JP5636962B2 - Resin composition - Google Patents
Resin composition Download PDFInfo
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- JP5636962B2 JP5636962B2 JP2010546670A JP2010546670A JP5636962B2 JP 5636962 B2 JP5636962 B2 JP 5636962B2 JP 2010546670 A JP2010546670 A JP 2010546670A JP 2010546670 A JP2010546670 A JP 2010546670A JP 5636962 B2 JP5636962 B2 JP 5636962B2
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- Prior art keywords
- resin
- resin composition
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- Prior art date
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- 239000011342 resin composition Substances 0.000 title claims description 118
- 229920005989 resin Polymers 0.000 claims description 76
- 239000011347 resin Substances 0.000 claims description 76
- 239000002245 particle Substances 0.000 claims description 44
- 239000002313 adhesive film Substances 0.000 claims description 36
- 239000004643 cyanate ester Substances 0.000 claims description 31
- 229920002554 vinyl polymer Polymers 0.000 claims description 29
- 239000004020 conductor Substances 0.000 claims description 28
- 229910052751 metal Inorganic materials 0.000 claims description 28
- 239000002184 metal Substances 0.000 claims description 28
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical group O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 23
- 239000011256 inorganic filler Substances 0.000 claims description 21
- 229910003475 inorganic filler Inorganic materials 0.000 claims description 21
- 150000001875 compounds Chemical class 0.000 claims description 18
- 239000003054 catalyst Substances 0.000 claims description 17
- 229920006287 phenoxy resin Polymers 0.000 claims description 16
- 239000013034 phenoxy resin Substances 0.000 claims description 16
- 239000002952 polymeric resin Substances 0.000 claims description 15
- 229920003002 synthetic resin Polymers 0.000 claims description 15
- 238000007747 plating Methods 0.000 claims description 14
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 13
- 238000007788 roughening Methods 0.000 claims description 11
- 239000000463 material Substances 0.000 claims description 10
- 239000000377 silicon dioxide Substances 0.000 claims description 10
- 229910052802 copper Inorganic materials 0.000 claims description 8
- 239000010949 copper Substances 0.000 claims description 8
- 230000003014 reinforcing effect Effects 0.000 claims description 8
- DHKHKXVYLBGOIT-UHFFFAOYSA-N 1,1-Diethoxyethane Chemical compound CCOC(C)OCC DHKHKXVYLBGOIT-UHFFFAOYSA-N 0.000 claims description 7
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 claims description 7
- 239000011354 acetal resin Substances 0.000 claims description 7
- 239000000835 fiber Substances 0.000 claims description 7
- 229920006324 polyoxymethylene Polymers 0.000 claims description 7
- 229910052725 zinc Inorganic materials 0.000 claims description 7
- 239000011701 zinc Substances 0.000 claims description 7
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 claims description 6
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims description 6
- 239000010941 cobalt Substances 0.000 claims description 5
- 229910017052 cobalt Inorganic materials 0.000 claims description 5
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical group [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 claims description 5
- 229920001721 polyimide Polymers 0.000 claims description 5
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 claims description 4
- 229920001955 polyphenylene ether Polymers 0.000 claims description 4
- 229910052718 tin Inorganic materials 0.000 claims description 4
- 239000004696 Poly ether ether ketone Substances 0.000 claims description 3
- 239000004962 Polyamide-imide Substances 0.000 claims description 3
- 239000004695 Polyether sulfone Substances 0.000 claims description 3
- 239000004697 Polyetherimide Substances 0.000 claims description 3
- 229910052742 iron Inorganic materials 0.000 claims description 3
- 150000002739 metals Chemical class 0.000 claims description 3
- 229910052759 nickel Inorganic materials 0.000 claims description 3
- 229920002492 poly(sulfone) Polymers 0.000 claims description 3
- 229920002312 polyamide-imide Polymers 0.000 claims description 3
- 229920005668 polycarbonate resin Polymers 0.000 claims description 3
- 239000004431 polycarbonate resin Substances 0.000 claims description 3
- 229920006393 polyether sulfone Polymers 0.000 claims description 3
- 229920002530 polyetherether ketone Polymers 0.000 claims description 3
- 229920001601 polyetherimide Polymers 0.000 claims description 3
- 239000009719 polyimide resin Substances 0.000 claims description 3
- WPBNNNQJVZRUHP-UHFFFAOYSA-L manganese(2+);methyl n-[[2-(methoxycarbonylcarbamothioylamino)phenyl]carbamothioyl]carbamate;n-[2-(sulfidocarbothioylamino)ethyl]carbamodithioate Chemical compound [Mn+2].[S-]C(=S)NCCNC([S-])=S.COC(=O)NC(=S)NC1=CC=CC=C1NC(=S)NC(=O)OC WPBNNNQJVZRUHP-UHFFFAOYSA-L 0.000 claims description 2
- 229920001225 polyester resin Polymers 0.000 claims description 2
- 239000004645 polyester resin Substances 0.000 claims description 2
- 150000003839 salts Chemical class 0.000 claims description 2
- 150000004696 coordination complex Chemical class 0.000 claims 1
- 239000000945 filler Substances 0.000 claims 1
- 239000010410 layer Substances 0.000 description 74
- -1 benzyl compound Chemical class 0.000 description 58
- 229920000647 polyepoxide Polymers 0.000 description 53
- 239000003822 epoxy resin Substances 0.000 description 46
- 238000000034 method Methods 0.000 description 41
- 239000000243 solution Substances 0.000 description 29
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 24
- ZWEHNKRNPOVVGH-UHFFFAOYSA-N 2-Butanone Chemical compound CCC(C)=O ZWEHNKRNPOVVGH-UHFFFAOYSA-N 0.000 description 23
- 229920001971 elastomer Polymers 0.000 description 21
- 125000004432 carbon atom Chemical group C* 0.000 description 20
- JHIVVAPYMSGYDF-UHFFFAOYSA-N cyclohexanone Chemical compound O=C1CCCCC1 JHIVVAPYMSGYDF-UHFFFAOYSA-N 0.000 description 20
- 239000002966 varnish Substances 0.000 description 20
- ZUOUZKKEUPVFJK-UHFFFAOYSA-N diphenyl Chemical group C1=CC=CC=C1C1=CC=CC=C1 ZUOUZKKEUPVFJK-UHFFFAOYSA-N 0.000 description 19
- NIXOWILDQLNWCW-UHFFFAOYSA-M Acrylate Chemical compound [O-]C(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-M 0.000 description 18
- 239000005060 rubber Substances 0.000 description 17
- IISBACLAFKSPIT-UHFFFAOYSA-N bisphenol A Chemical compound C=1C=C(O)C=CC=1C(C)(C)C1=CC=C(O)C=C1 IISBACLAFKSPIT-UHFFFAOYSA-N 0.000 description 14
- 229920003986 novolac Polymers 0.000 description 14
- 239000003960 organic solvent Substances 0.000 description 14
- 239000004593 Epoxy Substances 0.000 description 13
- 238000005259 measurement Methods 0.000 description 13
- 229920000642 polymer Polymers 0.000 description 13
- 239000000758 substrate Substances 0.000 description 13
- ISWSIDIOOBJBQZ-UHFFFAOYSA-N Phenol Chemical compound OC1=CC=CC=C1 ISWSIDIOOBJBQZ-UHFFFAOYSA-N 0.000 description 12
- LNEPOXFFQSENCJ-UHFFFAOYSA-N haloperidol Chemical compound C1CC(O)(C=2C=CC(Cl)=CC=2)CCN1CCCC(=O)C1=CC=C(F)C=C1 LNEPOXFFQSENCJ-UHFFFAOYSA-N 0.000 description 12
- XLJMAIOERFSOGZ-UHFFFAOYSA-M cyanate Chemical compound [O-]C#N XLJMAIOERFSOGZ-UHFFFAOYSA-M 0.000 description 11
- UFWIBTONFRDIAS-UHFFFAOYSA-N Naphthalene Chemical compound C1=CC=CC2=CC=CC=C21 UFWIBTONFRDIAS-UHFFFAOYSA-N 0.000 description 10
- 239000004305 biphenyl Substances 0.000 description 10
- 235000010290 biphenyl Nutrition 0.000 description 10
- 230000000052 comparative effect Effects 0.000 description 10
- 229910052698 phosphorus Inorganic materials 0.000 description 10
- 239000011574 phosphorus Substances 0.000 description 10
- 239000000126 substance Substances 0.000 description 10
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 9
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 9
- 238000011156 evaluation Methods 0.000 description 9
- WSFQLUVWDKCYSW-UHFFFAOYSA-M sodium;2-hydroxy-3-morpholin-4-ylpropane-1-sulfonate Chemical compound [Na+].[O-]S(=O)(=O)CC(O)CN1CCOCC1 WSFQLUVWDKCYSW-UHFFFAOYSA-M 0.000 description 9
- 229920001187 thermosetting polymer Polymers 0.000 description 9
- ZMXDDKWLCZADIW-UHFFFAOYSA-N N,N-Dimethylformamide Chemical compound CN(C)C=O ZMXDDKWLCZADIW-UHFFFAOYSA-N 0.000 description 8
- 239000003513 alkali Substances 0.000 description 8
- 125000000217 alkyl group Chemical group 0.000 description 8
- 238000010438 heat treatment Methods 0.000 description 8
- 125000002524 organometallic group Chemical group 0.000 description 8
- 230000003746 surface roughness Effects 0.000 description 8
- 125000003545 alkoxy group Chemical group 0.000 description 7
- PXKLMJQFEQBVLD-UHFFFAOYSA-N bisphenol F Chemical compound C1=CC(O)=CC=C1CC1=CC=C(O)C=C1 PXKLMJQFEQBVLD-UHFFFAOYSA-N 0.000 description 7
- 238000001035 drying Methods 0.000 description 7
- 230000000694 effects Effects 0.000 description 7
- 230000009477 glass transition Effects 0.000 description 7
- 238000010030 laminating Methods 0.000 description 7
- 238000003475 lamination Methods 0.000 description 7
- 239000002585 base Substances 0.000 description 6
- 239000003795 chemical substances by application Substances 0.000 description 6
- 239000003063 flame retardant Substances 0.000 description 6
- 125000004435 hydrogen atom Chemical group [H]* 0.000 description 6
- NIHNNTQXNPWCJQ-UHFFFAOYSA-N o-biphenylenemethane Natural products C1=CC=C2CC3=CC=CC=C3C2=C1 NIHNNTQXNPWCJQ-UHFFFAOYSA-N 0.000 description 6
- 230000001681 protective effect Effects 0.000 description 6
- KJCVRFUGPWSIIH-UHFFFAOYSA-N 1-naphthol Chemical compound C1=CC=C2C(O)=CC=CC2=C1 KJCVRFUGPWSIIH-UHFFFAOYSA-N 0.000 description 5
- VPWNQTHUCYMVMZ-UHFFFAOYSA-N 4,4'-sulfonyldiphenol Chemical compound C1=CC(O)=CC=C1S(=O)(=O)C1=CC=C(O)C=C1 VPWNQTHUCYMVMZ-UHFFFAOYSA-N 0.000 description 5
- 229930185605 Bisphenol Natural products 0.000 description 5
- 229920000459 Nitrile rubber Polymers 0.000 description 5
- AHZMUXQJTGRNHT-UHFFFAOYSA-N [4-[2-(4-cyanatophenyl)propan-2-yl]phenyl] cyanate Chemical compound C=1C=C(OC#N)C=CC=1C(C)(C)C1=CC=C(OC#N)C=C1 AHZMUXQJTGRNHT-UHFFFAOYSA-N 0.000 description 5
- 239000011889 copper foil Substances 0.000 description 5
- 239000007788 liquid Substances 0.000 description 5
- 238000004519 manufacturing process Methods 0.000 description 5
- 239000000203 mixture Substances 0.000 description 5
- FZHAPNGMFPVSLP-UHFFFAOYSA-N silanamine Chemical compound [SiH3]N FZHAPNGMFPVSLP-UHFFFAOYSA-N 0.000 description 5
- 125000005309 thioalkoxy group Chemical group 0.000 description 5
- RNFJDJUURJAICM-UHFFFAOYSA-N 2,2,4,4,6,6-hexaphenoxy-1,3,5-triaza-2$l^{5},4$l^{5},6$l^{5}-triphosphacyclohexa-1,3,5-triene Chemical compound N=1P(OC=2C=CC=CC=2)(OC=2C=CC=CC=2)=NP(OC=2C=CC=CC=2)(OC=2C=CC=CC=2)=NP=1(OC=1C=CC=CC=1)OC1=CC=CC=C1 RNFJDJUURJAICM-UHFFFAOYSA-N 0.000 description 4
- 101100410148 Pinus taeda PT30 gene Proteins 0.000 description 4
- 125000003710 aryl alkyl group Chemical group 0.000 description 4
- 125000001797 benzyl group Chemical group [H]C1=C([H])C([H])=C(C([H])=C1[H])C([H])([H])* 0.000 description 4
- KAKZBPTYRLMSJV-UHFFFAOYSA-N butadiene group Chemical group C=CC=C KAKZBPTYRLMSJV-UHFFFAOYSA-N 0.000 description 4
- FCEOGYWNOSBEPV-FDGPNNRMSA-N cobalt;(z)-4-hydroxypent-3-en-2-one Chemical compound [Co].C\C(O)=C\C(C)=O.C\C(O)=C\C(C)=O FCEOGYWNOSBEPV-FDGPNNRMSA-N 0.000 description 4
- 125000000753 cycloalkyl group Chemical group 0.000 description 4
- 238000009826 distribution Methods 0.000 description 4
- 238000005530 etching Methods 0.000 description 4
- 235000013824 polyphenols Nutrition 0.000 description 4
- 239000002904 solvent Substances 0.000 description 4
- 238000012360 testing method Methods 0.000 description 4
- INZDTEICWPZYJM-UHFFFAOYSA-N 1-(chloromethyl)-4-[4-(chloromethyl)phenyl]benzene Chemical group C1=CC(CCl)=CC=C1C1=CC=C(CCl)C=C1 INZDTEICWPZYJM-UHFFFAOYSA-N 0.000 description 3
- HECLRDQVFMWTQS-RGOKHQFPSA-N 1755-01-7 Chemical group C1[C@H]2[C@@H]3CC=C[C@@H]3[C@@H]1C=C2 HECLRDQVFMWTQS-RGOKHQFPSA-N 0.000 description 3
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 3
- XEKOWRVHYACXOJ-UHFFFAOYSA-N Ethyl acetate Chemical compound CCOC(C)=O XEKOWRVHYACXOJ-UHFFFAOYSA-N 0.000 description 3
- LYCAIKOWRPUZTN-UHFFFAOYSA-N Ethylene glycol Chemical compound OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 description 3
- KWYUFKZDYYNOTN-UHFFFAOYSA-M Potassium hydroxide Chemical compound [OH-].[K+] KWYUFKZDYYNOTN-UHFFFAOYSA-M 0.000 description 3
- 239000006087 Silane Coupling Agent Substances 0.000 description 3
- 239000012792 core layer Substances 0.000 description 3
- 239000011258 core-shell material Substances 0.000 description 3
- 238000000354 decomposition reaction Methods 0.000 description 3
- 238000005553 drilling Methods 0.000 description 3
- 238000007772 electroless plating Methods 0.000 description 3
- 239000011888 foil Substances 0.000 description 3
- 238000005227 gel permeation chromatography Methods 0.000 description 3
- 239000011521 glass Substances 0.000 description 3
- 125000005843 halogen group Chemical group 0.000 description 3
- RAXXELZNTBOGNW-UHFFFAOYSA-N imidazole Natural products C1=CNC=N1 RAXXELZNTBOGNW-UHFFFAOYSA-N 0.000 description 3
- 229910052500 inorganic mineral Inorganic materials 0.000 description 3
- 238000009413 insulation Methods 0.000 description 3
- 239000011707 mineral Substances 0.000 description 3
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 3
- 229920002037 poly(vinyl butyral) polymer Polymers 0.000 description 3
- 229920000058 polyacrylate Polymers 0.000 description 3
- 229920000139 polyethylene terephthalate Polymers 0.000 description 3
- 239000005020 polyethylene terephthalate Substances 0.000 description 3
- 239000000843 powder Substances 0.000 description 3
- 238000003825 pressing Methods 0.000 description 3
- 239000007787 solid Substances 0.000 description 3
- 230000008961 swelling Effects 0.000 description 3
- 239000011135 tin Substances 0.000 description 3
- YBYIRNPNPLQARY-UHFFFAOYSA-N 1H-indene Natural products C1=CC=C2CC=CC2=C1 YBYIRNPNPLQARY-UHFFFAOYSA-N 0.000 description 2
- TXBCBTDQIULDIA-UHFFFAOYSA-N 2-[[3-hydroxy-2,2-bis(hydroxymethyl)propoxy]methyl]-2-(hydroxymethyl)propane-1,3-diol Chemical compound OCC(CO)(CO)COCC(CO)(CO)CO TXBCBTDQIULDIA-UHFFFAOYSA-N 0.000 description 2
- QTWJRLJHJPIABL-UHFFFAOYSA-N 2-methylphenol;3-methylphenol;4-methylphenol Chemical compound CC1=CC=C(O)C=C1.CC1=CC=CC(O)=C1.CC1=CC=CC=C1O QTWJRLJHJPIABL-UHFFFAOYSA-N 0.000 description 2
- JYLNVJYYQQXNEK-UHFFFAOYSA-N 3-amino-2-(4-chlorophenyl)-1-propanesulfonic acid Chemical compound OS(=O)(=O)CC(CN)C1=CC=C(Cl)C=C1 JYLNVJYYQQXNEK-UHFFFAOYSA-N 0.000 description 2
- 229920002799 BoPET Polymers 0.000 description 2
- VTYYLEPIZMXCLO-UHFFFAOYSA-L Calcium carbonate Chemical compound [Ca+2].[O-]C([O-])=O VTYYLEPIZMXCLO-UHFFFAOYSA-L 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical group [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 2
- CURLTUGMZLYLDI-UHFFFAOYSA-N Carbon dioxide Chemical compound O=C=O CURLTUGMZLYLDI-UHFFFAOYSA-N 0.000 description 2
- HEDRZPFGACZZDS-UHFFFAOYSA-N Chloroform Chemical compound ClC(Cl)Cl HEDRZPFGACZZDS-UHFFFAOYSA-N 0.000 description 2
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 description 2
- MHAJPDPJQMAIIY-UHFFFAOYSA-N Hydrogen peroxide Chemical compound OO MHAJPDPJQMAIIY-UHFFFAOYSA-N 0.000 description 2
