JP5618910B2 - 絶縁劣化監視システム - Google Patents

絶縁劣化監視システム Download PDF

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Publication number
JP5618910B2
JP5618910B2 JP2011123286A JP2011123286A JP5618910B2 JP 5618910 B2 JP5618910 B2 JP 5618910B2 JP 2011123286 A JP2011123286 A JP 2011123286A JP 2011123286 A JP2011123286 A JP 2011123286A JP 5618910 B2 JP5618910 B2 JP 5618910B2
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Japan
Prior art keywords
frequency
leakage current
ior
load
calculation
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JP2011123286A
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English (en)
Japanese (ja)
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JP2012251817A (ja
JP2012251817A5 (enExample
Inventor
直聡 坂本
直聡 坂本
賢 新土井
賢 新土井
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Mitsubishi Electric Corp
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Mitsubishi Electric Corp
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Priority to JP2011123286A priority Critical patent/JP5618910B2/ja
Priority to CN201110350685.9A priority patent/CN102809717B/zh
Publication of JP2012251817A publication Critical patent/JP2012251817A/ja
Publication of JP2012251817A5 publication Critical patent/JP2012251817A5/ja
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    • G01R31/02—

Landscapes

  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
JP2011123286A 2011-06-01 2011-06-01 絶縁劣化監視システム Active JP5618910B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2011123286A JP5618910B2 (ja) 2011-06-01 2011-06-01 絶縁劣化監視システム
CN201110350685.9A CN102809717B (zh) 2011-06-01 2011-11-08 绝缘老化监视系统

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2011123286A JP5618910B2 (ja) 2011-06-01 2011-06-01 絶縁劣化監視システム

Publications (3)

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JP2012251817A JP2012251817A (ja) 2012-12-20
JP2012251817A5 JP2012251817A5 (enExample) 2014-01-16
JP5618910B2 true JP5618910B2 (ja) 2014-11-05

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JP2011123286A Active JP5618910B2 (ja) 2011-06-01 2011-06-01 絶縁劣化監視システム

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JP (1) JP5618910B2 (enExample)
CN (1) CN102809717B (enExample)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2014156386A1 (ja) * 2013-03-29 2014-10-02 三菱電機株式会社 電動機の診断装置および開閉装置
US9820229B2 (en) * 2013-04-05 2017-11-14 Qualcomm Incorporated Dynamic voltage and frequency scaling in wireless modems
CN105158649B (zh) * 2015-06-03 2018-06-19 廖小雄 电机电器在线绝缘状态无线监控装置
WO2016203633A1 (ja) * 2015-06-19 2016-12-22 三菱電機株式会社 漏洩電流検出装置
JP6477548B2 (ja) 2016-03-09 2019-03-06 オムロン株式会社 漏洩電流算出装置および漏洩電流算出方法
JP6718394B2 (ja) * 2017-02-06 2020-07-08 株式会社日立産機システム 絶縁監視装置および絶縁監視システム
JP6460146B2 (ja) * 2017-04-21 2019-01-30 オムロン株式会社 漏洩電流算出装置および漏洩電流算出方法
JP6568189B2 (ja) * 2017-12-07 2019-08-28 ファナック株式会社 モータ駆動装置および測定方法
JP7043367B2 (ja) * 2018-08-09 2022-03-29 株式会社日立製作所 電気機械の診断装置および診断方法、並びに回転電機
JP7218239B2 (ja) * 2019-04-26 2023-02-06 株式会社日立製作所 電気機械の診断方法および診断装置、並びに回転電機
CN110716112B (zh) * 2019-11-15 2022-01-25 国电南京自动化股份有限公司 一种高压级联svg绝缘框架绝缘检测方法
CN112557853B (zh) * 2020-12-19 2023-05-30 哈尔滨恒达交通设备技术开发有限公司 铁路客车复合型智能绝缘检测仪
CN118962408A (zh) * 2024-10-15 2024-11-15 浙江剑桥通信设备有限公司 电路长枝晶状态监测系统、方法、设备及介质
CN120879463B (zh) * 2025-09-25 2025-12-09 陕西斯锐明天智能设备有限公司 用于低压it供电系统的漏电保护系统

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7353123B2 (en) * 2001-10-04 2008-04-01 Hitachi, Ltd. Leakage current or resistance measurement method, and monitoring apparatus and monitoring system of the same
TWI231079B (en) * 2003-01-17 2005-04-11 Hitachi Ltd Insulation diagnostic device
JP4306781B2 (ja) * 2007-10-30 2009-08-05 ダイキン工業株式会社 漏電検出回路
JP2009115754A (ja) * 2007-11-09 2009-05-28 Sbc Co Ltd 電気機器における漏洩電流測定装置及び測定方法
WO2010100998A1 (ja) * 2009-03-05 2010-09-10 三菱電機株式会社 絶縁劣化検出装置

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Publication number Publication date
CN102809717B (zh) 2016-05-11
JP2012251817A (ja) 2012-12-20
CN102809717A (zh) 2012-12-05

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