JP5634473B2 - パネル評価システム及びパネル評価方法 - Google Patents

パネル評価システム及びパネル評価方法 Download PDF

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JP5634473B2
JP5634473B2 JP2012226339A JP2012226339A JP5634473B2 JP 5634473 B2 JP5634473 B2 JP 5634473B2 JP 2012226339 A JP2012226339 A JP 2012226339A JP 2012226339 A JP2012226339 A JP 2012226339A JP 5634473 B2 JP5634473 B2 JP 5634473B2
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display panel
measurement
measuring
image signal
panel
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JP2013015868A5 (enExample
JP2013015868A (ja
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重治 石川
重治 石川
智治 印南
智治 印南
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IIX Inc
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JP2012226339A 2012-10-11 2012-10-11 パネル評価システム及びパネル評価方法 Expired - Fee Related JP5634473B2 (ja)

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JP2012226339A JP5634473B2 (ja) 2012-10-11 2012-10-11 パネル評価システム及びパネル評価方法

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JP2012226339A JP5634473B2 (ja) 2012-10-11 2012-10-11 パネル評価システム及びパネル評価方法

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JP2010201179A Division JP5113232B2 (ja) 2010-09-08 2010-09-08 パネル評価システム及びパネル評価方法

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JP2013015868A JP2013015868A (ja) 2013-01-24
JP2013015868A5 JP2013015868A5 (enExample) 2013-10-17
JP5634473B2 true JP5634473B2 (ja) 2014-12-03

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Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20200043443A1 (en) * 2016-10-26 2020-02-06 Sakai Display Products Corporation Correction system
CN108806576B (zh) * 2018-05-30 2021-05-11 南京中电熊猫平板显示科技有限公司 显示装置、面板控制装置以及使用方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003254861A (ja) * 2002-03-01 2003-09-10 Seiko Epson Corp 液晶パネル検査方法及び装置
JP2005308476A (ja) * 2004-04-20 2005-11-04 Mitsubishi Electric Corp 液晶表示検査装置および液晶表示検査方法
JP5010814B2 (ja) * 2005-07-07 2012-08-29 グローバル・オーエルイーディー・テクノロジー・リミテッド・ライアビリティ・カンパニー 有機el表示装置の製造方法
JP4681033B2 (ja) * 2008-07-31 2011-05-11 株式会社イクス 画像補正データ生成システム、画像データ生成方法及び画像補正回路
JP2010193273A (ja) * 2009-02-19 2010-09-02 Sharp Corp テスト装置、テスト方法及びテストプログラム
JP5113232B2 (ja) * 2010-09-08 2013-01-09 株式会社イクス パネル評価システム及びパネル評価方法

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