- QIGBRXMKCJKVMJ-UHFFFAOYSA-N Hydroquinone Chemical compound OC1=CC=C(O)C=C1 QIGBRXMKCJKVMJ-UHFFFAOYSA-N 0.000 description 2
- 239000004743 Polypropylene Substances 0.000 description 2
- 239000004793 Polystyrene Substances 0.000 description 2
- 229920000297 Rayon Polymers 0.000 description 2
- WQDUMFSSJAZKTM-UHFFFAOYSA-N Sodium methoxide Chemical compound [Na+].[O-]C WQDUMFSSJAZKTM-UHFFFAOYSA-N 0.000 description 2
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 2
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 2
- 229920000800 acrylic rubber Polymers 0.000 description 2
- 239000000654 additive Substances 0.000 description 2
- 125000002947 alkylene group Chemical group 0.000 description 2
- WNROFYMDJYEPJX-UHFFFAOYSA-K aluminium hydroxide Chemical compound [OH-].[OH-].[OH-].[Al+3] WNROFYMDJYEPJX-UHFFFAOYSA-K 0.000 description 2
- 238000000137 annealing Methods 0.000 description 2
- 125000005577 anthracene group Chemical group 0.000 description 2
- 239000007864 aqueous solution Substances 0.000 description 2
- 125000003118 aryl group Chemical group 0.000 description 2
- TZCXTZWJZNENPQ-UHFFFAOYSA-L barium sulfate Chemical compound [Ba+2].[O-]S([O-])(=O)=O TZCXTZWJZNENPQ-UHFFFAOYSA-L 0.000 description 2
- HUMNYLRZRPPJDN-UHFFFAOYSA-N benzaldehyde Chemical compound O=CC1=CC=CC=C1 HUMNYLRZRPPJDN-UHFFFAOYSA-N 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- JUPWRUDTZGBNEX-UHFFFAOYSA-N cobalt;pentane-2,4-dione Chemical compound [Co].CC(=O)CC(C)=O.CC(=O)CC(C)=O.CC(=O)CC(C)=O JUPWRUDTZGBNEX-UHFFFAOYSA-N 0.000 description 2
- 229930003836 cresol Natural products 0.000 description 2
- 238000009713 electroplating Methods 0.000 description 2
- 125000001495 ethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 description 2
- 239000004744 fabric Substances 0.000 description 2
- 125000003983 fluorenyl group Chemical group C1(=CC=CC=2C3=CC=CC=C3CC12)* 0.000 description 2
- 239000011737 fluorine Substances 0.000 description 2
- 229910052731 fluorine Inorganic materials 0.000 description 2
- 239000012943 hotmelt Substances 0.000 description 2
- 150000002430 hydrocarbons Chemical group 0.000 description 2
- 125000002887 hydroxy group Chemical group [H]O* 0.000 description 2
- AQBLLJNPHDIAPN-LNTINUHCSA-K iron(3+);(z)-4-oxopent-2-en-2-olate Chemical compound [Fe+3].C\C([O-])=C\C(C)=O.C\C([O-])=C\C(C)=O.C\C([O-])=C\C(C)=O AQBLLJNPHDIAPN-LNTINUHCSA-K 0.000 description 2
- 239000002648 laminated material Substances 0.000 description 2
- VTHJTEIRLNZDEV-UHFFFAOYSA-L magnesium dihydroxide Chemical compound [OH-].[OH-].[Mg+2] VTHJTEIRLNZDEV-UHFFFAOYSA-L 0.000 description 2
- 239000000347 magnesium hydroxide Substances 0.000 description 2
- 229910001862 magnesium hydroxide Inorganic materials 0.000 description 2
- 229910000000 metal hydroxide Inorganic materials 0.000 description 2
- 150000004692 metal hydroxides Chemical class 0.000 description 2
- 239000011259 mixed solution Substances 0.000 description 2
- 125000000962 organic group Chemical group 0.000 description 2
- 125000001477 organic nitrogen group Chemical group 0.000 description 2
- 239000007800 oxidant agent Substances 0.000 description 2
- 229940059574 pentaerithrityl Drugs 0.000 description 2
- WXZMFSXDPGVJKK-UHFFFAOYSA-N pentaerythritol Chemical compound OCC(CO)(CO)CO WXZMFSXDPGVJKK-UHFFFAOYSA-N 0.000 description 2
- PRCNQQRRDGMPKS-UHFFFAOYSA-N pentane-2,4-dione;zinc Chemical compound [Zn].CC(=O)CC(C)=O.CC(=O)CC(C)=O PRCNQQRRDGMPKS-UHFFFAOYSA-N 0.000 description 2
- 150000003018 phosphorus compounds Chemical class 0.000 description 2
- 229920000728 polyester Polymers 0.000 description 2
- 229920001155 polypropylene Polymers 0.000 description 2
- 229920001296 polysiloxane Polymers 0.000 description 2
- 229920002223 polystyrene Polymers 0.000 description 2
- 239000012286 potassium permanganate Substances 0.000 description 2
- 230000007261 regionalization Effects 0.000 description 2
- 229920003048 styrene butadiene rubber Polymers 0.000 description 2
- 230000000930 thermomechanical effect Effects 0.000 description 2
- 125000000391 vinyl group Chemical group [H]C([*])=C([H])[H] 0.000 description 2
- XXEYMOUSTWPDDB-OJMIUMIFSA-N (2r)-5-[(5s,7r,8s,9r)-8,9-dihydroxy-2,4-dioxo-7-(phosphonooxymethyl)-6-oxa-1,3-diazaspiro[4.4]nonan-3-yl]-2-[formyl(hydroxy)amino]pentanoic acid Chemical compound O[C@@H]1[C@H](O)[C@@H](COP(O)(O)=O)O[C@]11C(=O)N(CCC[C@@H](N(O)C=O)C(O)=O)C(=O)N1 XXEYMOUSTWPDDB-OJMIUMIFSA-N 0.000 description 1
- MEBONNVPKOBPEA-UHFFFAOYSA-N 1,1,2-trimethylcyclohexane Chemical group CC1CCCCC1(C)C MEBONNVPKOBPEA-UHFFFAOYSA-N 0.000 description 1
- JYEUMXHLPRZUAT-UHFFFAOYSA-N 1,2,3-triazine Chemical compound C1=CN=NN=C1 JYEUMXHLPRZUAT-UHFFFAOYSA-N 0.000 description 1
- WSLDOOZREJYCGB-UHFFFAOYSA-N 1,2-Dichloroethane Chemical compound ClCCCl WSLDOOZREJYCGB-UHFFFAOYSA-N 0.000 description 1
- KGKAYWMGPDWLQZ-UHFFFAOYSA-N 1,2-bis(bromomethyl)benzene Chemical compound BrCC1=CC=CC=C1CBr KGKAYWMGPDWLQZ-UHFFFAOYSA-N 0.000 description 1
- FMGGHNGKHRCJLL-UHFFFAOYSA-N 1,2-bis(chloromethyl)benzene Chemical compound ClCC1=CC=CC=C1CCl FMGGHNGKHRCJLL-UHFFFAOYSA-N 0.000 description 1
- PAAZPARNPHGIKF-UHFFFAOYSA-N 1,2-dibromoethane Chemical compound BrCCBr PAAZPARNPHGIKF-UHFFFAOYSA-N 0.000 description 1
- OUPZKGBUJRBPGC-UHFFFAOYSA-N 1,3,5-tris(oxiran-2-ylmethyl)-1,3,5-triazinane-2,4,6-trione Chemical compound O=C1N(CC2OC2)C(=O)N(CC2OC2)C(=O)N1CC1CO1 OUPZKGBUJRBPGC-UHFFFAOYSA-N 0.000 description 1
- OXHOPZLBSSTTBU-UHFFFAOYSA-N 1,3-bis(bromomethyl)benzene Chemical compound BrCC1=CC=CC(CBr)=C1 OXHOPZLBSSTTBU-UHFFFAOYSA-N 0.000 description 1
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- 238000002156 mixing Methods 0.000 description 1
- GEMHFKXPOCTAIP-UHFFFAOYSA-N n,n-dimethyl-n'-phenylcarbamimidoyl chloride Chemical compound CN(C)C(Cl)=NC1=CC=CC=C1 GEMHFKXPOCTAIP-UHFFFAOYSA-N 0.000 description 1
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- 239000010452 phosphate Substances 0.000 description 1
- IEQIEDJGQAUEQZ-UHFFFAOYSA-N phthalocyanine Chemical compound N1C(N=C2C3=CC=CC=C3C(N=C3C4=CC=CC=C4C(=N4)N3)=N2)=C(C=CC=C2)C2=C1N=C1C2=CC=CC=C2C4=N1 IEQIEDJGQAUEQZ-UHFFFAOYSA-N 0.000 description 1
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- 229920003207 poly(ethylene-2,6-naphthalate) Polymers 0.000 description 1
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- NTTOTNSKUYCDAV-UHFFFAOYSA-N potassium hydride Chemical compound [KH] NTTOTNSKUYCDAV-UHFFFAOYSA-N 0.000 description 1
- 229910000105 potassium hydride Inorganic materials 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- KCTAWXVAICEBSD-UHFFFAOYSA-N prop-2-enoyloxy prop-2-eneperoxoate Chemical compound C=CC(=O)OOOC(=O)C=C KCTAWXVAICEBSD-UHFFFAOYSA-N 0.000 description 1
- LLHKCFNBLRBOGN-UHFFFAOYSA-N propylene glycol methyl ether acetate Chemical compound COCC(C)OC(C)=O LLHKCFNBLRBOGN-UHFFFAOYSA-N 0.000 description 1
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- VEALVRVVWBQVSL-UHFFFAOYSA-N strontium titanate Chemical compound [Sr+2].[O-][Ti]([O-])=O VEALVRVVWBQVSL-UHFFFAOYSA-N 0.000 description 1
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- 125000002298 terpene group Chemical group 0.000 description 1
- AYEKOFBPNLCAJY-UHFFFAOYSA-O thiamine pyrophosphate Chemical compound CC1=C(CCOP(O)(=O)OP(O)(O)=O)SC=[N+]1CC1=CN=C(C)N=C1N AYEKOFBPNLCAJY-UHFFFAOYSA-O 0.000 description 1
- 239000002562 thickening agent Substances 0.000 description 1
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 description 1
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- 150000003751 zinc Chemical class 0.000 description 1
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Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/03—Use of materials for the substrate
- H05K1/0313—Organic insulating material
- H05K1/0353—Organic insulating material consisting of two or more materials, e.g. two or more polymers, polymer + filler, + reinforcement
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08J—WORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
- C08J5/00—Manufacture of articles or shaped materials containing macromolecular substances
- C08J5/24—Impregnating materials with prepolymers which can be polymerised in situ, e.g. manufacture of prepregs
- C08J5/249—Impregnating materials with prepolymers which can be polymerised in situ, e.g. manufacture of prepregs characterised by the additives used in the prepolymer mixture
-
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- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
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Description
本発明は、多層プリント配線板等の絶縁層形成に好適な樹脂組成物に関する。 The present invention relates to a resin composition suitable for forming an insulating layer such as a multilayer printed wiring board.
多層プリント配線板の絶縁層に使用する樹脂組成物としては、シアネートエステル樹脂を含有する樹脂組成物が誘電特性に優れた絶縁層を形成できることが知られており、例えば、特許文献1には、シアネートエステル樹脂、エポキシ樹脂およびフェノキシ樹脂を含有する多層プリント配線板用の樹脂組成物が開示されているが、その誘電正接の低さは十分と言えるものでは無かった。 As a resin composition used for an insulating layer of a multilayer printed wiring board, it is known that a resin composition containing a cyanate ester resin can form an insulating layer having excellent dielectric properties. Although a resin composition for a multilayer printed wiring board containing a cyanate ester resin, an epoxy resin and a phenoxy resin has been disclosed, it cannot be said that the low dielectric loss tangent is sufficient.
また、近年さらに高密度微細配線の形成が望まれており、絶縁層表面の粗度を低く抑え、なおかつ十分な導体層との密着強度を得ることが重要な課題となっている。これは粗度が大きいと、そのアンカーに潜り込んだめっき部がエッチングで除去されず、高密度配線形成が困難である上、その後の絶縁信頼性を著しく悪化させるからである。また配線が高密度化された多層プリント配線板では、銅配線と絶縁層との熱膨張率の違いによるクラック発生等の問題が生じやすくなるため、絶縁層の熱膨張率を低く抑えることも要求される。 In recent years, the formation of high-density fine wiring has been desired, and it is an important issue to keep the surface roughness of the insulating layer low and to obtain sufficient adhesion strength with the conductor layer. This is because if the roughness is high, the plated portion that has entered the anchor is not removed by etching, and it is difficult to form a high-density wiring, and the subsequent insulation reliability is remarkably deteriorated. In addition, multilayer printed wiring boards with high-density wiring tend to cause problems such as cracking due to the difference in thermal expansion coefficient between copper wiring and insulating layer, so it is also necessary to keep the thermal expansion coefficient of insulating layer low. Is done.
低誘電正接を特徴とし絶縁層に適したものとしてはポリビニル化合物を含有する樹脂組成物が、特許文献2に開示されているが、該組成物の硬化物においては、エラストマー成分を必須としていたため熱膨張率の低さが十分でないという問題があったし、銅箔を支持体として使用したメッキによる導体層形成のみが検討されていた。 As a resin composition characterized by low dielectric loss tangent and suitable for an insulating layer, a resin composition containing a polyvinyl compound is disclosed in Patent Document 2, but an elastomer component is essential in a cured product of the composition. There was a problem that the coefficient of thermal expansion was not sufficient, and only the formation of a conductor layer by plating using a copper foil as a support was studied.
本発明の課題は、硬化物の誘電正接が低く、かつ導体との密着強度に優れた樹脂組成物を提供することにあり、さらには、該硬化性樹脂組成物を用いた接着フィルム、およびプリプレグ、該接着フィルム等を用いたプリント配線板等の電子部品、並びにその製造方法を提供することにある。 An object of the present invention is to provide a resin composition having a low dielectric loss tangent of a cured product and excellent adhesion strength with a conductor, and further, an adhesive film using the curable resin composition, and a prepreg Another object of the present invention is to provide an electronic component such as a printed wiring board using the adhesive film and the like, and a manufacturing method thereof.
本発明者らは、上記課題を解決すべく鋭意検討した結果、特定のシアネートエステル樹脂、硬化性ポリビニルベンジル化合物、および金属系硬化触媒、を含有することを特徴とする樹脂組成物により本発明を完成するに至った。すなわち本発明は以下の内容を含むものである。 As a result of intensive studies to solve the above-mentioned problems, the present inventors have found that the present invention is achieved by a resin composition comprising a specific cyanate ester resin, a curable polyvinyl benzyl compound, and a metal-based curing catalyst. It came to be completed. That is, the present invention includes the following contents.
[1](A)下記一般式(1)で表されるジシクロペンタジエン型シアネートエステル樹脂、(B)硬化性ポリビニルベンジル化合物、および(C)金属系硬化触媒、を含有することを特徴とする樹脂組成物。(ただし、nは0〜5である。) [1] It contains (A) a dicyclopentadiene-type cyanate ester resin represented by the following general formula (1), (B) a curable polyvinylbenzyl compound, and (C) a metal-based curing catalyst. Resin composition. (However, n is 0-5.)
[2]樹脂組成物の不揮発分を100質量%とした場合、成分(A)の含有量が3〜60質量%、成分(B)の含有量が0.5〜50質量%、成分(C)の金属系硬化触媒に基づく金属の含有量が25〜500ppmである、上記[1]記載の樹脂組成物。
[3]金属系硬化触媒が、コバルト、銅、亜鉛、鉄、ニッケル、マンガンおよびスズから選択される1種以上の金属の、有機金属錯体又は有機金属塩である上記[1]又は[2]記載の樹脂組成物。
[4]さらにポリビニルアセタール樹脂、フェノキシ樹脂、ポリイミド樹脂、ポリアミドイミド樹脂、ポリエーテルイミド樹脂、ポリスルホン樹脂、ポリエーテルスルホン樹脂、ポリフェニレンエーテル樹脂、ポリカーボネート樹脂、ポリエーテルエーテルケトン樹脂、およびポリエステル樹脂から選択される1種以上の高分子樹脂を含有する、上記[1]〜[3]のいずれかに記載の樹脂組成物。
[5]高分子樹脂の含有量が、樹脂組成物の不揮発分100質量%に対し1〜20質量%である、上記[4]記載の樹脂組成物。
[6]さらに無機充填材を含有する、上記[1]〜[5]のいずれかに記載の樹脂組成物。
[7]無機充填材の含有量が、樹脂組成物の不揮発分100質量%に対し、10〜70質量%である、上記[6]記載の樹脂組成物。
[8]無機充填材がシリカである、上記[6]または[7]記載の樹脂組成物。
[9]ピール強度が0.4kgf/cm〜1.0kgf/cmであって、算術平均粗さが50nm〜440nmであって、誘電正接が0.0030〜0.0079である、上記[1]〜[8]のいずれかに記載の樹脂組成物。
[10]上記[1]〜[9]のいずれかに記載の樹脂組成物が支持体上に層形成されてなる接着フィルム。
[11]上記[1]〜[9]のいずれかに記載の樹脂組成物が繊維からなるシート状補強基材中に含浸されてなるプリプレグ。
[12]上記[1]〜[9]のいずれかに記載の樹脂組成物の硬化物により絶縁層が形成されてなる多層プリント配線板。[2] When the nonvolatile content of the resin composition is 100% by mass, the content of the component (A) is 3 to 60% by mass, the content of the component (B) is 0.5 to 50% by mass, and the component (C The resin composition according to the above [1], wherein the metal content based on the metal-based curing catalyst is from 25 to 500 ppm.
[3] The above [1] or [2], wherein the metal-based curing catalyst is an organometallic complex or an organometallic salt of one or more metals selected from cobalt, copper, zinc, iron, nickel, manganese, and tin. The resin composition as described.
[4] Further selected from polyvinyl acetal resin, phenoxy resin, polyimide resin, polyamideimide resin, polyetherimide resin, polysulfone resin, polyethersulfone resin, polyphenylene ether resin, polycarbonate resin, polyetheretherketone resin, and polyester resin The resin composition according to any one of the above [1] to [3], comprising at least one polymer resin.
[5] The resin composition according to the above [4], wherein the content of the polymer resin is 1 to 20% by mass with respect to 100% by mass of the nonvolatile content of the resin composition.
[6] The resin composition according to any one of [1] to [5], further including an inorganic filler.
[7] The resin composition according to the above [6], wherein the content of the inorganic filler is 10 to 70% by mass with respect to 100% by mass of the nonvolatile content of the resin composition.
[8] The resin composition according to the above [6] or [7], wherein the inorganic filler is silica.
[9] The above [1], wherein the peel strength is 0.4 kgf / cm to 1.0 kgf / cm, the arithmetic average roughness is 50 nm to 440 nm, and the dielectric loss tangent is 0.0030 to 0.0079. -The resin composition in any one of [8].
[10] An adhesive film in which the resin composition according to any one of [1] to [9] is layered on a support.
[11] A prepreg obtained by impregnating the resin composition according to any one of [1] to [9] into a sheet-like reinforcing base material made of fibers.
[12] A multilayer printed wiring board in which an insulating layer is formed from a cured product of the resin composition according to any one of [1] to [9].
