) WO2013018235A1 (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11966209B2 (en) 2019-12-26 2024-04-23 Fanuc Corporation Simulator, numerical control device, and simulation method

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9098754B1 (en) 2014-04-25 2015-08-04 Google Inc. Methods and systems for object detection using laser point clouds
US9922452B2 (en) * 2015-09-17 2018-03-20 Samsung Electronics Co., Ltd. Apparatus and method for adjusting brightness of image
CN105388842A (zh) * 2015-12-10 2016-03-09 华中科技大学 一种零件表面加工缺陷的定位方法
CN108226231A (zh) * 2018-01-29 2018-06-29 英华达（上海）科技有限公司 缺陷评估系统
CN108765378B (zh) * 2018-05-07 2021-07-09 上海理工大学 基于g代码引导下工件轮廓飞边凸起的机器视觉检测方法
JPWO2020003917A1 (ja) * 2018-06-29 2021-06-24 富士フイルム株式会社 欠陥表示装置及び方法
CN109829911B (zh) * 2019-02-01 2020-09-29 佛山市南海区广工大数控装备协同创新研究院 一种基于轮廓超差算法的pcb板表面检测方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3017A (en) * 1843-03-21 Plate turn-button for fastening cupboard and other doors
JPH10277888A (ja) * 1997-04-01 1998-10-20 Toshiba Corp 加工データの修正方法及びその装置
DE10157964B4 (de) * 2001-11-26 2011-06-22 Siemens AG, 80333 Verfahren zur Optimierung einer Oberflächengüte eines zu fertigenden Werkstücks anhand von CNC-Programmdaten
US7012680B2 (en) * 2002-07-16 2006-03-14 Matsushita Electric Industrial Co., Ltd. Method and apparatus for quantitative quality inspection of substrate such as wafer
JP3761877B2 (ja) * 2002-07-16 2006-03-29 松下電器産業株式会社 ウェハの検査方法
US7272254B2 (en) * 2003-07-09 2007-09-18 General Electric Company System and method for analyzing and identifying flaws in a manufactured part
CN1998021A (zh) * 2004-08-05 2007-07-11 艾克斯视觉系统公司 用于检测表面的方法
JP4784555B2 (ja) * 2007-05-25 2011-10-05 トヨタ自動車株式会社 形状評価方法、形状評価装置および三次元検査装置
US8532812B2 (en) * 2010-06-29 2013-09-10 Mitsubishi Electric Research Laboratories, Inc. System and method for identifying defects of surfaces due to machining processes

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11966209B2 (en) 2019-12-26 2024-04-23 Fanuc Corporation Simulator, numerical control device, and simulation method

Also Published As

Publication number Publication date
DE112011105499T5 (de) 2014-05-28
JP2014508979A (ja) 2014-04-10
WO2013018235A1 (en) 2013-02-07
CN103733223A (zh) 2014-04-16
CN103733223B (zh) 2016-09-21

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