本発明によれば、多層プリント配線板の絶縁層形成に好適な樹脂組成物であって、樹脂組成物により形成される絶縁層が、低誘電正接、低熱膨張率であり、均一な粗化面が形成でき、低粗度においても絶縁層と導体層の高い密着性を維持できる樹脂組成物が提供される。 According to the present invention, a resin composition suitable for forming an insulating layer of a multilayer printed wiring board, wherein the insulating layer formed of the resin composition has a low dielectric loss tangent and a low coefficient of thermal expansion, and has a uniform roughened surface. Thus, a resin composition capable of maintaining high adhesion between the insulating layer and the conductor layer even at low roughness is provided.
[(A)下記一般式(1)で表されるジシクロペンタジエン型シアネートエステル樹脂]
本発明の樹脂組成物には、下記一般式(1)で表されるジシクロペンタジエン型シアネートエステル樹脂が使用される。[(A) Dicyclopentadiene-type cyanate ester resin represented by the following general formula (1)]
In the resin composition of the present invention, a dicyclopentadiene-type cyanate ester resin represented by the following general formula (1) is used.
一般式(1)で示される樹脂は、ロンザジャパン(株)製、DT−4000、DT−7000として入手可能である。繰り返し単位nは、特に限定されるものではないが、好ましくは0〜5であり、より好ましくは0〜3であり、更に好ましくは0〜2である。 The resin represented by the general formula (1) is available as DT-4000 and DT-7000 manufactured by Lonza Japan Co., Ltd. Although the repeating unit n is not specifically limited, Preferably it is 0-5, More preferably, it is 0-3, More preferably, it is 0-2.
樹脂組成物中の該シアネートエステル樹脂の含有量は、特に限定されるものではないが、樹脂組成物の不揮発分100質量%に対し、好ましくは3〜60質量%であり、より好ましくは10〜30質量%であり、更に好ましくは15〜25質量%である。該シアネートエステル樹脂の含有量が少なすぎると、耐熱性が低下する傾向、熱膨張率が増加する傾向にある。シアネートエステル樹脂の含有量が多すぎると、めっき導体層の密着強度が低下する傾向にある。 The content of the cyanate ester resin in the resin composition is not particularly limited, but is preferably 3 to 60% by mass, and more preferably 10 to 10% by mass with respect to 100% by mass of the nonvolatile content of the resin composition. It is 30 mass%, More preferably, it is 15-25 mass%. When there is too little content of this cyanate ester resin, it exists in the tendency for heat resistance to fall and for a thermal expansion coefficient to increase. When there is too much content of cyanate ester resin, it exists in the tendency for the adhesive strength of a plating conductor layer to fall.
なお、別構造のシアネートエステル樹脂、例えば、ノボラック型(フェノールノボラック型、アルキルフェノールノボラック型など)シアネートエステル樹脂、ビスフェノール型(ビスフェノールA型、ビスフェノールF型、ビスフェノールS型など)シアネートエステル樹脂およびこれらが一部トリアジン化したプレポリマーなどを、該シアネートエステル樹脂と組み合わせて使用してもよい。
市販されているシアネートエステル樹脂としては、フェノールノボラック型多官能シアネートエステル樹脂(ロンザジャパン(株)製、PT30)、ビスフェノールAジシアネート(ロンザジャパン(株)製、Badcy)、ビスフェノールAジシアネートの一部または全部がトリアジン化され三量体となったプレポリマー(ロンザジャパン(株)製、BA230)等が挙げられる。It should be noted that cyanate ester resins having different structures, such as novolak type (phenol novolak type, alkylphenol novolak type, etc.) cyanate ester resin, bisphenol type (bisphenol A type, bisphenol F type, bisphenol S type, etc.) cyanate ester resin, and the like. A partially triazine prepolymer or the like may be used in combination with the cyanate ester resin.
Commercially available cyanate ester resins include phenol novolac polyfunctional cyanate ester resins (Lonza Japan Co., Ltd., PT30), bisphenol A dicyanate (Lonza Japan Co., Ltd., Badcy), a part of bisphenol A dicyanate or Examples include prepolymers that are all triazine-modified to form trimers (Lonza Japan Co., Ltd., BA230).
[(B)硬化性ポリビニルベンジル化合物]
本発明における硬化性ポリビニルベンジル化合物は、分子内に2以上のビニルベンジル基を有する化合物であり、例えば、インデン化合物を、(i)ビニルベンジルハライドとアルカリ存在下に反応させる方法、(ii)ビニルベンジルハライドおよび炭素数2〜20のジハロメチル化合物とアルカリ存在下に反応させる方法、もしくは(iii)フルオレン化合物、ビニルベンジルハライドおよび炭素数2〜20のジハロメチル化合物とアルカリ存在下に反応させる方法(特開2003−277440号公報参照)、または(iv)フルオレン化合物およびビニルベンジルハライドをアルカリ存在下に反応させる方法(国際公開02/083610号パンフレット)等により製造することができる。硬化性ポリビニルベンジル化合物は、低誘電正接という観点から分子内にヘテロ原子を含まないものが好ましい。[(B) Curable Polyvinylbenzyl Compound]
The curable polyvinyl benzyl compound in the present invention is a compound having two or more vinyl benzyl groups in the molecule. For example, (i) a method of reacting a vinyl benzyl halide with an alkali in the presence of an alkali, (ii) vinyl Method of reacting benzyl halide and dihalomethyl compound having 2 to 20 carbon atoms in the presence of alkali, or (iii) Method of reacting fluorene compound, vinylbenzyl halide and dihalomethyl compound having 2 to 20 carbon atoms in the presence of alkali 2003-277440), or (iv) a method of reacting a fluorene compound and vinylbenzyl halide in the presence of an alkali (WO 02/083610 pamphlet) or the like. The curable polyvinyl benzyl compound preferably contains no hetero atom in the molecule from the viewpoint of low dielectric loss tangent.
樹脂組成物中の硬化性ポリビニルベンジル化合物の含有量は、特に限定されるものではないが、樹脂組成物の不揮発分100質量%に対し、0.5〜50質量%が好ましく、2〜50質量%がより好ましく、5〜25質量%が更に好ましく、5〜15質量%が更に一層好ましい。硬化性ポリビニルベンジル化合物の含有量が少なすぎると、誘電正接が増加する傾向にある。一方、硬化性ポリビニルベンジル化合物の含有量が多すぎると、密着性が低下する傾向にある。 Although content of the curable polyvinyl benzyl compound in a resin composition is not specifically limited, 0.5-50 mass% is preferable with respect to 100 mass% of non volatile matters of a resin composition, and 2-50 mass. % Is more preferable, 5 to 25% by mass is further preferable, and 5 to 15% by mass is even more preferable. When the content of the curable polyvinyl benzyl compound is too small, the dielectric loss tangent tends to increase. On the other hand, when there is too much content of a curable polyvinyl benzyl compound, it exists in the tendency for adhesiveness to fall.
インデン化合物としては、例えば、以下の式(2)で表されるインデン化合物が挙げられる。 As an indene compound, the indene compound represented by the following formula | equation (2) is mentioned, for example.
式中、R3は、同一または異なっていてもよく、水素原子、ハロゲン原子、アルキル基(好ましくは炭素数1〜5のアルキル基)、アルコキシ基(好ましくは炭素数1〜5のアルコキシ基)およびチオアルコキシ基(好ましくは炭素数1〜5のチオアルコキシ基)からなる群より選択される1つの基を示し(または2以上のR3が一体となって環を形成していてもよい)、pは0〜4の整数を示す。環を形成する場合としては、5〜8員のシクロアルキル環、ベンゼン環等の環が縮環した構造を挙げることができる。In the formula, R 3 may be the same or different and is a hydrogen atom, a halogen atom, an alkyl group (preferably an alkyl group having 1 to 5 carbon atoms), an alkoxy group (preferably an alkoxy group having 1 to 5 carbon atoms). And one group selected from the group consisting of a thioalkoxy group (preferably a thioalkoxy group having 1 to 5 carbon atoms) (or two or more R 3 may be combined to form a ring) , P represents an integer of 0-4. Examples of forming a ring include a structure in which a ring such as a 5- to 8-membered cycloalkyl ring or a benzene ring is condensed.
フルオレン化合物としては、例えば、以下の式(3)で表されるフルオレン化合物が挙げられる。 As a fluorene compound, the fluorene compound represented by the following formula | equation (3) is mentioned, for example.
式中、R2は、同一または異なっていてもよく、水素原子、ハロゲン原子、アルキル基(好ましくは炭素数1〜5のアルキル基)、アルコキシ基(好ましくは炭素数1〜5のアルコキシ基)およびチオアルコキシ基(好ましくは炭素数1〜5のチオアルコキシ基)からなる群より選択される1つの基を示し(または2以上のR2が一体となって環を形成していてもよい)、mは0〜4の整数を示す。環を形成する場合としては、5〜8員のシクロアルキル環、ベンゼン環等の環が縮環した構造を挙げることができる。In the formula, R 2 may be the same or different and is a hydrogen atom, a halogen atom, an alkyl group (preferably an alkyl group having 1 to 5 carbon atoms), an alkoxy group (preferably an alkoxy group having 1 to 5 carbon atoms). And one group selected from the group consisting of a thioalkoxy group (preferably a thioalkoxy group having 1 to 5 carbon atoms) (or two or more R 2 may be combined to form a ring) , M represents an integer of 0-4. Examples of forming a ring include a structure in which a ring such as a 5- to 8-membered cycloalkyl ring or a benzene ring is condensed.
ビニルベンジルハライドとしては、p−ビニルベンジルクロライド、m−ビニルベンジルクロライド及びこれらの任意の混合物等が挙げられる。また炭素数2〜20のジハロメチル化合物としては、例えば、1,2−ジクロロエタン、1,2−ジブロモエタン、1,3−ジクロロプロパン、1,3−ジブロモプロパン、1,4−ジクロロブタン、1,4−ジブロモブタン等のアルキレンジハライド、o−キシリレンジクロライド、o−キシリレンジブロマイド、m−キシリレンジクロライド、m−キシリレンジブロマイド、p−キシリレンジクロライド、p−キシリレンジブロマイド、4,4’−ビス(クロロメチル)ビフェニル、4,4’−ビス(クロロメチル)ジフェニルエーテル、4,4’−ビス(クロロメチル)ジフェニルスルフィド、2,6−ビス(ブロモメチル)ナフタレン、1,8−ビス(ブロモメチル)ナフタレン、1,4−ビス(クロロメチル)ナフタレン等のジハロメチル化合物を挙げることができる。 Examples of the vinyl benzyl halide include p-vinyl benzyl chloride, m-vinyl benzyl chloride, and any mixture thereof. Examples of the dihalomethyl compound having 2 to 20 carbon atoms include 1,2-dichloroethane, 1,2-dibromoethane, 1,3-dichloropropane, 1,3-dibromopropane, 1,4-dichlorobutane, 1, Alkylene dihalides such as 4-dibromobutane, o-xylylene dichloride, o-xylylene dibromide, m-xylylene dichloride, m-xylylene dibromide, p-xylylene dichloride, p-xylylene dibromide, 4,4 ′ -Bis (chloromethyl) biphenyl, 4,4'-bis (chloromethyl) diphenyl ether, 4,4'-bis (chloromethyl) diphenyl sulfide, 2,6-bis (bromomethyl) naphthalene, 1,8-bis (bromomethyl) ) Diphthal such as naphthalene, 1,4-bis (chloromethyl) naphthalene It can be exemplified methyl compound.
アルカリとしては、例えば、ナトリウムメトキサイド、ナトリウムエトキサイド、水素化ナトリウム、水素化カリウム、水酸化ナトリウム、水酸化カリウム等が挙げられる。 Examples of the alkali include sodium methoxide, sodium ethoxide, sodium hydride, potassium hydride, sodium hydroxide, potassium hydroxide and the like.
このような硬化性ポリビニルベンジル化合物は、特開2003−277440号公報、国際公開02/083610号パンフレットの記載に従って容易に製造することができる。 Such a curable polyvinyl benzyl compound can be easily produced according to the description in JP-A No. 2003-277440 and WO 02/083610.
好ましい硬化性ポリビニルベンジル化合物としては、以下の式(4)で表されるものを挙げることができる。式(4)の化合物は、ビニル基が重付加したダイマー構造となっていても良い。 Preferred curable polyvinyl benzyl compounds include those represented by the following formula (4). The compound of the formula (4) may have a dimer structure in which a vinyl group is polyadded.
式(4)中、R1は上記の炭素数2〜20のジハロメチル化合物の炭素鎖に由来する炭素数2〜20の2価の有機基を示し、R2は、同一または異なっていてもよく、水素原子、ハロゲン原子、アルキル基(好ましくは炭素数1〜5のアルキル基)、アルコキシ基(好ましくは炭素数1〜5のアルコキシ基)およびチオアルコキシ基(好ましくは炭素数1〜5のチオアルコキシ基)からなる群より選択される1つの基を示し(または2以上のR2が一体となって環を形成していてもよい)、mは0〜4の整数を示し、nは0〜20の整数を示す。環を形成する場合としては、5〜8員のシクロアルキル環、ベンゼン環等の環が縮環した構造を挙げることができる。In the formula (4), R 1 represents a divalent organic group having 2 to 20 carbon atoms derived from the carbon chain of the dihalomethyl compound having 2 to 20 carbon atoms, and R 2 may be the same or different. A hydrogen atom, a halogen atom, an alkyl group (preferably an alkyl group having 1 to 5 carbon atoms), an alkoxy group (preferably an alkoxy group having 1 to 5 carbon atoms) and a thioalkoxy group (preferably a thio having 1 to 5 carbon atoms). 1 represents a group selected from the group consisting of (alkoxy groups) (or two or more R 2 may be combined to form a ring), m represents an integer of 0 to 4, and n represents 0. Represents an integer of ~ 20. Examples of forming a ring include a structure in which a ring such as a 5- to 8-membered cycloalkyl ring or a benzene ring is condensed.
特に好ましい硬化性ポリビニルベンジル化合物としては、以下の式(5)で表されるものを挙げることができる。 Particularly preferable curable polyvinyl benzyl compounds include those represented by the following formula (5).
(式(5)中、R4は上記の炭素数2〜20のジハロメチル化合物の炭素鎖に由来する炭素数2〜20の2価の有機基(好ましくはアルキレン基)、nは0〜20の整数を示す)(In Formula (5), R 4 is a C 2-20 divalent organic group (preferably an alkylene group) derived from the carbon chain of the C 2-20 dihalomethyl compound, and n is 0-20. Indicates an integer)
市場で入手可能なものとしては昭和高分子(株)製のポリビニルベンジル樹脂V−5000X(硬化物のTg154℃、比誘電率2.63、誘電正接0.0016)、V−6000X(硬化物のTg136℃、比誘電率2.59、誘電正接0.0013)などが挙げられる。 As commercially available products, polyvinyl benzyl resin V-5000X (Tg 154 ° C. of cured product, relative dielectric constant 2.63, dielectric loss tangent 0.0016) manufactured by Showa Polymer Co., Ltd., V-6000X (of cured product) Tg 136 ° C., relative dielectric constant 2.59, dielectric loss tangent 0.0013) and the like.
本発明における硬化性ポリビニルベンジル化合物は、硬化性ポリビニルベンジルエーテル化合物であっても良い。例えば、1分子中に2個以上のヒドロキシベンジル基を有する化合物(ポリフェノール化合物)をビニルベンジルハライドとアルカリ存在下に反応させることによって得ることが出来る(特開平9−31006号公報、特開2001−181383号公報参照)。 The curable polyvinyl benzyl compound in the present invention may be a curable polyvinyl benzyl ether compound. For example, it can be obtained by reacting a compound having two or more hydroxybenzyl groups in one molecule (polyphenol compound) with vinylbenzyl halide in the presence of an alkali (JP-A-9-31006, JP-A-2001-2001). 181383).
ポリフェノール化合物としては、例えば、ハイドロキノン、ビスフェノールA、ビスフェノールF、ビスフェノールS、ビフェノール、フェノールノボラック樹脂、フェノールとベンズアルデヒドの縮合物、ザイロック(Xylok)型フェノール樹脂等が挙げられる。これら化合物の芳香環はアルキル基、ハロゲンなどで置換されていてもよい。 Examples of the polyphenol compound include hydroquinone, bisphenol A, bisphenol F, bisphenol S, biphenol, phenol novolac resin, a phenol / benzaldehyde condensate, and xylok type phenol resin. The aromatic ring of these compounds may be substituted with an alkyl group, halogen or the like.
ビニルベンジルハライドおよびアルカリとしては、上記で記載したものが挙げられる。 Examples of the vinyl benzyl halide and alkali include those described above.
代表的なポリビニルベンジルエーテル化合物としては、以下の式(6)で表されるものを挙げることができる(特開平9−31006号公報、特開2001−181383号公報等参照)。 As a typical polyvinyl benzyl ether compound, what is represented by the following formula | equation (6) can be mentioned (refer Unexamined-Japanese-Patent No. 9-31006, Unexamined-Japanese-Patent No. 2001-181383 etc.).
式(6)中、R1はメチル基またはエチル基、R2は水素原子または炭素数1〜10の炭化水素基、R3は水素原子またはビニルベンジル基(但し、水素原子とビニルベンジル基のモル比は60:40〜0:100の範囲である)、nは2〜4の整数を表す。
炭素数1〜10の炭化水素基としては、炭素数1〜10のアルキル基、炭素数3〜10のシクロアルキル基、炭素数6〜10のアリール基、炭素数7〜10のアラルキル基などが挙げられる。In the formula (6), R 1 is a methyl group or an ethyl group, R 2 is a hydrogen atom or a hydrocarbon group having 1 to 10 carbon atoms, R 3 is a hydrogen atom or a vinylbenzyl group (however, a hydrogen atom and a vinylbenzyl group) The molar ratio is in the range of 60:40 to 0: 100), and n represents an integer of 2 to 4.
Examples of the hydrocarbon group having 1 to 10 carbon atoms include an alkyl group having 1 to 10 carbon atoms, a cycloalkyl group having 3 to 10 carbon atoms, an aryl group having 6 to 10 carbon atoms, and an aralkyl group having 7 to 10 carbon atoms. Can be mentioned.
これらポリビニルベンジルエーテル化合物は特開平9−31006号公報、特開2001−181383号公報の記載に従って容易に製造することができる。 These polyvinyl benzyl ether compounds can be easily produced according to the descriptions in JP-A-9-31006 and JP-A-2001-181383.
市場で入手可能なものとしては昭和高分子(株)製V−1000X(硬化物のTg160℃、比誘電率2.7、誘電正接0.0045)、V−1100X(硬化物のTg171℃、比誘電率2.56、誘電正接0.0038)などが挙げられる。 The products available on the market are Showa Polymer Co., Ltd. V-1000X (Tg 160 ° C. of cured product, relative dielectric constant 2.7, dielectric loss tangent 0.0045), V-1100X (Tg 171 ° C. of cured product, ratio) Dielectric constant 2.56, dielectric loss tangent 0.0038) and the like.
これらポリビニルベンジル化合物は、異なる種類のものを2種以上混合して用いてもよい。 These polyvinyl benzyl compounds may be used as a mixture of two or more different types.
[(C)金属系硬化触媒]
本発明において使用される金属系硬化触媒としては、コバルト、銅、亜鉛、鉄、ニッケル、マンガン、スズ等の金属の、有機金属錯体又は有機金属塩が挙げられる。有機金属錯体の具体例としては、コバルト(II)アセチルアセトナート、コバルト(III)アセチルアセトナート等の有機コバルト錯体、銅(II)アセチルアセトナート等の有機銅錯体、亜鉛(II)アセチルアセトナート等の有機亜鉛錯体、鉄(III)アセチルアセトナート等の有機鉄錯体、ニッケル(II)アセチルアセトナート等の有機ニッケル錯体、マンガン(II)アセチルアセトナート等の有機マンガン錯体などが挙げられる。有機金属塩としては、オクチル酸亜鉛、オクチル酸錫、ナフテン酸亜鉛、ナフテン酸コバルト、ステアリン酸スズ、ステアリン酸亜鉛などが挙げられる。金属系硬化触媒としては、硬化性、溶剤溶解性の観点から、コバルト(II)アセチルアセトナート、コバルト(III)アセチルアセトナート、亜鉛(II)アセチルアセトナート、ナフテン酸亜鉛、鉄(III)アセチルアセトナートが好ましく、特にコバルト(II)アセチルアセトナート、ナフテン酸亜鉛が好ましい。金属系硬化触媒は2種以上を組み合わせて使用してもよい。[(C) Metal-based curing catalyst]
Examples of the metal-based curing catalyst used in the present invention include organometallic complexes or organometallic salts of metals such as cobalt, copper, zinc, iron, nickel, manganese and tin. Specific examples of the organometallic complex include organic cobalt complexes such as cobalt (II) acetylacetonate and cobalt (III) acetylacetonate, organocopper complexes such as copper (II) acetylacetonate, and zinc (II) acetylacetonate. Organic zinc complexes such as iron (III) acetylacetonate, organic nickel complexes such as nickel (II) acetylacetonate, and organic manganese complexes such as manganese (II) acetylacetonate. Examples of the organic metal salt include zinc octylate, tin octylate, zinc naphthenate, cobalt naphthenate, tin stearate, and zinc stearate. As metal-based curing catalysts, from the viewpoint of curability and solvent solubility, cobalt (II) acetylacetonate, cobalt (III) acetylacetonate, zinc (II) acetylacetonate, zinc naphthenate, iron (III) acetyl Acetonate is preferable, and cobalt (II) acetylacetonate and zinc naphthenate are particularly preferable. Two or more metal-based curing catalysts may be used in combination.
金属系硬化触媒の添加量は、樹脂組成物の不揮発分100質量%に対し、金属系硬化触媒に基づく金属の含有量が25〜500ppm、より好ましくは40〜200ppmとなる範囲で添加するのが好ましい。25ppm未満であると、低粗度の絶縁層表面への密着性に優れる導体層の形成が困難となる傾向にあり、500ppmを超えると、樹脂組成物の保存安定性、絶縁性が低下する傾向となる。 The addition amount of the metal-based curing catalyst is such that the metal content based on the metal-based curing catalyst is 25 to 500 ppm, more preferably 40 to 200 ppm with respect to 100% by mass of the nonvolatile content of the resin composition. preferable. If it is less than 25 ppm, it tends to be difficult to form a conductor layer having excellent adhesion to the surface of the low-roughness insulating layer, and if it exceeds 500 ppm, the storage stability and insulation of the resin composition tend to decrease. It becomes.
本発明の樹脂組成物は(A)成分、(B)成分、(C)成分を含有し、該樹脂組成物により形成される絶縁層が、低粗度、低誘電正接であり、絶縁層と導体層の高い密着性を維持できる。 The resin composition of the present invention contains the component (A), the component (B), and the component (C), and the insulating layer formed of the resin composition has a low roughness and a low dielectric loss tangent, High adhesion of the conductor layer can be maintained.
本発明の(A)成分、(B)成分、(C)成分を含有する樹脂組成物の硬化物のピール強度は、後述する<メッキ導体層の引き剥がし強さ(ピール強度)の測定及び評価>に記載の測定方法により把握することができる。 The peel strength of the cured product of the resin composition containing the components (A), (B), and (C) of the present invention is described below. <Measurement and Evaluation of Peeling Strength (Peel Strength) of Plating Conductor Layer> > Can be grasped by the measuring method described in>.
本発明の樹脂組成物の硬化物のピール強度の上限値は、0.5kgf/cmが好ましく、0.6kgf/cmがより好ましく、0.7kgf/cmが更に好ましく、1.0kgf/cmが更に一層好ましい。本発明の樹脂組成物の硬化物のピール強度の下限値は、0.4kgf/cmが好ましく、0.45kgf/cmがより好ましい。 The upper limit of the peel strength of the cured product of the resin composition of the present invention is preferably 0.5 kgf / cm, more preferably 0.6 kgf / cm, further preferably 0.7 kgf / cm, and further 1.0 kgf / cm. Even more preferred. The lower limit of the peel strength of the cured product of the resin composition of the present invention is preferably 0.4 kgf / cm, more preferably 0.45 kgf / cm.
本発明の(A)成分、(B)成分、(C)成分を含有する樹脂組成物の硬化物の表面粗度は、後述する<粗化後の算術平均粗さ(Ra値)の測定及び評価>に記載の測定方法により把握することができる。 The surface roughness of the cured product of the resin composition containing the (A) component, (B) component, and (C) component of the present invention is <measurement of arithmetic average roughness (Ra value) after roughening> It can be grasped by the measuring method described in Evaluation>.
本発明の樹脂組成物の硬化物の表面粗度の上限値は、440nmが好ましく、400nmがより好ましく、370nmが更に好ましい。本発明の樹脂組成物の硬化物の表面粗度の下限値は、250nmが好ましく、200nmがより好ましく、150nmが更に好ましく、100nmが更に一層好ましく、50nmが特に好ましい。 The upper limit of the surface roughness of the cured product of the resin composition of the present invention is preferably 440 nm, more preferably 400 nm, and still more preferably 370 nm. The lower limit of the surface roughness of the cured product of the resin composition of the present invention is preferably 250 nm, more preferably 200 nm, still more preferably 150 nm, still more preferably 100 nm, and particularly preferably 50 nm.
本発明の(A)成分、(B)成分、(C)成分を含有する樹脂組成物の硬化物の誘電正接は、後述する<誘電正接の測定及び評価>に記載の測定方法により把握することができる。 The dielectric loss tangent of the cured product of the resin composition containing the components (A), (B), and (C) of the present invention should be determined by the measurement method described in <Measurement and evaluation of dielectric loss tangent> described later. Can do.
本発明の樹脂組成物の硬化物の誘電正接の上限値は、0.0079が好ましく、0.0075がより好ましく、0.0070が更に好ましい。本発明の樹脂組成物の硬化物の誘電正接の下限値は、0.0050が好ましく、0.0040がより好ましく、0.0030が更に好ましい。 The upper limit of the dielectric loss tangent of the cured product of the resin composition of the present invention is preferably 0.0079, more preferably 0.0075, and still more preferably 0.0070. The lower limit of the dielectric loss tangent of the cured product of the resin composition of the present invention is preferably 0.0050, more preferably 0.0040, and still more preferably 0.0030.
[高分子樹脂]
本発明の樹脂組成物は、さらに特定の高分子樹脂を含有させることで、硬化物の機械強度や接着フィルムの形態で使用する場合のフィルム成型能を向上させることが可能である。このような高分子樹脂としては、ポリビニルアセタール樹脂、フェノキシ樹脂、ポリイミド樹脂、ポリアミドイミド樹脂、ポリエーテルイミド樹脂、ポリスルホン樹脂、ポリエーテルスルホン樹脂、ポリフェニレンエーテル樹脂、ポリカーボネート樹脂、ポリエーテルエーテルケトン樹脂、ポリエステル樹脂などを挙げることができる。高分子樹脂は2種以上を組み合わせて使用してもよい。高分子樹脂としては、特にポリビニルアセタール樹脂、フェノキシ樹脂が好ましく、フェノキシ樹脂がより好ましい。[Polymer resin]
The resin composition of the present invention can further improve the film strength when used in the form of a mechanical strength of the cured product or an adhesive film by further containing a specific polymer resin. Such polymer resins include polyvinyl acetal resin, phenoxy resin, polyimide resin, polyamideimide resin, polyetherimide resin, polysulfone resin, polyethersulfone resin, polyphenylene ether resin, polycarbonate resin, polyetheretherketone resin, polyester. Examples thereof include resins. Two or more polymer resins may be used in combination. As the polymer resin, polyvinyl acetal resin and phenoxy resin are particularly preferable, and phenoxy resin is more preferable.
ポリビニルアセタール樹脂としては、特にポリビニルブチラール樹脂が好ましい。ポリビニルアセタール樹脂の具体例としては、電気化学工業(株)製、電化ブチラール4000−2、5000−A、6000−C、6000−EP、積水化学工業(株)製エスレックBHシリーズ、BXシリーズ、KSシリーズ、BLシリーズ、BMシリーズ等が挙げられる。ポリビニルアセタール樹脂はガラス転移温度が80℃以上のものが特に好ましい。ここでいう「ガラス転移温度」はJIS K 7197に記載の方法に従って決定される。なお、ガラス転移温度が分解温度よりも高く、実際にはガラス転移温度が観測されない場合には、分解温度を本発明におけるガラス転移温度とみなすことができる。なお、分解温度とは、JIS K 7120に記載の方法に従って測定したときの質量減少率が5%となる温度で定義される。 As the polyvinyl acetal resin, a polyvinyl butyral resin is particularly preferable. Specific examples of the polyvinyl acetal resin include: Denki Butyral 4000-2, 5000-A, 6000-C, 6000-EP manufactured by Denki Kagaku Kogyo Co., Ltd. Series, BL series, BM series and the like. The polyvinyl acetal resin having a glass transition temperature of 80 ° C. or higher is particularly preferable. The “glass transition temperature” here is determined according to the method described in JIS K7197. When the glass transition temperature is higher than the decomposition temperature and the glass transition temperature is not actually observed, the decomposition temperature can be regarded as the glass transition temperature in the present invention. The decomposition temperature is defined as the temperature at which the mass reduction rate is 5% when measured according to the method described in JIS K 7120.
フェノキシ樹脂としては、ビスフェノールA骨格、ビスフェノールF骨格、ビスフェノールS骨格、ビスフェノールアセトフェノン骨格、ノボラック骨格、ビフェニル骨格、フルオレン骨格、ジシクロペンタジエン骨格、ノルボルネン骨格、ナフタレン骨格、アントラセン骨格、アダマンタン骨格、テルペン骨格、トリメチルシクロヘキサン骨格から選択される1種以上の骨格を有するものが挙げられる。なかでも、ビスフェノールアセトフェノン骨格、ビフェニル骨格、フルオレン骨格が好ましい。フェノキシ樹脂は2種以上を混合して用いてもよい。フェノキシ樹脂の末端はフェノール性水酸基、エポキシ基等のいずれの官能基でもよい。 Examples of the phenoxy resin include bisphenol A skeleton, bisphenol F skeleton, bisphenol S skeleton, bisphenol acetophenone skeleton, novolac skeleton, biphenyl skeleton, fluorene skeleton, dicyclopentadiene skeleton, norbornene skeleton, naphthalene skeleton, anthracene skeleton, adamantane skeleton, terpene skeleton, Examples thereof include those having one or more skeletons selected from a trimethylcyclohexane skeleton. Of these, a bisphenol acetophenone skeleton, a biphenyl skeleton, and a fluorene skeleton are preferable. Two or more phenoxy resins may be mixed and used. The terminal of the phenoxy resin may be any functional group such as a phenolic hydroxyl group or an epoxy group.
フェノキシ樹脂の具体例としては東都化成(株)製FX280、FX293、ジャパンエポキシレジン(株)製1256、4250(ビスフェノールA骨格含有フェノキシ樹脂)、YX8100(ビスフェノールS骨格含有フェノキシ樹脂)、YX6954、YL6974、YL7482、YL7553、YL6794(ビスフェノールアセトフェノン骨格含有フェノキシ樹脂)、YL7213、YL7290等が挙げられる。フェノキシ樹脂はガラス転移温度が80℃以上のものが好ましく、100℃以上のものが特に好ましい。 Specific examples of the phenoxy resin include FX280, FX293 manufactured by Toto Kasei Co., Ltd., 1256, 4250 (bisphenol A skeleton-containing phenoxy resin) manufactured by Japan Epoxy Resin Co., Ltd., YX8100 (bisphenol S skeleton-containing phenoxy resin), YX6954, YL6974, YL7482, YL7553, YL6794 (bisphenol acetophenone skeleton-containing phenoxy resin), YL7213, YL7290, and the like can be given. The phenoxy resin preferably has a glass transition temperature of 80 ° C. or higher, particularly preferably 100 ° C. or higher.
高分子樹脂の重量平均分子量は5,000〜200,000の範囲であるのが好ましく、15,000〜100,000の範囲がより好ましく、30,000〜80,000の範囲が更に好ましい。この範囲よりも小さいとフィルム成型能や機械強度向上の効果が十分発揮されない傾向にあり、この範囲よりも大きいとシアネートエステル樹脂及びエポキシ樹脂との相溶性が低下し、絶縁層表面の粗化処理後の粗度が増大する傾向にある。 The weight average molecular weight of the polymer resin is preferably in the range of 5,000 to 200,000, more preferably in the range of 15,000 to 100,000, and still more preferably in the range of 30,000 to 80,000. If it is smaller than this range, the effect of improving the film forming ability and mechanical strength tends to be insufficient. If it is larger than this range, the compatibility with the cyanate ester resin and the epoxy resin is lowered, and the surface of the insulating layer is roughened. Later roughness tends to increase.
なお本発明における重量平均分子量は、ゲルパーミエーションクロマトグラフィー(GPC)法(ポリスチレンン換算)で測定される。GPC法による重量平均分子量は、具体的には、測定装置として(株)島津製作所製LC−9A/RID−6Aを、カラムとして昭和電工(株)製Shodex K−800P/K−804L/K−804Lを、移動相としてクロロホルム等を用いて、カラム温度40℃にて測定し、標準ポリスチレンの検量線を用いて算出することができる。 In addition, the weight average molecular weight in this invention is measured by the gel permeation chromatography (GPC) method (polystyrene conversion). Specifically, the weight average molecular weight by the GPC method is LC-9A / RID-6A manufactured by Shimadzu Corporation as a measuring device, and Shodex K-800P / K-804L / K- manufactured by Showa Denko KK as a column. 804 L can be measured at a column temperature of 40 ° C. using chloroform or the like as a mobile phase, and can be calculated using a standard polystyrene calibration curve.
樹脂組成物中の高分子樹脂の含有量は、特に限定されるものではないが、樹脂組成物の不揮発分100質量%に対し、好ましくは1〜20質量%であり、より好ましくは2〜15質量%であり、更に好ましくは2〜10質量%である。高分子樹脂の含有量が少なすぎるとフィルム成型能や機械強度向上の効果が発揮されにくい傾向にあり、多すぎると粗化工程後の絶縁層表面の粗度が増大する傾向にある。 The content of the polymer resin in the resin composition is not particularly limited, but is preferably 1 to 20% by mass, more preferably 2 to 15% with respect to 100% by mass of the nonvolatile content of the resin composition. It is mass%, More preferably, it is 2-10 mass%. If the content of the polymer resin is too small, the effect of improving the film forming ability and the mechanical strength tends to be hardly exhibited. If the content is too large, the roughness of the surface of the insulating layer after the roughening process tends to increase.
[無機充填材]
本発明の樹脂組成物には、当該樹脂組成物から得られる絶縁層の熱膨張率をさらに低下させるために無機充填材を添加してもよい。無機充填材としては、例えば、シリカ、アルミナ、硫酸バリウム、タルク、クレー、雲母粉、水酸化アルミニウム、水酸化マグネシウム、炭酸カルシウム、炭酸マグネシウム、酸化マグネシウム、窒化ホウ素、ホウ酸アルミニウム、チタン酸バリウム、チタン酸ストロンチウム、チタン酸カルシウム、チタン酸マグネシウム、チタン酸ビスマス、酸化チタン、ジルコン酸バリウム、ジルコン酸カルシウムなどが挙げられ、これらの中でも無定形シリカ、溶融シリカ、結晶シリカ、合成シリカ等のシリカが特に好適である。シリカとしては球状のものが好ましい。無機充填材は2種以上を組み合わせて使用してもよい。無機充填材の平均粒径は、特に限定されるものではないが、絶縁層への微細配線形成の観点から好ましくは5μm以下、より好ましくは1μm以下、さらに好ましくは0.7μm以下である。なお、無機充填材の平均粒径が小さくなりすぎると、当該樹脂組成物を樹脂ワニスとした場合に、ワニスの粘度が上昇し、取り扱い性が低下する傾向にあるため、平均粒径は0.05μm以上であるのが好ましい。上記無機充填材の平均粒径はミー(Mie)散乱理論に基づくレーザー回折・散乱法により測定することができる。具体的にはレーザー回折式粒度分布測定装置により、無機充填材の粒度分布を体積基準で作成し、そのメディアン径を平均粒径とすることで測定することができる。測定サンプルは、無機充填材を超音波により水中に分散させたものを好ましく使用することができる。レーザー回折式粒度分布測定装置としては、(株)堀場製作所製 LA−500等を使用することができる。[Inorganic filler]
An inorganic filler may be added to the resin composition of the present invention in order to further reduce the thermal expansion coefficient of the insulating layer obtained from the resin composition. Examples of the inorganic filler include silica, alumina, barium sulfate, talc, clay, mica powder, aluminum hydroxide, magnesium hydroxide, calcium carbonate, magnesium carbonate, magnesium oxide, boron nitride, aluminum borate, barium titanate, Examples include strontium titanate, calcium titanate, magnesium titanate, bismuth titanate, titanium oxide, barium zirconate, and calcium zirconate. Among these, silica such as amorphous silica, fused silica, crystalline silica, and synthetic silica Particularly preferred. The silica is preferably spherical. Two or more inorganic fillers may be used in combination. The average particle diameter of the inorganic filler is not particularly limited, but is preferably 5 μm or less, more preferably 1 μm or less, and even more preferably 0.7 μm or less from the viewpoint of forming fine wiring on the insulating layer. In addition, when the average particle diameter of the inorganic filler is too small, when the resin composition is used as a resin varnish, the viscosity of the varnish tends to increase and the handleability tends to decrease. It is preferable that it is 05 μm or more. The average particle diameter of the inorganic filler can be measured by a laser diffraction / scattering method based on Mie scattering theory. Specifically, the particle size distribution of the inorganic filler can be created on a volume basis by a laser diffraction particle size distribution measuring device, and the median diameter can be measured as the average particle diameter. As the measurement sample, an inorganic filler dispersed in water by ultrasonic waves can be preferably used. As a laser diffraction type particle size distribution measuring apparatus, LA-500 manufactured by Horiba Ltd. can be used.
無機充填材は、エポキシシランカップリング剤、アミノシランカップリング剤、チタネート系カップリング剤等の表面処理剤で表面処理してその耐湿性を向上させたものが好ましい。無機充填材の添加量は、樹脂組成物の不揮発分100質量%に対し、10〜70質量%の範囲が好ましく、15〜60質量%の範囲がより好ましく、20〜55質量%の範囲が更に好ましい。無機充填材の含有量が多すぎると、硬化物が脆くなる傾向や、ピール強度が低下する傾向にある。 The inorganic filler is preferably one that has been surface treated with a surface treatment agent such as an epoxy silane coupling agent, an amino silane coupling agent, or a titanate coupling agent to improve its moisture resistance. The addition amount of the inorganic filler is preferably in the range of 10 to 70% by mass, more preferably in the range of 15 to 60% by mass, and further in the range of 20 to 55% by mass with respect to 100% by mass of the nonvolatile content of the resin composition. preferable. When there is too much content of an inorganic filler, it exists in the tendency for hardened | cured material to become weak and for the peel strength to fall.
[ゴム粒子]
本発明の樹脂組成物には、メッキ密着性を向上させるという観点から、ゴム粒子をさらに添加することができる。本発明において使用され得るゴム粒子は、例えば、当該樹脂組成物のワニスを調製する際に使用する有機溶剤にも溶解せず、必須成分であるシアネートエステル樹脂やポリビニルベンジル化合物などとも相溶しないものである。従って、該ゴム粒子は、本発明の樹脂組成物のワニス中では分散状態で存在する。このようなゴム粒子は、一般には、ゴム成分の分子量を有機溶剤や樹脂に溶解しないレベルまで大きくし、粒子状とすることで調製される。[Rubber particles]
From the viewpoint of improving the plating adhesion, rubber particles can be further added to the resin composition of the present invention. The rubber particles that can be used in the present invention are, for example, those that do not dissolve in the organic solvent used when preparing the varnish of the resin composition and are incompatible with the essential components cyanate ester resin and polyvinylbenzyl compound. It is. Accordingly, the rubber particles exist in a dispersed state in the varnish of the resin composition of the present invention. Such rubber particles are generally prepared by increasing the molecular weight of the rubber component to a level at which it does not dissolve in an organic solvent or resin and making it into particles.
本発明で使用され得るゴム粒子の好ましい例としては、コアシェル型ゴム粒子、架橋アクリロニトリルブタジエンゴム粒子、架橋スチレンブタジエンゴム粒子、アクリルゴム粒子などが挙げられる。コアシェル型ゴム粒子は、コア層とシェル層とを有するゴム粒子であり、例えば、外層のシェル層がガラス状ポリマーで構成され、内層のコア層がゴム状ポリマーで構成される2層構造、または外層のシェル層がガラス状ポリマーで構成され、中間層がゴム状ポリマーで構成され、コア層がガラス状ポリマーで構成される3層構造のものなどが挙げられる。ガラス状ポリマーの層は、例えば、メタクリル酸メチルの重合物などで構成され、ゴム状ポリマーの層は、例えば、ブチルアクリレート重合物(ブチルゴム)などで構成される。ゴム粒子は2種以上を組み合わせて使用してもよい。コアシェル型ゴム粒子の具体例としては、スタフィロイドAC3832、AC3816N(商品名、ガンツ化成(株)製)、メタブレンKW−4426(商品名、三菱レイヨン(株)製)などが挙げられる。架橋アクリロニトリルブタジエンゴム(NBR)粒子の具体例としては、XER−91(平均粒径0.5μm、JSR(株)製)などが挙げられる。架橋スチレンブタジエンゴム(SBR)粒子の具体例としては、XSK−500(平均粒径0.5μm、JSR(株)製)などが挙げられる。アクリルゴム粒子の具体例としては、メタブレンW300A(平均粒径0.1μm)、W450A(平均粒径0.2μm)(三菱レイヨン(株)製)などを挙げることができる。 Preferable examples of rubber particles that can be used in the present invention include core-shell type rubber particles, cross-linked acrylonitrile butadiene rubber particles, cross-linked styrene butadiene rubber particles, and acrylic rubber particles. The core-shell type rubber particles are rubber particles having a core layer and a shell layer. For example, a two-layer structure in which an outer shell layer is formed of a glassy polymer and an inner core layer is formed of a rubbery polymer, or Examples include a three-layer structure in which the outer shell layer is made of a glassy polymer, the intermediate layer is made of a rubbery polymer, and the core layer is made of a glassy polymer. The glassy polymer layer is made of, for example, a polymer of methyl methacrylate, and the rubbery polymer layer is made of, for example, a butyl acrylate polymer (butyl rubber). Two or more rubber particles may be used in combination. Specific examples of the core-shell type rubber particles include Staphyloid AC3832, AC3816N (trade name, manufactured by Ganz Kasei Co., Ltd.), and Metabrene KW-4426 (trade name, manufactured by Mitsubishi Rayon Co., Ltd.). Specific examples of the crosslinked acrylonitrile butadiene rubber (NBR) particles include XER-91 (average particle size: 0.5 μm, manufactured by JSR Corporation). Specific examples of the crosslinked styrene butadiene rubber (SBR) particles include XSK-500 (average particle size 0.5 μm, manufactured by JSR Corporation). Specific examples of the acrylic rubber particles include methabrene W300A (average particle size 0.1 μm), W450A (average particle size 0.2 μm) (manufactured by Mitsubishi Rayon Co., Ltd.), and the like.
配合するゴム粒子の平均粒径は、好ましくは0.005〜1μmの範囲であり、より好ましくは0.2〜0.6μmの範囲である。本発明で使用されるゴム粒子の平均粒径は、動的光散乱法を用いて測定することができる。例えば、適当な有機溶剤にゴム粒子を超音波などにより均一に分散させ、濃厚系粒径アナライザー(FPAR−1000;大塚電子(株)製)を用いて、ゴム粒子の粒度分布を質量基準で作成し、そのメディアン径を平均粒径とすることで測定することができる。 The average particle diameter of the rubber particles to be blended is preferably in the range of 0.005 to 1 μm, more preferably in the range of 0.2 to 0.6 μm. The average particle diameter of the rubber particles used in the present invention can be measured using a dynamic light scattering method. For example, rubber particles are uniformly dispersed in an appropriate organic solvent by ultrasonic waves, etc., and a particle size distribution of rubber particles is created on a mass basis using a concentrated particle size analyzer (FPAR-1000; manufactured by Otsuka Electronics Co., Ltd.). And it can measure by making the median diameter into an average particle diameter.
ゴム粒子の含有量は、樹脂組成物の不揮発分100質量%に対し、好ましくは1〜10質量%であり、より好ましくは2〜5質量%である。 The content of the rubber particles is preferably 1 to 10% by mass and more preferably 2 to 5% by mass with respect to 100% by mass of the nonvolatile content of the resin composition.
[エポキシ樹脂]
本発明の樹脂組成物は、密着性、絶縁性の向上という観点から、エポキシ樹脂を更に含有させることができる。エポキシ樹脂としては、特に限定されるものではなく、例えば、ビスフェノールA型エポキシ樹脂、ビスフェノールF型エポキシ樹脂、ビスフェノールS型エポキシ樹脂、フェノールノボラック型エポキシ樹脂、アルキルフェノールノボラック型エポキシ樹脂、ブタジエン構造を有するエポキシ樹脂、ビフェニル型エポキシ樹脂、アラルキル型エポキシ樹脂、ナフトール型エポキシ樹脂、ジシクロペンタジエン型エポキシ樹脂、ナフタレン型エポキシ樹脂、フェノール類とフェノール性ヒドロキシル基を有する芳香族アルデヒドとの縮合物のエポキシ化物、ビフェニルアラルキル型エポキシ樹脂、フルオレン型エポキシ樹脂、キサンテン型エポキシ樹脂、トリグリシジルイソシアヌレート、リン含有エポキシ樹脂等を挙げることができる。なかでも、ビフェニル型エポキシ樹脂、アラルキル型エポキシ樹脂、ナフトール型エポキシ樹脂、ナフタレン型エポキシ樹脂、ビフェニルアラルキル型エポキシ樹脂が好ましい。エポキシ樹脂は2種以上を組み合わせて使用してもよい。[Epoxy resin]
The resin composition of the present invention can further contain an epoxy resin from the viewpoint of improving adhesion and insulation. The epoxy resin is not particularly limited. For example, bisphenol A type epoxy resin, bisphenol F type epoxy resin, bisphenol S type epoxy resin, phenol novolac type epoxy resin, alkylphenol novolac type epoxy resin, epoxy having a butadiene structure Resin, biphenyl type epoxy resin, aralkyl type epoxy resin, naphthol type epoxy resin, dicyclopentadiene type epoxy resin, naphthalene type epoxy resin, epoxidized product of phenol and aromatic aldehyde having phenolic hydroxyl group, biphenyl Examples thereof include aralkyl type epoxy resins, fluorene type epoxy resins, xanthene type epoxy resins, triglycidyl isocyanurate, phosphorus-containing epoxy resins and the like. Of these, biphenyl type epoxy resins, aralkyl type epoxy resins, naphthol type epoxy resins, naphthalene type epoxy resins, and biphenyl aralkyl type epoxy resins are preferable. Two or more epoxy resins may be used in combination.
市販されているエポキシ樹脂としては、例えば、ジャパンエポキシレジン(株)製「jER828EL」(液状ビスフェノールA型エポキシ樹脂)、大日本インキ化学工業(株)製「HP4032」、「HP4032D」(ナフタレン型2官能エポキシ樹脂)、大日本インキ化学工業(株)製「HP4700」(ナフタレン型4官能エポキシ樹脂)、東都化成(株)製「ESN−475V」(ナフトール型エポキシ樹脂)、ダイセル化学工業(株)製「PB−3600」(ブタジエン構造を有するエポキシ樹脂)、日本化薬(株)製「NC3000H」、「NC3000L」(ビフェニル型エポキシ樹脂)、ジャパンエポキシレジン(株)製「YX4000」(ビフェニル型エポキシ樹脂)、ジャパンエポキシレジン(株)製「YX8800」(アントラセン骨格含有型エポキシ樹脂)などが挙げられる。 Examples of commercially available epoxy resins include “jER828EL” (liquid bisphenol A type epoxy resin) manufactured by Japan Epoxy Resin Co., Ltd., “HP4032”, “HP4032D” (naphthalene type 2) manufactured by Dainippon Ink & Chemicals, Inc. Functional epoxy resin), "HP4700" (naphthalene type tetrafunctional epoxy resin) manufactured by Dainippon Ink & Chemicals, Ltd., "ESN-475V" (naphthol type epoxy resin) manufactured by Toto Kasei Co., Ltd., Daicel Chemical Industries, Ltd. “PB-3600” (epoxy resin having a butadiene structure) manufactured by Nippon Kayaku Co., Ltd., “NC3000H”, “NC3000L” (biphenyl type epoxy resin), “YX4000” (biphenyl type epoxy) manufactured by Japan Epoxy Resin Co., Ltd. Resin), "YX8800" manufactured by Japan Epoxy Resin Co., Ltd. (Anthracene skeleton-containing epoxy resin) and the like.
本発明のエポキシ樹脂の含有量の上限値は、誘電特性の低下を防止するという観点から、樹脂組成物の不揮発分100質量%に対し、40質量%が好ましく、30質量%がより好ましく、25質量%がさらに好ましい。一方、エポキシ樹脂の含有量の下限値は、エポキシ樹脂を配合する効果を得るという観点から、3質量%が好ましく、10質量%がより好ましい。 The upper limit of the content of the epoxy resin of the present invention is preferably 40% by mass, more preferably 30% by mass with respect to 100% by mass of the nonvolatile content of the resin composition, from the viewpoint of preventing a decrease in dielectric properties. More preferred is mass%. On the other hand, the lower limit of the content of the epoxy resin is preferably 3% by mass and more preferably 10% by mass from the viewpoint of obtaining the effect of blending the epoxy resin.
[その他の熱硬化性樹脂]
本発明の樹脂組成物は、必要に応じて本発明の効果が発揮される範囲でマレイミド化合物、ビスアリルナジイミド化合物などの熱硬化性樹脂を配合することもできる。このような熱硬化性樹脂は2種以上を混合して用いてもよい。マレイミド樹脂としては、BMI−1000、BMI−2000、BMI−3000、BMI−4000、BMI−5100(大和化成工業(株)製)、BMI、BMI−70、BMI−80(ケイ・アイ化成(株)製)、ANILIX−MI(三井化学ファイン(株)製)など、ビスアリルナジイミド化合物としては、BANI−M、BANI−X(丸善石油化学工業(株)製)などが挙げられる。[Other thermosetting resins]
The resin composition of the present invention can be blended with a thermosetting resin such as a maleimide compound or a bisallylnadiimide compound within a range in which the effects of the present invention are exhibited as necessary. Such thermosetting resins may be used in combination of two or more. As maleimide resins, BMI-1000, BMI-2000, BMI-3000, BMI-4000, BMI-5100 (manufactured by Daiwa Kasei Kogyo Co., Ltd.), BMI, BMI-70, BMI-80 (Kay Kasei Co., Ltd.) )), ANILIX-MI (Mitsui Chemicals Fine Co., Ltd.), and the like, examples of bisallylnadiimide compounds include BANI-M, BANI-X (manufactured by Maruzen Petrochemical Industry Co., Ltd.), and the like.
[アクリレート化合物、メタクリレート化合物]
本発明の樹脂組成物は、必要に応じて本発明の効果が発揮される範囲でアクリレート化合物、メタクリレート化合物などの重合性化合物を配合することもできる。このような化合物として、例えば、エチル(メタ)アクリレート、ブチル(メタ)アクリレート、2−ヒドロキシエチル(メタ)アクリレート、2−ヒドロキシプロピル(メタ)アクリレート、オリゴエステル(メタ)モノアクリレート、エチレングリコールジ(メタ)アクリレート、ポリエチレングリコールジアクリレート、ネオペンチルグリコール(メタ)アクリレート、テトラメチロールメタンジ(メタ)アクリレート、トリメチロールプロパンジ(メタ)アクリレート、ジトリメチロールプロパンテトラ(メタ)アクリレート、ペンタエリスリトールトリ(メタ)アクリレート、ジペンタエリスリトールペンタ(メタ)アクリレート、ジペンタエリスリトールヘキサ(メタ)アクリレート、2−ヒドロキシ−1−(メタ)アクリロキシ−3−(メタ)アクリレート、エポキシアクレート(例えば、ビスフェノールA型エポキシ(メタ)アクリレート、ノボラック型エポキシ(メタ)アクリレート、クレゾールノボラック型エポキシ(メタ)アクリレート及びカルボキシル基含有クレゾールノボラック型エポキシ(メタ)アクリレート等)、ウレタン(メタ)アクリレート等が挙げられる。[Acrylate compounds, methacrylate compounds]
The resin composition of this invention can also mix | blend polymeric compounds, such as an acrylate compound and a methacrylate compound, in the range by which the effect of this invention is exhibited as needed. Examples of such compounds include ethyl (meth) acrylate, butyl (meth) acrylate, 2-hydroxyethyl (meth) acrylate, 2-hydroxypropyl (meth) acrylate, oligoester (meth) monoacrylate, ethylene glycol di ( (Meth) acrylate, polyethylene glycol diacrylate, neopentyl glycol (meth) acrylate, tetramethylolmethane di (meth) acrylate, trimethylolpropane di (meth) acrylate, ditrimethylolpropane tetra (meth) acrylate, pentaerythritol tri (meth) Acrylate, dipentaerythritol penta (meth) acrylate, dipentaerythritol hexa (meth) acrylate, 2-hydroxy-1- (meth) acryloxy -3- (meth) acrylate, epoxy acrylate (for example, bisphenol A type epoxy (meth) acrylate, novolac type epoxy (meth) acrylate, cresol novolac type epoxy (meth) acrylate) and carboxyl group-containing cresol novolac type epoxy (meth) Acrylate), urethane (meth) acrylate, and the like.
[難燃剤]
本発明の樹脂組成物は、本発明の効果を損なわない範囲で難燃剤を含有しても良い。難燃剤としては、例えば、有機リン系難燃剤、有機系窒素含有リン化合物、窒素化合物、シリコーン系難燃剤、金属水酸化物等が挙げられる。有機リン系難燃剤としては、三光(株)製のHCA、HCA−HQ、HCA−NQ等のフェナントレン型リン化合物、昭和高分子(株)製のHFB−2006M等のリン含有ベンゾオキサジン化合物、味の素ファインテクノ(株)製のレオフォス30、50、65、90、110、TPP、RPD、BAPP、CPD、TCP、TXP、TBP、TOP、KP140、TIBP、北興化学工業(株)製のPPQ、クラリアント(株)製のOP930、大八化学(株)製のPX200等のリン酸エステル化合物、東都化成(株)製のFX289、FX305等のリン含有エポキシ樹脂、東都化成(株)製のERF001等のリン含有フェノキシ樹脂、ジャパンエポキシレジン(株)製のYL7613等のリン含有エポキシ樹脂等が挙げられる。有機系窒素含有リン化合物としては、四国化成工業(株)製のSP670、SP703等のリン酸エステルミド化合物、大塚化学(株)製のSPB100、SPE100、(株)伏見製作所製FP−series等のホスファゼン化合物等が挙げられる。金属水酸化物としては、宇部マテリアルズ(株)製のUD65、UD650、UD653等の水酸化マグネシウム、巴工業(株)製のB−30、B−325、B−315、B−308、B−303、UFH−20等の水酸化アルミニウム等が挙げられる。[Flame retardants]
The resin composition of the present invention may contain a flame retardant as long as the effects of the present invention are not impaired. Examples of the flame retardant include an organic phosphorus flame retardant, an organic nitrogen-containing phosphorus compound, a nitrogen compound, a silicone flame retardant, and a metal hydroxide. Examples of organic phosphorus flame retardants include phenanthrene-type phosphorus compounds such as HCA, HCA-HQ, and HCA-NQ manufactured by Sanko Co., Ltd., phosphorus-containing benzoxazine compounds such as HFB-2006M manufactured by Showa Polymer Co., Ltd., and Ajinomoto Co., Inc. Reefos 30, 50, 65, 90, 110, Fine Techno Co., TPP, RPD, BAPP, CPD, TCP, TXP, TBP, TOP, KP140, TIBP, PPQ, Clariant (made by Hokuko Chemical Co., Ltd.) Phosphoric acid ester compounds such as OP930 manufactured by Daihachi Chemical Co., Ltd., FX289 compounds manufactured by Tohto Kasei Co., Ltd., phosphorus-containing epoxy resins such as FX305, phosphorus such as ERF001 manufactured by Tohto Kasei Co., Ltd. And a phosphorus-containing epoxy resin such as YL7613 manufactured by Japan Epoxy Resin Co., Ltd. Examples of organic nitrogen-containing phosphorus compounds include phosphate ester compounds such as SP670 and SP703 manufactured by Shikoku Kasei Kogyo Co., Ltd., phosphazenes such as SPB100 and SPE100 manufactured by Otsuka Chemical Co., Ltd., and FP-series manufactured by Fushimi Seisakusho Co., Ltd. Compounds and the like. As the metal hydroxide, magnesium hydroxide such as UD65, UD650, UD653 manufactured by Ube Materials Co., Ltd., B-30, B-325, B-315, B-308, B manufactured by Sakai Kogyo Co., Ltd. And aluminum hydroxide such as -303 and UFH-20.
[その他成分]
本発明の樹脂組成物には、本発明の効果を阻害しない範囲で、必要に応じて他の成分を配合することができる。他の成分としては、例えば、ダウ・ケミカル日本(株)製FORTEGRA等のタフナー、シリコンパウダー、ナイロンパウダー、フッ素パウダー等の有機充填剤、オルベン、ベントン等の増粘剤、シリコーン系、フッ素系、高分子系の消泡剤又はレベリング剤、イミダゾール系、チアゾール系、トリアゾール系、シラン系カップリング剤等の密着性付与剤、フタロシアニン・ブルー、フタロシアニン・グリーン、アイオジン・グリーン、ジスアゾイエロー、カーボンブラック等の着色剤などを挙げることができる。[Other ingredients]
In the resin composition of the present invention, other components can be blended as necessary within a range not inhibiting the effects of the present invention. Other components include, for example, tougheners such as FORTEGRA manufactured by Dow Chemical Japan Co., Ltd., organic fillers such as silicon powder, nylon powder and fluorine powder, thickeners such as Orben and Benton, silicone type, fluorine type, Adhesion imparting agents such as polymeric antifoaming or leveling agents, imidazole, thiazole, triazole, silane coupling agents, phthalocyanine blue, phthalocyanine green, iodin green, disazo yellow, carbon black, etc. And the like.
本発明の樹脂組成物の調製方法は、特に限定されるものではなく、例えば、配合成分を、必要により溶媒等を添加し、回転ミキサーなどを用いて混合する方法などが挙げられる。 The method for preparing the resin composition of the present invention is not particularly limited, and examples thereof include a method in which the components are mixed using a rotary mixer or the like, if necessary, by adding a solvent or the like.
本発明の樹脂組成物の用途は、特に限定されないが、接着フィルム、プリプレグ等の絶縁樹脂シート、回路基板、ソルダーレジスト、アンダ−フィル材、ダイボンディング材、半導体封止材、穴埋め樹脂、部品埋め込み樹脂等、樹脂組成物が必要とされる用途の広範囲に使用できる。なかでも、多層プリント配線板の製造において絶縁層を形成するために好適に使用することができる。本発明の樹脂組成物は、ワニス状態で回路基板に塗布して絶縁層を形成することもできるが、工業的には一般に、接着フィルム、プリプレグ等のシート状積層材料の形態で用いるのが好ましい。樹脂組成物の軟化点は、シート状積層材料のラミネート性の観点から40〜150℃が好ましい。 The use of the resin composition of the present invention is not particularly limited, but includes insulating resin sheets such as adhesive films and prepregs, circuit boards, solder resists, underfill materials, die bonding materials, semiconductor encapsulants, hole filling resins, and component embeddings. It can be used in a wide range of applications where a resin composition is required, such as a resin. Especially, it can use suitably in order to form an insulating layer in manufacture of a multilayer printed wiring board. The resin composition of the present invention can be applied to a circuit board in a varnish state to form an insulating layer, but in general, it is preferably used in the form of a sheet-like laminated material such as an adhesive film or a prepreg. . The softening point of the resin composition is preferably 40 to 150 ° C. from the viewpoint of the laminate property of the sheet-like laminated material.
[接着フィルム]
本発明の接着フィルムは、当業者に公知の方法、例えば、有機溶剤に樹脂組成物を溶解した樹脂ワニスを調製し、この樹脂ワニスを、ダイコーターなどを用いて、支持体に塗布し、更に加熱、あるいは熱風吹きつけ等により有機溶剤を乾燥させて樹脂組成物層を形成させることにより製造することができる。[Adhesive film]
The adhesive film of the present invention is prepared by a method known to those skilled in the art, for example, by preparing a resin varnish in which a resin composition is dissolved in an organic solvent, and applying the resin varnish to a support using a die coater or the like. It can be produced by drying the organic solvent by heating or blowing hot air to form the resin composition layer.
有機溶剤としては、例えば、アセトン、メチルエチルケトン、シクロヘキサノン等のケトン類、酢酸エチル、酢酸ブチル、セロソルブアセテート、プロピレングリコールモノメチルエーテルアセテート、カルビトールアセテート等の酢酸エステル類、セロソルブ、ブチルカルビトール等のカルビトール類、トルエン、キシレン等の芳香族炭化水素類、ジメチルホルムアミド、ジメチルアセトアミド、N−メチルピロリドン等が挙げられる。これらの有機溶剤は単独で用いてもよいし、2種以上を組みわせて用いてもよい。 Examples of the organic solvent include ketones such as acetone, methyl ethyl ketone and cyclohexanone, acetates such as ethyl acetate, butyl acetate, cellosolve acetate, propylene glycol monomethyl ether acetate and carbitol acetate, and carbitols such as cellosolve and butyl carbitol. , Aromatic hydrocarbons such as toluene and xylene, dimethylformamide, dimethylacetamide, N-methylpyrrolidone and the like. These organic solvents may be used alone or in combination of two or more.
乾燥条件は特に限定されないが、樹脂組成物層への有機溶剤の含有量が10質量%以下、好ましくは5質量%以下となるように乾燥させる。ワニス中の有機溶剤量、有機溶剤の沸点によっても異なるが、例えば30〜60質量%の有機溶剤を含むワニスを50〜150℃で3〜10分程度乾燥させることにより、樹脂組成物層が形成される。当業者であれば、簡単な実験により適宜、好適な乾燥条件を設定することができる。 The drying conditions are not particularly limited, but the drying is performed so that the content of the organic solvent in the resin composition layer is 10% by mass or less, preferably 5% by mass or less. Depending on the amount of organic solvent in the varnish and the boiling point of the organic solvent, for example, a resin composition layer is formed by drying a varnish containing 30 to 60% by mass of an organic solvent at 50 to 150 ° C. for about 3 to 10 minutes. Is done. Those skilled in the art can appropriately set suitable drying conditions through simple experiments.
接着フィルムにおいて形成される樹脂組成物層の厚さは、導体層の厚さ以上とするのが好ましい。回路基板が有する導体層の厚さは通常5〜70μmの範囲であるので、樹脂組成物層は10〜100μmの厚さを有するのが好ましい。 The thickness of the resin composition layer formed in the adhesive film is preferably equal to or greater than the thickness of the conductor layer. Since the thickness of the conductor layer of the circuit board is usually in the range of 5 to 70 μm, the resin composition layer preferably has a thickness of 10 to 100 μm.
支持体としては、ポリエチレン、ポリプロピレン、ポリ塩化ビニル等のポリオレフィンのフィルム、ポリエチレンテレフタレート(以下「PET」と略称することがある。)、ポリエチレンナフタレート等のポリエステルのフィルム、ポリカーボネートフィルム、ポリイミドフィルムなどの各種プラスチックフィルムが挙げられる。支持体及び後述する保護フィルムには、マット処理、コロナ処理等の表面処理が施してあってもよい。また、シリコーン樹脂系離型剤、アルキッド樹脂系離型剤、フッ素樹脂系離型剤等の離型剤で離型処理が施してあってもよい。また離型紙や銅箔、アルミニウム箔等の金属箔などを使用してもよい。なお、銅箔を使用した場合は、銅箔層をそのままサブトラクティブ法などによりパターン加工し回路形成することもできる。 Examples of the support include polyolefin films such as polyethylene, polypropylene, and polyvinyl chloride, polyethylene terephthalate (hereinafter sometimes abbreviated as “PET”), polyester films such as polyethylene naphthalate, polycarbonate films, and polyimide films. Various plastic films are listed. The support and the protective film described later may be subjected to surface treatment such as mat treatment or corona treatment. The release treatment may be performed with a release agent such as a silicone resin release agent, an alkyd resin release agent, or a fluororesin release agent. Moreover, you may use release foil, metal foil, such as copper foil and aluminum foil. In addition, when copper foil is used, a copper foil layer can also be pattern-processed by a subtractive method etc. as it is, and a circuit can also be formed.
支持体の厚さは特に限定されないが、10〜150μmが好ましく、25〜50μmがより好ましい。 Although the thickness of a support body is not specifically limited, 10-150 micrometers is preferable and 25-50 micrometers is more preferable.
樹脂組成物層の支持体が密着していない面には、支持体に準じた保護フィルムをさらに積層することができる。保護フィルムの厚みは、特に限定されるものではないが、例えば、1〜40μmである。保護フィルムを積層することにより、樹脂組成物層の表面へのゴミ等の付着やキズを防止することができる。接着フィルムは、ロール状に巻きとって貯蔵することもできる。 A protective film according to the support can be further laminated on the surface of the resin composition layer on which the support is not in close contact. Although the thickness of a protective film is not specifically limited, For example, it is 1-40 micrometers. By laminating the protective film, it is possible to prevent dust and the like from being attached to the surface of the resin composition layer and scratches. The adhesive film can also be stored in a roll.
[接着フィルムを用いた多層プリント配線板]
次に、上記のようにして製造した接着フィルムを用いて多層プリント配線板を製造する方法の一例を説明する。[Multilayer printed wiring board using adhesive film]
Next, an example of a method for producing a multilayer printed wiring board using the adhesive film produced as described above will be described.
まず、接着フィルムを、真空ラミネーターを用いて回路基板の片面または両面にラミネートする。回路基板に用いられる基板としては、例えば、ガラスエポキシ基板、金属基板、ポリエステル基板、ポリイミド基板、BTレジン基板、熱硬化型ポリフェニレンエーテル基板等が挙げられる。なお、ここで回路基板とは、上記のような基板の片面又は両面にパターン加工された導体層(回路)が形成されたものをいう。また導体層と絶縁層とを交互に積層してなる多層プリント配線板において、該多層プリント配線板の最外層の片面又は両面がパターン加工された導体層(回路)となっているものも、ここでいう回路基板に含まれる。なお導体層表面には、黒化処理、銅エッチング等により予め粗化処理が施されていてもよい。 First, an adhesive film is laminated on one side or both sides of a circuit board using a vacuum laminator. Examples of the substrate used for the circuit substrate include a glass epoxy substrate, a metal substrate, a polyester substrate, a polyimide substrate, a BT resin substrate, a thermosetting polyphenylene ether substrate, and the like. In addition, a circuit board means here that the conductor layer (circuit) patterned was formed in the one or both surfaces of the above boards. Also, in a multilayer printed wiring board in which conductor layers and insulating layers are alternately laminated, one of the outermost layers of the multilayer printed wiring board is a conductor layer (circuit) in which one or both sides are patterned. It is included in the circuit board. The surface of the conductor layer may be previously roughened by blackening, copper etching, or the like.
上記ラミネートにおいて、接着フィルムが保護フィルムを有している場合には該保護フィルムを除去した後、必要に応じて接着フィルム及び回路基板をプレヒートし、接着フィルムを加圧及び加熱しながら回路基板に圧着する。本発明の接着フィルムにおいては、真空ラミネート法により減圧下で回路基板にラミネートする方法が好適に用いられる。ラミネートの条件は、特に限定されるものではないが、例えば、圧着温度(ラミネート温度)を好ましくは70〜140℃、圧着圧力を好ましくは1〜11kgf/cm2(9.8×104〜107.9×104N/m2)とし、空気圧20mmHg(26.7hPa)以下の減圧下でラミネートするのが好ましい。また、ラミネートの方法は、バッチ式であってもロールでの連続式であってもよい。In the above laminate, when the adhesive film has a protective film, after removing the protective film, the adhesive film and the circuit board are preheated as necessary, and the adhesive film is pressed and heated to the circuit board. Crimp. In the adhesive film of the present invention, a method of laminating on a circuit board under reduced pressure by a vacuum laminating method is preferably used. Lamination conditions are not particularly limited. For example, the pressure bonding temperature (laminating temperature) is preferably 70 to 140 ° C., and the pressure bonding pressure is preferably 1 to 11 kgf / cm 2 (9.8 × 10 4 to 107). 9.9 × 10 4 N / m 2 ), and lamination is preferably performed under reduced pressure with an air pressure of 20 mmHg (26.7 hPa) or less. The laminating method may be a batch method or a continuous method using a roll.
真空ラミネートは、市販の真空ラミネーターを使用して行うことができる。市販の真空ラミネーターとしては、例えば、ニチゴー・モートン(株)製バキュームアップリケーター、(株)名機製作所製真空加圧式ラミネーター、(株)日立インダストリイズ製ロール式ドライコータ、日立エーアイーシー(株)製真空ラミネーター等を挙げることができる。 The vacuum lamination can be performed using a commercially available vacuum laminator. Commercially available vacuum laminators include, for example, a vacuum applicator manufactured by Nichigo-Morton Co., Ltd., a vacuum pressurizing laminator manufactured by Meiki Seisakusho Co., Ltd., a roll dry coater manufactured by Hitachi Industries, Ltd., and Hitachi AIC Co., Ltd. ) Made vacuum laminator and the like.
また、減圧下、加熱及び加圧を行う積層工程は、一般の真空ホットプレス機を用いて行うことも可能である。例えば、加熱されたSUS板等の金属板を支持体層側からプレスすることにより行うことができる。 Moreover, the lamination process which heats and pressurizes under reduced pressure can also be performed using a general vacuum hot press machine. For example, it can be performed by pressing a metal plate such as a heated SUS plate from the support layer side.
プレス条件としては、減圧度を1×10−2MPa以下とするのが好ましく、1×10−3MPa以下とするのがより好ましい。加熱及び加圧は、1段階で行うことも出来るが、樹脂のしみだしを制御する観点から2段階以上に条件を分けて行うのが好ましい。例えば、1段階目のプレスを、温度が70〜150℃、圧力が1〜15kgf/cm2の範囲、2段階目のプレスを、温度が150〜200℃、圧力が1〜40kgf/cm2の範囲で行うのが好ましい。各段階の時間は30〜120分で行うのが好ましい。市販されている真空ホットプレス機としては、例えば、MNPC−V−750−5−200(株)名機製作所製)、VH1−1603(北川精機(株)製)等が挙げられる。As pressing conditions, the degree of reduced pressure is preferably 1 × 10 −2 MPa or less, and more preferably 1 × 10 −3 MPa or less. Although heating and pressurization can be carried out in one stage, it is preferable to carry out the conditions separately in two or more stages from the viewpoint of controlling the oozing of the resin. For example, the first stage press has a temperature of 70 to 150 ° C. and the pressure is in a range of 1 to 15 kgf / cm 2 , and the second stage press has a temperature of 150 to 200 ° C. and a pressure of 1 to 40 kgf / cm 2 It is preferable to carry out within a range. The time for each stage is preferably 30 to 120 minutes. Examples of commercially available vacuum hot press machines include MNPC-V-750-5-200 (manufactured by Meiki Seisakusho), VH1-1603 (manufactured by Kitagawa Seiki Co., Ltd.), and the like.
接着フィルムを回路基板にラミネートした後、室温付近に冷却してから、支持体を剥離する場合は剥離し、樹脂組成物を熱硬化することにより回路基板に絶縁層を形成することができる。熱硬化の条件は、樹脂組成物中の樹脂成分の種類、含有量などに応じて適宜選択すればよいが、好ましくは150℃〜220℃で20分〜180分、より好ましくは160℃〜200℃で30〜120分の範囲で選択される。 After laminating the adhesive film on the circuit board, it is cooled to around room temperature, and then the support is peeled off, and then the resin composition is thermally cured to form an insulating layer on the circuit board. The thermosetting conditions may be appropriately selected according to the type and content of the resin component in the resin composition, but preferably 150 ° C. to 220 ° C. for 20 minutes to 180 minutes, more preferably 160 ° C. to 200 ° C. It is selected in the range of 30 to 120 minutes at ° C.
絶縁層を形成した後、硬化前に支持体を剥離しなかった場合は、ここで剥離する。次いで必要により、回路基板上に形成された絶縁層に穴開けを行ってビアホール、スルーホールを形成する。穴あけは、例えば、ドリル、レーザー、プラズマ等の公知の方法により、また必要によりこれらの方法を組み合わせて行うことができるが、炭酸ガスレーザー、YAGレーザー等のレーザーによる穴あけが最も一般的な方法である。 If the support is not peeled off after the insulating layer is formed, it is peeled off here. Next, if necessary, holes are formed in the insulating layer formed on the circuit board to form via holes and through holes. Drilling can be performed, for example, by a known method such as drilling, laser, or plasma, or by combining these methods as necessary. However, drilling by a laser such as a carbon dioxide gas laser or a YAG laser is the most common method. is there.
次いで、乾式メッキ又は湿式メッキにより絶縁層上に導体層を形成する。乾式メッキとしては、蒸着、スパッタリング、イオンプレーティング等の公知の方法を使用することができる。湿式メッキの場合は、まず、硬化した樹脂組成物層(絶縁層)の表面を、過マンガン酸塩(過マンガン酸カリウム、過マンガン酸ナトリウム等)、重クロム酸塩、オゾン、過酸化水素/硫酸、硝酸等の酸化剤で粗化処理し、凸凹のアンカーを形成する。酸化剤としては、特に過マンガン酸カリウム、過マンガン酸ナトリウム等の水酸化ナトリウム水溶液(アルカリ性過マンガン酸水溶液)が好ましく用いられる。次いで、無電解メッキと電解メッキとを組み合わせた方法で導体層を形成する。また導体層とは逆パターンのメッキレジストを形成し、無電解メッキのみで導体層を形成することもできる。その後のパターン形成の方法として、例えば、当業者に公知のサブトラクティブ法、セミアディティブ法などを用いることができる。 Next, a conductor layer is formed on the insulating layer by dry plating or wet plating. As the dry plating, a known method such as vapor deposition, sputtering, or ion plating can be used. In the case of wet plating, first, the surface of the cured resin composition layer (insulating layer) is coated with permanganate (potassium permanganate, sodium permanganate, etc.), dichromate, ozone, hydrogen peroxide / Roughening treatment is performed with an oxidizing agent such as sulfuric acid or nitric acid to form an uneven anchor. As the oxidizing agent, an aqueous sodium hydroxide solution (alkaline permanganate aqueous solution) such as potassium permanganate and sodium permanganate is particularly preferably used. Next, a conductor layer is formed by a method combining electroless plating and electrolytic plating. Alternatively, a plating resist having a pattern opposite to that of the conductor layer can be formed, and the conductor layer can be formed only by electroless plating. As a subsequent pattern formation method, for example, a subtractive method or a semi-additive method known to those skilled in the art can be used.
[プリプレグ]
本発明のプリプレグは、本発明の樹脂組成物を繊維からなるシート状補強基材にホットメルト法又はソルベント法により含浸させ、加熱して半硬化させることにより製造することができる。すなわち、本発明の樹脂組成物が繊維からなるシート状補強基材に含浸した状態となるプリプレグとすることができる。繊維からなるシート状補強基材としては、例えば、ガラスクロスやアラミド繊維等のプリプレグ用繊維として常用されている繊維からなるものを用いることができる。[Prepreg]
The prepreg of the present invention can be produced by impregnating the resin composition of the present invention into a sheet-like reinforcing base material made of fibers by a hot melt method or a solvent method, and heating and semi-curing. That is, it can be set as the prepreg which will be in the state which the resin composition of this invention impregnated the sheet-like reinforcement base material which consists of fibers. As the sheet-like reinforcing substrate made of fibers, for example, those made of fibers that are commonly used as prepreg fibers such as glass cloth and aramid fibers can be used.
ホットメルト法は、樹脂を、有機溶剤に溶解することなく、該樹脂との剥離性の良い塗工紙に一旦コーティングし、それをシート状補強基材にラミネートする方法、あるいは樹脂を、有機溶剤に溶解することなく、ダイコーターによりシート状補強基材に直接塗工するなどして、プリプレグを製造する方法である。またソルベント法は、接着フィルムと同様にして樹脂を有機溶剤に溶解して樹脂ワニスを調製し、このワニスにシート状補強基材を浸漬し、樹脂ワニスをシート状補強基材に含浸させ、その後乾燥させる方法である。 The hot melt method is a method in which a resin is once coated on a coated paper having good releasability from the resin without dissolving it in an organic solvent, and then laminated on a sheet-like reinforcing substrate, or the resin is added to an organic solvent. In this method, the prepreg is produced by, for example, coating directly on a sheet-like reinforcing substrate with a die coater without being dissolved in the substrate. In the solvent method, a resin varnish is prepared by dissolving a resin in an organic solvent in the same manner as the adhesive film, and a sheet-like reinforcing base material is immersed in the varnish, and then the resin-like varnish is impregnated into the sheet-like reinforcing base material. It is a method of drying.
[プリプレグを用いた多層プリント配線板]
次に、上記のようにして製造したプリプレグを用いて多層プリント配線板を製造する方法の一例を説明する。回路基板に本発明のプリプレグを1枚あるいは必要により数枚重ね、離型フィルムを介して金属プレートで挟み、加圧・加熱条件下でプレス積層する。加圧・加熱条件は、好ましくは、圧力が5〜40kgf/cm2(49×104〜392×104N/m2)、温度が120〜200℃で20〜100分である。また接着フィルムと同様に、プリプレグを真空ラミネート法により回路基板にラミネートした後、加熱硬化することも可能である。その後、上記で記載した方法と同様にして、硬化したプリプレグ表面を粗化した後、導体層をメッキにより形成して多層プリント配線板を製造することができる。[Multilayer printed wiring board using prepreg]
Next, an example of a method for producing a multilayer printed wiring board using the prepreg produced as described above will be described. One or several prepregs of the present invention are stacked on a circuit board, sandwiched between metal plates through a release film, and press-laminated under pressure and heating conditions. The pressurizing / heating conditions are preferably a pressure of 5 to 40 kgf / cm 2 (49 × 10 4 to 392 × 10 4 N / m 2 ) and a temperature of 120 to 200 ° C. for 20 to 100 minutes. Similarly to the adhesive film, the prepreg can be laminated on a circuit board by a vacuum laminating method and then cured by heating. Thereafter, in the same manner as described above, the surface of the cured prepreg is roughened, and then a conductor layer is formed by plating to produce a multilayer printed wiring board.
以下、本発明を実施例により具体的に説明するが、本発明はこれらの実施例に限定されるものではない。 EXAMPLES The present invention will be specifically described below with reference to examples, but the present invention is not limited to these examples.
[実施例1]
ジシクロペンタジエン型シアネートエステル樹脂(ロンザジャパン(株)製「DT−4000」、シアネート当量約140、不揮発分85質量%のトルエン溶液)40質量部、硬化性ポリビニルベンジル化合物(昭和高分子(株)製 V5000X、不揮発分65質量%)30重量部、コバルト(II)アセチルアセトナート(東京化成(株)製)の1質量%のN,N−ジメチルホルムアミド(以下DMFと略す)溶液4質量部、ポリビニルブチラール樹脂溶液(積水化学工業(株)製「KS-1」(ガラス転移温度105℃)の固形分15質量%のメチルエチルケトン(以下MEKと略す)とシクロヘキサノンの1:1溶液)15重量部、ブタジエン構造を有するエポキシ樹脂(ダイセル化学工業(株)製「PB−3600」)1重量部、および球形シリカ((株)アドマテックス製「SOC2」をアミノシランで表面処理したもの、平均粒子径0.5μm)80質量部さらにトルエン10質量部を混合し、高速回転ミキサーで均一に分散して、熱硬化性樹脂組成物のワニスを作製した。
樹脂組成物の不揮発分中、ジシクロペンタジエン型シアネートエステル樹脂25質量%、硬化性ポリビニルベンジル化合物14質量%、有機金属系触媒として添加した金属(コバルト)53ppm、高分子樹脂1.7質量%、無機充填材59質量%となる。
次に、かかる樹脂組成物ワニスを離型処理されたポリエチレンテレフタレートフィルム(リンテック(株)製AL5、厚さ38μm、以下PETフィルムと略す)の離型面上に、乾燥後の樹脂組成物層の厚みが40μmとなるようにダイコーターにて均一に塗布し、80〜120℃(平均100℃)で6分間乾燥した(樹脂組成物層中の残留溶媒量:約1.5質量%)。次いで、樹脂組成物層の表面に厚さ15μmのポリプロピレンフィルムを貼り合わせながらロール状に巻き取った。ロール状の接着フィルムを幅507mmにスリットし、507×336mmサイズのシート状の接着フィルムを得た。[Example 1]
40 parts by mass of dicyclopentadiene-type cyanate ester resin (“DT-4000” manufactured by Lonza Japan Co., Ltd., toluene solution having a cyanate equivalent of about 140 and a nonvolatile content of 85% by mass), a curable polyvinylbenzyl compound (Showa Polymer Co., Ltd.) Manufactured by V5000X, non-volatile content: 65% by mass), 30 parts by weight of cobalt (II) acetylacetonate (manufactured by Tokyo Chemical Industry Co., Ltd.), 4 parts by mass of a 1% by mass N, N-dimethylformamide (hereinafter abbreviated as DMF) solution, 15 parts by weight of a polyvinyl butyral resin solution (1: 1 solution of methyl ethyl ketone (hereinafter abbreviated as MEK) and cyclohexanone having a solid content of 15% by mass of "KS-1" (glass transition temperature 105 ° C) manufactured by Sekisui Chemical Co., Ltd.) 1 part by weight of an epoxy resin having a butadiene structure (“PB-3600” manufactured by Daicel Chemical Industries, Ltd.) 80 parts by mass of spherical silica ("SOC2" manufactured by Admatechs Co., Ltd., surface-treated with aminosilane, average particle size 0.5 µm) and 10 parts by mass of toluene were mixed and dispersed uniformly with a high-speed rotary mixer. A varnish of a thermosetting resin composition was prepared.
In the nonvolatile content of the resin composition, dicyclopentadiene-type cyanate ester resin 25% by mass, curable polyvinyl benzyl compound 14% by mass, metal (cobalt) 53 ppm added as an organometallic catalyst, polymer resin 1.7% by mass, It becomes 59 mass% of inorganic fillers.
Next, on the release surface of the polyethylene terephthalate film (AL5 manufactured by Lintec Co., Ltd., thickness 38 μm, hereinafter abbreviated as “PET film”) subjected to the release treatment of the resin composition varnish, the resin composition layer after drying It apply | coated uniformly with the die-coater so that thickness might be set to 40 micrometers, and it dried for 6 minutes at 80-120 degreeC (average 100 degreeC) (residual solvent amount in a resin composition layer: about 1.5 mass%). Subsequently, it wound up in roll shape, bonding a 15-micrometer-thick polypropylene film on the surface of a resin composition layer. The roll-like adhesive film was slit to a width of 507 mm to obtain a sheet-like adhesive film having a size of 507 × 336 mm.
[実施例2]
ジシクロペンタジエン型シアネートエステル樹脂(ロンザジャパン(株)製「DT−4000」、シアネート当量約140、不揮発分85質量%のトルエン溶液)30質量部、硬化性ポリビニルベンジル化合物(昭和高分子(株)製 V5000X、不揮発分65質量%)25重量部、ナフテン酸亜鉛(II)(東京化成(株)製、亜鉛含有量8質量%のミネラルスピリット溶液)の3質量%のシクロヘキサノン溶液3質量部、ビスフェノールAジシアネートのプレポリマー(ロンザジャパン(株)製「BA230S75」、シアネート当量約232、不揮発分75質量%のメチルエチルケトン溶液)10質量部、フェノールノボラック型多官能シアネートエステル樹脂(ロンザジャパン(株)製「PT30」、シアネート当量約124)4質量部、フェノキシ樹脂溶液(ジャパンエポキシレジン(株)製「YL−7553」、不揮発分30質量%のMEKとシクロヘキサノンとの混合溶液、重量平均分子量36000)10質量部、リン含有エポキシ樹脂(東都化成(株)製TX−0712、エポキシ当量約370、リン含有量2.8質量%、不揮発分75質量%のMEK溶液)8質量部、および球形シリカ((株)アドマテックス製「SOC2」をアミノシランで表面処理したもの、平均粒子径0.5μm)80質量部さらにトルエン10質量部を混合し、高速回転ミキサーで均一に分散して、熱硬化性樹脂組成物のワニスを作製した。
樹脂組成物の不揮発分中、ジシクロペンタジエン型シアネートエステル樹脂18質量%、硬化性ポリビニルベンジル化合物11質量%、有機金属系触媒として添加した金属(コバルト)51ppm、高分子樹脂2.1質量%、無機充填材56質量%となる。
次に、かかる樹脂組成物ワニスを使用し、実施例1と全く同様にして接着フィルムを得た。[Example 2]
Dicyclopentadiene-type cyanate ester resin (Lonza Japan Co., Ltd. “DT-4000”, cyanate equivalent of about 140, toluene solution with non-volatile content of 85% by mass), 30 parts by mass, curable polyvinylbenzyl compound (Showa Polymer Co., Ltd.) Manufactured by V5000X, non-volatile content: 65% by mass) 25 parts by weight, zinc naphthenate (II) (manufactured by Tokyo Chemical Industry Co., Ltd., 3% by mass of cyclohexanone solution of 3% by mass, mineral spirit solution having a zinc content of 8% by mass), bisphenol Prepolymer of A dicyanate ("BA230S75" manufactured by Lonza Japan Co., Ltd., methyl ethyl ketone solution having a cyanate equivalent of about 232 and a non-volatile content of 75% by mass), phenol novolac type polyfunctional cyanate ester resin ("Lonza Japan Co., Ltd." PT30 ", cyanate equivalent of about 124) Parts by weight, 10 parts by mass of a phenoxy resin solution (“YL-7553” manufactured by Japan Epoxy Resin Co., Ltd., a mixed solution of MEK and cyclohexanone having a nonvolatile content of 30% by mass, weight average molecular weight 36000), and a phosphorus-containing epoxy resin (Toto Kasei) Co., Ltd. TX-0712, epoxy equivalent of about 370, phosphorus content 2.8% by mass, non-volatile content 75% by mass MEK solution 8 parts by mass, and spherical silica (Admatex Co., Ltd. "SOC2" is aminosilane 80 parts by mass, average particle size 0.5 μm) and 10 parts by mass of toluene were mixed and dispersed uniformly with a high-speed rotary mixer to prepare a varnish of a thermosetting resin composition.
In the nonvolatile content of the resin composition, dicyclopentadiene-type cyanate ester resin 18% by mass, curable polyvinyl benzyl compound 11% by mass, metal (cobalt) 51 ppm added as an organometallic catalyst, polymer resin 2.1% by mass, It becomes 56 mass% of inorganic fillers.
Next, using this resin composition varnish, an adhesive film was obtained in exactly the same manner as in Example 1.
[実施例3]
ビスフェノールAジシアネートのプレポリマー(ロンザジャパン(株)製「BA230S75」、シアネート当量約232、不揮発分75質量%のMEK溶液)30質量部およびジシクロペンタジエン型シアネートエステル樹脂(ロンザジャパン(株)製「DT−4000」、シアネート当量約140、不揮発分85質量%のトルエン溶液)10質量部をMEK10質量部と共に攪拌混合した。これに、ナフトール型エポキシ樹脂として東都化成(株)製「ESN−475V」(エポキシ当量約340の不揮発分65質量%のMEK溶液)35質量部にビフェニル型エポキシ樹脂(エポキシ当量269、日本化薬(株)製「NC3000L」)15質量部をシクロヘキサノン20質量部と共に加熱溶解させたものを添加した。そこへ、フェノキシ樹脂溶液(ジャパンエポキシレジン(株)製「YL−7553」、不揮発分30質量%のMEKとシクロヘキサノンとの混合溶液、重量平均分子量36000)10質量部、不揮発分85質量%のトルエン溶液)30質量部、硬化性ポリビニルベンジル化合物(昭和高分子(株)製「V5000X」、不揮発分65質量%)3重量部、ナフテン酸亜鉛(II)(東京化成(株)製、亜鉛含有量8質量%のミネラルスピリット溶液)の3質量%のシクロヘキサノン溶液3質量部、および球形シリカ((株)アドマテックス製「SOC2」をアミノシランで表面処理したもの、平均粒子径0.5μm)95質量部を混合し、高速回転ミキサーで均一に分散して、熱硬化性樹脂組成物のワニスを作製した。
樹脂組成物の不揮発分中、ジシクロペンタジエン型シアネートエステル樹脂5質量%、硬化性ポリビニルベンジル化合物1質量%、有機金属系触媒として添加した金属(亜鉛)60ppm、高分子樹脂1.9質量%、無機充填材59質量%となる。
次に、かかる樹脂組成物ワニスを使用し、実施例1と全く同様にして接着フィルムを得た。[Example 3]
30 parts by mass of a prepolymer of bisphenol A dicyanate ("BA230S75" manufactured by Lonza Japan Co., Ltd., MEK solution having a cyanate equivalent of about 232 and a non-volatile content of 75% by mass) and dicyclopentadiene-type cyanate ester resin (manufactured by Lonza Japan Co., Ltd. 10 parts by mass of DT-4000 ", a toluene solution having a cyanate equivalent of about 140 and a nonvolatile content of 85% by mass) was stirred and mixed together with 10 parts by mass of MEK. To this, 35 parts by mass of “ESN-475V” (an epoxy equivalent of about 340 non-volatile content 65% by mass MEK solution) manufactured by Toto Kasei Co., Ltd. as a naphthol type epoxy resin was added to a biphenyl type epoxy resin (epoxy equivalent 269, Nippon Kayaku). "NC3000L" manufactured by Co., Ltd.) was added by dissolving 15 parts by mass together with 20 parts by mass of cyclohexanone. Thereto, a phenoxy resin solution (“YL-7553” manufactured by Japan Epoxy Resin Co., Ltd., a mixed solution of MEK and cyclohexanone having a nonvolatile content of 30% by mass, a weight average molecular weight of 36000), 10 parts by mass, and a toluene having a nonvolatile content of 85% by mass. Solution) 30 parts by weight, curable polyvinyl benzyl compound (“V5000X” manufactured by Showa Polymer Co., Ltd., nonvolatile content 65% by weight) 3 parts by weight, zinc naphthenate (II) (manufactured by Tokyo Chemical Industry Co., Ltd., zinc content) 3 parts by weight of a 3% by weight cyclohexanone solution (8% by weight mineral spirit solution) and 95 parts by weight of spherical silica ("SOC2" manufactured by Admatechs Co., Ltd., surface-treated with aminosilane, average particle size 0.5 µm) And were uniformly dispersed with a high-speed rotary mixer to prepare a varnish of a thermosetting resin composition.
In the nonvolatile content of the resin composition, 5% by mass of a dicyclopentadiene-type cyanate ester resin, 1% by mass of a curable polyvinylbenzyl compound, 60 ppm of metal (zinc) added as an organometallic catalyst, 1.9% by mass of a polymer resin, It becomes 59 mass% of inorganic fillers.
Next, using this resin composition varnish, an adhesive film was obtained in exactly the same manner as in Example 1.
[比較例1]
実施例1のジシクロペンタジエン型シアネートエステル樹脂(ロンザジャパン(株)製「DT−4000」、シアネート当量約140、不揮発分85質量%のトルエン溶液)40質量部を、フェノールノボラック型多官能シアネートエステル樹脂(ロンザジャパン(株)製「PT30」、シアネート当量約124)34質量部に変更する以外は、実施例1と全く同様にして接着フィルムを得た。[Comparative Example 1]
40 parts by mass of the dicyclopentadiene-type cyanate ester resin of Example 1 (“DT-4000” manufactured by Lonza Japan Co., Ltd., a toluene solution having a cyanate equivalent of about 140 and a nonvolatile content of 85% by mass) was added to a phenol novolac-type polyfunctional cyanate ester. An adhesive film was obtained in exactly the same manner as in Example 1 except that the resin ("PT30" manufactured by Lonza Japan Co., Ltd., cyanate equivalent of about 124) was changed to 34 parts by mass.
[比較例2]
実施例1の硬化性ポリビニルベンジル化合物(昭和高分子(株)製 V5000X、不揮発分65質量%)30重量部を、ビスフェノールAジシアネートのプレポリマー(ロンザジャパン(株)製「BA230S75」、シアネート当量約232、不揮発分75質量%のメチルエチルケトン溶液)26質量部に変更する以外は、実施例1と全く同様にして接着フィルムを得た。[Comparative Example 2]
30 parts by weight of the curable polyvinyl benzyl compound (V5000X, Showa High Polymer Co., Ltd., non-volatile content 65 mass%) of Example 1 was added to a prepolymer of bisphenol A dicyanate (“BA230S75” manufactured by Lonza Japan Co., Ltd.) with a cyanate equivalent of about 232, methyl ethyl ketone solution having a nonvolatile content of 75% by mass) An adhesive film was obtained in the same manner as in Example 1 except that the content was changed to 26 parts by mass.
[比較例3]
ビスフェノールAジシアネートのプレポリマー(ロンザジャパン(株)製「BA230S75」、シアネート当量約232、不揮発分75質量%のMEK溶液)15質量部およびフェノールノボラック型多官能シアネートエステル樹脂(ロンザジャパン(株)製「PT30」、シアネート当量約124)10質量部をMEK10質量部と共に攪拌混合した。これに、ナフトール型エポキシ樹脂として東都化成(株)製「ESN−475V」(エポキシ当量約340の不揮発分65質量%のMEK溶液)15質量部にビフェニル型エポキシ樹脂(エポキシ当量269、日本化薬(株)製「NC3000L」)35質量部をシクロヘキサノン20質量部と共に加熱溶解させたものを添加した。そこへ、ポリビニルブチラール樹脂溶液(積水化学工業(株)製「KS-1」(ガラス転移温度105℃)の固形分15質量%のMEKとシクロヘキサノンの1:1溶液)20質量部を混合し、ナフテン酸亜鉛(II)(東京化成(株)製、亜鉛含有量8質量%のミネラルスピリット溶液)の3質量%のシクロヘキサノン溶液3質量部、および球形シリカ((株)アドマテックス製「SOC2」をアミノシランで表面処理したもの、平均粒子径0.5μm)70質量部を混合し、高速回転ミキサーで均一に分散して、熱硬化性樹脂組成物のワニスを作製した。
次に、かかる樹脂組成物ワニスを使用し、実施例1と全く同様にして接着フィルムを得た[Comparative Example 3]
Prepolymer of bisphenol A dicyanate ("BA230S75" manufactured by Lonza Japan Co., Ltd., MEK solution having a cyanate equivalent of about 232 and a nonvolatile content of 75% by mass) and phenol novolac type polyfunctional cyanate ester resin (Lonza Japan Co., Ltd.) 10 parts by weight of “PT30”, a cyanate equivalent of about 124) was mixed with 10 parts by weight of MEK with stirring. To this, as a naphthol type epoxy resin, “ESN-475V” manufactured by Tohto Kasei Co., Ltd. (an MEK solution having an epoxy equivalent of about 340 having a nonvolatile content of 65% by mass) and a biphenyl type epoxy resin (epoxy equivalent 269, Nippon Kayaku) "NC3000L" manufactured by Co., Ltd.) was added by heating and dissolving 35 parts by mass together with 20 parts by mass of cyclohexanone. There, 20 parts by mass of a polyvinyl butyral resin solution (Sekisui Chemical Co., Ltd. “KS-1” (1: 1 solution of MEK and cyclohexanone having a solid content of 15 mass%) having a solid content of 15 mass%) was mixed, 3 parts by mass of 3% by mass cyclohexanone solution of zinc naphthenate (II) (manufactured by Tokyo Chemical Industry Co., Ltd., mineral spirit solution having a zinc content of 8% by mass), and spherical silica ("SOC2" by Admatechs Co., Ltd.) 70 parts by mass of a surface treated with aminosilane (average particle size 0.5 μm) were mixed and dispersed uniformly with a high-speed rotary mixer to prepare a varnish of a thermosetting resin composition.
Next, using this resin composition varnish, an adhesive film was obtained in exactly the same manner as in Example 1.
<ピール強度および表面粗度の測定用サンプルの調製>
(1)積層板の下地処理
内層回路を形成したガラス布基材エポキシ樹脂両面銅張積層板[銅箔の厚さ18μm、基板厚み0.3mm、パナソニック電工(株)製R5715ES]の両面をメック(株)製CZ8100に浸漬して銅表面の粗化処理をおこなった。
(2)接着フィルムのラミネート
実施例1、2および比較例1〜3で作製した接着フィルムを、バッチ式真空加圧ラミネーターMVLP-500(名機(株)製 商品名)を用いて、積層板の両面にラミネートした。ラミネートは、30秒間減圧して気圧を13hPa以下とし、その後30秒間、100℃、圧力0.74MPaでプレスすることにより行った。
(3)樹脂組成物の硬化
ラミネート後、100℃、30分さらに、180℃、30分の硬化条件で樹脂組成物を硬化した。その後、接着フィルムからPETフィルムを剥離した。
(4)粗化処理
積層板を、膨潤液である、アトテックジャパン(株)のジエチレングリコールモノブチルエーテル含有のスエリングディップ・セキュリガントPに浸漬し、次に粗化液として、アトテックジャパン(株)のコンセントレート・コンパクトP(KMnO4:60g/L、NaOH:40g/Lの水溶液)に浸漬、最後に中和液として、アトテックジャパン(株)のリダクションソリューシン・セキュリガントPに40℃で5分間浸漬した。粗化条件:膨潤液に80℃で10分間浸漬、粗化液に80℃で25分間浸漬した。この粗化処理後の積層板について、表面粗度(算術平均粗さ)の測定を行った。
(5)セミアディティブ工法によるメッキ
絶縁層表面に回路を形成するために、積層板を、PdCl2を含む無電解メッキ用触媒溶液に浸漬し、次に無電解銅メッキ液に浸漬した。150℃にて30分間加熱してアニール処理を行った後に、エッチングレジストを形成し、エッチングによるパターン形成の後に、硫酸銅電解メッキを行い、30±5μmの厚さで導体層を形成した。次に、アニール処理を180℃にて60分間行った。この積層板についてメッキ銅のピール強度の測定を行った。<Preparation of samples for measuring peel strength and surface roughness>
(1) Ground treatment of laminated board Glass cloth base material epoxy resin double-sided copper-clad laminated board with inner layer circuit [copper foil thickness 18μm, substrate thickness 0.3mm, Panasonic Electric Works Co., Ltd. R5715ES] The copper surface was roughened by immersing in CZ8100 manufactured by Co., Ltd.
(2) Lamination of adhesive film The adhesive film produced in Examples 1 and 2 and Comparative Examples 1 to 3 was laminated using a batch-type vacuum pressure laminator MVLP-500 (trade name, manufactured by Meiki Co., Ltd.). Laminated on both sides. Lamination was performed by reducing the pressure for 30 seconds to a pressure of 13 hPa or less, and then pressing at 100 ° C. and a pressure of 0.74 MPa for 30 seconds.
(3) Curing of resin composition After lamination, the resin composition was cured at 100 ° C for 30 minutes and further at 180 ° C for 30 minutes. Thereafter, the PET film was peeled from the adhesive film.
(4) Roughening treatment The laminate is immersed in a swelling dip securigant P containing diethylene glycol monobutyl ether of Atotech Japan Co., Ltd., which is a swelling liquid, and then the outlet of Atotech Japan Co., Ltd. as a roughening liquid. Immerse in rate compact P (KMnO 4 : 60 g / L, NaOH: 40 g / L aqueous solution), and finally immerse in Atotech Japan Co., Ltd., reduction solution securigant P at 5 ° C. for 5 minutes. did. Roughening conditions: immersed in a swelling liquid at 80 ° C. for 10 minutes, and immersed in a roughening liquid at 80 ° C. for 25 minutes. About the laminated board after this roughening process, the surface roughness (arithmetic mean roughness) was measured.
(5) Plating by semi-additive method In order to form a circuit on the surface of the insulating layer, the laminate was immersed in an electroless plating catalyst solution containing PdCl 2 and then immersed in an electroless copper plating solution. After annealing at 150 ° C. for 30 minutes, an etching resist was formed, and after pattern formation by etching, copper sulfate electrolytic plating was performed to form a conductor layer with a thickness of 30 ± 5 μm. Next, annealing was performed at 180 ° C. for 60 minutes. The peel strength of the plated copper was measured for this laminate.
<メッキ導体層の引き剥がし強さ(ピール強度)の測定及び評価>
積層板の導体層に、カッターを用いて幅10mm、長さ100mmの部分の切込みをいれ、この一端を剥がしてつかみ具(株式会社ティー・エス・イー、オートコム型試験機 AC−50C−SL)で掴み、室温中にて、50mm/分の速度で垂直方向に35mmを引き剥がした時の荷重を測定した。ピール強度の値が、0.60kgf/cm以上の場合を「◎」とし、0.60kgf/cm未満0.50kgf/cm以上の場合を「○」とし、0.50kgf/cm未満0.40kgf/cm以上の場合を「△」とし、0.40kgf/cm未満の場合を「×」とした。<Measurement and Evaluation of Peeling Strength (Peel Strength) of Plating Conductor Layer>
The conductor layer of the laminated plate is cut with a cutter with a width of 10 mm and a length of 100 mm, and one end is peeled off to grasp the grip (TSE, Inc., Autocom type testing machine AC-50C-SL ) And measured the load when 35 mm was peeled off in the vertical direction at a speed of 50 mm / min at room temperature. When the peel strength value is 0.60 kgf / cm or more, “と し”, and less than 0.60 kgf / cm, 0.50 kgf / cm or more, “◯”, and less than 0.50 kgf / cm, 0.40 kgf / cm The case of cm or more was designated as “Δ”, and the case of less than 0.40 kgf / cm was designated as “x”.
<粗化後の算術平均粗さ(Ra値)の測定及び評価>
非接触型表面粗さ計(ビーコインスツルメンツ社製WYKO NT3300)を用いて、VSIコンタクトモード、50倍レンズにより測定範囲を121μm×92μmとして得られる数値により算術平均粗さ(Ra値)を求めた。なお、表1に示す算術平均粗さ(Ra値)は、積層板から3cm角の測定用サンプルを切り出し、同サンプル上のランダムな10点(10箇所)について測定した測定値の平均値である。算術平均粗さ(Ra値)の値が、300nm未満の場合を「◎」とし、300nm以上370nm未満の場合を「○」とし、370nm以上450nm未満の場合を「△」とし、450nm以上600nm未満の場合を「×」とし、600nm以上の場合を「××」とした。<Measurement and evaluation of arithmetic average roughness (Ra value) after roughening>
Using a non-contact type surface roughness meter (WYKO NT3300 manufactured by BEIKO INSTRUMENTS Co., Ltd.), the arithmetic average roughness (Ra value) was obtained from the numerical value obtained by setting the measurement range to 121 μm × 92 μm with a VSI contact mode and a 50 × lens. In addition, the arithmetic average roughness (Ra value) shown in Table 1 is an average value of measured values obtained by cutting a 3 cm square measurement sample from the laminated plate and measuring 10 random points (10 locations) on the sample. . When the arithmetic average roughness (Ra value) is less than 300 nm, “◎”, when it is 300 nm or more and less than 370 nm, “◯”, when it is 370 nm or more and less than 450 nm, “Δ”, and 450 nm or more and less than 600 nm In the case of “×”, the case of 600 nm or more was designated as “XX”.
<誘電正接の測定及び評価>
実施例1、2、3および比較例1、2、3で得られた接着フィルムを190℃で90分熱硬化させてシート状の硬化物を得た。その硬化物を長さ80mm、幅2mmに切り出し評価サンプルとした。この評価サンプルについてアジレントテクノロジーズ(Agilent Technologies)社製HP8362B装置を用い空洞共振摂動法により測定周波数5.8GHz、測定温度23℃にて誘電正接を測定した。誘電正接の値が、0.0060未満の場合を「◎」とし、0.0060以上0.0070未満の場合を「○」とし、0.0070以上0.0080未満の場合を「△」とし、0.0080以上0.0100未満の場合を「×」とし、0.0100以上の場合を「××」とした。<Measurement and evaluation of dielectric loss tangent>
The adhesive films obtained in Examples 1, 2, and 3 and Comparative Examples 1, 2, and 3 were thermally cured at 190 ° C. for 90 minutes to obtain sheet-like cured products. The cured product was cut into a length of 80 mm and a width of 2 mm and used as an evaluation sample. The dielectric loss tangent of this evaluation sample was measured at a measurement frequency of 5.8 GHz and a measurement temperature of 23 ° C. by a cavity resonance perturbation method using an HP 8362B apparatus manufactured by Agilent Technologies. The case where the value of the dielectric loss tangent is less than 0.0060 is “、”, the case where it is 0.0060 or more and less than 0.0070 is “◯”, and the case where it is 0.0070 or more and less than 0.0080 is “△”, The case of 0.0080 or more and less than 0.0100 was designated as “X”, and the case of 0.0100 or more was designated as “XX”.
<線熱膨張率の評価>
実施例1、2、3および比較例1、2、3で得られた接着フィルムを190℃で90分熱硬化させてシート状の硬化物を得た。その硬化物を、幅約5mm、長さ約15mmの試験片に切断し、(株)リガク製熱機械分析装置(Thermo Plus TMA8310)を使用して、引張加重法で熱機械分析を行った。試験片を上記装置に装着後、荷重1g、昇温速度5℃/分の測定条件にて連続して2回測定した。2回目の測定における25℃から150℃までの平均線熱膨張率(ppm)を算出した。線熱膨張率の値が、33ppm未満の場合を「○」とし、33ppm以上の場合を「△」とした。<Evaluation of linear thermal expansion coefficient>
The adhesive films obtained in Examples 1, 2, and 3 and Comparative Examples 1, 2, and 3 were thermally cured at 190 ° C. for 90 minutes to obtain sheet-like cured products. The cured product was cut into a test piece having a width of about 5 mm and a length of about 15 mm, and thermomechanical analysis was performed by a tensile load method using a thermomechanical analyzer manufactured by Rigaku Corporation (Thermo Plus TMA8310). After mounting the test piece on the above-mentioned apparatus, the test piece was measured twice continuously under the measurement conditions of a load of 1 g and a heating rate of 5 ° C./min. The average linear thermal expansion coefficient (ppm) from 25 ° C. to 150 ° C. in the second measurement was calculated. The case where the value of the coefficient of linear thermal expansion was less than 33 ppm was set as “◯”, and the case where it was 33 ppm or more was set as “Δ”.
結果を表1に示す。 The results are shown in Table 1.
表1の結果から、実施例1〜3で得られた接着フィルムにより形成された絶縁層は、誘電正接が比較例1〜3のどれよりも低く、かつ、32ppm以下と低線熱膨張率であり、また表面粗度がRa値360nm以下と低粗度で、0.5kgf/cm以上の導体層ピール強度が得られることが分かる。
一方、ジシクロペンタジエン型シアネートエステル樹脂を使用せず、フェノールノボラック型多官能シアネートエステル樹脂に変更した比較例1や、硬化性ポリビニルベンジル化合物を使用していない比較例2では、誘電正接が高く、かつ粗度が高いにも関わらず導体層ピール強度が弱いことが分かる。
ジシクロペンタジエン型シアネートエステル樹脂および硬化性ポリビニルベンジル化合物を共に含まない比較例3においては、粗度及び導体層のピール強度は良好であるものの、エポキシ樹脂の使用量が多いため、誘電正接が0.011と実施例の2倍近く高くなっており、高周波分野での使用に適さない事が分かった。From the results of Table 1, the insulating layer formed of the adhesive films obtained in Examples 1 to 3 has a dielectric loss tangent lower than that of any of Comparative Examples 1 to 3, and a low linear thermal expansion coefficient of 32 ppm or less. In addition, it can be seen that a conductor layer peel strength of 0.5 kgf / cm or more can be obtained with a surface roughness as low as a Ra value of 360 nm or less and a low roughness.
On the other hand, in Comparative Example 1 in which the dicyclopentadiene type cyanate ester resin was not used and the phenol novolac type polyfunctional cyanate ester resin was changed, and in Comparative Example 2 in which no curable polyvinylbenzyl compound was used, the dielectric loss tangent was high. It can also be seen that the conductor layer peel strength is weak despite the high roughness.
In Comparative Example 3, which does not contain both the dicyclopentadiene-type cyanate ester resin and the curable polyvinyl benzyl compound, the roughness and the peel strength of the conductor layer are good, but the dielectric loss tangent is 0 because of the large amount of epoxy resin used. .011, which is nearly twice as high as that of the example, and was found to be unsuitable for use in the high frequency field.
本発明によれば、硬化物の誘電正接が低く、かつ導体との密着強度に優れた樹脂組成物を提供することができ、さらには、該硬化性樹脂組成物を用いた接着フィルム、およびプリプレグ、該接着フィルム等を用いたプリント配線板等の電子部品、並びにその製造方法を提供することができる。
本出願は、日本で出願された特願2009−008562を基礎としており、その内容は本明細書にすべて包含される。According to the present invention, it is possible to provide a resin composition having a low dielectric loss tangent of a cured product and excellent adhesion strength with a conductor, and further, an adhesive film using the curable resin composition, and a prepreg Further, it is possible to provide an electronic component such as a printed wiring board using the adhesive film and the like, and a manufacturing method thereof.
This application is based on Japanese Patent Application No. 2009-008562 filed in Japan, the contents of which are incorporated in full herein.
Claims (14)
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JP2010546670A JP5636962B2 (en) | 2009-01-19 | 2010-01-19 | Resin composition |
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JP5672694B2 (en) * | 2009-12-16 | 2015-02-18 | 住友ベークライト株式会社 | Resin sheet, printed wiring board, and semiconductor device |
CN102942684B (en) * | 2012-11-08 | 2015-06-17 | 广东生益科技股份有限公司 | Thermosetting cyanate resin composition and application of thermosetting cyanate resin composition |
JP6307236B2 (en) * | 2013-09-30 | 2018-04-04 | 新日鉄住金化学株式会社 | Curable resin composition, cured product, electrical / electronic component and circuit board material |
EP3077449B1 (en) * | 2013-12-04 | 2017-10-18 | Lonza Ltd | Method for preparing fiber-reinforced parts based on cyanate ester/epoxy blends |
CN104804185B (en) * | 2015-04-24 | 2017-05-17 | 黑龙江省科学院石油化学研究院 | Preparation method of cyanate ester prepolymer used for preparing glue film |
JP7427455B2 (en) * | 2015-09-18 | 2024-02-05 | 味の素株式会社 | Adhesive films, printed wiring boards and semiconductor devices |
JP6651760B2 (en) * | 2015-09-18 | 2020-02-19 | 味の素株式会社 | Manufacturing method of printed wiring board |
KR102257926B1 (en) | 2018-09-20 | 2021-05-28 | 주식회사 엘지화학 | Multilayered printed circuit board, method for manufacturing the same, and semiconductor device using the same |
DE102019204344A1 (en) * | 2019-03-28 | 2020-10-01 | Tesa Se | Removable adhesive strip |
JP7115445B2 (en) * | 2019-09-03 | 2022-08-09 | 信越化学工業株式会社 | Maleimide resin film and composition for maleimide resin film |
JP7452560B2 (en) * | 2020-01-22 | 2024-03-19 | 味の素株式会社 | Manufacturing method of printed wiring board |
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JPH11263940A (en) * | 1998-03-17 | 1999-09-28 | Hitachi Chem Co Ltd | Modified cyanate ester resin varnish for printed wiring board and its production |
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JP3231814B2 (en) * | 1991-07-12 | 2001-11-26 | ミネソタ マイニング アンド マニュファクチャリング カンパニー | Anisotropic conductive film |
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TWI455988B (en) * | 2006-10-13 | 2014-10-11 | Ajinomoto Kk | Resin composition |
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- 2010-01-19 WO PCT/JP2010/050531 patent/WO2010082658A1/en active Application Filing
- 2010-01-19 JP JP2010546670A patent/JP5636962B2/en active Active
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JPS62223230A (en) * | 1986-02-11 | 1987-10-01 | ザ ダウ ケミカル カンパニ− | Curable composition containing ethylenic unsaturated monomerand polyarylcyanate ester component |
JPH01503783A (en) * | 1986-08-15 | 1989-12-21 | ザ ダウ ケミカル カンパニー | Vinyl benzyl ether of polyhalogenated phenol compounds |
JPH0299515A (en) * | 1988-10-06 | 1990-04-11 | Nippon Oil Co Ltd | Thermosetting resin composition |
JPH11263940A (en) * | 1998-03-17 | 1999-09-28 | Hitachi Chem Co Ltd | Modified cyanate ester resin varnish for printed wiring board and its production |
JP2005244150A (en) * | 2004-01-28 | 2005-09-08 | Ajinomoto Co Inc | Resin composition, adhesive film using it, and multi-layer printed wiring board |
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WO2010082658A1 (en) | 2010-07-22 |
TW201038647A (en) | 2010-11-01 |
KR20110117158A (en) | 2011-10-26 |
KR101694138B1 (en) | 2017-01-09 |
JPWO2010082658A1 (en) | 2012-07-05 |
TWI471369B (en) | 2015-02-01 |
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